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GLS29VF020-70-4C-WHE

Flash Memory 256K X 8 70ns

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厂商名称:Greenliant

器件标准:

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器件参数
参数名称
属性值
是否Rohs认证
符合
厂商名称
Greenliant
包装说明
TSSOP, TSSOP32,.56,20
Reach Compliance Code
compliant
最长访问时间
70 ns
命令用户界面
NO
数据轮询
YES
JESD-30 代码
R-PDSO-G32
内存密度
2097152 bit
内存集成电路类型
FLASH
内存宽度
8
部门数/规模
2K
端子数量
32
字数
262144 words
字数代码
256000
最高工作温度
70 °C
最低工作温度
组织
256KX8
封装主体材料
PLASTIC/EPOXY
封装代码
TSSOP
封装等效代码
TSSOP32,.56,20
封装形状
RECTANGULAR
封装形式
SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
并行/串行
PARALLEL
电源
3/3.3 V
认证状态
Not Qualified
部门规模
128
最大待机电流
0.00003 A
最大压摆率
0.03 mA
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子形式
GULL WING
端子节距
0.5 mm
端子位置
DUAL
切换位
YES
类型
NOR TYPE
文档预览
2 Mbit / 4 Mbit (x8) Small-Sector Flash
GLS29SF020 / GLS29SF040
GLS29VF020 / GLS29VF040
GLS29SF/VF020 / 0402Mb / 4Mb (x8)
Byte-Program, Small-Sector flash memories
Data Sheet
FEATURES:
• Organized as 256K x8 / 512K x8
• Single Voltage Read and Write Operations
– 4.5-5.5V for GLS29SF020/040
– 2.7-3.6V for GLS29VF020/040
• Superior Reliability
– Endurance: 100,000 Cycles (typical)
– Greater than 100 years Data Retention
• Low Power Consumption:
– Active Current: 10 mA (typical)
– Standby Current:
30 µA (typical) for GLS29SF020/040
1 µA (typical) for GLS29VF020/040
• Sector-Erase Capability
– Uniform 128 Byte sectors
• Fast Read Access Time:
– 55 ns for GLS29SF020/040
– 70 ns for GLS29VF020/040
• Latched Address and Data
• Fast Erase and Byte-Program:
– Sector-Erase Time: 18 ms (typical)
– Chip-Erase Time: 70 ms (typical)
– Byte-Program Time: 14 µs (typical)
– Chip Rewrite Time:
4 seconds (typical) for GLS29SF/VF020
8 seconds (typical) for GLS29SF/VF040
• Automatic Write Timing
– Internal V
PP
Generation
• End-of-Write Detection
– Toggle Bit
– Data# Polling
• TTL I/O Compatibility for GLS29SF020/040
• CMOS I/O Compatibility for GLS29VF020/040
• JEDEC Standard
– Flash EEPROM Pinouts and command sets
• Packages Available
– 32-lead PLCC
– 32-lead TSOP (8mm x 14mm)
• All non-Pb (lead-free) devices are RoHS compliant
PRODUCT DESCRIPTION
The GLS29SF020/040 and GLS29VF020/040 are 256K
x8 / 512K x8 CMOS Small-Sector Flash (SSF) manufac-
tured with high-performance SuperFlash technology. The
split-gate cell design and thick-oxide tunneling injector
attain better reliability and manufacturability compared with
alternate approaches. The GLS29SF020/040 devices
write (Program or Erase) with a 4.5-5.5V power supply.
The GLS29VF020/040 devices write (Program or Erase)
with a 2.7-3.6V power supply. These devices conform to
JEDEC standard pin assignments for x8 memories.
Featuring high performance Byte-Program, the
GLS29SF020/040 and GLS29VF020/040 devices pro-
vide a maximum Byte-Program time of 20 µsec. To protect
against inadvertent write, they have on-chip hardware and
Software Data Protection schemes. Designed, manufac-
tured, and tested for a wide spectrum of applications, these
devices are offered with a guaranteed endurance of at
least 10,000 cycles. Data retention is rated at greater than
100 years.
The GLS29SF020/040 and GLS29VF020/040 devices
are suited for applications that require convenient and eco-
nomical updating of program, configuration, or data mem-
ory. For all system applications, they significantly improve
performance and reliability, while lowering power consump-
tion. They inherently use less energy during Erase and
Program than alternative flash technologies. The total
energy consumed is a function of the applied voltage, cur-
rent, and time of application. Since for any given voltage
range, the SuperFlash technology uses less current to pro-
gram and has a shorter erase time, the total energy con-
sumed during any Erase or Program operation is less than
alternative flash technologies. They also improve flexibility
while lowering the cost for program, data, and configuration
storage applications.
The SuperFlash technology provides fixed Erase and Pro-
gram times independent of the number of Erase/Program
cycles that have occurred. Therefore, the system software
or hardware does not have to be modified or de-rated as is
necessary with alternative flash technologies, whose Erase
and Program times increase with accumulated Erase/Pro-
gram cycles.
©2010 Greenliant Systems, Ltd.
www.greenliant.com
S71160-15-00005/10
2 Mbit / 4 Mbit Small-Sector Flash
GLS29SF020 / GLS29SF040
GLS29VF020 / GLS29VF040
Data Sheet
To meet high density, surface mount requirements, the
GLS29SF020/040 and GLS29VF020/040 devices are
offered in 32-lead PLCC and 32-lead TSOP packages. The
pin assignments are shown in Figures 2 and 3.
Sector-Erase Operation
The Sector-Erase operation allows the system to erase the
device on a sector-by-sector basis. The GLS29SF020/
040 and GLS29VF020/040 offer Sector-Erase mode. The
sector architecture is based on uniform sector size of 128
Bytes. The Sector-Erase operation is initiated by executing
a six-byte command sequence with Sector-Erase com-
mand (20H) and sector address (SA) in the last bus cycle.
The sector address is latched on the falling edge of the
sixth WE# pulse, while the command (20H) is latched on
the rising edge of the sixth WE# pulse. The internal Erase
operation begins after the sixth WE# pulse. The End-of-
Erase operation can be determined using either Data#
Polling or Toggle Bit methods. For timing waveforms, see
Figure 9. Any commands issued during the Sector-Erase
operation are ignored.
Device Operation
Commands are used to initiate the memory operation func-
tions of the device. Commands are written to the device
using standard microprocessor write sequences. A com-
mand is written by asserting WE# low while keeping CE#
low. The address bus is latched on the falling edge of WE#
or CE#, whichever occurs last. The data bus is latched on
the rising edge of WE# or CE#, whichever occurs first.
Read
The Read operation of the GLS29SF020/040 and
GLS29VF020/040 devices are controlled by CE# and
OE#, both have to be low for the system to obtain data
from the outputs. CE# is used for device selection. When
CE# is high, the chip is deselected and only standby power
is consumed. OE# is the output control and is used to gate
data from the output pins. The data bus is in high imped-
ance state when either CE# or OE# is high. Refer to the
Read cycle timing diagram in Figure 4 for further details.
Chip-Erase Operation
The GLS29SF020/040 and GLS29VF020/040 devices
provide a Chip-Erase operation, which allows the user to
erase the entire memory array to the “1s” state. This is use-
ful when the entire device must be quickly erased.
The Chip-Erase operation is initiated by executing a six-
byte Software Data Protection command sequence with
Chip-Erase command (10H) with address 555H in the last
byte sequence. The internal Erase operation begins with
the rising edge of the sixth WE# or CE#, whichever occurs
first. During the internal Erase operation, the only valid read
is Toggle Bit or Data# Polling. See Table 4 for the com-
mand sequence, Figure 10 for the timing diagram, and Fig-
ure 19 for the flowchart. Any commands written during the
Chip-Erase operation will be ignored.
Byte-Program Operation
The GLS29SF020/040 and GLS29VF020/040 devices
are programmed on a byte-by-byte basis. Before program-
ming, the sector where the byte exists must be fully erased.
The Program operation is accomplished in three steps.
The first step is the three-byte load sequence for Software
Data Protection. The second step is to load byte address
and byte data. During the Byte-Program operation, the
addresses are latched on the falling edge of either CE# or
WE#, whichever occurs last. The data is latched on the ris-
ing edge of either CE# or WE#, whichever occurs first. The
third step is the internal Program operation which is initi-
ated after the rising edge of the fourth WE# or CE#, which-
ever occurs first. The Program operation, once initiated, will
be completed, within 20 µs. See Figures 5 and 6 for WE#
and CE# controlled Program operation timing diagrams
and Figure 16 for flowcharts. During the Program opera-
tion, the only valid reads are Data# Polling and Toggle Bit.
During the internal Program operation, the host is free to
perform additional tasks. Any commands written during the
internal Program operation will be ignored.
Write Operation Status Detection
The GLS29SF020/040 and GLS29VF020/040 devices
provide two software means to detect the completion of a
Write (Program or Erase) cycle, in order to optimize the
system Write cycle time. The software detection includes
two status bits: Data# Polling (DQ
7
) and Toggle Bit
(DQ
6
). The End-of-Write detection mode is enabled after
the rising edge of WE# which initiates the internal Pro-
gram or Erase operation.
The actual completion of the nonvolatile write is asyn-
chronous with the system; therefore, either a Data# Poll-
ing or Toggle Bit read may be simultaneous with the
completion of the Write cycle. If this occurs, the system
may possibly get an erroneous result, i.e., valid data may
appear to conflict with either DQ
7
or DQ
6
. In order to pre-
©2010 Greenliant Systems, Ltd.
2
S71160-15-000
05/10
2 Mbit / 4 Mbit Small-Sector Flash
GLS29SF020 / GLS29SF040
GLS29VF020 / GLS29VF040
Data Sheet
vent spurious rejection, if an erroneous result occurs, the
software routine should include a loop to read the
accessed location an additional two (2) times. If both
reads are valid, then the device has completed the Write
cycle, otherwise the rejection is valid.
Hardware Data Protection
Noise/Glitch Protection: A WE# or CE# pulse of less than 5
ns will not initiate a Write cycle.
V
DD
Power Up/Down Detection: The Write operation is
inhibited when V
DD
is less than 2.5V for GLS29SF020/
040. The Write operation is inhibited when V
DD
is less than
1.5V. for GLS29VF020/040.
Write Inhibit Mode: Forcing OE# low, CE# high, or WE#
high will inhibit the Write operation. This prevents inadver-
tent writes during power-up or power-down.
Data# Polling (DQ
7
)
When the GLS29SF020/040 and GLS29VF020/040
devices are in the internal Program operation, any
attempt to read DQ
7
will produce the complement of the
true data. Once the Program operation is completed,
DQ
7
will produce true data. Note that even though DQ
7
may have valid data immediately following the comple-
tion of an internal Write operation, the remaining data
outputs may still be invalid: valid data on the entire data
bus will appear in subsequent successive Read cycles
after an interval of 1 µs. During internal Erase operation,
any attempt to read DQ
7
will produce a ‘0’. Once the
internal Erase operation is completed, DQ
7
will produce
a ‘1’. The Data# Polling is valid after the rising edge of
fourth WE# (or CE#) pulse for Program operation. For
Sector- or Chip-Erase, the Data# Polling is valid after the
rising edge of sixth WE# (or CE#) pulse. See Figure 7 for
Data# Polling timing diagram and Figure 17 for a flow-
chart.
Software Data Protection (SDP)
The GLS29SF020/040 and GLS29VF020/040 provide
the JEDEC approved Software Data Protection scheme for
all data alteration operations, i.e., Program and Erase. Any
Program operation requires the inclusion of a series of
three- byte sequence. The three-byte load sequence is
used to initiate the Program operation, providing optimal
protection from inadvertent Write operations, e.g., during
the system power-up or power-down. Any Erase operation
requires the inclusion of a six-byte load sequence. These
devices are shipped with the Software Data Protection per-
manently enabled. The specific software command codes
are shown in Table 4. During SDP command sequence,
invalid commands will abort the device to read mode,
within T
RC.
Toggle Bit (DQ
6
)
During the internal Program or Erase operation, any con-
secutive attempts to read DQ
6
will produce alternating ‘0’s
and ‘1’s, i.e., toggling between 0 and 1. When the internal
Program or Erase operation is completed, the toggling will
stop. The device is then ready for the next operation. The
Toggle Bit is valid after the rising edge of fourth WE# (or
CE#) pulse for Program operation. For Sector or Chip-
Erase, the Toggle Bit is valid after the rising edge of sixth
WE# (or CE#) pulse. See Figure 8 for Toggle Bit timing dia-
gram and Figure 17 for a flowchart.
Product Identification
The Product Identification mode identifies the devices as
GLS29SF020,
GLS29SF040
and
GLS29VF020,
GLS29VF040 and manufacturer as Greenliant. This mode
may be accessed by software operations. Users may use
the Software Product Identification operation to identify the
part (i.e., using the device ID) when using multiple manu-
facturers in the same socket. For details, see Table 4 for
Data Protection
The GLS29SF020/040 and GLS29VF020/040 devices
provide both hardware and software features to protect
nonvolatile data from inadvertent writes.
©2010 Greenliant Systems, Ltd.
3
S71160-15-000
05/10
2 Mbit / 4 Mbit Small-Sector Flash
GLS29SF020 / GLS29SF040
GLS29VF020 / GLS29VF040
Data Sheet
software operation, Figure 11 for the Software ID Entry and
Read timing diagram, and Figure 18 for the Software ID
Entry command sequence flowchart.
TABLE 1: Product Identification
Address
Manufacturer’s ID
Device ID
GLS29SF020
GLS29VF020
GLS29SF040
GLS29VF040
0001H
0001H
0001H
0001H
24H
25H
13H
14H
T1.3 1160
Product Identification Mode Exit/Reset
In order to return to the standard Read mode, the Software
Product Identification mode must be exited. Exit is accom-
plished by issuing the Software ID Exit command
sequence, which returns the device to the Read operation.
Please note that the Software ID Exit command is ignored
during an internal Program or Erase operation. See Table 4
for software command codes, Figure 12 for timing wave-
form, and Figure 18 for a flowchart.
Data
BFH
0000H
X-Decoder
SuperFlash
Memory
Memory
Address
Address Buffers & Latches
Y-Decoder
CE#
OE#
WE#
DQ
7
- DQ
0
1160 B1.0
Control Logic
I/O Buffers and Data Latches
FIGURE 1: Functional Block Diagram
©2010 Greenliant Systems, Ltd.
4
S71160-15-000
05/10
2 Mbit / 4 Mbit Small-Sector Flash
GLS29SF020 / GLS29SF040
GLS29VF020 / GLS29VF040
Data Sheet
GLS29SF/VF040
VDD
WE#
WE#
A12
A15
A16
A18
GLS29SF/VF020
VDD
A12
A15
A16
GLS29SF/VF040
GLS29SF/VF020
A17
GLS29SF/VF020
NC
A17
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
5
6
7
8
9
10
11
12
13
GLS29SF/VF020
4
3
2
1
32 31 30
GLS29SF/VF040
29
28
27
26
25
24
23
22
21
A14
A13
A8
A9
A11
OE#
A10
CE#
DQ7
A14
A13
A8
A9
A11
OE#
A10
CE#
DQ7
32-lead PLCC
T View
op
14 15 16 17 18 19 20
DQ1
DQ2
DQ3
DQ4
DQ5
VSS
DQ6
1160 32-plcc NH P1.2
GLS29SF/VF040
DQ1
DQ2
DQ3
DQ4
DQ5
FIGURE 2: Pin Assignments for 32-lead PLCC
GLS29SF/VF040 GLS29SF/VF020
A11
A9
A8
A13
A14
A17
WE#
VDD
A18
A16
A15
A12
A7
A6
A5
A4
A11
A9
A8
A13
A14
A17
WE#
VDD
NC
A16
A15
A12
A7
A6
A5
A4
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1160 32-tsop
WH P2.2
DQ6
VSS
GLS29SF/VF020 GLS29SF/VF04
OE#
A10
CE#
DQ7
DQ6
DQ5
DQ4
DQ3
VSS
DQ2
DQ1
DQ0
A0
A1
A2
A3
OE#
A10
CE#
DQ7
DQ6
DQ5
DQ4
DQ3
VSS
DQ2
DQ1
DQ0
A0
A1
A2
A3
Standard Pinout
T View
op
Die Up
FIGURE 3: Pin Assignments for 32-lead TSOP (8mm x 14mm)
©2010 Greenliant Systems, Ltd.
5
S71160-15-000
05/10
查看更多>
参数对比
与GLS29VF020-70-4C-WHE相近的元器件有:GLS29VF040-70-4I-NHE-T、GLS29SF020-55-4I-NHE、GLS29VF020-70-4C-NHE、GLS29VF020-70-4I-WHE、GLS29SF040-55-4C-NHE-T、GLS29SF020-55-4C-NHE、GLS29SF040-55-4I-WHE。描述及对比如下:
型号 GLS29VF020-70-4C-WHE GLS29VF040-70-4I-NHE-T GLS29SF020-55-4I-NHE GLS29VF020-70-4C-NHE GLS29VF020-70-4I-WHE GLS29SF040-55-4C-NHE-T GLS29SF020-55-4C-NHE GLS29SF040-55-4I-WHE
描述 Flash Memory 256K X 8 70ns Flash Memory 4Mb Small-Sect Flash 512K x 8, 128B Sect Flash Memory 2M (256Kx8) 55ns 5.0V Industrial Flash Memory 2M (256Kx8) 70ns 2.7-3.6V Commercial Flash Memory 2M (256Kx8) 70ns 2.7-3.6V Industrial Flash Memory 4M (512Kx8) 55ns 5.0V Commercial Flash Memory 256K x 8 55 ns Flash Memory 512K X 8 55ns
是否Rohs认证 符合 - 符合 符合 符合 - 符合 符合
厂商名称 Greenliant - Greenliant Greenliant Greenliant - - Greenliant
包装说明 TSSOP, TSSOP32,.56,20 - QCCJ, LDCC32,.5X.6 QCCJ, LDCC32,.5X.6 TSSOP, TSSOP32,.56,20 - QCCJ, LDCC32,.5X.6 TSSOP, TSSOP32,.56,20
Reach Compliance Code compliant - compliant compliant compliant - compliant compliant
最长访问时间 70 ns - 55 ns 70 ns 70 ns - 55 ns 55 ns
命令用户界面 NO - NO NO NO - NO -
数据轮询 YES - YES YES YES - YES YES
JESD-30 代码 R-PDSO-G32 - R-PQCC-J32 R-PQCC-J32 R-PDSO-G32 - R-PQCC-J32 R-PDSO-G32
内存密度 2097152 bit - 2097152 bit 2097152 bit 2097152 bit - 2097152 bit 4194304 bit
内存集成电路类型 FLASH - FLASH FLASH FLASH - FLASH FLASH
内存宽度 8 - 8 8 8 - 8 8
部门数/规模 2K - 2K 2K 2K - 2K 4K
端子数量 32 - 32 32 32 - 32 32
字数 262144 words - 262144 words 262144 words 262144 words - 262144 words 524288 words
字数代码 256000 - 256000 256000 256000 - 256000 512000
最高工作温度 70 °C - 85 °C 70 °C 85 °C - 70 °C 85 °C
组织 256KX8 - 256KX8 256KX8 256KX8 - 256KX8 512KX8
封装主体材料 PLASTIC/EPOXY - PLASTIC/EPOXY PLASTIC/EPOXY PLASTIC/EPOXY - PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 TSSOP - QCCJ QCCJ TSSOP - QCCJ TSSOP
封装等效代码 TSSOP32,.56,20 - LDCC32,.5X.6 LDCC32,.5X.6 TSSOP32,.56,20 - LDCC32,.5X.6 TSSOP32,.56,20
封装形状 RECTANGULAR - RECTANGULAR RECTANGULAR RECTANGULAR - RECTANGULAR RECTANGULAR
封装形式 SMALL OUTLINE, THIN PROFILE, SHRINK PITCH - CHIP CARRIER CHIP CARRIER SMALL OUTLINE, THIN PROFILE, SHRINK PITCH - CHIP CARRIER SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
并行/串行 PARALLEL - PARALLEL PARALLEL PARALLEL - PARALLEL PARALLEL
电源 3/3.3 V - 5 V 3/3.3 V 3/3.3 V - 5 V 5 V
认证状态 Not Qualified - Not Qualified Not Qualified Not Qualified - Not Qualified Not Qualified
部门规模 128 - 128 128 128 - 128 128
最大待机电流 0.00003 A - 0.0001 A 0.00003 A 0.00003 A - 0.0001 A 0.0001 A
最大压摆率 0.03 mA - 0.03 mA 0.03 mA 0.03 mA - 0.03 mA 0.03 mA
表面贴装 YES - YES YES YES - YES YES
技术 CMOS - CMOS CMOS CMOS - CMOS CMOS
温度等级 COMMERCIAL - INDUSTRIAL COMMERCIAL INDUSTRIAL - COMMERCIAL INDUSTRIAL
端子形式 GULL WING - J BEND J BEND GULL WING - J BEND GULL WING
端子节距 0.5 mm - 1.27 mm 1.27 mm 0.5 mm - 1.27 mm 0.5 mm
端子位置 DUAL - QUAD QUAD DUAL - QUAD DUAL
切换位 YES - YES YES YES - YES YES
类型 NOR TYPE - NOR TYPE NOR TYPE NOR TYPE - NOR TYPE NOR TYPE
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