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AS7C34096A-15TCNTR

sram 4M, 3.3V, 15ns, fast 512k x 8 asynch sram

器件类别:半导体    其他集成电路(IC)   

厂商名称:All Sensors

器件标准:  

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器件参数
参数名称
属性值
Manufacture
Alliance Memory
产品种类
Product Category
SRAM
RoHS
Yes
Memory Size
4 Mbi
Organizati
512 k x 8
系列
Packaging
Reel
工厂包装数量
Factory Pack Quantity
1000
文档预览
August 2004
®
AS7C34096A
3.3V 512K × 8 CMOS SRAM
Features
• Pin compatible to AS7C34096
• Industrial and commercial temperature
• Organization: 524,288 words × 8 bits
• Center power and ground pins
• High speed
- 10/12/15/20 ns address access time
- 4/5/6/7 ns output enable access time
• Equal access and cycle times
• Easy memory expansion with CE, OE inputs
• TTL-compatible, three-state I/O
• JEDEC standard packages
• ESD protection
2000 volts
• Latch-up current
200 mA
- 400 mil 36-pin SOJ
- 44-pin TSOP 2
• Low power consumption: ACTIVE
- 650 mW / max @ 10 ns
Pin arrangement
s
36-pin SOJ (400 mil)
A0
A1
A2
A3
A4
CE
I/O1
I/O2
V
CC
GND
I/O3
I/O4
WE
A5
A6
A7
A8
A9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
36
35
34
33
32
31
30
29
28
27
26
25
24
23
22
21
20
19
NC
A18
A17
A16
A15
OE
I/O8
I/O7
GND
V
CC
I/O6
I/O5
A14
A13
A12
A11
A10
NC
• Low power consumption: STANDBY
- 28.8 mW / max CMOS
Logic block diagram
V
CC
GND
Input buffer
A0
A1
A2
A3
A4
A5
A6
A7
A8
A9
Row decoder
524,288 × 8
Array
(4,194,304)
Sense amp
I/O1
44-pin TSOP 2
I/O8
NC
NC
A0
A1
A2
A3
A4
CE
I/O1
I/O2
V
CC
GND
I/O3
I/O4
WE
A5
A6
A7
A8
A9
NC
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
NC
NC
NC
A18
A17
A16
A15
OE
I/O8
I/O7
GND
V
CC
I/O6
I/O5
A14
A13
A12
A11
A10
NC
NC
NC
Column decoder
A10
A11
A12
A13
A14
A15
A16
A17
A18
Control
Circuit
WE
OE
CE
Selection guide
Maximum address access time
Maximum outputenable access time
Maximum operating current
Maximum CMOS standby current
Industrial
Commercial
–10
10
4
180
170
8
–12
12
5
160
150
8
–15
15
6
140
130
8
–20
20
7
110
100
8
Unit
ns
ns
mA
mA
mA
8/17/04, v. 2.1
Alliance Semiconductor
P. 1 of 9
Copyright © Alliance Semiconductor. All rights reserved.
AS7C34096A
®
Functional description
The AS7C34096A is a high-performance CMOS 4,194,304-bit Static Random Access Memory (SRAM) device organized as
524,288 words × 8 bits. It is designed for memory applications where fast data access, low power, and simple interfacing are
desired.
Equal address access and cycle times (t
AA
, t
RC
, t
WC
) of 10/12/15/20 ns with output enable access times (t
OE
) of 4/5/6/7 ns are
ideal for high-performance applications. The chip enable input CE permits easy memory expansion with multiple-bank memory
systems.
When CE is high the device enters standby mode. The device is guaranteed not to exceed 28.8mW power consumption in
CMOS standby mode.
A write cycle is accomplished by asserting write enable (WE) and chip enable (CE). Data on the input pins I/O1–I/O8 is written
on the rising edge of WE (write cycle 1) or CE (write cycle 2). To avoid bus contention, external devices should drive I/O pins
only after outputs have been disabled with output enable (OE) or write enable (WE).
A read cycle is accomplished by asserting output enable (OE) and chip enable (CE), with write enable (WE) high. The chip
drives I/O pins with the data word referenced by the input address. When either chip enable or output enable is inactive, or write
enable is active, output drivers stay in high-impedance mode.
All chip inputs and outputs are TTL-compatible, and operation is from a single 3.3V supply voltage. This device is available as
per industry standard 400-mil 36-pin SOJ and 44-pin TSOP 2 packages.
Absolute maximum ratings
Parameter
Voltage on V
CC
relative to GND
Voltage on any pin relative to GND
Power dissipation
Storage temperature (plastic)
Temperature with V
CC
applied
DC current into output (low)
Symbol
V
t1
V
t2
P
D
T
stg
T
bias
I
OUT
Min
–0.5
–0.5
–65
–55
Max
+5.0
V
CC
+0.5
1.0
+150
+125
20
Unit
V
V
W
°C
°C
mA
NOTE: Stresses greater than those listed under
Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress rating only and func-
tional operation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect reliability.
Truth table
CE
H
L
L
L
WE
X
H
H
L
OE
X
H
L
X
Data
High Z
High Z
D
OUT
D
IN
Mode
Standby (I
SB
, I
SB1
)
Output disable (I
CC
)
Read (I
CC
)
Write (I
CC
)
Key: X = Don’t care, L = Low, H = High
8/17/04, v. 2.1
Alliance Semiconductor
P. 2 of 9
AS7C34096A
®
Recommended operating condition
Parameter
Supply voltage
Input voltage
Ambient operating
temperature
commercial
industrial
Symbol
V
CC
(10/12/15/20)
V
IH**
V
IL*
T
A
T
A
Min
3.0
2.0
–0.5
0
–40
Nominal
3.3
Max
3.6
V
CC
+ 0.5
0.8
70
85
Unit
V
V
V
°C
°C
* V min = –1.0V for pulse width less than 5ns.
**
IL
V
IH
max = V
CC
+ 2.0V for pulse width less than 5ns.
DC operating characteristics (over the operating range)
1
Parameter
Input leakage
current
Output leakage
current
Operating power
supply current
Symbol
|I
LI
|
|I
LO
|
I
CC
I
SB
Standby power
supply current
I
SB1
V
OL
V
OH
Test conditions
V
CC
= Max, V
IN
= GND to V
CC
V
CC
= Max, CE = V
IH
V
OUT
= GND to V
CC
V
CC
= Max, CE
V
IL
f = f
Max
, I
OUT
= 0mA
Industrial
Commercial
–10
–12
–15
–20
Min Max Min Max Min Max Min Max Unit
-
1
1
180
170
60
-
1
1
160
150
60
-
1
1
140
130
60
-
1
1
110
100
60
µA
µA
mA
mA
mA
V
CC
= Max, CE
V
IH,
f = f
Max
V
CC
= Max,
CE
V
CC
– 0.2V,
V
IN
0.2V or V
IN
V
CC
– 0.2V,
f=0
I
OL
= 8 mA, V
CC
= Min
I
OH
= –4 mA, V
CC
= Min
8
8
8
8
mA
Output voltage
2.4
0.4
2.4
0.4
2.4
0.4
2.4
0.4
V
V
Capacitance
(f = 1MHz, T
a
= 25° C, V
CC
= NOMINAL)
2
Parameter
Input capacitance
I/O capacitance
Symbol
C
IN
C
I/O
Signals
A, CE, WE, OE
I/O
Test conditions
V
IN
= 0V
V
IN
= V
OUT
= 0V
Max
5
7
Unit
pF
pF
8/17/04, v. 2.1
Alliance Semiconductor
P. 3 of 9
AS7C34096A
®
Read cycle (over the operating range)
3,9
Parameter
Read cycle time
Address access time
Chip enable (CE) access time
Output enable (OE) access time
Output hold from address change
CE Low to output in low Z
CE High to output in high Z
OE Low to output in low Z
OE High to output in high Z
Power up time
Power down time
Symbol
t
RC
t
AA
t
ACE
t
OE
t
OH
t
CLZ
t
CHZ
t
OLZ
t
OHZ
t
PU
t
PD
–10
Min
Max
10
3
3
0
0
10
10
4
5
5
10
–12
Min
Max
12
3
3
0
0
12
12
5
6
6
12
–15
Min
Max
15
3
3
0
0
15
15
6
7
7
15
–20
Min
Max
20
3
3
0
0
20
20
7
9
9
20
Unit Notes
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
5
4, 5
4, 5
4, 5
4, 5
4, 5
4, 5
3
3
Key to switching waveforms
Rising input
Falling input
Undefined/don’t care
Read waveform 1 (address controlled)
3,6,7,9
t
RC
Address
t
AA
D
OUT
Data valid
t
OH
Read waveform 2 (CE, OE controlled)
3,6,8,9
t
RC1
CE
t
OE
OE
t
OLZ
t
ACE
D
OUT
t
CLZ
Supply
current
t
PU
50%
Data valid
t
PD
50%
I
CC
I
SB
t
OHZ
t
CHZ
8/17/04, v. 2.1
Alliance Semiconductor
P. 4 of 9
AS7C34096A
®
Write cycle (over the operating range)
10
Parameter
Write cycle time
Chip enable (CE) to write end
Address setup to write end
Address setup time
Write pulse width (OE = high)
Write pulse width (OE = low
Address hold from end of write
Write recovery time
Data valid to write end
Data hold time
Write enable to output in high Z
Output active from write end
–10
Symbol Min
Max
t
WC
t
CW
t
AW
t
AS
t
WP1
t
WP2
t
AH
t
WR
t
DW
t
DH
t
WZ
t
OW
10
7
7
0
7
10
0
0
5
0
0
3
5
–12
Min
Max
12
8
8
0
8
12
0
0
6
0
0
3
6
–15
Min
Max
15
10
10
0
10
15
0
0
7
0
0
3
7
–20
Min
Max
20
12
12
0
12
20
0
0
9
0
0
3
9
Unit Notes
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
4, 5
4, 5
4, 5
Write waveform 1 (WE controlled)
10
t
WC
t
AW
Address
t
WP
WE
t
AS
D
IN
t
WZ
D
OUT
t
DW
Data valid
t
OW
t
DH
t
WR
t
AH
8/17/04, v. 2.1
Alliance Semiconductor
P. 5 of 9
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