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25AA010A/WF16K

电可擦除可编程只读存储器 1K, 128 X 8, 1.8V SER EE, WAFER on FRAME

器件类别:半导体    存储器 IC    电可擦除可编程只读存储器   

厂商名称:Microchip(微芯科技)

厂商官网:https://www.microchip.com

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器件参数
参数名称
属性值
厂商名称
Microchip(微芯科技)
产品种类
电可擦除可编程只读存储器
文档预览
25AA010A/25LC010A
1K SPI Bus Serial EEPROM
Device Selection Table
Part Number
25AA010A
25LC010A
V
CC
Range
1.8-5.5V
2.5-5.5V
Page Size
16 Bytes
16 Bytes
Temp. Ranges
I
I, E
Packages
P, MS, SN, ST, MC, OT
P, MS, SN, ST, MC, OT
Features:
• 10 MHz max. clock frequency
• Low-power CMOS technology:
- Max. Write Current: 5 mA at 5.5V, 10 MHz
- Read Current: 5 mA at 5.5V, 10 MHz
- Standby Current: 5
μA
at 5.5V
• 128 x 8-bit organization
• Write Page mode (up to 16 bytes)
• Sequential Read
• Self-timed Erase and Write cycles (5 ms max.)
• Block Write protection:
- Protect none, 1/4, 1/2 or all of array
• Built-in Write protection:
- Power-on/off data protection circuitry
- Write enable latch
- Write-protect pin
• High reliability:
- Endurance: 1,000,000 Erase/Write cycles
- Data retention: > 200 years
- ESD protection: > 4000V
• Temperature ranges supported:
- Industrial (I):
-40°C to +85°C
- Automotive (E):
-40°C to +125°C
• Pb-Free packages available
Description:
The Microchip Technology Inc. 25XX010A* is a 1 Kbit
Serial Electrically Erasable Programmable Read-Only
Memory (EEPROM). The memory is accessed via a
simple Serial Peripheral Interface™ (SPI) compatible
serial bus. The bus signals required are a clock input
(SCK) plus separate data in (SI) and data out (SO)
lines. Access to the device is controlled through a Chip
Select (CS) input.
Communication to the device can be paused via the
hold pin (HOLD). While the device is paused,
transitions on its inputs will be ignored, with the
exception of Chip Select, allowing the host to service
higher priority interrupts.
The 25XX010A is available in standard packages
including 8-lead PDIP and SOIC, and advanced
packages including 8-lead MSOP, 8-lead TSSOP and
rotated TSSOP, 8-lead 2x3 DFN, and 6-lead SOT-23.
Package Types (not to scale)
TSSOP/MSOP
(ST, MS)
CS
SO
WP
V
SS
1
2
3
4
8
7
6
5
PDIP/SOIC
(P, SN)
CS
SO
WP
V
SS
1
2
3
4
8
7
6
5
V
CC
HOLD
SCK
SI
V
CC
HOLD
SCK
SI
Pin Function Table
Name
CS
SO
WP
V
SS
SI
SCK
HOLD
V
CC
Function
Chip Select Input
Serial Data Output
Write-Protect
Ground
Serial Data Input
Serial Clock Input
Hold Input
Supply Voltage
SCK
V
SS
SI
SOT-23
(OT)
1
2
3
6
5
4
V
DD
CS
SO
DFN
(MC)
CS 1
SO 2
WP 3
V
SS
4
8 V
CC
7 HOLD
6 SCK
5 SI
X-Rotated TSSOP
(X/ST)
HOLD
V
CC
CS
SO
1
2
3
4
8
7
6
5
SCK
SI
V
SS
WP
*25XX010A is used in this document as a generic part number for the
25AA010A and the 25LC010A.
©
2006 Microchip Technology Inc.
Preliminary
DS21832C-page 1
25AA010A/25LC010A
1.0
ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings
(†)
V
CC
.............................................................................................................................................................................6.5V
All inputs and outputs w.r.t. V
SS
......................................................................................................... -0.6V to V
CC
+1.0V
Storage temperature .................................................................................................................................-65°C to 150°C
Ambient temperature under bias ...............................................................................................................-40°C to 125°C
ESD protection on all pins ..........................................................................................................................................4 kV
NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at those or any other conditions above those
indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an
extended period of time may affect device reliability.
TABLE 1-1:
DC CHARACTERISTICS
Industrial (I):
Automotive (E):
Min.
0.7 V
CC
-0.3
-0.3
V
CC
-0.5
T
A
= -40°C to +85°C
T
A
= -40°C to +125°C
Max.
V
CC
+1
0.3 V
CC
0.2 V
CC
0.4
0.2
±1
±1
7
Units
V
V
V
V
V
V
μA
μA
pF
V
CC
2.7V
(Note)
V
CC
< 2.7V
(Note)
I
OL
= 2.1 mA
I
OL
= 1.0 mA, V
CC
< 2.5V
I
OH
= -400
μA
CS = V
CC
, V
IN
= V
SS TO
V
CC
CS = V
CC
, V
OUT
= V
SS TO
V
CC
T
A
= 25°C, CLK = 1.0 MHz,
V
CC
= 5.0V
(Note)
V
CC
= 5.5V; F
CLK
= 10.0 MHz;
SO = Open
V
CC
= 2.5V; F
CLK
= 5.0 MHz;
SO = Open
V
CC
= 5.5V
V
CC
= 2.5V
CS = V
CC
= 5.5V, Inputs tied to V
CC
or
V
SS
, T
A
= +125°C
CS = V
CC
= 2.5V, Inputs tied to V
CC
or
V
SS
, T
A
= +85°C
V
CC
= 1.8V to 5.5V
V
CC
= 2.5V to 5.5V
Test Conditions
DC CHARACTERISTICS
Param.
No.
D001
D002
D003
D004
D005
D006
D007
D008
D009
Sym.
V
IH1
V
IL1
V
IL2
V
OL
V
OL
V
OH
I
LI
I
LO
C
INT
Characteristic
High-level Input
Voltage
Low-level Input
Voltage
Low-level Output
Voltage
High-level Output
Voltage
Input Leakage
Current
Output Leakage
Current
Internal Capacitance
(all inputs and
outputs)
D010
I
CC
Read
Operating Current
Standby Current
5
2.5
5
3
5
1
mA
mA
mA
mA
μA
μA
D011
D012
I
CC
Write
I
CCS
Note:
This parameter is periodically sampled and not 100% tested.
DS21832C-page 2
Preliminary
©
2006 Microchip Technology Inc.
25AA010A/25LC010A
TABLE 1-2:
AC CHARACTERISTICS
Industrial (I):
Automotive (E):
Min.
50
100
150
100
200
250
50
10
20
30
20
40
50
0.05
0.1
0.15
0.05
0.1
0.15
50
50
0
20
40
80
T
A
= -40°C to +85°C
T
A
= -40°C to +125°C
Units
MHz
MHz
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
μs
μs
μs
μs
μs
μs
μs
μs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
CC
= 1.8V to 5.5V
V
CC
= 2.5V to 5.5V
Test Conditions
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
(Note 1)
(Note 1)
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
(Note 1)
4.5V
V
CC
<
5.5V
(Note 1)
2.5V
V
CC
<
4.5V
(Note 1)
1.8V
V
CC
<
2.5V
(Note 1)
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
AC CHARACTERISTICS
Param.
Sym.
No.
1
F
CLK
Characteristic
Clock Frequency
Max.
10
5
3
2
2
1000
1000
1000
1000
1000
1000
50
100
160
40
80
160
2
T
CSS
CS Setup Time
3
T
CSH
CS Hold Time
4
5
T
CSD
Tsu
CS Disable Time
Data Setup Time
6
T
HD
Data Hold Time
7
8
9
T
R
T
F
T
HI
CLK Rise Time
CLK Fall Time
Clock High Time
10
T
LO
Clock Low Time
11
12
13
T
CLD
T
CLE
T
V
Clock Delay Time
Clock Enable Time
Output Valid from Clock
Low
Output Hold Time
Output Disable Time
14
15
T
HO
T
DIS
16
T
HS
HOLD Setup Time
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3:
T
WC
begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
©
2006 Microchip Technology Inc.
Preliminary
DS21832C-page 3
25AA010A/25LC010A
TABLE 1-2:
AC CHARACTERISTICS (CONTINUED)
Industrial (I):
Automotive (E):
Min.
20
40
80
30
60
160
30
60
160
1M
T
A
= -40°C to +85°C
T
A
= -40°C to +125°C
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
V
CC
= 1.8V to 5.5V
V
CC
= 2.5V to 5.5V
Test Conditions
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
4.5V
V
CC
<
5.5V
(Note 1)
2.5V
V
CC
<
4.5V
(Note 1)
1.8V
V
CC
<
2.5V
(Note 1)
4.5V
V
CC
<
5.5V
2.5V
V
CC
<
4.5V
1.8V
V
CC
<
2.5V
(N
OTE
3)
AC CHARACTERISTICS
Param.
Sym.
No.
17
T
HH
Characteristic
HOLD Hold Time
Max.
5
18
T
HZ
HOLD Low to Output
High-Z
HOLD High to Output
Valid
Internal Write Cycle Time
(byte or page)
Endurance
19
T
HV
20
21
T
WC
E/W
(N
OTE
2)
Cycles
Note 1:
This parameter is periodically sampled and not 100% tested.
2:
This parameter is not tested but ensured by characterization. For endurance estimates in a specific
application, please consult the Total Endurance™ Model which can be obtained from our web site:
www.microchip.com.
3:
T
WC
begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle
is complete.
TABLE 1-3:
AC Waveform:
V
LO
= 0.2V
AC TEST CONDITIONS
(Note 1)
(Note 2)
0.5 V
CC
0.5 V
CC
V
HI
= V
CC
- 0.2V
V
HI
= 4.0V
C
L
= 100 pF
Timing Measurement Reference Level
Input
Output
Note 1:
For V
CC
4.0V
2:
For V
CC
>
4.0V
DS21832C-page 4
Preliminary
©
2006 Microchip Technology Inc.
25AA010A/25LC010A
FIGURE 1-1:
CS
16
SCK
18
SO
n+2
n+1
n
high-impedance
19
n
5
n
n-1
n-1
17
16
17
HOLD TIMING
don’t care
SI
HOLD
n+2
n+1
n
FIGURE 1-2:
SERIAL INPUT TIMING
4
CS
2
Mode 1,1
SCK Mode 0,0
5
SI
6
LSB in
7
8
3
12
11
MSB in
SO
high-impedance
FIGURE 1-3:
SERIAL OUTPUT TIMING
CS
9
SCK
13
14
SO
MSB out
15
ISB out
10
3
Mode 1,1
Mode 0,0
SI
don’t care
©
2006 Microchip Technology Inc.
Preliminary
DS21832C-page 5
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