Voltage Regulators
AN79Lxx/AN79LxxM Series
3-pin negative output voltage regulator (100 mA type)
■
Overview
The AN79Lxx series and the AN79LxxM series are
3-pin, fixed negative output type monolithic voltage
regulators.
Stabilized fixed output voltage is obtained from un-
stable DC input voltage without using any external compo-
nents. 12 types of output voltage are available:
−4V, −5V,
−6V, −7V, −8V, −9V, −10V, −12V, −15V, −18V, −20V
and
−24V.
They can be used widely in power circuits with
current capacity of up to 100mA.
AN79Lxx series
5.0±0.2
5.1±0.2
Unit: mm
4.0±0.2
(1.0)
2.3±0.2
0.6±0.15
(1.0)
13.5±0.5
0.43
+0.1
–0.05
0.43
+0.1
–0.05
■
Features
•
No external components
•
Output voltage:
−4V, −5V, −6V, −7V, −8V, −9V,−10V,
−12V, −15V, −18V, −20V, −24V
•
Built-in overcurrent limit circuit
•
Built-in thermal overload protection circuit
2.54
2 3 1
1 : Output
2 : Common
3 : Intput
SSIP003-P-0000
AN79LxxM series
4.6 max.
1.8 max.
Unit: mm
1.6 max.
2.6 typ.
0.48 max.
1.5
3.0
0.58 max.
1.5
0.8 min.
4.25 max.
2.6 max.
0.44 max.
3
2
1
1 : Common
2 : Input
3 : Output
HSIP003-P-0000B
Note) The packages (SSIP003-P-0000 and HSIP003-
P-0000B) of this product will be changed to
lead-free type (SSIP003-P-0000S and
2
R
1
+
Voltage
Reference
Error Amp.
■
Block Diagram
(AN79Lxx series)
Common
HSIP003-P-0000Q). See the new package di-
(1)
mensions section later of this datasheet.
−
R
2
1
Q
1
Output
(3)
Starter
Thermal
Protection
Current
Limiter
R
SC
Pass Tr.
3
Input
(2)
Note) The number in ( ) shows the pin number for the AN79LxxM series.
Publication date: June 2004
SFF00006DEB
1
AN79Lxx/AN79LxxM Series
■
Absolute Maximum Ratings at T
a
=
25°C
Parameter
Input voltage
Power dissipation
Operating ambient temperature
Storage temperature
AN79Lxx series
AN79LxxM series
Symbol
V
I
P
D
T
opr
T
stg
Rating
−35
*
1
−40
*
2
650 *
3
−20
to
+80
−55
to
+150
−55
to
+125
Unit
V
V
mW
°C
°C
*1 AN79L04, AN79L05/M, AN79L06, AN79L07/M, AN79L08/M, AN79L09/M, AN79L10/M, AN79L12/M, AN79L15/M, AN79L18
*2 AN79L20, AN79L24
*3 Follow the derating curve. When T
j
exceeds 150°C, the internal circuit cuts off the output.
AN79LxxM series is mounted on a standard board (glass epoxy: 20mm
×
20mm
×
t1.7mm with Cu foil of 1cm
2
or more).
■
Electrical Characteristics at T
a
=
25°C
•
AN79L04 (−4V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −7
to
−19V,
I
O
=
1 to 70mA
V
I
= −6
to
−20V,
T
j
=
25°C
V
I
= −7
to
−17V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −7
to
−19V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −7
to
−17V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA
55
0.8
200
−
0.4
Conditions
Min
−3.84
−3.8
Typ
−4
Max
−4.16
−4.2
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
80
40
10
4.5
60
30
5
0.5
0.1
3
38
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −9V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C
2
SFF00006DEB
AN79Lxx/AN79LxxM Series
■
Electrical Characteristics at T
a
=
25°C (continued)
•
AN79L05, AN79L05M (−5V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −8
to
−20V,
I
O
=
1 to 70mA
V
I
= −7
to
−21V,
T
j
=
25°C
V
I
= −8
to
−18V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −8
to
−20V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −8
to
−18V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA
55
0.8
200
−
0.4
40
11
5
3
Conditions
Min
−4.8
−4.75
Typ
−5
Max
−5.2
−5.25
100
50
60
30
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −10V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C (AN79L05) and T
j
=
0 to 100°C
(AN79L05M)
•
AN79L06 (−6V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −9
to
−21V,
I
O
=
1 to 70mA
V
I
= −8
to
−22V,
T
j
=
25°C
V
I
= −9
to
−19V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −9
to
−21V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −9
to
−19V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA
55
0.8
200
−
0.4
44
12
5.5
3
Conditions
Min
−5.76
−5.7
Typ
−6
Max
−6.24
−6.3
120
60
60
30
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −11V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C
SFF00006DEB
3
AN79Lxx/AN79LxxM Series
■
Electrical Characteristics at T
a
=
25°C (continued)
•
AN79L07, AN79L07M (−7V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −10
to
−22V,
I
O
=
1 to 70mA
V
I
= −9
to
−23V,
T
j
=
25°C
V
I
= −10
to
−20V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −10
to
−22V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −10
to
−20V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA
54
0.8
200
−
0.5
48
13
6
3
Conditions
Min
−6.72
−6.65
Typ
−7
Max
−7.28
−7.35
140
70
70
40
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −12V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C (AN79L07) and T
j
=
0 to 100°C
(AN79L07M)
•
AN79L08, AN79L08M (−8V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −11
to
−23V,
I
O
=
1 to 70mA
V
I
= −10
to
−24V,
T
j
=
25°C
V
I
= −11
to
−21V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −11
to
−23V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −11
to
−21V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA, T
j
=
0 to 125°C
54
0.8
200
−
0.6
52
15
7
3
Conditions
Min
−7.68
−7.6
Typ
−8
Max
−8.32
−8.4
160
80
80
40
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −14V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C (AN79L08) and T
j
=
0 to 100°C
(AN79L08M)
4
SFF00006DEB
AN79Lxx/AN79LxxM Series
■
Electrical Characteristics at T
a
=
25°C (continued)
•
AN79L09, AN79L09M (−9V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −12
to
−24V,
I
O
=
1 to 70mA
V
I
= −11
to
−25V,
T
j
=
25°C
V
I
= −12
to
−22V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −12
to
−24V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −12
to
−22V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA, T
j
=
0 to 125°C
53
0.8
200
−
0.6
58
16
8
3
Conditions
Min
−8.64
−8.55
Typ
−9
Max
−9.36
−9.45
160
80
90
50
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −15V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C (AN79L09) and T
j
=
0 to 100°C
(AN79L09M)
•
AN79L10, AN79L10M (−10V type)
Parameter
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Symbol
V
O
V
O
REG
IN
REG
L
I
Bias
∆I
Bias(IN)
∆I
Bias(L)
V
no
RR
V
DIF(min)
I
O(Short)
∆V
O
/T
a
T
j
=
25°C
V
I
= −13
to
−25V,
I
O
=
1 to 70mA
V
I
= −12
to
−26V,
T
j
=
25°C
V
I
= −13
to
−23V,
T
j
=
25°C
I
O
=
1 to 100mA, T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
T
j
=
25°C
V
I
= −13
to
−25V,
T
j
=
25°C
I
O
=
1 to 40mA, T
j
=
25°C
f
=
10Hz to 100kHz, T
a
=
25°C
V
I
= −13
to
−23V,
f
=
120Hz, T
a
=
25°C
T
j
=
25°C
V
I
= −35V,
T
j
=
25°C
I
O
=
5mA
53
0.8
200
−
0.7
65
17
9
3
Conditions
Min
−9.6
−9.5
Typ
−10
Max
−10.4
−10.5
160
80
100
50
5
0.5
0.1
Unit
V
V
mV
mV
mV
mV
mA
mA
mA
µV
dB
V
mA
mV/°C
Note 1) The specified condition T
j
=
25°C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
= −16V,
I
O
=
40mA, C
I
=
2µF, C
O
=
1µF, T
j
=
0 to 125°C (AN79L10) and T
j
=
0 to 100°C
(AN79L10M)
SFF00006DEB
5
微控制器 MCU
