REVISIONS
LTR
A
B
C
D
E
DESCRIPTION
Changes made in accordance with NOR 5962-R275-94.
Changes made in accordance with NOR 5962-R365-97.
Add device type 03, 04 and CAGE code 88379. Correct note 1 in
table I.
Corrections to tables I and II.
Add device types 05 through 07. Add case outlines T and Z. Table I,
I
IH
and I
IL
tests with notes 4 and 6, reverse the minimum and
maximum limits. Table I, I
IH
for device types 01-04 with note 6 in the
conditions column, change the minimum limit from -0.2 mA to -0.4 mA.
Update drawing boilerplate.
Paragraph 4.2 Screening: add subparagraphs 4.2.a.3 and 4.2.c for
device types 05, 06, and 07, only. Table I, device types 05 through
07, change min/max test limits for V
IH
, V
IL
, I
IH
(3 places), I
IL
(3 places),
and device types 05 and 06, change max test limits for I
EE
(2 places
each).
Add device types 08 and 09.
Updated drawing paragraphs. -sld
Add device type 10. Add Transceiver positive input supply voltage to
paragraphs 1.3 and 1.4. Table I: Condition for V
OH
and V
OL
for device
types 08-10, Change “I
OL
= Max” to “I
OL
= 8.0 mA”. Remove “I
L
” test
and replace with “I
CC1
”. Add I
CC2
– I
CC3
tests. Remove both I
EE
tests
and replace with I
EE1
- I
EE8
. Table I footnote 6/ change “I
o
” to “C
IO
” -gc
DATE (YR-MO-DA)
94-09-14
97-06-19
98-01-15
98-05-14
02-03-13
APPROVED
K. A. Cottongim
K. A. Cottongim
K. A. Cottongim
K. A. Cottongim
Raymond Monnin
F
02-05-24
Raymond Monnin
G
H
J
06-03-28
11-11-08
12-10-16
Raymond Monnin
Charles F. Saffle
Charles F. Saffle
REV
SHEET
REV
SHEET
REV STATUS
OF SHEETS
PMIC N/A
J
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J
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J
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REV
SHEET
PREPARED BY
Steve L. Duncan
CHECKED BY
Michael C. Jones
J
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J
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J
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J
1
J
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J
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J
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J
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J
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J
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J
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J
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J
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J
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J
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J
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J
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STANDARD
MICROCIRCUIT
DRAWING
THIS DRAWING IS
AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil/
APPROVED BY
Gregory Lude
MICROCIRCUIT, HYBRID, LINEAR, DUAL
REDUNDANT REMOTE TERMINAL UNIT
(RTU)
DRAWING APPROVAL DATE
91-11-25
REVISION LEVEL
J
SIZE
A
SHEET
CAGE CODE
67268
1 OF
26
5962-89798
5962-E488-12
DSCC FORM 2233
APR 97
1. SCOPE
1.1 Scope. This drawing describes device requirements for class H hybrid microcircuits to be processed in accordance with
MIL-PRF-38534 and a choice of case outlines and lead finishes are available and are reflected in the Part or Identifying
Number (PIN).
1.2 PIN. The PIN shall be as shown in the following example:
5962-89798
Drawing number
01
Device type
(see 1.2.1)
X
Case outline
(see 1.2.2)
X
Lead finish
(see 1.2.3)
1.2.1 Device type(s). The device type(s) shall identify the circuit function as follows:
Device type
01
02
03
04
05
06
07
08
09
10
Generic number
BUS65142, BUS65144
BUS65143, BUS65145
CT2542, CT2542-FP
CT2543, CT2543-FP
BU-65142X1
BU-65142X2
BU-65142X3
BU-63705X1
BU-63705X2
BU-63705X3
Circuit function
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU)
Dual redundant remote terminal unit (RTU), +5/-15 V transceiver
Dual redundant remote terminal unit (RTU), +5/-12 V transceiver
Dual redundant remote terminal unit (RTU), +5/+5 V transceiver
Dual redundant remote terminal unit (RTU), +5/-15 V transceiver
Dual redundant remote terminal unit (RTU), +5/-12 V transceiver
Dual redundant remote terminal unit (RTU), +5/+5 V transceiver
1.2.2 Case outline(s). The case outline(s) shall be as designated in MIL-STD-1835 and as follows:
Outline letter
T
X
Y
Z
Descriptive designator
See figure 1
See figure 1
See figure 1
See figure 1
Terminals
78
78
82
78
Package style
Dual-in-line, ceramic, staggered pins
Dual-in-line, staggered pins
Flat pack
Flat pack
1.2.3 Lead finish. The lead finish shall be as specified in MIL-PRF-38534.
1.3 Absolute maximum ratings. 1/
Logic supply voltage (V
L
):
Device types 01 through 07 ....................................................
Device types 08, 09 and 10 ....................................................
Transceiver, channels A and B, positive input supply voltage
(+5 V
L
A, +5 V
L
B)
Device types 8, 09, and 10 .....................................................
Negative supply voltage (V
EE
)
Device types 05, 06, 08, and 09 .............................................
Storage temperature ..................................................................
Thermal rise, case to junction(∆T
J
):
Device types 01 through 07 ....................................................
Device types 08, 09 and 10 ....................................................
Lead temperature (soldering, 10 seconds) ................................
Power dissipation (T
C
= +125°C) ...............................................
1/
5.5 V dc
6.5 V dc
7.0 V dc
-18.0 V dc
-65°C to +150°C
13.9°C
7.55°C
+300°C
Duty cycle dependent (see table I power supplies)
Stresses above the absolute maximum ratings may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
SIZE
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
A
REVISION LEVEL
J
5962-89798
SHEET
2
DSCC FORM 2234
APR 97
1.4 Recommended operating conditions.
Logic supply voltage (V
L
):
Device types 01 through 06, 08, 09 and 10 ............................
Device type 07........................................................................
Transceiver, channels A and B, positive input supply voltage
(+5 V
L
A, +5 V
L
B)
Device types 8, and 09 ...........................................................
Device type 10........................................................................
Negative supply voltage (V
EE
):
Device types 01, 03, 05, and 08 .............................................
Device types 02, 04, 06, and 09 .............................................
Maximum differential input voltage ..............................................
Case operating temperature range (T
C
) ......................................
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38534 - Hybrid Microcircuits, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 - Test Method Standard Microcircuits.
MIL-STD-1835 - Interface Standard for Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 - List of Standard Microcircuit Drawings.
MIL-HDBK-780 - Standard Microcircuit Drawings.
(Copies of these documents are available online at
https://assist.dla.mil/quicksearch/
or from the Standardization Document
Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item performance requirements for device class H shall be in accordance with
MIL-PRF-38534. Compliance with MIL-PRF-38534 may include the performance of all tests herein or as designated in the
device manufacturer's Quality Management (QM) plan or as designated for the applicable device class. The manufacturer may
eliminate, modify or optimize the tests and inspections herein, however the performance requirements as defined in MIL-PRF-
38534 shall be met for the applicable device class. In addition, the modification in the QM plan shall not affect the form, fit, or
function of the device for the applicable device class.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38534 and herein.
3.2.1 Case outline(s). The case outline(s) shall be in accordance with 1.2.4 herein and figure 1.
3.2.2 Terminal connections and pin functions. The terminal connections and pin functions shall be as specified on figure 2.
+4.5 V dc to +5.5 V dc
+4.75 V dc to +5.25 V dc
4.5 V dc to +5.5 V dc
+4.75 V dc to +5.25 V dc
-14.25 V dc to -15.75 V dc
-11.4 V dc to -12.6 V dc
40 Vp-p
-55°C to +125°C
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
J
5962-89798
SHEET
3
DSCC FORM 2234
APR 97
3.2.3 Block diagram. The block diagram shall be as specified on figure 3.
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are
as specified in table I and shall apply over the full specified operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
3.5 Marking of device(s). Marking of device(s) shall be in accordance with MIL-PRF-38534. The device shall be marked with
the PIN listed in 1.2 herein. In addition, the manufacturer's vendor similar PIN may also be marked.
3.6 Data. In addition to the general performance requirements of MIL-PRF-38534, the manufacturer of the device described
herein shall maintain the electrical test data (variables format) from the initial quality conformance inspection group A lot sample,
for each device type listed herein. Also, the data should include a summary of all parameters manually tested, and for those
which, if any, are guaranteed. This data shall be maintained under document revision level control by the manufacturer and be
made available to the preparing activity (DLA Land and Maritime -VA) upon request.
3.7 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to supply to this
drawing. The certificate of compliance (original copy) submitted to DLA Land and Maritime -VA shall affirm that the
manufacturer's product meets the performance requirements of MIL-PRF-38534 and herein.
3.8 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38534 shall be provided with each lot of
microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38534 or as
modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not affect the form,
fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38534. The following additional criteria shall apply:
a.
Burn-in test, method 1015 of MIL-STD-883.
(1)
Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to either DLA Land and Maritime -VA or the acquiring activity upon request.
Also, the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance
with the intent specified in method 1015 of MIL-STD-883.
T
A
as specified in accordance with table I of method 1015 of MIL-STD-883.
Burn-in test shall be for 320 hours. (For device types 05 through 10, only.)
(2)
(3)
b.
Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter
tests prior to burn-in are optional at the discretion of the manufacturer.
100% Nondestructive bond pull test. (For device types 05 through 10, only.)
c.
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
J
5962-89798
SHEET
4
DSCC FORM 2234
APR 97
TABLE I. Electrical performance characteristics.
Test
Symbol
Conditions 1/
-55°C
≤
T
C
≤
+125°C
unless otherwise specified
Group A
subgroups
Device
type
Min
Limits
Max
Unit
Receiver
Differential input impedance
Differential input voltage
Input threshold
Z
IN
diff
V
IN
diff
V
TH
DC to 1 MHz 2/
2/
Direct coupled (across
35Ω load)
Transformer coupled (across
70Ω load)
Common mode rejection
ratio
Common mode voltage
Transmitter
Differential output voltage
V
OUT
diff
Direct coupled (across
35Ω load)
Transformer coupled (across
70Ω load)
Output rise and fall time
t
r
, t
f
Transformer coupled (across
70Ω load) 10 to 90 percent of
full waveform peak to peak.
In accordance with MIL-STD-
1553.
Direct coupled
Transformer coupled 2/ 3/
Direct coupled
Logic
High level input voltage
V
IH
V
L
= 5.5 V
V
L
= 5.25 V
V
L
= 5.5 V 12/
Low level input voltage
V
IL
V
L
= 5.5 V
V
L
= 5.25 V
V
L
= 4.5 V 12/
See footnotes at end of table.
1,2,3
1,2,3
01-04
05-07
08-10
01-04
05-07
08-10
2.4
2.0
2.0
0.7
0.8
0.8
V
V
08-10
9,10,11
All
4,5,6
All
6.0
18.0
100
9.0
27.0
300
ns
Vp-p
CMRR
CMV
DC to 2 MHz 2/ 3/
DC to 2 MHz 2/ 3/
1,2,3
1,2,3
All
All
40
-10
+10
1,2,3
1,2,3
4,5,6
All
All
All
4
40
1.2
0.86
dB
V dc
kΩ
Vp-p
Vp-p
Output noise
N
OUT
4,5,6
01-07
5
14
10
mV RMS
mV RMS
mV p-p
(
differential
)
STANDARD
MICROCIRCUIT DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
SIZE
A
REVISION LEVEL
J
5962-89798
SHEET
5
DSCC FORM 2234
APR 97
