[求助] CCS6 启动选择配置问题

CCS6 启动选择配置问题
launch selected configuration  出现对话框

ccs6.0 里编译成功后，点击 launch selected configuration 失败，显示disconnected unknown。dsp为28335，仿真器瑞泰创新的xds200u。

     配置目标文件里选的是xds 200 usb emulator，TMS320F28335；仿真器驱动应该是装好了，端口里显示xds2xx Emulator CDC Serial Port (COM9) 和xds2xx User CDC Serial Port (10)。

    另外如何reset emulator。

     Test configuration如下

Test configuration

[Start: Texas Instruments XDS2xx USB Emulator_0]

 

Execute the command:

 

%ccs_base%/common/uscif/dbgjtag -f %boarddatafile% -rv -o -S integrity

 

[Result]

 

 

-----[Print the board config pathname(s)]------------------------------------

 

C:\DOCUME~1\ADMINI~1\LOCALS~1\APPLIC~1\TEXASI~1\

    CCS\TI\0\0\BrdDat\testBoard.dat

 

-----[Print the reset-command software log-file]-----------------------------

 

This utility has selected a 560/2xx-class product.

This utility will load the program 'xds2xxu.out'.

The library build date was 'May 21 2014'.

The library build time was '18:02:25'.

The library package version is '5.1.507.0'.

The library component version is '35.34.40.0'.

The controller does not use a programmable FPGA.

The controller has a version number of '13' (0x0000000d).

The controller has an insertion length of '0' (0x00000000).

This utility will attempt to reset the controller.

This utility has successfully reset the controller.

 

-----[Print the reset-command hardware log-file]-----------------------------

 

This emulator does not create a reset log-file.

 

-----[Perform the Integrity scan-test on the JTAG IR]------------------------

 

This test will use blocks of 512 32-bit words.

This test will be applied just once.

 

Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Scan tests: 2, skipped: 0, failed: 0

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 0

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 0

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 0

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 0

All of the values were scanned correctly.

 

The JTAG IR Integrity scan-test has succeeded.

 

-----[Perform the Integrity scan-test on the JTAG DR]------------------------

 

This test will use blocks of 512 32-bit words.

This test will be applied just once.

 

Do a test using 0xFFFFFFFF.

Scan tests: 1, skipped: 0, failed: 0

Do a test using 0x00000000.

Scan tests: 2, skipped: 0, failed: 0

Do a test using 0xFE03E0E2.

Scan tests: 3, skipped: 0, failed: 0

Do a test using 0x01FC1F1D.

Scan tests: 4, skipped: 0, failed: 0

Do a test using 0x5533CCAA.

Scan tests: 5, skipped: 0, failed: 0

Do a test using 0xAACC3355.

Scan tests: 6, skipped: 0, failed: 0

All of the values were scanned correctly.

 

The JTAG DR Integrity scan-test has succeeded.

 

[End: Texas Instruments XDS2xx USB Emulator_0]