DS1004
5-Tap High Speed
Silicon Delay Line
www.dalsemi.com
FEATURES
All-silicon timing circuit
Five delayed clock phases per input
Precise tap-to-tap nominal delay tolerances of
±0.75 and ±1 ns
Input-to-tap 1 delay of 5 ns
Nominal Delay tolerances of ±1.5 ns
Leading and trailing edge precision preserves
the input symmetry
CMOS design with TTL compatibility
Standard 8-pin DIP and 150 mil 8-pin SOIC
Vapor phase, IR and wave solderable
Available in Tape and Reel
PIN ASSIGNMENT
IN
TAP 2
TAP 4
GND
1
2
3
4
8
7
6
5
V
CC
TAP 1
TAP 3
TAP 5
DS1004M 8-Pin DIP (300-mil)
See Mech. Drawings Section
IN
TAP 2
TAP 4
GND
1
2
3
4
8
7
6
5
V
CC
TAP 1
TAP 3
TAP 5
DS1004Z 8-Pin SOIC (150-mil)
See Mech. Drawings Section
PIN DESCRIPTION
TAP 1-5
V
CC
GND
IN
- TAP Output Number
- +5V Supply
- Ground
- Input
DESCRIPTION
The DS1004 is a 5-tap all silicon delay line which can provide 2, 3, 4, or 5 ns tap-to-tap delays within a
standard part family. The device is Dallas Semiconductor’s fastest 5-tap delay line. It is available in a
standard 8-pin DIP and 150 mil 8-pin mini-SOIC. The device features precise leading and trailing edge
accuracies and has the inherent reliability of an all-silicon delay line solution.
The DS1004 is specified for tap-to-tap tolerances as shown in Table 1. Each device has a minimum
input-to-tap 1 delay of 5 ns. Subsequent taps (taps 2 through 5) are precisely delayed by 2, 3, 4, or 5 ns.
See Table 1 for details. Input to Tap Tolerance over temperature and voltage is
±1.5
ns in addition to the
nominal delay tolerance. Nominal tap-to-tap tolerances range from
±0.75
ns to
±1.0
ns. Each output is
capable of driving up to 10 LS loads.
For customers needing non-standard delay values, the Late Package Program (LPP) is available.
Customers may contact Dallas Semiconductor at (972) 371–4348 for further details.
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092500
DS1004
PART NUMBER TOLERANCE TABLE
Table 1
PART
NUMBER
INPUT-TO-TAP TOLERANCE
NOMINAL
1
TAP-TO-TAP TOLERANCE
NOMINAL
1
OVER TEMP &
VOLTAGE
2
OVER TEMP &
VOLTAGE
2
DS1004M-2
DS1004M-3
DS1004M-4
DS1004M-5
DS1004Z-2
DS1004Z-3
DS1004Z-4
DS1004Z-5
1.5 ns
1.5 ns
1.5 ns
1.5 ns
1.5 ns
1.5 ns
1.5 ns
1.5 ns
±3.0 ns
±3.0 ns
±3.0 ns
±3.0 ns
±3.0 ns
±3.0 ns
±3.0 ns
±3.0 ns
±0.75 ns
±0.75 ns
±1.0 ns
±1.0 ns
±0.75 ns
±0.75 ns
±1.0 ns
±1.0 ns
±1.5 ns
±1.5 ns
±1.75 ns
±1.75 ns
±1.5 ns
±1.5 ns
±1.75 ns
±1.75 ns
NOTES:
1. Nominal conditions are +25°C and V
CC
= +5.0V
2. Temperature and voltage variations cover the range from V
CC
=5.0V
±=5%
and temperature range from
0°C to +70°C.
3. Delay accuracy for both leading and trailing edges.
PART NUMBER DELAY TABLE
Table 2
PART
NUMBER
DS1004M-2
DS1004M-3
DS1004M-4
DS1004M-5
DS1004Z-2
DS1004Z-3
DS1004Z-4
DS1004Z-5
NOMINAL VALUES (FOR REFERENCE ONLY)
INPUT-TO-
INPUT-TO-
INPUT-TO-
INPUT-TO-
INPUT-TO-
TAP1
TAP2
TAP3
TAP4
TAP5
5 ns
7 ns
9 ns
11 ns
13 ns
5 ns
8 ns
11 ns
14 ns
17 ns
5 ns
9 ns
13 ns
17 ns
21 ns
5 ns
10 ns
15 ns
20 ns
25 ns
5 ns
7 ns
9 ns
11 ns
13 ns
5 ns
8 ns
11 ns
14 ns
17 ns
5 ns
9 ns
13 ns
17 ns
21 ns
5 ns
10 ns
15 ns
20 ns
25 ns
LOGIC DIAGRAM
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DS1004
DS1004 TEST CIRCUIT
Figure 1
TEST SETUP DESCRIPTION
Figure 1 illustrates the hardware configuration used for measuring the timing parameters of the DS1004.
The input waveform is produced by a precision pulse generator under software control. Time delays are
measured by a time interval counter (20 ps resolution) connected to the output. The DS1004 output taps
are selected and connected to the interval counter by a VHF switch control unit. All measurements are
fully automated with each instrument controlled by the computer over an IEEE 488 bus.
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DS1004
ABSOLUTE MAXIMUM RATINGS*
Voltage on Any Pin Relative to Ground
Operating Temperature
Storage Temperature
Soldering Temperature
Short Circuit Output Current
-1.0V to +7.0V
0°C to 70°C
-55°C to +125°C
See J-STD-020A Specification
50 mA for 1 second
* This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operation sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods of time may affect reliability.
DC ELECTRICAL CHARACTERISTICS
PARAMETER
Supply Voltage
Active Current
High Level Input
Voltage
Low Level Input
Voltage
Input Leakage
High Level Output
Current
Low Level Output
Current
SYM
V
CC
I
CC
V
IH
V
IL
I
I
I
OH
I
OL
0.0V
≤
V
I
≤
V
CC
V
CC
=4.75V
V
OH
=4V
V
CC
=4.75V
V
OL
=0.5V
TEST
CONDITION
V
CC
=5.25V
Period=1 µs
2.2
-0.5
-1.0
MIN
4.75
(0°C to 70°C; V
CC
= 5.0V ± 5%)
TYP
5.00
35
MAX
5.25
75
V
CC
+ 0.5
0.8
1.0
-1.0
UNITS
V
mA
V
V
µA
mA
mA
NOTES
1
1
1
12
AC ELECTRICAL CHARACTERISTICS
PARAMETER
Period
Input Pulse Width
Input to Tap 1
Output Delay
Tap-to-Tap Delays
Output Rise or
Fall Time
Power-up Time
SYMBOL
t
PERIOD
t
WI
t
PLH
,
t
PHL
t
PLH
t
OR
,
t
OF
t
PU
MIN
4 (t
WI
)
40% of Tap 5 t
PLH
(T
A
= 25°C; V
CC
= 5V ± 5%)
TYP
MAX
UNITS
ns
ns
ns
ns
ns
ms
NOTES
3
3
2
2
Table 1
Table 1
2.0
2.5
100
CAPACITANCE
PARAMETER
Input Capacitance
SYMBOL
C
IN
MIN
TYP
MAX
10
(T
A
= 25°C)
UNITS
pF
NOTES
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DS1004
NOTES:
1. All voltages are referenced to ground.
2. V
CC
=5V and 25°C. Delay accuracy on both the rising and falling edges within tolerances given in
Table 1.
3. Pulse width and duty cycle specifications may be exceeded, however, accuracy will be application
sensitive with respect to decoupling, layout, etc.
TEST CONDITIONS
INPUT:
Ambient Temperature:
Supply Voltage (V
CC
):
Input Pulse:
25°C
±=3°C
5.0V
±=0.1V
High = 3.0V
±=0.1V
Low = 0.0V
±=0.1V
50 ohm max.
3.0 ns max. (measured between 0.6V and 2.4V)
500 ns
1
µs
15 pF
Source Impedance:
Rise and Fall Time:
Pulse Width:
Pulse Period:
Output Load
Capacitance:
OUTPUT:
Each output is loaded with the equivalent of one 74F04 input gate. Data is measured at the 1.5V level on
the rising and falling edge.
NOTE:
Above conditions are for test only and do not restrict the devices under other data sheet conditions.
TIMING DIAGRAM: DS1004 INPUT TO OUTPUTS
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传感器
