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CD-700KACGCB-54.000

PHASE LOCKED LOOP, CQCC16, HERMETIC SEALED, CERAMIC, SMD-16

器件类别:模拟混合信号IC    信号电路   

厂商名称:Vectron International, Inc.

厂商官网:http://www.vectron.com/

器件标准:  

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器件参数
参数名称
属性值
是否无铅
不含铅
是否Rohs认证
符合
厂商名称
Vectron International, Inc.
零件包装代码
SOIC
包装说明
QCCN,
针数
16
Reach Compliance Code
compliant
模拟集成电路 - 其他类型
PHASE LOCKED LOOP
JESD-30 代码
R-CQCC-N16
JESD-609代码
e4
长度
7.49 mm
湿度敏感等级
1
功能数量
1
端子数量
16
最高工作温度
70 °C
最低工作温度
封装主体材料
CERAMIC, METAL-SEALED COFIRED
封装代码
QCCN
封装形状
RECTANGULAR
封装形式
CHIP CARRIER
峰值回流温度(摄氏度)
260
认证状态
Not Qualified
座面最大高度
2.13 mm
最大供电电压 (Vsup)
5.5 V
最小供电电压 (Vsup)
4.5 V
标称供电电压 (Vsup)
5 V
表面贴装
YES
温度等级
COMMERCIAL
端子面层
GOLD OVER NICKEL
端子形式
NO LEAD
端子节距
1.02 mm
端子位置
QUAD
处于峰值回流温度下的最长时间
40
宽度
5.08 mm
文档预览
CD-700
Complete VCXO Based Phase Lock Loop
Features
5 x 7.5 x 2 mm, smallest VCXO PLL available
Output Frequencies to 65.536 MHz
5.0 or 3.3 Vdc operation
Tri-State Output
Loss of Signal Alarm
VCXO with CMOS outputs
0/70 or –40/85
°C
temperature range
Hermetically sealed ceramic SMD package
Applications
Frequency Translation
Clock Smoothing, Clock Switching
NRZ Clock recovery
LOS
(8)
PHO OPN
(3)
(2)
OPOUT
(1)
VC
(16)
LOSIN
(4)
DSLAM, ADM, ATM, Aggregation, Optical
Switching/Routing, Base Station
Low jitter PLL’s
DATAIN
(5)
CLKIN
(6)
VCXO
Phase
Detector
and LOS
OP-Amp
OUT1
(13)
Description
Optional
n
2 Divider
OUT2
(11)
RCLK RDATA
(9)
(10)
OPP
(15)
GND
(7)
VDD
(14)
HIZ
(12)
The VI CD-700 is a user-configurable crystal
based PLL integrated circuit. It includes a digital
phase detector, op-amp, VCXO and additional
integrated functions for use in digital
synchronization applications. Loop filter software
is available as well SPICE models for circuit
simulation.
Figure 1. CD-700 Block Diagram
Vectron International 166 Glover Avenue, Norwalk CT 06856-5160
Tel:1-88-VECTRON-1
e-mail: vectron@vectron.com
CD-700, VCXO Based PLL
Performance Characteristics
Table 1. Electrical Performance
Parameter
Output Frequency (ordering
option)
OUT1, 5.0 V option
OUT1, 3.3 V option
1
Supply Voltage
+5.0
+3.3
Supply Current
Output Logic Levels
2
Output Logic High
2
Output Logic Low
Output Transition Times
2
Rise Time
2
Fall Time
Input Logic Levels
2
Output Logic High
2
Output Logic Low
Loss of Signal Indication
2
Output Logic High
2
Output Logic Low
Nominal Frequency on Loss of Signal
Output 1
Output 2
3
Symmetry or Duty Cycle
Out 1
Out 2
RCLK
Absolute Pull Range (ordering
option)
over operating temperature, aging, and
power supply variations
Symbol
Min
12.000
12.000
Typical
Maximum
65.536
51.840
Units
MHz
MHz
V
V
mA
V
V
ns
ns
V
V
V
V
ppm
ppm
%
%
%
ppm
V
DD
4.5
2.97
I
DD
V
OH
V
OL
t
R
t
F
V
IH
V
IL
V
OH
V
OL
2.0
0.5
2.5
0.5
±75
±75
SYM1
SYM2
RCLK
APR
40/60
45/55
40/60
±50
±80
±100
0.5
0.3
Positive
0.53
0.35
0/70 or –40/85
I
VCXO
±1
rad/V
rad/V
°C
uA
2.5
0.5
5
5
5.0
3.3
5.5
3.63
63
Test Conditions for APR (+5.0 V option)
Test Conditions for APR (+3.3 V option)
Gain Transfer
Phase Detector Gain
+5V option
+3.3V option
Operating temperature (ordering
option)
Control Voltage Leakage Current
V
C
V
C
4.5
3.0
V
V
1. A 0.01uF and 0.1uF parallel capacitor should be located as close to pin 14 as possible (and grounded).
2. Figure 2 defines these parameters. Figure 3 illustrates the equivalent five gate TTL load and operating conditions under which
these parameters are tested and specified. Loads greater than 15 pF will adversely effect rise/fall time as well as symmetry.
3. Symmetry is defined as (ON TIME/PERIOD with Vs=1.4 V for both 5.0 V and 3.3 V operation.
t
R
80
%
t
F
I
DD
14
V
DD
+
-
13
7
15pF
650Ω
1.4V
20
%
.
1µF
.01µF
I
C
V
C
16
+
-
On Time
Period
1.8k
Figure 2. Output Waveform
Figure 3. OUT1, OUT2, RCLK, RDATA
Test Conditions (25±5°C)
±
Tel:1-88-VECTRON-1
e-mail: vectron@vectron.com
Vectron International 166 Glover Avenue, Norwalk CT 06856-5160
CD-700, VCXO Based PLL
Absolute Maximum Ratings
Stresses in excess of the absolute maximum ratings can permanently damage the device. Functional
operation is not implied at these or any other conditions in excess of conditions represented in the
operational sections of this data sheet. Exposure to absolute maximum ratings for extended periods may
adversely affect device reliability.
Table 2. Absolute Maximum Ratings
Parameter
Symbol
Power Supply
V
DD
Storage Temperature
Tstorage
Clock and Data Input Range
CLKIN, DATAIN
Ratings
7
-55/125
Gnd-0.5 to V
DD
+0.5
Unit
Vdc
°C
V
Reliability
The CD-700 is capable of meeting the the following qualification tests.
Table 3. Environmental Compliance
Parameter
Mechanical Shock
Mechanical Vibration
Solderability
Gross and Fine Leak
Resistance to Solvents
Conditions
MIL-STD-883, Method 2002
MIL-STD-883, Method 2007
MIL-STD-883, Method 2003
MIL-STD-883, Method 1014, 100% Tested
MIL-STD-883, Method 2016
Handling Precautions
Although ESD protection circuitry has been designed into the the CD-700, proper precautions should be
taken when handling and mounting. VI employs a Human Body Model (HBM) and a Charged Device
Model (CDM) for ESD susceptibility testing and design protection evaluation. ESD thresholds are
dependent on the circuit parameters used to define the model.
Table 4. Predicted ESD Ratings
Model
Minimum
Human Body Model
Charged Device Model
1500 V
1000 V
Conditions
MIL-STD 883, Method 3015
JESD 22-C101
Vectron International
166 Glover Avenue, Norwalk, CT 06856
Tel: 1-88-VECTRON-1• http://www.vectron.com
CD-700, VCXO Based PLL
CD-700 Theory of Operation
Phase Detector
The phase detector has two buffered inputs (DATAIN and CLKIN) which are designed to switch at
1.4 volts. DATAIN is designed to accept an NRZ data stream but may also be used for clock signals which
have a 50% duty cycle. CLKIN is connected to OUT1 or OUT2, or a divided version of one of these
outputs. CLKIN and DATAIN and are protected by ESD diodes and should not exceed the power supply
voltage or ground by more than a few hundred millivolts.
The phase detector is basically a latched flip flop/exclusive-or gate/differential amplifier filter design to
produce a DC signal proportional to the phase between the CLKIN and DATAIN signals (see Figure 4 for
a block diagram and Figure 5 for an open loop transfer curve). This will simplify the PLL design as the
designer does not have to filter narrow pulse signals to a DC level. Under locked conditions the rising
edge of CLKIN will be centered in the middle of the DATAIN signal (see Figure 6).
The phase detector gain is 0.53V/rad x data density for 5volt operation and 0.35V/rad x data density for
3.3 volt operation. Data density is equal to 1.0 for clock signals and is system dependent on coding and
design for NRZ signals, but 0.25 could be used as a starting point for data density.
The phase detector output is a DC signal for DATAIN frequencies greater than 1 MHz but produces
significant ripple when inputs are less than 200 kHz. Additional filtering is required for lower input
frequencies applications such as 8kHz (see Figures 8 and 9 as examples).
Under closed loop conditions the active filter has a blocking capacitor which provides a very high DC gain,
so under normal locked conditions and input frequencies >1 MHz, PHO will be about V
DD
/2 and will not
vary significantly with changes in input frequency (within lock range). The control voltage (pin 16) will vary
according to the input frequency offset, but PHO will remain relatively constant.
Data In
(pin 5)
D
Clock In
(pin 6)
Q
1
30 kΩ
20 kΩ
D
Q
2
PHO
(pin 3)
Gain = V
DD
/ 2π
Gain = 2 / 3
Figure 4. Simplified Phase Detector Block Diagram
Vectron International
166 Glover Avenue, Norwalk, CT 06856
Tel: 1-88-VECTRON-1• http://www.vectron.com
CD-700, VCXO Based PLL
V
DD
−π
V
d
V
DD
/2
0
Relative
Phase (θ
e
)
0V
Gain Slope = V
DD
/ 2π
Figure 5. Open Loop Phase Detector Transfer Curve
Recovered Clock and Data Alignment Outputs
The CD-700 is designed to recover an embedded clock from an NRZ data signal and retime it with a data
pattern. In this application, the VCXO frequency is exactly the same frequency as the NRZ data rate and
the outputs are taken off Pin 9 (RCLK), and Pin 10 (RDATA). Under locked conditions, the falling edge of
RCLK is centered in the RDATA pattern. Also, there is a 1.5 clock cycle delay between DATAIN and
RDATA. Figure 6 shows the relationship between the DATAIN, CLKIN, RDATA and RCLK.
Data In
DATAIN
Clock In
CLKIN
Recovered Data
RDATA
Recovered Clock
RCLK
Data1
Figure 6. Clock and Data Timing Relationships for the NRZ data
Other RZ encoding schemes such as Manchester or AMI can be accomodated by using a CD-700 at twice
the baud rate.
Loss of Signal, LOS and LOSIN
The LOS circuit provides an output alarm flag when the DATAIN input signal is lost. The LOS output is
normally a logic low and is set to a logic high after 256 consecutive clock periods on CLKIN with no
detected DATAIN transitions. This signal can be used to either flag external alarm circuits and/or drive the
CD-700’s LOSIN input. When LOSIN is set to a logic high, the VCXO control voltage (pin 16) is switched
to an internal voltage which sets OUT1 and OUT2 to center frequency +/-75ppm. Also, LOS automatically
closes the op amp feedback which means the op-amp is a unity gain buffer and will produce a DC voltage
equal to the +op amp voltage (pin 15), usually V
DD
/2.
Vectron International
166 Glover Avenue, Norwalk, CT 06856
Tel: 1-88-VECTRON-1• http://www.vectron.com
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