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MSCD-53-331K

General Purpose Inductor, 330uH, 10%, 1 Element, Ferrite-Core, SMD, 2320, CHIP, 2320, LEAD FREE

器件类别:无源元件    电感器   

厂商名称:美磊(MAGLAYERS)

厂商官网:http://www.maglayers.com/

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器件参数
参数名称
属性值
厂商名称
美磊(MAGLAYERS)
包装说明
2320
Reach Compliance Code
compliant
ECCN代码
EAR99
大小写代码
2320
构造
Unshielded
型芯材料
Ferrite
直流电阻
3.2 Ω
标称电感 (L)
330 µH
电感器应用
HIGH CURRENT INDUCTOR
电感器类型
GENERAL PURPOSE INDUCTOR
制造商序列号
MSCD-53
功能数量
1
端子数量
2
最高工作温度
60 °C
最低工作温度
-40 °C
封装高度
3 mm
封装长度
5.8 mm
封装形式
SMT
封装宽度
5.2 mm
包装方法
TR
最大额定电流
0.28 A
系列
MSCD-53
形状/尺寸说明
RECTANGULAR PACKAGE
屏蔽
NO
表面贴装
YES
端子位置
DUAL ENDED
端子形状
ONE SURFACE
测试频率
0.1 MHz
容差
10%
Base Number Matches
1
文档预览
SCOPE:
This specification applies to the Pb Free high current type SMD inductors for
MSCD-53-SERIES
PRODUCT INDENTIFICATION
MSCD- 53 - 100 K
③ ④
Product Code
Dimensions Code
Inductance Code
Tolerance Code
(1) SHAPES AND DIMENSIONS
A: 5.8
±
0.3
B: 5.2
±
0.3
C: 3.0
±
0.3
D: 2.0 Typ.
mm
mm
mm
mm
(2) ELECTRICAL SPECIFICATIONS
SEE TABLE 1
TEST INSTRUMENTS
L
: HP 4284A PRECISION LCR METER (or equivalent)
RDC : CHROMA MODEL 16502 MILLIOHMMETER (or equivalent)
(3) CHARACTERISTICS
(3)-1 Ambient temperature
…….........
+60℃
Max.
(3)-2 Operate temperature range ......
-40℃½+125℃
(Including self temp. rise)
(3)-3 Storage temperature range ......
-40℃½+125℃
MAG.LAYERS
MSCD-53-SERIES
Page 1/8
TABLE 1
MAGLAYERS
PT/NO.
MSCD-53-1R0□
MSCD-53-1R4□
MSCD-53-1R5□
MSCD-53-1R8□
MSCD-53-2R2□
MSCD-53-2R7□
MSCD-53-3R3□
MSCD-53-3R9□
MSCD-53-4R7□
MSCD-53-5R6□
MSCD-53-6R8□
MSCD-53-8R2□
MSCD-53-100□
MSCD-53-120□
MSCD-53-150□
MSCD-53-180□
MSCD-53-220□
MSCD-53-270□
MSCD-53-330□
MSCD-53-390□
MSCD-53-470□
MSCD-53-560□
MSCD-53-680□
MSCD-53-820□
MSCD-53-101□
MSCD-53-121□
MSCD-53-151□
MSCD-53-181□
MSCD-53-221□
MSCD-53-271□
MSCD-53-331□
MSCD-53-391□
MSCD-53-471□
MSCD-53-561□
MSCD-53-681□
MSCD-53-821□
MSCD-53-102□
Inductance
L(μH)
1.0
1.4
1.5
1.8
2.2
2.7
3.3
3.9
4.7
5.6
6.8
8.2
10
12
15
18
22
27
33
39
47
56
68
82
100
120
150
180
220
270
330
390
470
560
680
820
1000
Percent
Tolerance
M,N
M,N
M,N
M,N
M,N
M,N
M,N
M,N
M,N
M,N
M,N
M,N
K,L,M
L,M
L,M
L,M
L,M
K,L,M
K,L,M
L,M
K,L,M
L,M
L,M
L,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
K,M
Test
Frequency
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
100kHz/0.25V
Resistance Rated DC Current
RDC(Ω)Max.
30m
30m
30m
30m
30m
40m
50m
60m
70m
80m
90m
0.10
0.12
0.13
0.15
0.18
0.22
0.26
0.33
0.42
0.50
0.55
0.65
0.80
0.90
1.00
1.30
1.50
2.00
2.50
3.20
3.50
4.20
4.50
6.50
7.50
8.00
IDC(A)
4.50
4.10
4.00
3.70
3.50
3.20
2.80
2.60
2.50
2.40
2.20
2.00
1.80
1.75
1.70
1.60
1.30
1.20
1.10
1.00
0.90
0.85
0.80
0.65
0.60
0.58
0.43
0.41
0.38
0.35
0.28
0.26
0.20
0.19
0.18
0.15
0.13
Marking
1R0
1R4
1R5
1R8
2R2
2R7
3R3
3R9
4R7
5R6
6R8
8R2
100
120
150
180
220
270
330
390
470
560
680
820
101
121
151
181
221
271
331
391
471
561
681
821
102
※ □
specify the inductance tolerance,K(±10%),L(±15%),M(±20%),N(±30%)
IDC : Based on inductance change (△L/Lo:drop 10% Max.) @ ambient temp. 25℃ and
Based on temperature rise (△T: 40℃ TYP.)
M A G .L A Y E R S
MSCD-53-SERIES
Page-2/8
(4) RELIABILITY TEST METHOD
MECHANICAL
TEST ITEM
Substrate bending
SPECIFICATION
△L/Lo≦±5%
TEST DETAILS
The sample shall be soldered onto the printed circuit board
in figure 1 and a load applied unitil the figure in the arrow
There shall be
no mechanical
damage or elec-
trical damege.
direction is made approximately 3mm.(keep time 30 seconds)
PCB dimension shall the page 7/9
F(Pressurization)
PRESSURE ROD
figure-1
Vibration
△L/Lo≦±5%
The sample shall be soldered onto the printed circuit board
and when a vibration having an amplitude of 1.52mm
There shall be
no mechanical
damage.
and a frequency of from 10 to 55Hz/1 minute repeated should
be applied to the 3 directions (X,Y,Z) for 2 hours each.
(A total of 6 hours)
Solderability
New solder
More than 90%
Flux (rosin, isopropyl alcohol{JIS-K-1522}) shall be coated
over the whole of the sample before hard, the sample shall
then be preheated for about 2 minutes in a temperature of
130½150℃ and after it has been immersed to a depth 0.5mm
below for 3±0.2 seconds fully in molten solder M705 with
a temperature of 245±5℃.
More than 90% of the electrode sections shall be couered
with new solder smoothly when the sample is taken out of
the solder bath.
MAG.LAYERS
MSCD-53-SERIES
Page-3*8
MECHANICAL
TEST ITEM
Resistance to
Soldering heat
(reflow soldering)
There shall be
no damage or
Sodering temperature (℃)
SPECIFICATION
Temperature profile of reflow soldering
problems.
300
250
200
150
100
50
soldering
(Peak temperature 260±3℃ 10 sec
30 sec Min
Pre-heating
(230
+0
℃)
150 ~ 180℃
Slow cooling
(Stored at room
temperature)
2 min
10
sec.
2 min. or more
The specimen shall be passed through the reflow oven with the
condition shown in the above profile for 1 time.
The specimen shall be stored at standard atmospheric conditions
for 1 hour, after which the measurement shall be made.
ELECTRICAL
TEST ITEM
Insulation
resistance
SPECIFICATION
There shall be
no other
damage or
problems.
Dielectric
withstand
voltage
There shall be
no other
damage or
problems.
Temperature
characteristics
△L/L20℃≦±10%
0½2000 ppm/℃
The test shall be performed after the sample has stabilized in
an ambient temperature of -20 to +85℃,and the value
calculated based on the value applicable in a normal
temperature and narmal humidity shall be
△L/L20℃≦±10%.
AC 100V voltage shall be applied for 1 minute acrosset the top
surface and the terminal of this sample
TEST DETAILS
DC 100V voltage shall be applied across this sample of top
surface and the terminal.
The insulation resistance shall be more than 1
×
10
8
Ω.
M AG .LAYERS
MSCD-53-SERIES
Page-4/8
ENVIROMENT CHARACTERISTICS
TEST ITEM
High temperature
storage
There shall be
no mechanical
damage.
△L/Lo≦±5%
SPECIFICATION
The sample shall be left for 96±4 hours in an atmospere with
a temperature of 85±2℃ and a normal humidity.
Upon completion of the measurement shall be made after the
sample has been left in a normal temperature and normal
humidity for 1 hour.
Low temperature
△L/Lo≦±5%
The sample shall be left for 96±4 hours in an atmosphere with
a temperature of -25±3℃.
There shall be
no mechanical
damage.
Change of
temperature
There shall be
no other dama-
ge of problems
△L/Lo≦±5%
Upon completion of the test, the measurement shall be made
after the sample has been left in a normal temperature and
normal humidity for 1 hour.
The sample shall be subject to 5 continuos cycles, such as shown
in the table 2 below and then it shall be subjected to standard
atmospheric conditions for 1 hour, after which measurement
shall be made.
table 2
Temperature
1
-25±3℃
(Themostat No.1)
2
Standard
atmospheric
3
85±2℃
(Themostat No.2)
4
Standard
atmospheric
Moisture storage
△L/Lo≦±5%
The sample shall be left for 96±4 hours in a temperature of
40±2℃ and a humidity(RH) of 90½95%.
There shall be
no mechanical
damage.
Test conditions:
The sample shall be reflow soldered onto the printed circuit board in every test.
Upon completion of the test, the measurement shall be made
after the sample has been left in a normal temperature and
normal humidity more than 1 hour.
No.2→No.1
30 min.
No.1→No.2
Duration
30 min.
MAG.LAYERS
MSCD-53-SERIES
Page-5/8
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