500mW ZENER DIODES
1N5221BD2A TO 1N5261BD2A
•
•
•
•
DLCC2 Hermetic Ceramic Package Designed as a Drop-In
Replacement for “D-5A”/ “A-MELF” Package
Extensive Voltage Selection (2.4V – 47V)
Standard Zener Voltage Tolerance of
±5%
Regulation Over a Large Operating Current & Temperature Range
Space Level and High-Reliability Screening Options Available
•
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise stated)
VZM
IZM
PT
TJ
TSTG
TSP
Reference Voltage
Continuous DC Current
Total Power Dissipation at
Junction Temperature Range
Storage Temperature Range
Maximum Soldering Pad Temperature for 20s
TA = 75°C
See Reference Table
See Reference Table
500mW
-55 to +175°C
-65 to +175°C
260°C
THERMAL PROPERTIES
Symbol
R
θJA
(1)
Parameter
Thermal Resistance Junction to Ambient
Max
300
Units
°C/W
(1)
PCB = FR4 – 0.0625 Inch (1.59mm), 1 Layer, 1.0-Oz Cu, 0.007 Inch
2
(1.7mm x 2.76mm
2
) Pad Size, horizontal, in still air
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing an order.
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9024
Issue 2
Page 1 of 4
500mW ZENER DIODES
1N5221BD2A TO 1N5261BD2A
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
P/N
Nominal
Zener
Voltage
VZ @ IZT
1N5221
1N5222
1N5223
1N5224
1N5225
1N5226
1N5227
1N5228
1N5229
1N5230
1N5231
1N5232
1N5233
1N5234
1N5235
1N5236
1N5237
1N5238
1N5239
1N5240
1N5241
1N5242
1N5243
1N5244
1N5245
1N5246
1N5247
1N5248
1N5249
1N5250
1N5251
1N5252
1N5253
1N5254
1N5255
1N5256
1N5257
1N5258
1N5259
1N5260
1N5261
Notes:
1)
I
Test
Current
IZT
mA
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
9.5
9.0
8.5
7.8
7.4
7.0
6.6
6.2
5.6
5.2
5.0
4.6
4.5
4.2
3.8
3.4
3.2
3.0
2.7
Maximum Zener Impedance
(1)
Maximum Reverse Leakage
Current
IR
µA
100
100
75
75
50
25
15
10
5.0
5.0
5.0
5.0
5.0
5.0
3.0
3.0
3.0
3.0
3.0
3.0
2.0
1.0
0.5
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
@VR
V
Maximum Zener
Voltage
Coefficient
(2)
αV
Z
%/°
C
–0.085
–0.085
–0.080
–0.080
–0.075
–0.070
–0.065
–0.060
±0.055
±0.030
±0.030
+0.038
+0.038
+0.045
+0.050
+0.058
+0.062
+0.065
+0.068
+0.075
+0.076
+0.077
+0.079
+0.082
+0.082
+0.083
+0.084
+0.085
+0.086
+0.086
+0.087
+0.088
+0.089
+0.090
+0.091
+0.091
+0.092
+0.093
+0.094
+0.095
+0.095
ZT
(or
ZZT @ IZK
30
30
30
30
29
28
24
23
22
19
17
11
7.0
7.0
5.0
6.0
8.0
8.0
10
17
22
30
13
15
16
17
19
21
23
25
29
33
35
41
44
49
58
70
80
93
105
ZZT @ IZK = 250µA
1200
1250
1300
1400
1600
1600
1700
1900
2000
1900
1600
1600
1600
1000
750
500
500
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
700
700
800
900
1000
V
2.4
2.5
2.7
2.8
3.0
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6.0
6.2
6.8
7.5
8.2
8.7
9.1
10
11
12
13
14
15
16
17
18
19
20
22
24
25
27
28
30
33
36
39
43
47
1.0
2.0
3.0
3.5
4.0
5.0
6.0
6.5
6.5
7.0
8.0
8.4
9.1
9.9
10
11
12
13
14
14
15
17
18
19
21
21
23
25
27
30
33
36
Zener Impedance is measured to ensure a sharp knee characteristic on the breakdown curve. Derived from 50Hz ac voltage from ac current of 10% rms of I
) superimposed on DC I (or I )
ZK
ZT
ZK
2)
Temperature Coefficient test conditions:
a. I
= 7.5mA , T = 25° T = 125° (1N5221 through to 1N5242)
C,
C
ZT
1
2
b. I
= Rated I , T = 25° T = 125° (1N5243 through to 1N5261)
C,
C
ZT
ZT 1
2
DUT temperature stabilised with constant current for
αV
measurement @ T ,T
Z
1 2
SERIES ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise)
Symbol
VF
Parameters
Forward Voltage
Test Conditions
IF = 200mA
Max
1.5
Units
V
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9024
Issue 2
Page 2 of 4
500mW ZENER DIODES
1N5221BD2A TO 1N5261BD2A
MECHANICAL DATA
DLCC2 Variant A (D2A)
PAD 1
PAD 2
DIMENSION
A
B
C
D
ANODE
CATHODE
mm
5.00
±0.10
2.61
±0.10
1.08
±0.10
1.76
±0.10
Inches
0.197
±0.004
0.103
±0.004
0.043
±0.004
0.069
±0.004
DLCC2 Variant B (D2B)
PAD 1
PAD 2
PAD 3
DIMENSION
A
B
C
D
ANODE
CATHODE
LID CONTACT TO ANODE*
mm
5.00
±0.10
2.61
±0.10
1.08
±0.10
1.76
±0.10
Inches
0.197
±0.004
0.103
±0.004
0.043
±0.004
0.069
±0.004
SOLDER PAD LAYOUT D-5A
DLCC2/ D-5A MELF OVERLAY
DIMENSION
A
B
C
mm
6.25
1.70
2.67
Inches
0.246
0.067
0.105
A
B
* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep
dielectric discharge in space applications; see the Space Weather link
www.semelab.co.uk/dlcc2.html
on the Semelab web site. Package variant
to be specified at order.
Other Package Outlines may be available – Contact Semelab Sales to Enquire
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9024
Issue 2
Page 3 of 4
C
500mW ZENER DIODES
1N5221BD2A TO 1N5261BD2A
SCREENING OPTIONS
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the
High Reliability and
Screening Options Handbook
available for download from
the from the TT electronics Semelab web site.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MIL-
PRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF-
19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
ORDERING INFORMATION
Part numbers are built up from Type, Package Variant, and
screening level. The part numbers are extended to include
the additional options as shown below.
Type – See Electrical Characteristics Table
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Customer Pre-Cap Visual Inspection
Customer Buy-Off visit
Data Pack
Solderability Samples
Scanning Electron Microscopy
Radiography (X-ray)
Total Dose Radiation Test
MIL-PRF-19500 (QR217)
Group B charge
Group B destructive mechanical samples
Group C charge
Group C destructive electrical samples
Group C destructive mechanical samples
ESA/ESCC
Lot Validation Testing (subgroup 1) charge
LVT1 destructive samples (environmental)
LVT1 destructive samples (mechanical)
Lot Validation Testing (subgroup 2) charge
LVT2 endurance samples (electrical)
Lot Validation Testing (subgroup 3) charge
LVT3 destructive samples (mechanical)
.CVP
.CVB
.DA
.SS
.SEM
.XRAY
.RAD
.GRPB
.GBDM (12 pieces)
.GRPC
.GCDE (12 pieces)
.GCDM (6 pieces)
.LVT1
.L1DE (15 pieces)
.L1DM (15 pieces)
.LVT2
.L2D (15 pieces)
.LVT3
.L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
MARKING DETAILS
Parts can be laser marked with approximately 7 characters
on two lines and always includes cathode identification.
Typical marking would include part or specification number,
week of seal or serial number subject to available space and
legibility.
Customer specific marking requirements can be arranged at
the time of order.
Example Marking:
Example ordering information:
The following example is for the 1N5245B part with
package variant A, JQRS screening, additional Group C
conformance testing and a Data pack.
Part Numbers:
1N5245BD2A-JQRS
(Include quantity for flight parts)
1N5245BD2A.GRPC
(chargeable conformance option)
1N5245BD2A.GCDE
(charge for destructive parts)
1N5245BD2A.GCDM
(charge for destructive parts)
1N5245BD2A.DA
(charge for Data pack)
Customers with any specific requirements (e.g. marking or
screening) may be supplied with a similar alternative part
number (there is maximum 20 character limit to part
numbers). Contact Semelab sales with enquiries.
High Reliability and Screening Options Handbook link:
http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9024
Issue 2
Page 4 of 4
ADI参考电路
