Product
Specification
Two, Three and Four Pair HM-Zd Connectors
1.
1.1.
SCOPE
Content
108-2055
11Mar11 Rev C
This specification covers perform ance, tests and quality requirem ents for the TE Connectivity (TE)
Z-PACK* HM-Zd connector system . This connector system uses a m odular concept and interconnects
2 printed circuit boards. Both receptacle and pin connectors are connected to the printed circuit board
with plated thru-hole com pliant press-fit leads. A connector has a m atrix configuration of either 4, 6 or 8
rows and a variable num ber of colum ns. Each colum n consists of either 2 or 4 shielded pairs of
contacts.
1.2.
Qualification
W hen tests are perform ed on the subject product line, procedures specified in Figure 1 shall be used.
All inspections shall be perform ed using the applicable inspection plan and product drawing.
1.3.
Qualification Test Results
Successful qualification testing on the subject product line was com pleted on 09Sep03. The
Qualification Test Report num ber for this testing is 501-568. Additional testing was com pleted on
03Mar05. This docum entation is on file at and available from Engineering Practices and Standards
(EPS).
2.
APPLICABLE DOCUM ENTS
The following docum ents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the docum ent applies. In the event of conflict between the
requirem ents of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirem ents of this specification and the referenced docum ents,
this specification shall take precedence.
2.1.
TE Docum ents
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2.2.
109 Series: Test Specifications as indicated in Figure 1
109-197: TE Test Specifications vs EIA and IEC Test Methods
114-13059: Application Specification (Z-PACK* HMZd Connector System )
408-8500: Instruction Sheet (Seating Tools 91347-1 and 91350-1 for HMZd Receptacle
Connectors)
408-8501: Instruction Sheet (Seating Tools 91348-1 and 91349-1 for HMZd Header Connectors)
501-568: Qualification Test Report
Com m ercial Standard
EIA-364:
Electrical Connector/Socket Test Procedures Including Environm ental Classifications
3.
3.1.
REQUIREM ENTS
Design and Construction
Product shall be of the design, construction and physical dim ensions specified on the applicable product
drawing.
©2011 Tyco Electronics Corporation, | Indicates change
a TE Connectivity Ltd. Company
*Trademark
All Rights Reserved
TE logo is a trademark.
For latest revision, visit our website at www.te.com/documents.
For Regional Customer Service, visit our website at www.te.com
Other products, logos, and company names might be trademarks of their respective owners.
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LOC B
108-2055
3.2.
Materials
Materials used in the construction of this product shall be as specified on the applicable product
drawing.
3.3.
Ratings
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3.4.
Operating Voltage: 250 volts AC m axim um peak (a of m inim um breakdown voltage)
Current: .7 am pere per contact (fully loaded)
Tem perature: -65 to 105°C
Perform ance and Test Description
Product is designed to m eet the electrical, m echanical and environm ental perform ance requirem ents
specified in Figure 1. Unless otherwise specified, all tests shall be perform ed at am bient environm ental
conditions per EIA-364.
3.5.
Test Requirem ents and Procedures Sum m ary
Test Description
Requirem ent
Meets requirem ents of product
drawing.
Meets visual requirem ents.
ELECTRICAL
Procedure
EIA-364-18.
Visual and dim ensional © of C)
inspection per product drawing.
EIA-364-18.
Visual inspection.
Initial exam ination of product.
Final exam ination of product.
Low level contact resistance.
20 m illiohm s m axim um initial for
right angle receptacle and vertical
header.
50 m illiohm s m axim um initial for
right angle receptacle and right
angle header.
ÄR
< 5 m illiohm s average final.
ÄR
< 10 m illiohm s individual
reading final (applies to both signal
and ground contacts).
1 m illiohm m axim um initial.
ÄR
= 1 m illiohm m axim um change
from initial.
EIA-364-23.
Subject specim ens to 100
m illiam peres m axim um and 20
m illivolts m axim um open circuit
voltage.
See Figure 3.
Low level com pliant pin resistance.
EIA-364-23.
Subject specim ens to 100
m illiam peres m axim um and 20
m illivolts m axim um open circuit
voltage. Measurem ents shall be
taken between PCB hole and pin
tip.
EIA-364-21.
Test between any adjacent signal
contacts, and between any signal
contact and adjacent ground
contacts at 100 volts DC.
Specim ens shall be fully m ated.
Insulation resistance.
10000 m egohm s m inim um .
Figure 1 (continued)
Rev C
2 of 8
108-2055
Test Description
W ithstanding voltage.
Requirem ent
Procedure
1 m inute hold with no breakdown or EIA-364-20, Condition I.
flashover.
650 volts AC at sea level between
m ated pairs of signal contacts.
550 volts AC at sea level between
m ated ground and signal contacts.
Test between adjacent signal
contacts, and closest signal and
ground contact.
30°C m axim um tem perature rise at
.7 am pere per contact, fully
energized.
MECHANICAL
EIA-364-70, Method 1.
Stabilize at a single current level
until 3 readings at 5 m inute
intervals are within 1°C.
Tem perature rise vs current.
Vibration, random .
No discontinuities of 1 m icrosecond EIA-364-28, Test Condition VII,
or longer duration.
Condition D.
See Note.
Subject m ated specim ens to 3.10
G's rm s between 20-500 Hz. 15
m inutes in each of 3 m utually
perpendicular planes.
See Figure 4.
No discontinuities of 1 m icrosecond EIA-364-27, Method A.
or longer duration.
Subject m ated specim ens to
See Note.
490m /s
2
(50 G's) half-sine shock
pulses of 11 m illiseconds duration.
3 shocks in each direction applied
along 3 m utually perpendicular
planes, 18 total shocks.
See Figure 4.
See Note.
EIA-364-9.
Mate and unm ate specim ens for
250 cycles at a m axim um rate of
600 cycles per hour.
EIA-364-13.
Measure force necessary to m ate
specim ens at a m axim um rate of
12.7 m m [.5 in] per m inute.
Mechanical shock.
Durability.
Mating force.
0.38 N [.085 lbf] m axim um average
per m ated contact. “m ated contact”
refers to signal pins and ground
blades, i.e., each signal pin = 1
contact and each ground blade = 1
contact.
0.15 N [.03 lbf] m inim um average
per contact (applies to both signal
and ground contacts).
Figure 1 (continued)
Unm ating force.
EIA-364-13.
Measure force necessary to
unm ate specim ens at a m axim um
rate of 12.7 m m [.5 in] per m inute.
Rev C
3 of 8
108-2055
Test Description
Com pliant pin insertion force.
Requirem ent
44.5 N [10 lbf] m axim um average
per pin.
Procedure
TE Spec 109-41.
Measure force necessary to seat
pins into a printed circuit board at a
m axim um rate of 12.7 m m [.5 in]
per m inute.
TE Spec 109-30.
Measure force necessary to unseat
pins from a printed circuit board at
a m axim um rate of 12.7 m m [.5 in]
per m inute.
Unm ate and m ate each connector
pair a distance of approxim ately 0.1
m m [.004 in].
Measure force necessary to
rem ove receptacle front cover from
chicklet at a m axim um rate of 5.08
m m [.2 in] per m inute. Connectors
are to be inserted into the PCB's.
Com pliant pin retention force.
4.4 N [1 lbf] m inim um average per
pin.
Minute disturbance.
See Note.
Receptacle cover retention.
111.25 N [25 lbf] m inim um per 25
m m [.984 in] long m odule.
ENVIRONMENTAL
Therm al shock.
See Note.
EIA-364-32, Test Condition II.
Subject m ated specim ens to 5
cycles between -65 and 105°C.
EIA-364-31, Method III.
Subject specim ens to 50 cycles (50
days) between 5 and 85°C at 80 to
100% RH.
EIA-364-17, Method A, Test
Condition 4, Test Tim e Condition D.
Subject m ated specim ens to 105°C
for 1000 hours.
EIA-364-65, Class IIIA.
Subject m ated and unm ated
specim ens to environm ental Class
IIIA for 20 days total.
EIA-364-91.Subject unm ated
specim ens to dust contam ination
#1 for 1 hour. Air flow shall be 360
cfm .
Hum idity-tem perature cycling.
See Note.
Tem perature life.
See Note.
Mixed flowing gas.
See Note.
Dust contam ination.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure
2.
Figure 1 (end)
Rev C
4 of 8
108-2055
3.6.
Product Qualification and Requalification Test Sequence
A.
Two and Four Pair HM-Zd Connectors (right angle receptacle, vertical header)
Test Group (a)
Test or Examination
1
2
3
Test Sequence (b)
Initial examination of product
Low level contact resistance
Low level compliant pin resistance
Insulation resistance
Withstanding voltage
Temperature rise vs current
Vibration
Mechanical shock
Durability
Mating force
Unmating force
Compliant pin insertion force
Compliant pin retention force
Minute disturbance
Receptacle cover retention
Thermal shock
Humidity-temperature cycling
Temperature life
Mixed flowing gas (mated)
Mixed flowing gas (unmated)
Dust contamination
Final examination of product
NOTE
(a)
(b)
(c)
(d)
(e)
8
17
9
21
13
21
3
3
11
13
7
11(e),13(e)
7(e),9(e)
10
12
6
3,16
5,14
7
4,19
6,17
2
20
4,11
6,9
2
12
15
2
5(d),17(d)
3
19
1
1
1
1
1
1
4
5
6
4,7,9,11,13 5,8,10,12,14 5(c),8 4,6,8,10,12,14,16,18
2,15
3,18
15
16
2
3,10
2,20
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Perform 10 durability cycles prior to initial measurement.
Perform 125 durability cycles before, and 125 durability cycles after mixed flowing gas
testing.
Exposure interval of 5 days.
Figure 2A
Rev C
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