[求助] 关于TI28027 JTAG连接问题

shiguangjiqiren   2017-4-7 15:08 楼主
各位路过的大神你们好! 我是新手,自己制作了一块电路板,使用的主芯片是28027,连接好仿真器之后,首先使用ccxml文件,检测JTAG连接问题,得到的文件如下: -----[Print the reset-command hardware log-file]----------------------------- The scan-path will be reset by toggling the JTAG TRST signal. The controller is the FTDI FT2232 with USB interface. The link from controller to target is direct (without cable). The software is configured for FTDI FT2232 features. The controller cannot monitor the value on the EMU[0] pin. The controller cannot monitor the value on the EMU[1] pin. The controller cannot control the timing on output pins. The controller cannot control the timing on input pins. The scan-path link-delay has been set to exactly '0' (0x0000). -----[The log-file for the JTAG TCLK output generated from the PLL]---------- There is no hardware for programming the JTAG TCLK frequency. -----[Measure the source and frequency of the final JTAG TCLKR input]-------- There is no hardware for measuring the JTAG TCLK frequency. -----[Perform the standard path-length test on the JTAG IR and DR]----------- This path-length test uses blocks of 512 32-bit words. The test for the JTAG IR instruction path-length succeeded. The JTAG IR instruction path-length is 38 bits. The test for the JTAG DR bypass path-length succeeded. The JTAG DR bypass path-length is 1 bits. -----[Perform the Integrity scan-test on the JTAG IR]------------------------ This test will use blocks of 512 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG IR Integrity scan-test has succeeded. -----[Perform the Integrity scan-test on the JTAG DR]------------------------ This test will use blocks of 512 32-bit words. This test will be applied just once. Do a test using 0xFFFFFFFF. Scan tests: 1, skipped: 0, failed: 0 Do a test using 0x00000000. Scan tests: 2, skipped: 0, failed: 0 Do a test using 0xFE03E0E2. Scan tests: 3, skipped: 0, failed: 0 Do a test using 0x01FC1F1D. Scan tests: 4, skipped: 0, failed: 0 Do a test using 0x5533CCAA. Scan tests: 5, skipped: 0, failed: 0 Do a test using 0xAACC3355. Scan tests: 6, skipped: 0, failed: 0 All of the values were scanned correctly. The JTAG DR Integrity scan-test has succeeded. [End: Texas Instruments XDS100v2 USB Emulator_0] 文件表明JTAG扫描链扫描成功,然后写好工程,在烧写程序的时候报错为: C28xx: Error connecting to the target: (Error -151 @ 0x0) One of the FTDI driver functions used during the connect returned bad status or an error. The cause may one or more of: invalid emulator serial number, blank emulator EEPROM, missing FTDI drivers, faulty USB cable. Use the xds100serial command-line utility in the 'common/uscif' folder to verify the emulator can be located. (Emulation package 5.1.507.0) 不知道该怎么解决?特地求助大家~~~ 先谢谢大家了! 本帖最后由 shiguangjiqiren 于 2017-4-7 15:24 编辑

回复评论 (10)

是新手,还自己做的板子。你这叫一步到位哈。


好象仿真器是好的。连接目标芯片没有连接上。或者芯片没加电,或者不是所选芯片,或者芯片坏。或者电路有错
点赞  2017-4-7 16:05
这个问题我看到好几个人在问这个JTAG的问题:
1、排除硬件连接.不上电的情况下,检查下有些线是否是通的。或者硬件其他连接有没有问题;
在排除硬件连接问题的情况下,安装JLINK的驱动,一定要保证在“设备管理器”下显示有jlink;
2、如果你使用Jlink,建议用JLINK自带的Jflash连接一下,看是否能连接通。如果安装JLINK驱动后,在开始菜单的 SEGGER文件夹下,找这个Jflash;
如果连接不通,说明还是你的硬件设计有问题。请仔细查看硬件设计
点赞  2017-4-7 18:24
引用: dontium 发表于 2017-4-7 16:05
是新手,还自己做的板子。你这叫一步到位哈。


好象仿真器是好的。连接目标芯片没有连接上。或者芯片没 ...

版主见笑了,以前一直做FPGA,现在项目做的关于DSP~~~我在一直学习,感谢您能回复我!
点赞  2017-4-7 21:09
引用: huaiqiao 发表于 2017-4-7 18:24
这个问题我看到好几个人在问这个JTAG的问题:
1、排除硬件连接.不上电的情况下,检查下有些线是否是通的。 ...

首先感谢您能够恢复我,刚才又做了一下检测,从一个芯片的小系统来看,主要是时钟(晶振)、复位和JTAG电路,通过示波器和万用表检测,前两部分都正常,可是CCS6.0报错说,芯片一直处于复位状态,这就不能理解了~
C28xx: Failed CPU Reset: (Error -1137 @ 0x0) Device is held in reset. Take the device out of reset, and retry the operation. (Emulation package 5.1.507.0)
C28xx: Trouble Reading Register PC: (Error -1137 @ 0x0) Device is held in reset. Take the device out of reset, and retry the operation. (Emulation package 5.1.507.0)
准备使用其他的仿真器和其他版本的编译器写一个测试过程~
点赞  2017-4-7 21:28
引用: dontium 发表于 2017-4-7 16:05
是新手,还自己做的板子。你这叫一步到位哈。


好象仿真器是好的。连接目标芯片没有连接上。或者芯片没 ...

恩恩仿真器应该没问题,报错提示的说CCS探测到的芯片不是我的设置的target芯片,让我从新配置目标文件;
第二个错误是芯片一直处于复位状态,可实际上使用万用表测量复位引脚并不是一直处于低电平状态,只有我按下复位键的时候才被拉低;
第三,使用示波器测试了晶振也都正常,芯片的供电引脚电平都正常;我也会再请教一下身边的高人!
点赞  2017-4-7 21:34
引用: shiguangjiqiren 发表于 2017-4-7 21:34
恩恩仿真器应该没问题,报错提示的说CCS探测到的芯片不是我的设置的target芯片,让我从新配置目标文件;
...

新的CPU,没有启动外部晶振的,用示波器怎么测的它是正常的呢?
点赞  2017-4-7 22:11
引用: shiguangjiqiren 发表于 2017-4-7 21:28
首先感谢您能够恢复我,刚才又做了一下检测,从一个芯片的小系统来看,主要是时钟(晶振)、复位和JTAG电 ...

那就检查你的硬件复位电路,估计是个电阻和电容的那种复位吧。另外,需要注意的是你的芯片到底是高电平复位还是低电平复位这个一定要搞清楚。如果不清楚的话,我想这种片子,TI官网一般会有硬件demo的,可以找找参考看下
点赞  2017-4-7 22:22
引用: dontium 发表于 2017-4-7 22:11
新的CPU,没有启动外部晶振的,用示波器怎么测的它是正常的呢?

我是使用的示波器检测了晶振的输入端,证明时钟信号输出了,至少给芯片了~
点赞  2017-4-8 11:03
引用: huaiqiao 发表于 2017-4-7 22:22
那就检查你的硬件复位电路,估计是个电阻和电容的那种复位吧。另外,需要注意的是你的芯片到底是高电平复 ...

好的!我再检查一下~谢谢您!
点赞  2017-4-8 11:03
您好,请问您的问题解决了吗,我也出现了和您一样的问题,求教,不胜感激!
点赞  2017-5-16 14:16
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