LH Series
Zener diode
Features
1. Low leakage
2. Low zener impedance
3. High reliability
4. Small surface mounting type
Applications
Voltage stabilization
Absolute Maximum Ratings
T
j
=25℃
Parameter
Power dissipation
Junction temperature
Storage temperature range
Symbol
P
d
T
j
T
stg
Value
500
175
-55~+175
Unit
mW
℃
℃
Stresses exceeding maximum ratings may damage the device. Maximum ratings are stress ratings only. Functional operation above the
recommended operating conditions is not implied. Extended exposure to stresses above the recommended operating conditions may
affect device reliability.
Electrical Characteristics
T
j
=25℃
Type
Grade
Zener Voltage
V
Z
(V)
Min
1.6
1.7
1.8
1.9
2.0
2.1
2.2
2.3
2.4
Max
1.8
1.9
2.0
2.1
2.2
2.3
2.4
2.5
2.6
Dynamic Resistance
r
d
(Ω)
Test
Condition
Max
I
Z
(mA)
100
5
Reverse Current
I
R
(μA)
Test
Condition
Max
V
R
(V)
25
0.5
LH
A1
A2
A3
B1
B2
B3
C1
C2
C3
Test
Condition
I
Z
(mA)
5
2
5
100
5
5
0.5
Excel Semiconductor
www.excel-semi.com
FaxBack +86-512-66607370
Rev. 3e, 1-Nov-2006
1/4
LH Series
Type
Grade
Zener Voltage
V
Z
(V)
Min
2.5
2.6
2.7
2.8
2.9
3.0
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
4.0
4.1
4.2
4.3
4.4
4.5
4.6
4.7
4.8
4.9
5.0
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
6.0
6.1
6.3
6.4
6.6
6.7
6.9
7.0
7.2
7.3
7.5
Max
2.7
2.8
2.9
3.0
3.1
3.2
3.3
3.4
3.5
3.6
3.7
3.8
3.9
4.0
4.1
4.2
4.3
4.4
4.5
4.6
4.7
4.8
4.9
5.0
5.1
5.2
5.3
5.5
5.6
5.7
5.8
5.9
6.0
6.1
6.3
6.4
6.6
6.7
6.9
7.0
7.2
7.3
7.6
7.7
7.9
LH
A1
A2
A3
B1
B2
B3
C1
C2
C3
A1
A2
A3
B1
B2
B3
C1
C2
C3
A1
A2
A3
B1
B2
B3
C1
C2
C3
A1
A2
A3
B1
B2
B3
C1
C2
C3
A1
A2
A3
B1
B2
B3
C1
C2
C3
Test
Condition
I
Z
(mA)
Dynamic Resistance
r
d
(Ω)
Test
Condition
Max
I
Z
(mA)
Reverse Current
I
R
(μA)
Test
Condition
Max
V
R
(V)
3
5
100
5
5
0.5
4
5
100
5
5
1.0
5
5
100
5
5
1.5
6
5
40
5
5
2.0
7
5
15
5
1
3.5
Excel Semiconductor
www.excel-semi.com
FaxBack +86-512-66607370
Rev. 3e, 1-Nov-2006
2/4
LH Series
Type
Grade
Zener Voltage
V
Z
(V)
Min
7.7
7.9
8.1
8.3
8.5
8.7
8.9
9.1
9.3
9.5
9.7
9.9
10.2
10.4
10.7
10.9
11.1
11.4
11.6
11.9
12.2
12.4
12.6
12.9
13.2
13.5
13.8
14.1
14.5
14.9
15.3
15.7
16.3
16.9
17.5
18.1
18.8
19.5
20.2
20.9
21.6
22.3
22.9
23.6
24.3
Max
8.1
8.3
8.5
8.7
8.9
9.1
9.3
9.5
9.7
9.9
10.1
10.3
10.6
10.8
11.1
11.3
11.6
11.9
12.1
12.4
12.7
12.9
13.1
13.4
13.7
14.0
14.3
14.7
15.1
15.5
15.9
16.5
17.1
17.7
18.3
19.0
19.7
20.4
21.1
21.9
22.6
23.3
24.0
24.7
25.5
LH
A1
A2
A3
B1
B2
B3
C1
C2
C3
A1
A2
A3
B1
B2
B3
C1
C2
C3
A1
A2
A3
B1
B2
B3
C1
C2
C3
1
2
3
1
2
3
1
2
3
1
2
3
1
2
3
1
2
3
Test
Condition
I
Z
(mA)
Dynamic Resistance
r
d
(Ω)
Test
Condition
Max
I
Z
(mA)
Reverse Current
I
R
(μA)
Test
Condition
Max
V
R
(V)
9
5
20
5
1
5.0
11
5
25
5
1
7.5
12
5
35
5
1
9.5
15
5
40
5
1
11.0
16
5
45
5
1
12.0
18
5
55
5
1
13.0
20
2
60
2
1
15.0
22
2
65
2
1
17.0
24
2
70
2
1
19.0
Excel Semiconductor
www.excel-semi.com
FaxBack +86-512-66607370
Rev. 3e, 1-Nov-2006
3/4
LH Series
Type
Grade
Zener Voltage
V
Z
(V)
Min
25.2
26.2
27.2
28.2
29.2
30.2
31.2
32.2
33.2
34.2
35.3
36.4
Max
26.6
27.6
28.6
29.6
30.6
31.6
32.6
33.6
34.6
35.7
36.8
38.0
LH
27
1
2
3
1
2
3
1
2
3
1
2
3
Test
Condition
I
Z
(mA)
2
Dynamic Resistance
r
d
(Ω)
Test
Condition
Max
I
Z
(mA)
80
2
Reverse Current
I
R
(μA)
Test
Condition
Max
V
R
(V)
1
21.0
30
2
100
2
1
23.0
33
2
120
2
1
25.0
36
2
140
2
1
27.0
Note: 1. Tested with DC.
2. Type No. is as follows: 2A1, 2A2, 36-3.
Dimensions in mm
Cathode identification
0.3
3.5±0.2
Glass Case
Mini Melf / SOD-80
JEDEC DO-213 AA
Excel Semiconductor
www.excel-semi.com
FaxBack +86-512-66607370
Rev. 3e, 1-Nov-2006
4/4
Φ1.5±0.1