EQTD15E3F-30.000M
REGULATORY COMPLIANCE
2011/65 +
2015/863
(Data Sheet downloaded on Sep 22, 2020)
191 SVHC
ITEM DESCRIPTION
Temperature Compensated Quartz Crystal Clock Oscillators TCXO Clipped Sinewave 3.0Vdc 4 Pad 5.0mm x 7.0mm Ceramic
Surface Mount (SMD) 30.000MHz 0°C to +70°C
ELECTRICAL SPECIFICATIONS
Nominal Frequency
Frequency Stability
Frequency Stability vs. Frequency
Tolerance
Frequency Stability vs. Input Voltage
Frequency Stability vs. Load
Frequency Stability vs. Reflow
Frequency Stability vs. Aging
Operating Temperature Range
Supply Voltage
Input Current
Output Voltage
Load Drive Capability
Output Logic Type
Phase Noise
30.000MHz
±2.5ppm Maximum (Inclusive of Operating Temperature Range, at Vdd=3.0Vdc)
±1.0ppm Maximum (at 25°C ±2°C, at Vdd=3.0Vdc, Pre-Reflow)
±0.2ppm Maximum (±5%)
±0.2ppm Maximum (±1kOhm//±1pF)
±1ppm Maximum (at 25°C, 24 hours after reflow, 1 time)
±1ppm/Year Maximum (at 25°C)
0°C to +70°C
3.0Vdc ±5%
2.5mA Maximum
0.8Vp-p Clipped Sinewave Minimum (External DC-Cut capacitor required, 1000pF recommended)
10kOhms//10pF
Clipped Sinewave
All Values are Typical
-80dBc/Hz at 10Hz Offset
-115dBc/Hz at 100Hz Offset
-135dBc/Hz at 1kHz Offset
-138dBc/Hz at 10kHz Offset
0.7pSec Typical, 1pSec Maximum (Fj = 12kHz to 20MHz (Random))
2mSec Maximum
-40°C to +85°C
RMS Phase Jitter
Start Up Time
Storage Temperature Range
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
ESD Susceptibility
Fine Leak Test
Flammability
Gross Leak Test
Mechanical Shock
Moisture Resistance
Moisture Sensitivity
Resistance to Soldering Heat
Resistance to Solvents
Solderability
Temperature Cycling
Vibration
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
MIL-STD-883, Method 1014, Condition A
UL94-V0
MIL-STD-883, Method 1014, Condition C
MIL-STD-883, Method 2002, Condition B
MIL-STD-883, Method 1004
J-STD-020, MSL 1
MIL-STD-202, Method 210, Condition K
MIL-STD-202, Method 215
MIL-STD-883, Method 2003
MIL-STD-883, Method 1010, Condition B
MIL-STD-883, Method 2007, Condition A
www.ecliptek.com | Specification Subject to Change Without Notice | Revision B 03/20/2015 | Page 1 of 4
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
EQTD15E3F-30.000M
MECHANICAL DIMENSIONS (all dimensions in millimeters)
PIN
CONNECTION
Do Not Connect
Case/Ground
Output
Supply Voltage
5.00
±0.15
2.50
MAX
2
1.27 ±0.10 (X4)
3
1
2
3
MARKING
ORIENTATION
4
LINE MARKING
7.00
±0.15
5.08
±0.15
1
4
1.40
±0.10 (X4)
2.46 ±0.10
1
2
E30.000
E=Ecliptek Designator
XXXXX
XXXXX=Ecliptek
Manufacturing Identifier
Suggested Solder Pad Layout
All Dimensions in Millimeters
2.00 (X4)
2.20 (X4)
2.88
Solder Land
(X4)
1.80
All Tolerances are ±0.1
www.ecliptek.com | Specification Subject to Change Without Notice | Revision B 03/20/2015 | Page 2 of 4
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
EQTD15E3F-30.000M
OUTPUT WAVEFORM
CLOCK OUTPUT
0V
DC
V
P-P
www.ecliptek.com | Specification Subject to Change Without Notice | Revision B 03/20/2015 | Page 3 of 4
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
EQTD15E3F-30.000M
Test Circuit for Clipped Sinewave Output
Oscilloscope
Frequency
Counter
Current
Meter
Power
Supply
Voltage
Meter
0.01µF
(Note 1)
Supply
Voltage
(V
DD
)
Probe
(Note 2)
Output
1000pF
0.1µF
(Note 1)
Ground
R
L
= 10kOhms
C
L
= 10pF
(Note 3)
Do Not
Connect
Note 1: An external 0.01µF bypass capacitor in parallel with a 0.1µF high frequency ceramic bypass
capacitor close (less than 2mm) to the package ground and supply voltage pin is required.
Note 2: A low input capacitance (<12pF), 10X attenuation factor, high impedance (>10Mohms), and
high bandwidth (>300MHz) passive probe is recommended.
Note 3: Capacitance value C
L
includes sum of all probe and fixture capacitance.
www.ecliptek.com | Specification Subject to Change Without Notice | Revision B 03/20/2015 | Page 4 of 4
Ecliptek, LLC
5458 Louie Lane, Reno, NV 89511
1-800-ECLIPTEK or 714.433.1200
微控制器 MCU
