74VCXH16244
LOW VOLTAGE CMOS 16-BIT BUS BUFFER (3-STATE INV.)
WITH 3.6V TOLERANT INPUTS AND OUTPUTS
s
s
s
s
s
s
s
s
s
3.6V TOLERANT INPUTS AND OUTPUTS
HIGH SPEED :
t
PD
= 2.5 ns (MAX.) at V
CC
= 3.0 to 3.6V
t
PD
= 3.0 ns (MAX.) at V
CC
= 2.3 to 2.7V
POWER DOWN PROTECTION ON INPUTS
AND OUTPUTS
SYMMETRICAL OUTPUT IMPEDANCE:
|I
OH
| = I
OL
= 24mA (MIN) at V
CC
= 3.0V
|I
OH
| = I
OL
= 18mA (MIN) at V
CC
= 2.3V
OPERATING VOLTAGE RANGE:
V
CC
(OPR) = 2.3V to 3.6V
PIN AND FUNCTION COMPATIBLE WITH
74 SERIES H16244
BUS HOLD PROVIDED ON DATA INPUTS
LATCH-UP PERFORMANCE EXCEEDS
300mA (JESD 17)
ESD PERFORMANCE:
HBM > 2000V (MIL STD 883 method 3015);
MM > 200V
TSSOP
ORDER CODES
PACKAGE
TSSOP
TUBE
T&R
74VCXH16244TTR
PIN CONNECTION
DESCRIPTION
The 74VCXH16244 is a low voltage CMOS 16 BIT
BUS BUFFER (NON INVERTED) fabricated with
sub-micron silicon gate and five-layer metal wiring
C
2
MOS technology. It is ideal for low power and
very high speed 2.3 to 3.6V applications; it can be
interfaced to 3.6V signal environment for both
inputs and outputs.
Any nG output control governs four BUS
BUFFERS. Output Enable input (nG) tied together
gives full 16-bit operation.
When nG is LOW, the outputs are on. When nG is
HIGH, the output are in high impedance state.
This device is designed to be used with 3 state
memory address drivers, etc. Bus hold on data
inputs is provided in order to eliminate the need for
external pull-up or pull-down resistor.
All inputs and outputs are equipped with
protection circuits against static discharge, giving
them 2KV ESD immunity and transient excess
voltage.
February 2003
1/11
74VCXH16244
INPUT AND OUTPUT EQUIVALENT CIRCUIT
PIN DESCRIPTION
PIN No
1
2, 3, 5, 6
8, 9, 11, 12
13, 14, 16, 17
19, 20, 22, 23
24
25
30, 29, 27, 26
36, 35, 33, 32
41, 40, 38, 37
47, 46, 44, 43
48
4, 10, 15, 21,
28, 34, 39, 45
7, 18, 31, 42
SYMBOL
1G
1Y1 to 1Y4
2Y1 to 2Y4
3Y1 to 3Y4
4Y1 to 4Y4
4G
3G
4A1 to 4A4
3A1 to 3A4
2A1 to 2A4
1A1 to 1A4
2G
GND
V
CC
NAME AND FUNCTION
Output Enable Input
Data Outputs
Data Outputs
Data Outputs
Data Outputs
Output Enable Input
Output Enable Input
Data Outputs
Data Outputs
Data Outputs
Data Outputs
Output Enable Input
Ground (0V)
Positive Supply Voltage
IEC LOGIC SYMBOLS
TRUTH TABLE
INPUTS
G
L
L
H
X : Don‘t Care
Z : High Impedance
OUTPUT
An
L
H
X
Yn
L
H
Z
2/11
74VCXH16244
ABSOLUTE MAXIMUM RATINGS
Symbol
V
CC
V
I
V
O
V
O
I
IK
I
OK
I
O
Supply Voltage
DC Input Voltage
DC Output Voltage (OFF State)
DC Output Voltage (High or Low State) (note 1)
DC Input Diode Current
DC Output Diode Current (note 2)
DC Output Current
Parameter
Value
-0.5 to +4.6
-0.5 to +4.6
-0.5 to +4.6
-0.5 to V
CC
+ 0.5
- 50
- 50
±
50
±
100
400
-65 to +150
300
Unit
V
V
V
V
mA
mA
mA
mA
mW
°C
°C
I
CC
or I
GND
DC V
CC
or Ground Current per Supply Pin
Power Dissipation
P
D
T
stg
T
L
Storage Temperature
Lead Temperature (10 sec)
Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is
not implied
1) I
O
absolute maximum rating must be observed
2) V
O
< GND, V
O
> V
CC
RECOMMENDED OPERATING CONDITIONS
Symbol
V
CC
V
I
V
O
V
O
I
OH
, I
OL
I
OH
, I
OL
T
op
dt/dv
Supply Voltage
Input Voltage
Output Voltage (OFF State)
Output Voltage (High or Low State)
High or Low Level Output Current (V
CC
= 3.0 to 3.6V)
High or Low Level Output Current (V
CC
= 2.3 to 2.7V)
Operating Temperature
Input Rise and Fall Time (note 1)
Parameter
Value
2.3 to 3.6
-0.3 to 3.6
0 to 3.6
0 to V
CC
±
24
±
18
-55 to 125
0 to 10
Unit
V
V
V
V
mA
mA
°C
ns/V
1) V
IN
from 0.8V to 2V at V
CC
= 3.0V
3/11
74VCXH16244
DC SPECIFICATIONS
(2.7V < V
CC
< 3.6V unless otherwise specified)
Test Condition
Symbol
Parameter
V
CC
(V)
-40 to 85 °C
Min.
2.0
2.7 to 3.6
0.8
2.7 to 3.6
2.7
3.0
V
OL
Low Level Output
Voltage
2.7 to 3.6
2.7
3.0
I
I
I
I(HOLD)
Input Leakage
Current
Input Hold Current
2.7 to 3.6
3.0
3.6
I
off
I
OZ
Power Off Leakage
Current
High Impedance
Output Leakage
Current
Quiescent Supply
Current
I
CC
incr. per Input
0
2.7 to 3.6
I
O
=-100
µA
I
O
=-12 mA
I
O
=-18 mA
I
O
=-24 mA
I
O
=100
µA
I
O
=12 mA
I
O
=18 mA
I
O
=24 mA
V
I
= V
CC
or GND
V
I
= 0.8V
V
I
= 2V
V
I
= 0 to 3.6V
V
I
or V
O
= 0 to 3.6V
V
I
= V
IH
or V
IL
V
O
= 0 to 3.6V
V
I
= V
CC
or GND
V
I
or V
O
= V
CC
to
3.6V
V
IH
= V
CC
- 0.6V
75
-75
±
500
10
±
10
20
±
20
750
V
CC
-0.2
2.2
2.4
2.2
0.2
0.4
0.4
0.55
±
5
75
-75
±
500
10
±
10
20
±
20
750
µA
µA
µA
µA
µA
V
CC
-0.2
2.2
2.4
2.2
0.2
0.4
0.4
0.55
±
5
µA
V
V
0.8
Max.
Value
-55 to 125 °C
Min.
2.0
V
Max.
Unit
V
IH
V
IL
V
OH
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
I
CC
2.7 to 3.6
2.7 to 3.6
∆I
CC
4/11
74VCXH16244
DC SPECIFICATIONS
(2.3V < V
CC
< 2.7V unless otherwise specified)
Test Condition
Symbol
Parameter
V
CC
(V)
-40 to 85 °C
Min.
1.6
2.3 to 2.7
0.7
2.3 to 2.7
2.3
V
OL
Low Level Output
Voltage
2.3 to 2.7
2.3
I
I
I
I(HOLD)
I
off
I
OZ
Input Leakage
Current
Input Hold Current
Power Off Leakage
Current
High Impedance
Output Leakage
Current
Quiescent Supply
Current
2.3 to 2.7
2.3
0
2.3 to 2.7
I
O
=-100
µA
I
O
=-6 mA
I
O
=-12 mA
I
O
=-18 mA
I
O
=100
µA
I
O
=12 mA
I
O
=18 mA
V
I
= V
CC
or GND
V
I
= 0.7V
V
I
= 1.7V
V
I
or V
O
= 0 to 3.6V
V
I
= V
IH
or V
IL
V
O
= 0 to 3.6V
V
I
= V
CC
or GND
V
I
or V
O
= V
CC
to
3.6V
45
-45
10
±
10
20
±
20
V
CC
-0.2
2.0
1.8
1.7
0.2
0.4
0.6
±
5
45
-45
10
±
10
20
±
20
µA
V
CC
-0.2
2.0
1.8
1.7
0.2
0.4
0.6
±
5
µA
µA
µA
µA
V
V
0.7
Max.
Value
-55 to 125 °C
Min.
1.6
V
Max.
Unit
V
IH
V
IL
V
OH
High Level Input
Voltage
Low Level Input
Voltage
High Level Output
Voltage
I
CC
2.3 to 2.7
DYNAMIC SWITCHING CHARACTERISTICS
(T
a
= 25°C, Input t
r
= t
f
= 2.0ns, C
L
= 30pF, R
L
= 500Ω)
Test Condition
Symbol
Parameter
V
CC
(V)
2.5
3.3
2.5
3.3
2.5
3.3
V
IL
= 0V
V
IH
= V
CC
V
IL
= 0V
V
IH
= V
CC
V
IL
= 0V
V
IH
= V
CC
Value
T
A
= 25 °C
Min.
Typ.
0.6
0.8
-0.6
-0.8
1.9
2.2
Max.
V
V
V
Unit
V
OLP
V
OLV
V
OHV
Dynamic Low Voltage Quiet
Output (note 1, 3)
Dynamic Low Voltage Quiet
Output (note 1, 3)
Dynamic High Voltage Quiet
Output (note 2, 3)
1) Number of outputs defined as "n". Measured with "n-1" outputs switching from HIGH to LOW or LOW to HIGH. The remaining output is
measured in the LOW state.
2) Number of outputs defined as "n". Measured with "n-1" outputs switching from HIGH to LOW or LOW to HIGH. The remaining output is
measured in the HIGH state.
3) Parameters guaranteed by design.
5/11
NXP MCU
