— Device generates data output voltages and tolerates
data input voltages as determined by the voltage on
the V
IO
pin
— 1.8V compatible I/O signals
Simultaneous Read/Write operation
— Data can be continuously read from one bank while
executing erase/program functions in other bank
— Zero latency between read and write operations
— Four bank architecture:
128 Mb has 16/48/48/16 Mbit banks
64 Mb has 8/24/24/8 Mbit banks
Programable Burst Interface
— 2 Modes of Burst Read Operation
— Linear Burst: 8, 16, and 32 words with wrap-around
— Continuous Sequential Burst
SecSi
TM
(Secured Silicon) Sector region
— Up to 128 words accessible through a command
sequence
— Up to 64 factory-locked words
— Up to 64 customer-lockable words
Sector Architecture
— Banks A and D each contain both 4 Kword sectors
and 32 Kword sectors; Banks B and C contain ninety-
six 32 Kword sectors
— Sixteen 4 Kword boot sectors
Half of the boot sectors are at the top of the address
range; half are at the bottom of address range
100,000 erase cycles per sector typical
20 year data retention typical
80-ball FBGA package (128 Mb) or 64-ball FBGA
(64 Mb) package
Power dissipation (typical values, C
L
= 30 pF)
— Burst Mode Read: 10 mA
— Simultaneous Operation: 25 mA
— Program/Erase: 15 mA
— Standby mode: 0.2 µA
PRELIMINARY
INFORMATION
Hardware Features
Handshaking feature
— Provides host system with minimum possible latency
by monitoring RDY
— Reduced Wait-state handshaking option further
reduces initial access cycles required for burst
accesses beginning on even addresses
Hardware reset input (RESET#)
— Hardware method to reset the device for reading
array data
WP# input
— Write protect (WP#) function allows protection of the
four highest and four lowest 4 kWord boot sectors,
regardless of sector protect status
Persistent Sector Protection
— A command sector protection method to lock
combinations of individual sectors and sector groups
to prevent program or erase operations within that
sector
— Sectors can be locked and unlocked in-system at V
CC
level
Password Sector Protection
— A sophisticated sector protection method to lock
combinations of individual sectors and sector groups
to prevent program or erase operations within that
sector using a user-defined 64-bit password
ACC input: Acceleration function reduces
programming time; all sectors locked when ACC =
V
IL
CMOS compatible inputs, CMOS compatible outputs
Low V
CC
write inhibit
Performance Characteristics
Read access times at 75/66/54 MHz (C
L
=30 pF)
— Burst access times of 9.3/11/13.5 ns at industrial
temperature range
— Synchronous latency of 49/56/69 ns
— Asynchronous random access times of 45/50/55 ns
Software Features
Supports Common Flash Memory Interface (CFI)
Software command set compatible with JEDEC
42.4 standards
— Backwards compatible with Am29F and Am29LV
families
Publication Number
27024
Revision
A
Amendment
5
Issue Date
June 18, 2004
This document contains information on a product under development at FASL LLC. The information is intended to help you evaluate this product. FASL LLC reserves the
right to change or discontinue work on this proposed product without notice.
P r e l i m i n a r y
I n f o r m a t i o n
Data# Polling and toggle bits
— Provides a software method of detecting program
and erase operation completion
Erase Suspend/Resume
— Suspends an erase operation to read data from, or
program data to, a sector that is not being erased,
then resumes the erase operation
Unlock Bypass Program command
— Reduces overall programming time when issuing
multiple program command sequences
Burst Suspend/Resume
— Suspends a burst operation to allow system use of
the address and data bus, than resumes the burst at
the previous state
2
Am29BDS128H/Am29BDS064H
27024_A5_00_E June 18, 2004
P r e l i m i n a r y
I n f o r m a t i o n
General Description
The Am29BDS128H/Am29BDS064H is a 128 or 64 Mbit, 1.8 Volt-only, simulta-
neous Read/Write, Burst Mode Flash memory device, organized as 8,388,608 or
4,194,304 words of 16 bits each. This device uses a single V
CC
of 1.65 to 1.95 V
to read, program, and erase the memory array. A 12.0-volt V
HH
on ACC may be
used for faster program performance if desired. The device can also be pro-
grammed in standard EPROM programmers.
At 75 MHz, the device provides a burst access of 9.3 ns at 30 pF with a latency
of 49 ns at 30 pF. At 66 MHz, the device provides a burst access of 11 ns at 30
pF with a latency of 56 ns at 30 pF. At 54 MHz, the device provides a burst access
of 13.5 ns at 30 pF with a latency of 69ns at 30 pF. The device operates within
the industrial temperature range of -40°C to +85°C. The device is offered in
FBGA packages.
The Simultaneous Read/Write architecture provides
simultaneous operation
by dividing the memory space into four banks. The device can improve overall
system performance by allowing a host system to program or erase in one bank,
then immediately and simultaneously read from another bank, with zero latency.
This releases the system from waiting for the completion of program or erase op-
erations.
The device is divided as shown in the following table:
Quantity
Bank
A
B
C
D
128 Mb
8
31
96
96
31
8
64 Mb
8
15
48
48
15
8
Size
4 Kwords
32 Kwords
32 Kwords
32 Kwords
32 Kwords
4 Kwords
The VersatileIO™ (V
IO
) control allows the host system to set the voltage levels
that the device generates at its data outputs and the voltages tolerated at its data
inputs to the same voltage level that is asserted on the V