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25AA080A/B, 25LC080A/B

8K SPI Bus Serial EEPROM

Device Selection Table

Part Number

25LC080A

25AA080A

25LC080B

25AA080B

Range

2.5-5.5V

1.8-5.5V

2.5-5.5V

1.8-5.5V

Page Size

16 Byte

32 Byte

Temp. Ranges

I, E

Packages

P, SN, ST, MS

Features

•

Max. clock 10 MHz

Low-power CMOS technology

1024 x 8-bit organization

16 byte page (‘A’ version devices)

32 byte page (‘B’ version devices)

Write cycle time: 5 ms max.

Self-timed ERASE and WRITE cycles

Block write protection

- Protect none, 1/4, 1/2 or all of array

Built-in write protection

- Power-on/off data protection circuitry

- Write enable latch

- Write-protect pin

Sequential read

High reliability

- Endurance: 1,000,000 erase/write cycles

- Data retention: > 200 years

- ESD protection: > 4000V

Pb-free and RoHS compliant

Temperature ranges supported;

- Industrial (I):

-40°C to +85°C

- Automotive (E):

-40°C to +125°C

Description

The Microchip Technology Inc. 25AA080A/B,

25LC080A/B (25XX080A/B

) are 8 Kbit Serial

Electrically Erasable PROMs. The memory is accessed

via a simple Serial Peripheral Interface (SPI)

compatible serial bus. The bus signals required are a

clock input (SCK) plus separate data in (SI) and data

out (SO) lines. Access to the device is controlled

through a Chip Select (CS) input.

Communication to the device can be paused via the

hold pin (HOLD). While the device is paused, transi-

tions on its inputs will be ignored, with the exception of

chip select, allowing the host to service higher priority

interrupts.

The 25XX080A/B is available in standard packages

including 8-lead PDIP and SOIC, and advanced

packaging including 8-lead MSOP, and 8-lead TSSOP.

All packages are Pb-free and RoHS compliant.

•

Package Types (not to scale)

TSSOP/MSOP

(ST, MS)

HOLD

SCK

•

PDIP/SOIC

(P, SN)

HOLD

SCK

Pin Function Table

Name

SCK

HOLD

Function

Chip Select Input

Serial Data Output

Write-Protect

Ground

Serial Data Input

Serial Clock Input

Hold Input

Supply Voltage

*25XX080A/B is used in this document as a generic part

number for the 25AA080A/B, 25LC080A/B.

2007 Microchip Technology Inc.

DS21808D-page 1

25XX080A/B

1.0

ELECTRICAL CHARACTERISTICS

Absolute Maximum Ratings

(†)

.............................................................................................................................................................................7.0V

All inputs and outputs w.r.t. V

......................................................................................................... -0.6V to V

+1.0V

Storage temperature .................................................................................................................................-65°C to 150°C

Ambient temperature under bias ...............................................................................................................-65°C to 125°C

ESD protection on all pins ..........................................................................................................................................4 kV

† NOTICE: Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the

device. This is a stress rating only and functional operation of the device at those or any other conditions above those

indicated in the operational listings of this specification is not implied. Exposure to maximum rating conditions for an

extended period of time may affect device reliability.

TABLE 1-1:

DC CHARACTERISTICS

Industrial (I):

AMB

= -40°C to +85°C

Automotive (E): T

AMB

= -40°C to +125°C

Min.

2.0

0.7 V

-0.3

—

-0.5

Max.

0.8

0.2 V

0.4

0.2

—

±1

—

Units

μA

= 1.8V to 5.5V

= 2.5V to 5.5V

Test Conditions

≥

2.7V

(Note)

< 2.7V

(Note)

≥

2.7V

(Note)

< 2.7V

(Note)

= 2.1 mA

= 1.0 mA, V

< 2.5V

= -400

μA

CS = V

, V

= V

SS TO

CS = V

, V

OUT

= V

SS TO

AMB

= 25°C, CLK = 1.0 MHz,

= 5.0V

(Note)

= 5.5V; F

CLK

= 10.0 MHz;

SO = Open

= 2.5V; F

CLK

= 5.0 MHz;

SO = Open

= 5.5V

CS = V

= 5.5V, Inputs tied to V

, T

AMB

= -40°C

+125°C

CS = V

= 2.5V, Inputs tied to V

, T

AMB

= -40°C

+85°C

DC CHARACTERISTICS

Param.

No.

D001

D002

D003

D004

D005

D006

D007

D008

D009

D010

Sym.

IH1

IH2

IL1

IL2

INT

Characteristic

High-level input

voltage

Low-level input

voltage

Low-level output

voltage

High-level output

voltage

Input leakage current

Output leakage

current

Internal Capacitance

(all inputs and

outputs)

D011

Read

Operating Current

—

2.5

μA

D012

D013

Write

Iccs

Standby Current

—

Note:

This parameter is periodically sampled and not 100% tested.

DS21808D-page 2

2007 Microchip Technology Inc.

25XX080A/B

TABLE 1-2:

AC CHARACTERISTICS

Industrial (I):

AMB

= -40°C to +85°C

Automotive (E): T

AMB

= -40°C to +125°C

Min.

—

100

150

100

200

250

—

100

150

100

150

—

Max.

—

500

—

100

160

—

160

—

Units

MHz

= 1.8V to 5.5V

= 2.5V to 5.5V

Test Conditions

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

—

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

(Note 1)

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

—

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

(Note 1)

4.5V

≤

5.5V

(Note 1)

2.5V

≤

4.5V

(Note 1)

1.8V

≤

2.5V

(Note 1)

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

AC CHARACTERISTICS

Param.

Sym.

No.

CLK

Characteristic

Clock Frequency

CSS

CS Setup Time

CSH

CS Hold Time

CSD

Tsu

CS Disable Time

Data Setup Time

Data Hold Time

CLK Rise Time

CLK Fall Time

Clock High Time

Clock Low Time

CLD

CLE

Clock Delay Time

Clock Enable Time

Output Valid from Clock

Low

Output Hold Time

Output Disable Time

DIS

HOLD Setup Time

Note 1:

This parameter is periodically sampled and not 100% tested.

This parameter is not tested but ensured by characterization. For endurance estimates in a specific

application, please consult the Total Endurance™ Model which can be obtained from our web site:

www.microchip.com.

begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle

is complete.

2007 Microchip Technology Inc.

DS21808D-page 3

25XX080A/B

TABLE 1-2:

AC CHARACTERISTICS (CONTINUED)

Industrial (I):

AMB

= -40°C to +85°C

Automotive (E): T

AMB

= -40°C to +125°C

Min.

160

—

1,000,000

Max.

—

Units

= 1.8V to 5.5V

= 2.5V to 5.5V

Test Conditions

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

4.5V

≤

5.5V

(Note 1)

2.5V

≤

4.5V

(Note 1)

1.8V

≤

2.5V

(Note 1)

4.5V

≤

5.5V

2.5V

≤

4.5V

1.8V

≤

2.5V

(Note 3)

AC CHARACTERISTICS

Param.

Sym.

No.

Characteristic

HOLD Hold Time

HOLD Low to Output

High-Z

HOLD High to Output

Valid

Internal Write Cycle Time

Endurance

—

E/W

(Note 2)

Cycles

Note 1:

This parameter is periodically sampled and not 100% tested.

This parameter is not tested but ensured by characterization. For endurance estimates in a specific

application, please consult the Total Endurance™ Model which can be obtained from our web site:

www.microchip.com.

begins on the rising edge of CS after a valid write sequence and ends when the internal write cycle

is complete.

TABLE 1-3:

AC Waveform:

= 0.2V

AC TEST CONDITIONS

—

(Note 1)

(Note 2)

0.5 V

= V

- 0.2V

= 4.0V

Input

Output

Note 1:

For V

≤

4.0V

For V

> 4.0V

Timing Measurement Reference Level

DS21808D-page 4

2007 Microchip Technology Inc.

25XX080A/B

FIGURE 1-1:

SCK

n+2

n+1

high-impedance

n-1

HOLD TIMING

don’t care

HOLD

n+2

n+1

FIGURE 1-2:

SERIAL INPUT TIMING

Mode 1,1

SCK Mode 0,0

LSB in

MSB in

high-impedance

FIGURE 1-3:

SERIAL OUTPUT TIMING

SCK

MSB out

ISB out

Mode 1,1

Mode 0,0

don’t care

2007 Microchip Technology Inc.

DS21808D-page 5