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D640G12PI

4M X 16 FLASH 3V PROM, 70 ns, PDSO48
4M × 16 FLASH 3V 可编程只读存储器, 70 ns, PDSO48

器件类别:存储   

厂商名称:SPANSION

厂商官网:http://www.spansion.com/

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器件参数
参数名称
属性值
功能数量
1
端子数量
48
最小工作温度
-40 Cel
最大工作温度
85 Cel
额定供电电压
3 V
最小供电/工作电压
2.7 V
最大供电/工作电压
3.6 V
加工封装描述
MO-142DD, TSOP-48
状态
Transferred
ype
NOR TYPE
sub_category
Flash Memories
ccess_time_max
70 ns
boot_block
BOTTOM/TOP
command_user_interface
YES
common_flash_interface
YES
data_polling
YES
jesd_30_code
R-PDSO-G48
存储密度
6.71E7 bi
内存IC类型
FLASH
内存宽度
16
备用存储器宽度
8
umber_of_sectors_size
16,126
位数
4.19E6 words
位数
4M
操作模式
ASYNCHRONOUS
组织
4MX16
包装材料
PLASTIC/EPOXY
ckage_code
TSOP1
ckage_equivalence_code
TSSOP48,.8,20
包装形状
RECTANGULAR
包装尺寸
SMALL OUTLINE, THIN PROFILE
串行并行
PARALLEL
wer_supplies__v_
3/3.3
gramming_voltage__v_
3
qualification_status
COMMERCIAL
eady_busy
YES
seated_height_max
1.2 mm
sector_size__words_
8K,64K
standby_current_max
5.00E-6 Am
最大供电电压
0.0450 Am
表面贴装
YES
工艺
CMOS
温度等级
INDUSTRIAL
端子形式
GULL WING
端子间距
0.5000 mm
端子位置
DUAL
ggle_bi
YES
length
18.4 mm
width
12 mm
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Am29DL640G
Data Sheet
RETIRED
PRODUCT
This product has been retired and is not recommended for designs. For new and current designs,
S29JL064H (for TSOP packages) and S29PL064J (for FBGA packages) supersede AM29DL640G as
the factory-recommended migration path. Please refer to each respective datasheets for specifica-
tions and ordering information. Availability of this document is retained for reference and historical
purposes only.
April 2005
The following document specifies Spansion memory products that are now offered by both Advanced
Micro Devices and Fujitsu. Although the document is marked with the name of the company that
originally developed the specification, these products will be offered to customers of both AMD and
Fujitsu.
Continuity of Specifications
There is no change to this datasheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal datasheet improvement and are noted in the
document revision summary, where supported. Future routine revisions will occur when appro-
priate, and changes will be noted in a revision summary.
For More Information
Please contact your local AMD or Fujitsu sales office for additional information about Spansion
memory solutions.
Publication Number
25693
Revision
B
Amendment
5
Issue Date
June 6, 2005
THIS PAGE LEFT INTENTIONALLY BLANK.
Am29DL640G
64 Megabit (8 M x 8-Bit/4 M x 16-Bit)
CMOS 3.0 Volt-only, Simultaneous Read/Write Flash Memory
This product has been retired and is not recommended for designs. For new and current designs, S29JL064H (for TSOP packages) and S29PL064J (for FBGA packages) supersede
AM29DL640G as the factory-recommended migration path. Please refer to each respective datasheets for specifications and ordering information. Availability of this document is retained
for reference and historical purposes only.
DISTINCTIVE CHARACTERISTICS
ARCHITECTURAL ADVANTAGES
Simultaneous Read/Write operations
— Data can be continuously read from one bank while
executing erase/program functions in another bank.
— Zero latency between read and write operations
Flexible Bank
TM
architecture
— Read may occur in any of the three banks not being
written or erased.
— Four banks may be grouped by customer to achieve
desired bank divisions.
Boot Sectors
— Top and bottom boot sectors in the same device
— Any combination of sectors can be erased
Manufactured on 0.17 µm process technology
SecSi™ (Secured Silicon) Sector: Extra 256 Byte
sector
Factory locked and identifiable:
16 bytes available for
secure, random factory Electronic Serial Number;
verifiable as factory locked through autoselect
function. ExpressFlash option allows entire sector to
be available for factory-secured data
Customer lockable:
One-time programmable only.
Once locked, data cannot be changed
Zero Power Operation
— Sophisticated power management circuits reduce
power consumed during inactive periods to nearly
zero.
Compatible with JEDEC standards
— Pinout and software compatible with
single-power-supply flash standard
Ultra low power consumption (typical values)
— 2 mA active read current at 1 MHz
— 10 mA active read current at 5 MHz
— 200 nA in standby or automatic sleep mode
Minimum 1 million erase cycles guaranteed per
sector
20 year data retention at 125°C
— Reliable operation for the life of the system
SOFTWARE FEATURES
Data Management Software (DMS)
— AMD-supplied software manages data programming,
enabling EEPROM emulation
— Eases historical sector erase flash limitations
Supports Common Flash Memory Interface (CFI)
Erase Suspend/Erase Resume
— Suspends erase operations to allow reading from
other sectors in same bank
Data# Polling and Toggle Bits
— Provides a software method of detecting the status of
program or erase cycles
Unlock Bypass Program command
— Reduces overall programming time when issuing
multiple program command sequences
HARDWARE FEATURES
Ready/Busy# output (RY/BY#)
— Hardware method for detecting program or erase
cycle completion
Hardware reset pin (RESET#)
— Hardware method of resetting the internal state
machine to the read mode
WP#/ACC input pin
— Write protect (WP#) function protects sectors 0, 1,
140, and 141, regardless of sector protect status
— Acceleration (ACC) function accelerates program
timing
Sector protection
— Hardware method of locking a sector, either
in-system or using programming equipment, to
prevent any program or erase operation within that
sector
— Temporary Sector Unprotect allows changing data in
protected sectors in-system
Publication#
25693
Rev:
B
Amendment
5
Issue Date:
June 6, 2005
PACKAGE OPTIONS
63-ball Fine Pitch BGA
64-ball Fortified BGA
48-pin TSOP
PERFORMANCE CHARACTERISTICS
High performance
— Access time as fast as 70 ns
— Program time: 4 µs/word typical utilizing Accelerate
function
Refer to AMD’s Website (www.amd.com) for the latest information.
GENERAL DESCRIPTION
The Am29DL640G is a 64 megabit, 3.0 volt-only flash
memory device, organized as 4,194,304 words of 16
bits each or 8,388,608 bytes of 8 bits each. Word
mode data appears on DQ15–DQ0; byte mode data
appears on DQ7–DQ0. The device is designed to be
programmed in-system with the standard 3.0 volt V
CC
supply, and can also be programmed in standard
EPROM programmers.
The device is available with an access time of 70, 90,
or 120 ns and is offered in 48-pin TSOP, 63-ball
Fine-Pitch BGA, and 64-ball Fortified BGA packages.
Standard control pins—chip enable (CE#), write en-
able (WE#), and output enable (OE#)—control normal
read and write operations, and avoid bus contention
issues.
The device requires only a
single 3.0 volt power sup-
ply
for both read and write functions. Internally gener-
ated and regulated voltages are provided for the
program and erase operations.
Factory locked parts provide several options. The
SecSi Sector may store a secure, random 16 byte
ESN (Electronic Serial Number), customer code (pro-
grammed through AMD’s ExpressFlash service), or
both. Customer Lockable parts may utilize the SecSi
Sector as bonus space, reading and writing like any
other flash sector, or may permanently lock their own
code there.
DMS (Data Management Software)
allows systems
to easily take advantage of the advanced architecture
of the simultaneous read/write product line by allowing
removal of EEPROM devices. DMS will also allow the
system software to be simplified, as it will perform all
functions necessary to modify data in file structures,
as opposed to single-byte modifications. To write or
update a particular piece of data (a phone number or
configuration data, for example), the user only needs
to state which piece of data is to be updated, and
where the updated data is located in the system. This
i s a n a d va n t a g e c o m p a r e d t o s y s te m s w h e r e
user-written software must keep track of the old data
location, status, logical to physical translation of the
data onto the Flash memory device (or memory de-
vices), and more. Using DMS, user-written software
does not need to interface with the Flash memory di-
rectly. Instead, the user's software accesses the Flash
memory by calling one of only six functions. AMD pro-
vides this software to simplify system design and soft-
ware integration efforts.
The device offers complete compatibility with the
JEDEC single-power-supply Flash command set
standard.
Commands are written to the command
register using standard microprocessor write timings.
Reading data out of the device is similar to reading
from other Flash or EPROM devices.
The host system can detect whether a program or
erase operation is complete by using the device
sta-
tus bits:
RY/BY# pin, DQ7 (Data# Polling) and
DQ6/DQ2 (toggle bits). After a program or erase cycle
has been completed, the device automatically returns
to the read mode.
The
sector erase architecture
allows memory sec-
tors to be erased and reprogrammed without affecting
the data contents of other sectors. The device is fully
erased when shipped from the factory.
Hardware data protection
measures include a low
V
CC
detector that automatically inhibits write opera-
tions during power transitions. The
hardware sector
protection
feature disables both program and erase
operations in any combination of the sectors of mem-
ory. This can be achieved in-system or via program-
ming equipment.
The device offers two power-saving features. When
addresses have been stable for a specified amount of
time, the device enters the
automatic sleep mode.
The system can also place the device into the
standby mode.
Power consumption is greatly re-
duced in both modes.
Simultaneous Read/Write Operations with
Zero Latency
The Simultaneous Read/Write architecture provides
simultaneous operation
by dividing the memory
space into
four banks,
two 8 Mb banks with small and
large sectors, and two 24 Mb banks of large sectors.
Sector addresses are fixed, system software can be
used to form user-defined bank groups.
During an Erase/Program operation, any of the three
non-busy banks may be read from. Note that only two
banks can operate simultaneously. The device can im-
prove overall system performance by allowing a host
system to program or erase in one bank, then
immediately and simultaneously read from the other
bank, with zero latency. This releases the system from
waiting for the completion of program or erase
operations.
The Am29DL640G can be organized as both a top
and bottom boot sector configuration.
Bank
Bank 1
Bank 2
Bank 3
Bank 4
Megabits
8 Mb
24 Mb
24 Mb
8 Mb
Sector Sizes
Eight 8 Kbyte/4 Kword,
Fifteen 64 Kbyte/32 Kword
Forty-eight 64 Kbyte/32 Kword
Forty-eight 64 Kbyte/32 Kword
Eight 8 Kbyte/4 Kword,
Fifteen 64 Kbyte/32 Kword
Am29DL640G Features
The
SecSi™ (Secured Silicon) Sector
is an extra
256 byte sector capable of being permanently locked
by AMD or customers. The
SecSi Indicator Bit
(DQ7)
is permanently set to a 1 if the part is
factory locked,
and set to a 0 if
customer lockable.
This way, cus-
tomer lockable parts can never be used to replace a
factory locked part.
2
Am29DL640G
June 6, 2005
TABLE OF CONTENTS
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 5
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 6
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . 7
Special Handling Instructions for BGA Packages ..................... 7
Pin Description. . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 9
Device Bus Operations . . . . . . . . . . . . . . . . . . . . 10
Table 1. Am29DL640G Device Bus Operations ..............................10
Erase Suspend/Erase Resume Commands ........................... 28
Table 12. Am29DL640G Command Definitions ............................. 29
Write Operation Status . . . . . . . . . . . . . . . . . . . . . 30
DQ7: Data# Polling ................................................................. 30
Figure 6. Data# Polling Algorithm .................................................. 30
RY/BY#: Ready/Busy#............................................................ 31
DQ6: Toggle Bit I .................................................................... 31
Figure 7. Toggle Bit Algorithm........................................................ 31
Word/Byte Configuration ........................................................ 10
Requirements for Reading Array Data ................................... 10
Writing Commands/Command Sequences ............................ 11
Accelerated Program Operation ............................................. 11
Autoselect Functions .............................................................. 11
Simultaneous Read/Write Operations with Zero Latency ....... 11
Standby Mode ........................................................................ 11
Automatic Sleep Mode ........................................................... 12
RESET#: Hardware Reset Pin ............................................... 12
Output Disable Mode .............................................................. 12
Table 2. Am29DL640G Sector Architecture ....................................12
Table 3. Bank Address ....................................................................15
Table 4. SecSi
TM
Sector Addresses ................................................15
DQ2: Toggle Bit II ................................................................... 32
Reading Toggle Bits DQ6/DQ2 ............................................... 32
DQ5: Exceeded Timing Limits ................................................ 32
DQ3: Sector Erase Timer ....................................................... 32
Table 13. Write Operation Status ................................................... 33
Absolute Maximum Ratings. . . . . . . . . . . . . . . . . 34
Figure 8. Maximum Negative Overshoot Waveform ...................... 34
Figure 9. Maximum Positive Overshoot Waveform........................ 34
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 35
Figure 10. I
CC1
Current vs. Time (Showing Active and
Automatic Sleep Currents) ............................................................. 36
Figure 11. Typical I
CC1
vs. Frequency ............................................ 36
Test Conditions. . . . . . . . . . . . . . . . . . . . . . . . . . . 37
Figure 12. Test Setup.................................................................... 37
Figure 13. Input Waveforms and Measurement Levels ................. 37
Autoselect Mode..................................................................... 15
Table 5. Am29DL640G Autoselect Codes, (High Voltage Method) 16
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 38
Read-Only Operations ........................................................... 38
Figure 14. Read Operation Timings ............................................... 38
Sector/Sector Block Protection and Unprotection .................. 17
Table 6. Am29DL640G Boot Sector/Sector Block Addresses for
Protection/Unprotection ...................................................................17
Hardware Reset (RESET#) .................................................... 39
Figure 15. Reset Timings ............................................................... 39
Write Protect (WP#) ................................................................ 17
Table 7. WP#/ACC Modes ..............................................................18
Word/Byte Configuration (BYTE#) .......................................... 40
Figure 16. BYTE# Timings for Read Operations............................ 40
Figure 17. BYTE# Timings for Write Operations............................ 40
Temporary Sector Unprotect .................................................. 18
Figure 1. Temporary Sector Unprotect Operation........................... 18
Figure 2. In-System Sector Protect/Unprotect Algorithms .............. 19
Erase and Program Operations .............................................. 41
Figure 18. Program Operation Timings..........................................
Figure 19. Accelerated Program Timing Diagram..........................
Figure 20. Chip/Sector Erase Operation Timings ..........................
Figure 21. Back-to-back Read/Write Cycle Timings ......................
Figure 22. Data# Polling Timings (During Embedded Algorithms).
Figure 23. Toggle Bit Timings (During Embedded Algorithms)......
Figure 24. DQ2 vs. DQ6.................................................................
42
42
43
44
44
45
45
SecSi™ (Secured Silicon) Sector
Flash Memory Region ............................................................ 20
Figure 3. SecSi Sector Protect Verify.............................................. 21
Hardware Data Protection ...................................................... 21
Low VCC Write Inhibit ............................................................ 21
Write Pulse “Glitch” Protection ............................................... 21
Logical Inhibit .......................................................................... 21
Power-Up Write Inhibit ............................................................ 21
Common Flash Memory Interface (CFI) . . . . . . . 21
Table 8. CFI Query Identification String .......................................... 22
Table 9. System Interface String......................................................22
Table 10. Device Geometry Definition ............................................ 23
Table 11. Primary Vendor-Specific Extended Query ...................... 24
Temporary Sector Unprotect .................................................. 46
Figure 25. Temporary Sector Unprotect Timing Diagram .............. 46
Figure 26. Sector/Sector Block Protect and
Unprotect Timing Diagram ............................................................. 47
Alternate CE# Controlled Erase and Program Operations ..... 48
Figure 27. Alternate CE# Controlled Write (Erase/Program)
Operation Timings.......................................................................... 49
Command Definitions . . . . . . . . . . . . . . . . . . . . . 25
Reading Array Data ................................................................ 25
Reset Command ..................................................................... 25
Autoselect Command Sequence ............................................ 25
Enter SecSi™ Sector/Exit SecSi Sector
Command Sequence .............................................................. 25
Byte/Word Program Command Sequence ............................. 26
Unlock Bypass Command Sequence ..................................... 26
Figure 4. Program Operation .......................................................... 27
Chip Erase Command Sequence ........................................... 27
Sector Erase Command Sequence ........................................ 27
Figure 5. Erase Operation............................................................... 28
Erase And Programming Performance. . . . . . . . 50
Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 50
TSOP & BGA Pin Capacitance. . . . . . . . . . . . . . . 50
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 52
FBE063—63-Ball Fine-Pitch Ball Grid Array (FBGA)
12 x 11 mm package .............................................................. 52
LAA064—64-Ball Fortified Ball Grid Array (FBGA)
13 x 11 mm package .............................................................. 53
TS 048—48-Pin Standard TSOP ............................................ 54
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 55
June 6, 2005
Am29DL640G
3
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