500mW ZENER DIODES
1N6309BD2A TO 1N6340BD2A
•
•
•
DLCC2 Hermetic Ceramic Package Designed as a Drop-In
Replacement for “D-5A”/ “A-MELF” Package
Standard Zener Voltage Tolerance of
±5%
Space Level and High-Reliability Screening Options Available
ABSOLUTE MAXIMUM RATINGS
(TA = 25°C unless otherwise stated)
VZM
IZM
PT
TJ
TSTG
TSP
Reference Voltage
Continuous DC Current
Total Power Dissipation at
Junction Temperature Range
Storage Temperature Range
Maximum Soldering Pad Temperature for 20s
TA = 75°C
See Reference Table
See Reference Table
500mW
-65 to +175°C
-65 to +175°C
260°C
THERMAL PROPERTIES
Symbol
R
θJA
(1)
Parameter
Thermal Resistance Junction to Ambient
Max
300
Units
°C/W
(1)
PCB = FR4 – 0.0625 Inch (1.59mm), 1 Layer, 1.0-Oz Cu, 0.007 Inch
2
(1.7mm x 2.76mm
2
) Pad Size, horizontal, in still air
Semelab Limited reserves the right to change test conditions, parameter limits and package dimensions without notice.
Information furnished by Semelab is believed to be both accurate and reliable at the time of going to press. However
Semelab assumes no responsibility for any errors or omissions discovered in its use. Semelab encourages customers to
verify that datasheets are current before placing an order.
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9021
Issue 2
Page 1 of 4
500mW ZENER DIODES
1N6309BD2A TO 1N6340BD2A
ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise stated)
Max Zener
Impedance
Nominal
Zener
Voltage
@ IZ2
Type
(VZ2)
Volts
1N6309
1N6310
1N6311
1N6312
1N6313
1N6314
1N6315
1N6316
1N6317
1N6318
1N6319
1N6320
1N6321
1N6322
1N6323
1N6324
1N6325
1N6326
1N6327
1N6328
1N6329
1N6330
1N6331
1N6332
1N6333
1N6334
1N6335
1N6336
1N6337
1N6338
1N6339
1N6340
2.4
2.7
3.0
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6.2
6.8
7.5
8.2
9.1
10
11
12
13
15
16
18
20
22
24
27
30
33
36
39
43
47
Minimum
Zener
Voltage
@ IZ1
250
µA
(VZ1)
Volts
1.1
1.2
1.3
1.5
1.8
2
2.4
2.8
3.3
4.3
5.2
6.0
6.6
7.5
8.4
9.1
10
11
11.9
13.8
14.7
16.6
18.5
20.4
22.3
25.2
28
30.9
33.7
36.6
40.4
44.2
Maximum
Reverse
Current
@
VR
Voltage
(2)
Reg.
VZ(reg)
V
1.5
1.5
1.5
1.6
1.6
1.6
0.9
0.5
0.4
0.4
0.3
0.35
0.4
0.4
0.5
0.5
0.5
0.55
0.55
0.7
0.75
0.85
0.95
1.05
1.15
1.3
1.45
1.6
1.75
1.9
2.1
2.25
Surge
Current
(IZSM)
A
2.5
2.2
2
1.8
1.65
1.5
1.4
1.27
1.17
1.1
0.97
1.23
1.16
1.07
0.97
0.89
0.83
0.77
0.71
0.62
0.58
0.52
0.47
0.43
0.39
0.35
0.31
0.28
0.26
0.24
0.22
0.2
Maximum
Noise
Density
ND
µV/√Hz
200
150
100
20
12
12
12
12
12
10
10
50
30
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
10
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
2
5
5
5
20
40
80
100
100
100
100
100
100
100
100
100
100
100
100
100
100
80
80
Test
Current
(IZ2)
mA
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
9.5
8.5
7.8
7
6.2
5.6
5.2
4.6
4.2
3.8
3.4
3.2
3
2.7
@
IZ2
(ZZ)
Ω
30
30
29
27
25
23
20
17
14
8
3
3
4
5
6
6
7
7
8
10
12
14
18
20
24
27
32
40
50
55
65
75
@
250µA
(ZZK)
(IZM)
mA
(VR)
V
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.5
2
2.5
3.5
4
5
6
7
8
8.5
9
9.9
11
12
14
15
17
18
21
23
25
27
30
33
36
@25°
C
IR1
µA
100
60
30
5
3
2
2
5
5
5
5
2
2
1.0
1.0
1.0
1.0
1.0
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
0.05
@150°
C
IR2
Typical
Temp
Coefficient
α
VZ
%/°
C
-0.085
-0.080
-0.075
-0.070
-0.065
-.060
-0.045
+0.020
-.028
+0.032
-0.020
+0.035
+0.050
+0.060
+0.062
+0.068
+0.075
+0.076
+0.079
+0.082
+0.083
+0.083
+0.084
+0.084
+0.085
+0.086
+0.087
+0.088
+0.090
+0.091
+0.092
+0.093
+0.094
+0.095
+0.095
(3)
1200
1300
1400
1400
1400
1700
1700
1500
1300
1200
800
400
400
400
500
500
550
550
550
600
600
600
500
500
500
500
500
600
600
700
800
900
177
157
141
128
117
108
99
90
83
76
68
63
57
52
47
43
39
35
33
28
27
24
21
19
18
16
14
13
12
11
9.9
9
SERIES ELECTRICAL CHARACTERISTICS
(TA = 25°C unless otherwise)
Symbol
VF
Note
Note
(2)
(3)
Voltage regulation VZ(reg) is the measured voltage change at thermal equilibrium between the current of 10% and 50% of
Maximum Zener current IZM when the pad temperature is maintained at 25°C =+8°C, -2°C. Not a production test.
Temp Coefficient is applicable to space product - IZ stabilised at = IZ2 rated, T1 = +25°C ±5°C;T2 = +125°C
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
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Document Number 9021
Issue 2
Page 2 of 4
Parameters
Forward Voltage
Test Conditions
IF = 200mA
Max
1.5
Units
V
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
500mW ZENER DIODES
1N6309BD2A TO 1N6340BD2A
MECHANICAL DATA
DLCC2 Variant A (D2A)
PAD 1
PAD 2
DIMENSION
A
B
C
D
ANODE
CATHODE
mm
5.00
±0.10
2.61
±0.10
1.08
±0.10
1.76
±0.10
Inches
0.197
±0.004
0.103
±0.004
0.043
±0.004
0.069
±0.004
DLCC2 Variant B (D2B)
PAD 1
PAD 2
PAD 3
DIMENSION
A
B
C
D
ANODE
CATHODE
LID CONTACT TO ANODE*
mm
5.00
±0.10
2.61
±0.10
1.08
±0.10
1.76
±0.10
Inches
0.197
±0.004
0.103
±0.004
0.043
±0.004
0.069
±0.004
SOLDER PAD LAYOUT D-5A
DLCC2/ D-5A MELF OVERLAY
DIMENSION
A
B
C
mm
6.25
1.70
2.67
Inches
0.246
0.067
0.105
A
B
* The additional contact provides a connection to the lid in the application. Connecting the metal lid to a known electrical potential stops deep
dielectric discharge in space applications; see the Space Weather link
www.semelab.co.uk/dlcc2.html
on the Semelab web site. Package variant
to be specified at order.
Other Package Outlines may be available – Contact Semelab Sales to Enquire
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9021
Issue 2
Page 3 of 4
C
500mW ZENER DIODES
1N6309BD2A TO 1N6340BD2A
SCREENING OPTIONS
Space Level (JQRS/ESA) and High Reliability options are
available in accordance with the
High Reliability and
Screening Options Handbook
available for download from
the from the TT electronics Semelab web site.
ESA Quality Level Products are based on the testing
procedures specified in the generic ESCC 5000 and in the
corresponding part detail specifications.
Semelabs QR216 and QR217 processing specifications
(JQRS), in conjunction with the companies ISO 9001:2000
approval present a viable alternative to the American MIL-
PRF-19500 space level processing.
QR217 (Space Level Quality Conformance) is based on the
quality conformance inspection requirements of MIL-PRF-
19500 groups A (table V), B (table VIa), C (table VII) and
also ESA / ESCC 5000 (chart F4) lot validation tests.
QR216 (Space Level Screening) is based on the screening
requirements of MIL-PRF-19500 (table IV) and also ESA
/ESCC 5000 (chart F3).
JQRS parts are processed to the device data sheet and
screened to QR216 with conformance testing to Q217
groups A and B in accordance with MIL-STD-750 methods
and procedures.
Additional conformance options are available, for example
Pre-Cap Visual Inspection, Buy-Off Visit or Data Packs.
These are chargeable and must be specified at the order
stage (See Ordering Information). Minimum order
quantities may apply.
Alternative or additional customer specific conformance or
screening requirements would be considered. Contact
Semelab sales with enquires.
ORDERING INFORMATION
Part numbers are built up from Type, Package Variant, and
screening level. The part numbers are extended to include
the additional options as shown below.
Type – See Electrical Characteristics Table
Package Variant – See Mechanical Data
Screening Level – See Screening Options (ESA / JQRS)
Additional Options:
Customer Pre-Cap Visual Inspection
Customer Buy-Off visit
Data Pack
Solderability Samples
Scanning Electron Microscopy
Radiography (X-ray)
Total Dose Radiation Test
MIL-PRF-19500 (QR217)
Group B charge
Group B destructive mechanical samples
Group C charge
Group C destructive electrical samples
Group C destructive mechanical samples
ESA/ESCC
Lot Validation Testing (subgroup 1) charge
LVT1 destructive samples (environmental)
LVT1 destructive samples (mechanical)
Lot Validation Testing (subgroup 2) charge
LVT2 endurance samples (electrical)
Lot Validation Testing (subgroup 3) charge
LVT3 destructive samples (mechanical)
.CVP
.CVB
.DA
.SS
.SEM
.XRAY
.RAD
.GRPB
.GBDM (12 pieces)
.GRPC
.GCDE (12 pieces)
.GCDM (6 pieces)
.LVT1
.L1DE (15 pieces)
.L1DM (15 pieces)
.LVT2
.L2D (15 pieces)
.LVT3
.L3D (5 pieces)
Additional Option Notes:
1) All ‘Additional Options’ are chargeable and must be specified at order stage.
2) When Group B,C or LVT is required, additional electrical and mechanical destructive
samples must be ordered
3) All destructive samples are marked the same as other production parts unless
otherwise requested.
MARKING DETAILS
Parts can be laser marked with approximately 7 characters
on two lines and always includes cathode identification.
Typical marking would include part or specification number,
week of seal or serial number subject to available space and
legibility.
Customer specific marking requirements can be arranged at
the time of order.
Example Marking:
Example ordering information:
The following example is for the 1N6309B part with
package variant A, JQRS screening, additional Group C
conformance testing and a Data pack.
Part Numbers:
1N6309BD2A-JQRS
(Include quantity for flight parts)
1N6309BD2A-JQRS.GRPC
(chargeable conformance option)
1N6309BD2A-JQRS.GCDE
(charge for destructive parts)
1N6309BD2A-JQRS.GCDM
(charge for destructive parts)
1N6309BD2A-JQRS.DA
(charge for Data pack)
Customers with any specific requirements (e.g. marking or
screening) may be supplied with a similar alternative part
number (there is maximum 20 character limit to part
numbers). Contact Semelab sales with enquiries.
High Reliability and Screening Options Handbook link:
http://www.semelab.co.uk/pdf/misc/documents/hirel_and_screening_options.pdf
Semelab Limited
Telephone +44 (0) 1455 556565
Email:
sales@semelab-tt.com
Coventry Road, Lutterworth, Leicestershire, LE17 4JB
Fax +44 (0) 1455 552612
Website:
http://www.semelab-tt.com
Document Number 9021
Issue 2
Page 4 of 4
微控制器 MCU
