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747957-1

CONNECTOR, 37 CONTACT(S), FEMALE, D SUBMINIATURE CONNECTOR, SOLDER, RECEPTACLE

器件类别:连接器   

厂商名称:TE Connectivity(泰科)

厂商官网:http://www.te.com

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器件参数
参数名称
属性值
是否Rohs认证
不符合
厂商名称
TE Connectivity(泰科)
Reach Compliance Code
unknown
其他特性
AMPLIMITE, COMPATIBLE CONTACTS: 66505-3; 6-66505-0; 66505-4; 5-66505-7
主体/外壳类型
RECEPTACLE
连接器类型
D SUBMINIATURE CONNECTOR
联系完成配合
NOT SPECIFIED
触点性别
FEMALE
触点材料
NOT SPECIFIED
DIN 符合性
NO
空壳
YES
滤波功能
NO
IEC 符合性
NO
绝缘体材料
POLYETHYLENE
MIL 符合性
NO
制造商序列号
747957
插接信息
MULTIPLE MATING PARTS AVAILABLE
混合触点
NO
安装类型
CABLE
选件
GENERAL PURPOSE
外壳面层
TIN
外壳材料
STEEL
外壳尺寸
4/C
端接类型
SOLDER
触点总数
37
UL 易燃性代码
94V-0
Base Number Matches
1
文档预览
AMPLIMITE* HDP-20 Subminiature D
Connector with F Crimp Contacts
Product Specification
108-40005
18 DEC 19
Rev G
1.
1.1.
SCOPE
Content
This specification covers the performance, test and quality requirements for the AMPLIMITE* HDP-20
subminiature D connectors with removable F crimp contacts. The assembly consists of a two piece
plastic housing which has integral plastic retention tines and two metal shells which secure the housing
components.
1.2.
Qualification
When tests are performed on the subject product line, the procedures specified in Figure 1 shall be
used. All inspections shall be performed using the applicable inspection plan and product drawing.
1.3.
Qualification Test Results
Successful qualification testing on the subject product line was completed on 06Oct89. The
Qualification Test Report number for this testing is 501-99. This documentation is on file at and
available from Engineering Practices and Standards (EPS).
2.
APPLICABLE DOCUMENTS
The following documents form a part of this specification to the extent specified herein. Unless
otherwise specified, the latest edition of the document applies. In the event of conflict between the
requirements of this specification and the product drawing, the product drawing shall take precedence.
In the event of conflict between the requirements of this specification and the referenced documents,
this specification shall take precedence.
2.1.
TE Connectivity (TE) Documents
114-40030: Application Specification (AMPLIMITE* HDP-20 & Economy Crimp Snap Subminiature D
Commercial Connectors)
501-99: Qualification Test Report (AMPLIMITE* HDP-20 Subminiature D Connector With F Crimp
Contacts)
2.2.
Industry Standard
EIA-364: Electrical Connector/Socket Test Procedures Including Environmental Classifications
2.3.
Reference Document
109-197: Test Specification (AMP Test Specifications vs EIA and IEC Test Methods)
3.
3.1.
REQUIREMENTS
Design and Construction
Product shall be of the design, construction and physical dimensions specified on the applicable
product drawing.
© 2019 TE Connectivity Ltd. family of companies.
All Rights Reserved.
*Trademark
PRODUCT INFORMATION 1-800-522-6752
This controlled document is subject to change.
For latest revision and Regional Customer Service,
visit our website at
www.te.com.
1
of 10
TE Connectivity, TE connectivity (logo), and TE (logo) are trademarks. Other logos, product, and/or company names may be trademarks of their respective owners.
108-40005
3.2.
Material
Materials used in the construction of this product shall be as specified on the applicable product
drawing.
3.3.
Ratings
Voltage: 250 volts AC
Current: Fully loaded and energized connectors, see Figure 4
18 AWG: 3.1 amperes
22 AWG: 2.0 amperes
28 AWG: 1.2 amperes
Temperature: -55 to 105°C
3.4.
Performance and Test Description
Product is designed to meet the electrical, mechanical and environmental performance
requirements specified in Figure 1. Unless otherwise specified, all tests are performed at ambient
temperature. 3.5.
Test Requirements and Procedures Summary
Test Description
Examination of product.
Requirement
Meets requirements of product
drawing and Application
Specification 114-40030.
Procedure
EIA-364-18.
Visual and dimensional (C of C)
inspection per product drawing.
EIA-364-18. Visual inspection.
Final examination of product.
Meets visual requirements.
ELECTRICAL
Low level contact resistance.
15 milliohms maximum.
EIA-364-23.
Subject specimens to 100
milliamperes maximum and 20
millivolts maximum open circuit
voltage.
See Figure 3.
EIA-364-6.
Measure potential drop of mated
contacts assembled in housing.
Calculate resistance.
See Figure 3.
Contact resistance, specified
current.
Wire
Test
Resistance
Size
Current
Maximum
(AWG) (amperes) (milliohms)
18
3.1
15
20
2.4
15
22
2.0
15
24
1.6
15
26
1.3
15
28
1.2
15
5000 megohms minimum initial.
500 megohms minimum final.
One minute hold with no
breakdown or flashover. 0.5
milliampere maximum leakage
current.
Figure 1 (continued)
Insulation resistance.
EIA-364-21.
Test between adjacent contacts of
unmated specimens.
EIA-364-20, Condition I.
1000 volts AC at sea level.
Test between adjacent contacts of
unmated specimens.
Withstanding voltage.
Rev
G
2
of 10
108-40005
Test Description
Temperature rise vs current.
Requirement
Procedure
30°C maximum temperature rise at EIA-364-70, Method 1.
specified current.
Stabilize at a single current level
until 3 readings at 5 minute
intervals are within 1°C.
See Figure 4.
MECHANICAL
No discontinuities of 1 microsecond EIA-364-28, Test Condition V,
or longer duration.
Condition F.
See Note.
Subject mated specimens to 20.71
G's rms between 50 to 2000 Hz.
Fifteen minutes in each of 3
mutually perpendicular planes.
See Figure 5.
No discontinuities of 1 microsecond EIA-364-27, Method A.
or longer duration.
Subject mated specimens to 50 G's
See Note.
half-sine shock pulses of 11
milliseconds duration. Three
shocks in each direction applied
along 3 mutually perpendicular
planes, 18 total shocks.
See Figure 5.
See Note.
EIA-364-9.
Mate and unmate gold flash
specimens for 100 cycles, and 30
µin gold specimens for 500 cycles
at a maximum rate of 200 cycles
per hour.
EIA-364-13.
Measure force necessary to mate
specimens at a maximum rate of
25.4 mm [1 in] per minute.
Vibration, random.
Mechanical shock.
Durability.
Mating force.
Size
1
2
3
4
5
Without
With
Ground
Indents
Posn (N [lbf] maximum)
9
12.5 [2.8] 133.4 [30]
15 20.9 [4.7] 146.8 [33]
25 34.7 [7.8] 164.6 [37]
37 51.6 [11.6] 177.9[40]
50 69.4 [15.6] 195.7[44]
Without
With
Ground
Indents
Posn
(N [lbf] maximum)
9
12.5 [2.8] 133.4 [30]
15 20.9 [4.7] 146.8 [33]
25 34.7 [7.8] 164.6 [37]
37 51.6 [11.6] 177.9 [40]
50 69.4 [15.6] 195.7 [44]
Unmating force.
Size
1
2
3
EIA-364-13.
Measure force necessary to
unmate specimens at a maximum
rate of
25.4 mm [1 in] per minute.
4
5
Contact insertion force.
13.3 N [3 lbf] maximum per
contact.
Figure 1 (continued)
EIA-364-5.
Measure force necessary to insert
contact into housing.
Rev
G
3
of 10
108-40005
Test Description
Contact retention force.
Requirement
Contacts shall nor dislodge from
housing when subjected to a
minimum force of 22.2 N [5 lbf].
Procedure
EIA-364-29.
Apply specified to contacts in an
axial direction and hold for 6
seconds.
Measure force necessary to insert
gage A to a depth of 5.6 mm [.220
in].
See Figure 6.
Contact engaging force.
2.2 N [8 ozf] maximum per contact.
EIA-364-37.
Contact separating force.
0.208 N [.75 ozf] minimum per
contact.
EIA-364-37.
Size 2 times using gage A. Insert
gage B to a depth of 5.6 mm [.220
in] and measure force necessary to
separate gage B.
See Figure 6.
EIA-364-8.
Determine crimp tensile at a
maximum rate of 25.4 mm [1 in]
per minute.
Crimp tensile.
Wire Size
Crimp Tensile
(AWG)
(N [lbf] minimum)
18
120.1 [27]
20
89.0 [20]
22
53.4 [12]
24
35.6 [8]
26
20.0 [4.5]
28
12.0 [2.7]
ENVIRONMENTAL
Thermal shock.
See Note.
EIA-364-32, Test Condition VII.
Subject unmated specimens to 5
cycles between -55 and 105°C.
EIA-364-31, Method III with cold
shock.
Subject mated specimens to 10
cycles (10 days) between 25 and
65°C at 80 to 100% RH.
EIA-364-17, Method A, Test
Condition 4, Test Time Condition
C. Subject mated specimens to
105°C for 500 hours.
EIA-364-65, Class IIIA (4 gas).
Subject mated specimens to
environmental Class IIIA for 20
days.
Humidity/temperature cycling.
See Note.
Temperature life.
See Note.
Mixed flowing gas.
See Note.
NOTE
Shall meet visual requirements, show no physical damage, and meet requirements of additional
tests as specified in the Product Qualification and Requalification Test Sequence shown in Figure 2.
Figure 1 (end)
Rev
G
4
of 10
108-40005
3.6.
Product Qualification and Requalification Test Sequence
Test Group (a)
Test or Examination
1
2
3
4
5
Test Sequence
(b)
Initial examination of product
Low level contact resistance
Contact resistance, specified current
Insulation resistance
Withstanding voltage
Temperature rise vs current
Vibration, random
Mechanical shock
Durability
Mating force
Unmating force
Contact insertion force
Contact retention force
Contact engaging force
Contact separating force
Crimp tensile
Thermal shock
Humidity/temperature cycling
Temperature life
Mixed flowing gas
Final examination of product
NOTE
(a)
(b)
(c)
1
3,7
8
1
2,8
1
1
1
3,7
4,8
3,9
5
6
4
2
9
2
9
2
3
4
5
6
6
5
10
10
10
5
1,7
4
4
2,5
3,6
7(c)
See paragraph 4.1.A.
Numbers indicate sequence in which tests are performed.
Discontinuities shall not be measured. Energize at 18°C level for 100% loadings per
Quality Specification 102-950.
Figure 2
Rev
G
5
of 10
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