Shanghai Lunsure Electronic
Technology Co.,Ltd
Tel:0086-21-37185008
Fax:0086-21-57152769
DL5221
THRU
DL5261
500 mW
Zener Diode
2.4 to 47 Volts
MINIMELF
Cathode Mark
•
•
•
•
Features
Wide Voltage Range Available
Glass Package
High Temp Soldering: 250°C for 10 Seconds At Terminals
Surface Mount Package
•
•
•
•
•
Maximum Ratings
Operating Temperature: -55°C to +150°C
Storage Temperature: -55°C to +150°C
500 mWatt DC Power Dissipation
Power Derating: 4.0mW/°C above 50°C
Forward Voltage @ 200mA: 1.1 Volts
Figure 1 - Typical Capacitance
100
C
B
A
pf
10
At zero volts
At –2 Volts V
R
DIM
A
B
C
INCHES
MIN
.134
.008
.055
DIMENSIONS
MM
MIN
3.40
.20
1.40
1
0
100
V
Z
200
MAX
.142
.016
.059
MAX
3.60
.40
1.50
NOTE
∅
Typical Capacitance (pf) –
versus
– Zener voltage (V
Z
)
Figure 2 - Derating Curve
SUGGESTED SOLDER
PAD LAYOUT
400
mW
200
0.075”
0.105
0.030”
50
100
150
Temperature
°C
Power Dissipation (mW) -
Versus
- Temperature
°C
0
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DL5221 thru DL5261
PART
NUMBER
DL5221
DL5222
DL5223
DL5224
DL5225
DL5226
DL5227
DL5228
DL5229
DL5230
DL5231
DL5232
DL5233
DL5234
DL5235
DL5236
DL5237
DL5238
DL5239
DL5240
DL5241
DL5242
DL5243
DL5244
DL5245
DL5246
DL5247
DL5248
DL5249
DL5250
DL5251
DL5252
DL5253
DL5254
DL5255
DL5256
DL5257
DL5258
DL5259
DL5260
DL5261
NOMINAL ZENER
VOLTAGE V
Z
@ I
ZT
VOLTS
2.4
2.5
2.7
2.8
3.0
3.3
3.6
3.9
4.3
4.7
5.1
5.6
6.0
6.2
6.8
7.5
8.2
8.7
9.1
10
11
12
13
14
15
16
17
18
19
20
22
24
25
27
28
30
33
36
39
43
47
TEST
CURRENT I
ZT
mA
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
20
9.5
9.0
8.5
7.8
7.4
7.0
6.6
6.2
5.6
5.2
5.0
4.6
4.5
4.2
3.8
3.4
3.2
3.0
2.7
MAXIMUM ZENER IMPEDANCE
‘B’ SUFFIX ONLY
Z
ZT
@ I
ZT
Z
ZK
@I
ZK
= 0.25mA
OHMS
OHMS
30
30
30
30
29
28
24
23
22
19
17
11
7.0
7.0
5.0
6.0
8.0
8.0
10
17
22
30
13
15
16
17
19
21
23
25
29
33
35
41
44
49
58
70
80
93
105
1200
1250
1300
1400
1600
1600
1700
1900
2000
1900
1600
1600
1600
1000
750
500
500
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
600
700
700
800
900
1000
MAXIMUM REVERSE
LEAKAGE CURRENT
I
R
@
V
R
µA
VOLTS
100
100
75
75
50
25
15
10
5.0
5.0
5.0
5.0
5.0
5.0
3.0
3.0
3.0
3.0
3.0
3.0
2.0
1.0
0.5
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
0.1
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
1.0
2.0
2.0
3.0
3.5
4.0
5.0
6.0
6.5
6.5
7.0
8.0
8.4
9.1
9.9
10
11
12
13
14
14
15
17
18
19
21
21
23
25
27
30
33
36
MAX. ZENER VOLTAGE
TEMP COEFFICIENT ‘B’
SUFFIX ONLY
% /
°C
-0.085
-0.085
-0.080
-0.080
-0.075
-0.070
-0.065
-0.060
±0.055
±0.030
±0.030
+0.038
+0.038
+0.045
+0.050
+0.058
+0.062
+0.065
+0.068
+0.075
+0.076
+0.077
+0.079
+0.082
+0.082
+0.083
+0.084
+0.085
+0.086
+0.086
+0.087
+0.088
+0.089
+0.090
+0.091
+0.091
+0.092
+0.093
+0.094
+0.095
+0.095
NOTE 1: Table as shown lists type numbers, which indicate a tolerance of ±20% with guaranteed limits on only Vz, I
R
, and V
F
. Devices with
guaranteed limits on all six parameters are indicated by suffix “A” for ±10%, “B” for ±5%, “C” for ±2%, and “D” for ±1% tolerance
NOTE 2: The electrical characteristics are measured after allowing the device to stabilize for 20 seconds.
NOTE 3: Temperature coefficient (á
VZ
). Test conditions for temperature coefficient are as follows:
a.
I
ZT
= 7.5mA, T
I
= 25
o
C T
2
= 125
o
C (DL5221 thru DL5242)
b.
I
ZT
= Rated I
ZT
, T
I
= 25
o
C, T
2
= 125
o
C (DL5243 thru DL5261)
Device to be temperature stabilized with current applied prior to reading breakdown voltage at the specified ambient temperature.
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NXP MCU
