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AD7874AN

4-CH 12-BIT SUCCESSIVE APPROXIMATION ADC, PARALLEL ACCESS, PDIP28, 0.600 INCH, PLASTIC, DIP-28

器件类别:模拟混合信号IC    转换器   

厂商名称:Rochester Electronics

厂商官网:https://www.rocelec.com/

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器件参数
参数名称
属性值
是否无铅
含铅
是否Rohs认证
不符合
厂商名称
Rochester Electronics
零件包装代码
DIP
包装说明
DIP,
针数
28
Reach Compliance Code
unknown
最大模拟输入电压
10 V
最小模拟输入电压
-10 V
最长转换时间
35 µs
转换器类型
ADC, SUCCESSIVE APPROXIMATION
JESD-30 代码
R-PDIP-T28
JESD-609代码
e0
长度
37.4 mm
最大线性误差 (EL)
0.024%
湿度敏感等级
NOT APPLICABLE
标称负供电电压
-5 V
模拟输入通道数量
4
位数
12
功能数量
1
端子数量
28
最高工作温度
85 °C
最低工作温度
-40 °C
输出位码
2'S COMPLEMENT BINARY
输出格式
PARALLEL, WORD
封装主体材料
PLASTIC/EPOXY
封装代码
DIP
封装形状
RECTANGULAR
封装形式
IN-LINE
峰值回流温度(摄氏度)
NOT APPLICABLE
采样速率
0.029 MHz
采样并保持/跟踪并保持
TRACK
座面最大高度
6.35 mm
标称供电电压
5 V
表面贴装
NO
技术
BICMOS
温度等级
INDUSTRIAL
端子面层
TIN LEAD
端子形式
THROUGH-HOLE
端子节距
2.54 mm
端子位置
DUAL
处于峰值回流温度下的最长时间
NOT APPLICABLE
宽度
15.24 mm
Base Number Matches
1
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LC MOS 4-Channel, 12-Bit Simultaneous
Sampling Data Acquisition System
AD7874
FUNCTIONAL BLOCK DIAGRAM
INT
CS
2
FEATURES
Four On-Chip Track/Hold Amplifiers
Simultaneous Sampling of 4 Channels
Fast 12-Bit ADC with 8 s Conversion Time/Channel
29 kHz Sample Rate for All Four Channels
On-Chip Reference
10 V Input Range
5 V Supplies
APPLICATIONS
Sonar
Motor Controllers
Adaptive Filters
Digital Signal Processing
RD CONVST
V
DD
V
DD
CONTROL LOGIC
V
IN1
TRACK/
HOLD 1
TRACK/
HOLD 2
MUX
V
IN3
TRACK/
HOLD 3
TRACK/
HOLD 4
INTERNAL
CLOCK
CLK
V
IN2
COMP
SAR
DATA
REGISTERS
REFERENCE
BUFFER
12-BIT
DAC
DB0
DB11
V
IN4
REF IN
AD7874
GENERAL DESCRIPTION
The AD7874 is a four-channel simultaneous sampling, 12-bit
data acquisition system. The part contains a high speed 12-bit
ADC, on-chip reference, on-chip clock and four track/hold am-
plifiers. This latter feature allows the four input channels to be
sampled simultaneously, thus preserving the relative phase
information of the four input channels, which is not possible if
all four channels share a single track/hold amplifier. This makes
the AD7874 ideal for applications such as phased-array sonar
and ac motor controllers where the relative phase information is
important.
The aperture delay of the four track/hold amplifiers is small and
specified with minimum and maximum limits. This allows sev-
eral AD7874s to sample multiple input channels simultaneously
without incurring phase errors between signals connected to
several devices. A reference output/reference input facility also
allows several AD7874s to be driven from the same reference
source.
In addition to the traditional dc accuracy specifications such as
linearity, full-scale and offset errors, the AD7874 is also fully
specified for dynamic performance parameters including distor-
tion and signal-to-noise ratio.
The AD7874 is fabricated in Analog Devices’ Linear Compat-
ible CMOS (LC
2
MOS) process, a mixed technology process
that combines precision bipolar circuits with low-power CMOS
logic. The part is available in a 28-pin, 0.6" wide, plastic or her-
metic dual-in-line package (DIP), in a 28-terminal leadless ce-
ramic chip carrier (LCCC) and in a 28-pin SOIC.
3V
REFERENCE
AGND DGND
V
SS
REF OUT
PRODUCT HIGHLIGHTS
1. Simultaneous Sampling of Four Input Channels.
Four input channels, each with its own track/hold amplifier,
allow simultaneous sampling of input signals. Track/hold ac-
quisition time is 2
µs,
and the conversion time per channel is
8
µs,
allowing 29 kHz sample rate for all four channels.
2. Tight Aperture Delay Matching.
The aperture delay for each channel is small and the aperture
delay matching between the four channels is less than 4 ns.
Additionally, the aperture delay specification has upper and
lower limits allowing multiple AD7874s to sample more than
four channels.
3. Fast Microprocessor Interface.
The high speed digital interface of the AD7874 allows direct
connection to all modern 16-bit microprocessors and digital
signal processors.
REV. C
Information furnished by Analog Devices is believed to be accurate and
reliable. However, no responsibility is assumed by Analog Devices for its
use, nor for any infringements of patents or other rights of third parties
which may result from its use. No license is granted by implication or
otherwise under any patent or patent rights of Analog Devices.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 617/329-4700
Fax: 617/326-8703
AD7874–SPECIFICATIONS
Parameter
SAMPLE-AND-HOLD
Acquisition Time
2
to 0.01%
Droop Rate
2, 3
–3 dB Small Signal Bandwidth
3
Aperture Delay
2
Aperture Jitter
2, 3
Aperture Delay Matching
2
SAMPLE-AND-HOLD AND ADC
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio
Total Harmonic Distortion
Peak Harmonic or Spurious Noise
Intermodulation Distortion
2nd Order Terms
3rd Order Terms
Channel-to-Channel Isolation
2
DC ACCURACY
Resolution
Relative Accuracy
Differential Nonlinearity
Positive Full-Scale Error
4
Negative Full-Scale Error
4
Full-Scale Error Match
Bipolar Zero Error
Bipolar Zero Error Match
ANALOG INPUTS
Input Voltage Range
Input Current
REFERENCE OUTPUTS
REF OUT
REF OUT Error @ +25°C
T
MIN
to T
MAX
REF OUT Temperature Coefficient
Reference Load Change
REFERENCE INPUT
Input Voltage Range
Input Current
Input Capacitance
3
LOGIC INPUTS
Input High Voltage, V
INH
Input Low Voltage, V
INL
Input Current, I
IN
Input Capacitance, C
IN3
LOGIC OUTPUTS
Output High Voltage, V
OH
Output Low Voltage, V
OL
DB0–DB11
Floating-State Leakage Current
Floating-State Output Capacitance
Output Coding
POWER REQUIREMENTS
V
DD
V
SS
I
DD
I
SS
Power Dissipation
2
1
500
0
40
200
4
2
1
500
0
40
200
4
(V
DD
= +5 V, V
SS
= –5 V, AGND = DGND = 0 V, REF IN = +3 V, f
CLK
= 2.5 MHz
external. All specifications T
MIN
to T
MAX
unless otherwise noted.)
Test Conditions/Comments
A Version B Version S Version Units
2
2
500
0
40
200
4
µs
max
mV/ms max
kHz typ
ns min
ns max
ps typ
ns max
V
IN
= 500 mV p-p
70
–78
–78
–80
–80
–80
12
±
1
±
1
±
5
±
5
5
±
5
4
±
10
±
600
3
±
0.33
±
1
±
35
±
1
71
–80
–80
–80
–80
–80
12
±
1/2
±
1
±
5
±
5
5
±
5
4
±
10
±
600
3
±
0.33
±
1
±
35
±
1
70
–78
–78
–80
–80
–80
12
±
1
±
1
±
5
±
5
5
±
5
4
±
10
±
600
3
±
0.33
±
1
±
35
±
2
dB min
dB max
dB max
dB max
dB max
dB max
Bits
LSB max
LSB max
LSB max
LSB max
LSB max
LSB max
LSB max
Volts
µA
max
V nom
% max
% max
ppm/°C typ
mV max
f
IN
= 10 kHz Sine Wave, f
SAMPLE
= 29 kHz
f
IN
= 10 kHz Sine Wave, f
SAMPLE
= 29 kHz
f
IN
= 10 kHz Sine Wave, f
SAMPLE
= 29 kHz
fa = 9 kHz, fb = 9.5 kHz, f
SAMPLE
= 29 kHz
No Missing Codes Guaranteed
Any Channel
Any Channel
Between Channels
Any Channel
Between Channels
Reference Load Current Change (0–500
µA)
Reference Load Should Not Be Changed During Conversion
2.85/3.15
±
1
10
2.4
0.8
±
10
10
4.0
0.4
±
10
10
2.85/3.15
±
1
10
2.4
0.8
±
10
10
4.0
0.4
2.85/3.15
±
1
10
2.4
0.8
±
10
10
4.0
0.4
V min/V max 3 V
±
5%
µA
max
pF max
V min
V max
µA
max
pF max
V min
V max
µA
max
pF max
V
DD
= 5 V
±
5%
V
DD
= 5 V
±
5%
V
IN
= 0 V to V
DD
V
DD
= 5 V
±
5%; I
SOURCE
= 40
µA
V
DD
= 5 V
±
5%; I
SINK
= 1–6 mA
V
IN
= 0 V to V
DD
±
10
±
10
10
10
2s COMPLEMENT
+5
–5
18
12
150
+5
–5
18
12
150
+5
–5
18
12
150
V nom
V nom
mA max
mA max
mW max
±
5% for Specified Performance
±
5% for Specified Performance
CS
=
RD
=
CONVST
= +5 V; Typically 12 mA
CS
=
RD
=
CONVST
= +5 V; Typically 8 mA
CS
=
RD
=
CONVST
= +5 V; Typically 100 mW
NOTES
1
Temperature ranges are as follows: A, B Versions: –40°C to +85°C; S Version: –55°C to +125°C.
2
See Terminology.
3
Sample tested @ +25°C to ensure compliance.
4
Measured with respect to the REF IN voltage and includes bipolar offset error.
5
For capacitive loads greater than 50 pF a series resistor is required.
Specifications subject to change without notice.
–2–
REV. C
AD7874
TIMING CHARACTERISTICS
Parameter
t
1
t
2
t
3
t
4
t
5
t
6 2
t
7 3
t
8
t
CONV
A, B Versions
50
0
60
0
60
57
5
45
130
31
32.5
31
35
10
1
(V
DD
= +5 V
5%, V
SS
= –5 V
otherwise noted.)
S Version
50
0
70
0
60
70
5
50
150
31
32.5
31
35
10
5%, AGND = DGND = O V, t
CLK
= 2.5 MHz external unless
Units
ns min
ns min
ns min
ns min
ns max
ns max
ns min
ns max
ns min
µs
min
µs
max
µs
min
µs
max
µs
max
Conditions/Comments
CONVST
Pulse Width
CS
to
RD
Setup Time
RD
Pulse Width
CS
to
RD
Hold Time
RD
to
INT
Delay
Data Access Time after
RD
Bus Relinquish Time after
RD
Delay Time between Reads
CONVST
to
INT,
External Clock
CONVST
to
INT,
External Clock
CONVST
to
INT,
Internal Clock
CONVST
to
INT,
Internal Clock
Minimum Input Clock Period
t
CLK
NOTES
1
Timing Specifications in
bold print
are 100% production tested. All other times are sample tested at +25°C to ensure compliance. All input signals are specified with
tr = tf = 5 ns (10% to 90% of +5 V) and timed from a voltage level of 1.6 V.
2
t
6
is measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
3
t
7
is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 2. The measured number is then extrapolated
back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t
7
, quoted in the timing characteristics is the true bus relinquish
time of the part and as such is independent of external bus loading capacitances.
Specifications subject to change without notice.
1.6mA
ABSOLUTE MAXIMUM RATINGS*
(T
A
= +25°C unless otherwise noted)
V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
V
SS
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V
AGND to DGND . . . . . . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
V
IN
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –15 V to +15 V
REF OUT to AGND . . . . . . . . . . . . . . . . . . . . . . . 0 V to V
DD
Digital Inputs to DGND . . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Digital Outputs to DGND . . . . . . . . . . –0.3 V to V
DD
+ 0.3 V
Operating Temperature Range
Commercial (A, B Versions) . . . . . . . . . . . –40°C to +85°C
Extended (S Version) . . . . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 secs) . . . . . . . . . . . +300°C
Power Dissipation (Any Package) to +75°C . . . . . . 1,000 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 10 mW/°C
*Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those listed in the
operational sections of this specifications is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
TO OUTPUT
PIN
+ 2.1V
50pF
200µA
Figure 1. Load Circuit for Access Time
1.6mA
TO OUTPUT
PIN
+ 2.1V
50pF
200µA
Figure 2. Load Circuit for Bus Relinquish Time
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7874 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
WARNING!
ESD SENSITIVE DEVICE
REV. C
–3–
AD7874
TERMINOLOGY
ACQUISITION TIME
PIN CONFIGURATIONS
DIP and SOIC
Acquisition Time is the time required for the output of the
track/hold amplifiers to reach their final values, within
±
1/2
LSB, after the falling edge of
INT
(the point at which the track/
holds return to track mode). This includes switch delay time,
slewing time and settling time for a full-scale voltage change.
APERTURE DELAY
V
IN1
V
IN2
V
DD
INT
CONVST
RD
CS
CLK
V
DD
DB11 (MSB)
1
2
3
4
5
6
7
8
9
10
28 V
IN4
27 V
IN3
26 V
SS
25 REF OUT
24 REF IN
23 AGND
22 DB0 (LSB)
TOP VIEW
(Not to Scale) 21 DB1
20 DB2
19 DB3
18 DB4
17 DB5
16 DB6
15 DB7
Aperture Delay is defined as the time required by the internal
switches to disconnect the hold capacitors from the inputs. This
produces an effective delay in sample timing. It is measured by
applying a step input and adjusting the
CONVST
input position
until the output code follows the step input change.
APERTURE DELAY MATCHING
AD7874
Aperture Delay Matching is the maximum deviation in aperture
delays across the four on-chip track/hold amplifiers.
APERTURE JITTER
DB10 11
DB9 12
DB8 13
DGND 14
Aperture Jitter is the uncertainty in aperture delay caused by
internal noise and variation of switching thresholds with signal
level.
V
DD
LCCC
V
IN1
V
IN4
V
IN3
V
IN2
INT
V
SS
DROOP RATE
Droop Rate is the change in the held analog voltage resulting
from leakage currents.
CONVST
5
6
7
8
9
4
3
2
1 28 27 26
25 REF OUT
24 REF IN
CHANNEL-TO-CHANNEL ISOLATION
RD
CS
CLK
V
DD
Channel-to-Channel Isolation is a measure of the level of
crosstalk between channels. It is measured by applying a full-
scale 1 kHz signal to the other three inputs. The figure given is
the worst case across all four channels.
SNR, THD, IMD
AD7874
TOP VIEW
(Not to Scale)
23 AGND
22 DB0 (LSB)
21 DB1
20 DB2
19 DB3
DB11 (MSB) 10
DB10 11
12 13 14 15 16 17 18
DGND
DB7
DB6
DB8
DB9
DB5
DB4
See DYNAMIC SPECIFICATIONS section.
–4–
REV. C
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L0 L1 L2 L3 L4 L5 L6 L7 L8 L9 LA LB LC LD LE LF LG LH LI LJ LK LL LM LN LO LP LQ LR LS LT LU LV LW LX LY LZ M0 M1 M2 M3 M4 M5 M6 M7 M8 M9 MA MB MC MD ME MF MG MH MI MJ MK ML MM MN MO MP MQ MR MS MT MU MV MW MX MY MZ N0 N1 N2 N3 N4 N5 N6 N7 N8 NA NB NC ND NE NF NG NH NI NJ NK NL NM NN NO NP NQ NR NS NT NU NV NX NZ O0 O1 O2 O3 OA OB OC OD OE OF OG OH OI OJ OK OL OM ON OP OQ OR OS OT OV OX OY OZ P0 P1 P2 P3 P4 P5 P6 P7 P8 P9 PA PB PC PD PE PF PG PH PI PJ PK PL PM PN PO PP PQ PR PS PT PU PV PW PX PY PZ Q1 Q2 Q3 Q4 Q5 Q6 Q8 Q9 QA QB QC QE QF QG QH QK QL QM QP QR QS QT QV QW QX QY R0 R1 R2 R3 R4 R5 R6 R7 R8 R9 RA RB RC RD RE RF RG RH RI RJ RK RL RM RN RO RP RQ RR RS RT RU RV RW RX RY RZ
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