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LM7171QML Very High Speed, High Output Current, Voltage Feedback Amplifier
February 4, 2009
LM7171QML
Very High Speed, High Output Current, Voltage Feedback
Amplifier
General Description
The LM7171 is a high speed voltage feedback amplifier that
has the slewing characteristic of a current feedback amplifier;
yet it can be used in all traditional voltage feedback amplifier
configurations. The LM7171 is stable for gains as low as +2
or −1. It provides a very high slew rate at 4100V/μs and a wide
unity-gain bandwidth of 200 MHz while consuming only
6.5 mA of supply current. It is ideal for video and high speed
signal processing applications such as HDSL and pulse am-
plifiers. With 100 mA output current, the LM7171 can be used
for video distribution, as a transformer driver or as a laser
diode driver.
Operation on ±15V power supplies allows for large signal
swings and provides greater dynamic range and signal-to-
noise ratio. The LM7171 offers low SFDR and THD, ideal for
ADC/DAC systems. In addition, the LM7171 is specified for
±5V operation for portable applications.
The LM7171 is built on National's advanced VIP
®
III (Verti-
cally integrated PNP) complementary bipolar process.
Features
(Typical Unless Otherwise Noted)
■
Easy-To-Use Voltage Feedback Topology
■
Very High Slew Rate: 2400V/μs
■
Wide Unity-Gain Bandwidth: 200 MHz
■
−3 dB Frequency @ A
V
= +2: 220 MHz
■
Low Supply Current: 6.5 mA
■
High Open Loop Gain: 85 dB
■
High Output Current: 100 mA
■
Specified for ±15V and ±5V Operation
■
Available with radiation guarantee
—
Total Ionizing Dose
—
ELDRS Free
300 krad(Si)
300 krad(Si)
Applications
■
■
■
■
■
■
■
■
HDSL and ADSL Drivers
Multimedia Broadcast Systems
Professional Video Cameras
Video Amplifiers
Copiers/Scanners/Fax
HDTV Amplifiers
Pulse Amplifiers and Peak Detectors
CATV/Fiber Optics Signal Processing
Ordering Information
NS Part Number
LM7171AMJ-QML
LM7171AMJFQMLV
HIGH DOSE RATE
(Note 5)
LM7171AMJFLQMLV
ELDRS FREE
(Note 14)
LM7171AMWFQMLV
HIGH DOSE RATE
(Note 5)
LM7171AMWFLQMLV
ELDRS FREE
(Note 14)
LM7171AMWG-QML
LM7171AMWGFQMLV
HIGH DOSE RATE
(Note 5)
LM7171AMWGFLQV
ELDRS FREE
(Note 14)
SMD Part Number
5962-9553601QPA
5962F9553601VPA
300 krad(Si)
5962F9553602VPA
300 krad(Si)
5962F9553601VHA
300 krad(Si)
5962F9553602VHA
300 krad(Si)
5962-9553601QXA
5962F9553601QXA
300 krad(Si)
5962F9553602VXA
300 krad(Si)
NS Package Number
J08A
J08A
J08A
W10A
W10A
WG10A
WG10A
WG10A
Package Description
8LD Ceramic Dip
8LD Ceramic Dip
8LD Ceramic Dip
10LD Ceramic Flatpack
10LD Ceramic Flatpack
10LD Ceramic SOIC
10LD Ceramic SOIC
10LD Ceramic SOIC
VIP
®
is a registered trademark of National Semiconductor Corporation.
© 2009 National Semiconductor Corporation
201595
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LM7171QML
Connection Diagrams
8-Pin Ceramic DIP
10-Pin Ceramic SOIC & Ceramic Flatpack
20159502
Top View
20159504
Top View
Simplified Schematic Diagram
20159509
Note:
M1 and M2 are current mirrors.
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2
LM7171QML
Typical Performance
Large Signal Pulse Response
A
V
= +2, V
S
= ±15V
20159501
3
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LM7171QML
Absolute Maximum Ratings
(Note 1)
Supply Voltage (V
+
–V
−
)
Differential Input Voltage (Note 10)
Maximum Power Dissipation (Note 2)
Output Short Circuit to Ground (Note 6)
Storage Temperature Range
Thermal Resistance (Note 13)
θ
JA
8LD Ceramic Dip (Still Air)
8LD Ceramic Dip (500LF/Min Air flow)
10LD Ceramic Flatpack (Still Air)
10LD Ceramic Flatpack (500LF/Min Air flow)
10LD Ceramic SOIC (Still Air)
10LD Ceramic SOIC (500LF/Min Air flow)
θ
JC
8LD Ceramic Dip
10LD Ceramic Flatpack
10LD Ceramic SOIC (Note 3)
Package Weight (Typical)
8LD Ceramic Dip
10LD Ceramic Flatpack
10LD Ceramic SOIC
Maximum Junction Temperature (Note 2)
ESD Tolerance (Note 4)
106°C/W
53°C/W
182°C/W
105°C/W
182°C/W
105°C/W
3°C/W
5°C/W
5°C/W
965mg
235mg
230mg
150°C
3000V
(Note 1)
5.5V
≤
V
S
≤
36V
36V
±10V
730mW
Continuous
−65°C
≤
T
A
≤
+150°C
Recommended Operating Conditions
Supply Voltage
Operating Temperature Range
−55°C
≤
T
A
≤
+125°C
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
1
2
3
4
5
6
7
8A
8B
9
10
11
12
13
14
Description
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
Temp °C
25
125
-55
25
125
-55
25
125
-55
25
125
-55
25
125
-55
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