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74ABT541PWDH

Octal buffer/line driver 3-State

厂商名称:Philips Semiconductors (NXP Semiconductors N.V.)

厂商官网:https://www.nxp.com/

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INTEGRATED CIRCUITS
74ABT541
Octal buffer/line driver (3-State)
Product specification
Supersedes data of 1996 Sep 10
IC23 Data Handbook
1998 Jan 16
Philips
Semiconductors
Philips Semiconductors
Product specification
Octal buffer/line driver (3-State)
74ABT541
FEATURES
Octal bus interface
Functions similar to the ’ABT241
Provides ideal interface and increases fan-out of MOS
Microprocessors
ESD protection exceeds 2000 V per MIL STD 883 Method 3015
and 200 V per Machine Model
Live insertion/extraction permitted
DESCRIPTION
The 74ABT541 high-performance BiCMOS device combines low
static and dynamic power dissipation with high speed and high
output drive.
The 74ABT541 device is an octal buffer that is ideal for driving bus
lines. The outputs are all capable of sinking 64mA and sourcing
32mA. The device features input and outputs on opposite sides of
the package to facilitate printed circuit board layout.
Efficient pinout to facilitate PC board layout
3-State buffer outputs sink 64mA and source 32mA
Power-up 3-State
Latch-up protection exceeds 500mA per Jedec JC40.2 Std 17
QUICK REFERENCE DATA
SYMBOL
t
PLH
t
PHL
C
IN
C
OUT
I
CCZ
PARAMETER
Propagation delay
An to Yn
Input capacitance
Output capacitance
Total supply current
CONDITIONS
T
amb
= 25°C; GND = 0V
C
L
= 50pF; V
CC
= 5V
V
I
= 0V or V
CC
Outputs disabled; V
O
= 0V or V
CC
Outputs disabled; V
CC
= 5.5V
TYPICAL
2.9
4
7
500
UNIT
ns
pF
pF
nA
ORDERING INFORMATION
PACKAGES
20-Pin Plastic DIP
20-Pin plastic SO
20-Pin Plastic SSOP Type II
20-Pin Plastic TSSOP Type I
TEMPERATURE RANGE
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
–40°C to +85°C
OUTSIDE NORTH AMERICA
74ABT541 N
74ABT541 D
74ABT541 DB
74ABT541 PW
NORTH AMERICA
74ABT541 N
74ABT541 D
74ABT541 DB
74ABT541PW DH
DWG NUMBER
SOT146-1
SOT163-1
SOT339-1
SOT360-1
PIN CONFIGURATION
LOGIC SYMBOL
OE0
OE1
1
19
2
A0
OE1
3
17
Y1
4
A2
5
A3
6
A4
7
A5
8
A6
9
A7
11
Y7
13
Y5
12
Y6
14
Y4
15
Y3
16
Y2
Y0
Y1
Y2
Y3
Y4
Y5
Y6
Y7
A1
18
Y0
OE0
A0
A1
A2
A3
A4
A5
A6
A7
1
2
3
4
5
6
7
8
9
20
19
18
17
16
15
14
13
12
11
V
CC
GND 10
SA00202
SA00203
1998 Jan 16
2
853-1458 18864
Philips Semiconductors
Product specification
Octal buffer/line driver (3-State)
74ABT541
LOGIC SYMBOL (IEEE/IEC)
PIN DESCRIPTION
PIN NUMBER
SYMBOL
A0 – A7
Y0 – Y7
OE0, OE1
GND
V
CC
NAME AND FUNCTION
Data inputs
Data outputs
Output enables
Ground (0V)
Positive supply voltage
2, 3, 4, 5,
6, 7, 8, 9
1
19
&
EN
18, 17, 16, 15,
14, 13, 12, 11
18
17
16
15
14
13
12
11
2
3
4
5
6
7
8
9
1, 19
10
20
FUNCTION TABLE
INPUTS
OE0
L
L
X
H
H
L
X
Z
OE1
L
L
H
X
An
L
H
X
X
OUTPUTS
Yn
L
H
Z
Z
SA00204
= High voltage level
= Low voltage level
= Don’t care
= High impedance ”off” state
ABSOLUTE MAXIMUM RATINGS
1, 2
SYMBOL
V
CC
I
IK
V
I
I
OK
V
OUT
I
OUT
T
stg
PARAMETER
DC supply voltage
DC input diode current
DC input voltage
3
DC output diode current
DC output voltage
3
DC output current
Storage temperature range
V
O
< 0
output in Off or High state
output in Low state
V
I
< 0
CONDITIONS
RATING
–0.5 to +7.0
–18
–1.2 to +7.0
–50
–0.5 to +5.5
128
–65 to 150
UNIT
V
mA
V
mA
V
mA
°C
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The performance capability of a high-performance integrated circuit in conjunction with its thermal environment can create junction
temperatures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 Jan 16
3
Philips Semiconductors
Product specification
Octal buffer/line driver (3-State)
74ABT541
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
Min
V
CC
V
I
V
IH
V
IL
I
OH
I
OL
∆t/∆v
T
amb
DC supply voltage
Input voltage
High-level input voltage
Low-level Input voltage
High-level output current
Low-level output current
Input transition rise or fall rate
Operating free-air temperature range
0
–40
4.5
0
2.0
0.8
–32
64
5
+85
LIMITS
Max
5.5
V
CC
V
V
V
V
mA
mA
ns/V
°C
UNIT
DC ELECTRICAL CHARACTERISTICS
LIMITS
SYMBOL
PARAMETER
TEST CONDITIONS
T
amb
= +25°C
Min
V
IK
Input clamp voltage
V
CC
= 4.5V; I
IK
= –18mA
V
CC
= 4.5V; I
OH
= –3mA; V
I
= V
IL
or V
IH
V
OH
High-level output voltage
V
CC
= 5.0V; I
OH
= –3mA; V
I
= V
IL
or V
IH
V
CC
= 4.5V; I
OH
= –32mA; V
I
= V
IL
or V
IH
V
OL
I
I
I
OFF
I
PU
/I
PD
I
OZH
I
OZL
I
CEX
I
O
I
CCH
I
CCL
I
CCZ
Quiescent supply current
Low-level output voltage
Input leakage current
Power-off leakage current
Power-up/down 3-state
output current
3
3-State output High current
3-State output Low current
Output High leakage current
Output current
1
V
CC
= 4.5V; I
OL
= 64mA; V
I
= V
IL
or V
IH
V
CC
= 5.5V; V
I
= GND or 5.5V
V
CC
= 0.0V; V
I
or V
O
4.5V
V
CC
= 2.0V; V
O
= 0.5V; V
I
= GND or V
CC
;
V
OE
= Don’t care
V
CC
= 5.5V; V
O
= 2.7V; V
I
= V
IL
or V
IH
V
CC
= 5.5V; V
O
= 0.5V; V
I
= V
IL
or V
IH
V
CC
= 5.5V; V
O
= 5.5V; V
I
= GND or V
CC
V
CC
= 5.5V; V
O
= 2.5V
V
CC
= 5.5V; Outputs High, V
I
= GND or V
CC
V
CC
= 5.5V; Outputs Low, V
I
= GND or V
CC
V
CC
= 5.5V; Outputs 3-State;
V
I
= GND or V
CC
Outputs enabled, one input at 3.4V, other
inputs at V
CC
or GND; V
CC
= 5.5V
∆I
CC
Additional supply current per
input pin
2
Outputs 3-State, one data input at 3.4V,
other inputs at V
CC
or GND; V
CC
= 5.5V
Outputs 3-State, one enable input at 3.4V,
other inputs at V
CC
or GND; V
CC
= 5.5V
–40
2.5
3.0
2.0
Typ
–0.9
2.9
3.4
2.4
0.42
±0.01
±5.0
±5.0
5.0
–5.0
5.0
–100
0.5
24
0.5
0.5
0.5
0.5
0.55
±1.0
±100
±50
50
–50
50
–180
250
30
250
1.5
50
1.5
–40
Max
–1.2
2.5
3.0
2.0
0.55
±1.0
±100
±50
50
–50
50
–180
250
30
250
1.5
50
1.5
T
amb
= –40°C
to +85°C
Min
Max
–1.2
V
V
V
V
V
µA
µA
µA
µA
µA
µA
mA
µA
mA
µA
mA
µA
mA
UNIT
NOTES:
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.
2. This is the increase in supply current for each input at 3.4V.
3. This parameter is valid for any V
CC
between 0V and 2.1V with a transition time of up to 10msec. For V
CC
= 2.1V to V
CC
= 5V
"
10%, a
transition time of up to 100µsec is permitted.
1998 Jan 16
4
Philips Semiconductors
Product specification
Octal buffer/line driver (3-State)
74ABT541
AC CHARACTERISTICS
GND = 0V; t
R
= t
F
= 2.5ns; C
L
= 50pF, R
L
= 500Ω
LIMITS
SYMBOL
PARAMETER
WAVEFORM
Min
t
PLH
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
Propagation delay
An to Yn
Output enable time
to High and Low level
Output disable time
from High and Low level
1
2
2
1.0
1.0
1.1
2.1
2.1
1.7
T
amb
= +25°C
V
CC
= +5.0V
Typ
2.6
2.9
3.1
4.4
5.1
4.7
Max
4.1
4.2
4.8
5.9
6.6
6.2
T
amb
= –40°C to +85°C
V
CC
= +5.0V
±0.5V
Min
1.0
1.0
1.1
2.1
2.1
1.7
Max
4.6
4.6
5.3
6.4
7.1
6.7
ns
ns
ns
UNIT
AC WAVEFORMS
V
M
= 1.5V, V
IN
= GND to 3.0V
3V
1.5V
INPUT
0V
t
PLH
t
PHL
V
OH
1.5V
OUTPUT
V
OL
1.5V
Yn
OUTPUT
Yn
OUTPUT
t
PZH
V
M
1.5V
OEn
INPUT
V
M
t
PZL
V
M
t
PHZ
V
M
t
PLZ
3.5V
V
OL
+ 0.3V
V
OL
V
OH
V
OH
– 0.3V
0V
SA00028
SA00206
Waveform 1. Waveforms Showing the Input (An) to Output (Yn)
Propagation Delays
Waveform 2. Waveforms Showing the 3-State Output Enable
and Disable Times
TEST CIRCUIT AND WAVEFORMS
7V
From Output
Under Test
C
L
= 50 pF
500
S1
Open
GND
500
Load Circuit
TEST
t
pd
t
PLZ
/t
PZL
t
PHZ
/t
PZH
S1
open
7V
open
DEFINITIONS
Load capacitance includes jig and probe capacitance;
C
L
=
see AC CHARACTERISTICS for value.
SA00012
1998 Jan 16
5
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