CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1.
θ
JA
is measured with the component mounted on an evaluation PC board in free air.
TABLE 1. DC ELECTRICAL PERFORMANCE SPECIFICATIONS
Device Tested at: V
SUPPLY
=
±5V,
R
SOURCE
= 0Ω, R
L
= 100Ω, V
OUT
= 0V, Unless Otherwise Specified.
PARAMETER
Output Offset Voltage
SYMBOL
V
OS
CONDITIONS
V
CM
= 0V
GROUP A
SUBGROUPS
1
2, 3
Power Supply
Rejection Ratio
PSRRP
∆V
SUP
=
±1.25V
V+ = 6.25V, V- = -5V
V+ = 3.75V, V- = -5V
∆V
SUP
=
±1.25V
V+ = 5V, V- = -6.25V
V+ = 5V, V- = -3.75V
V
CM
= 0V
1
2, 3
1
2, 3
1
2, 3
Input Current Common
Mode Rejection
Input Resistance
CMS
IBP
∆V
CM
=
±2V
V+ = 3V, V- = -7V
V+ = 7V, V- = -3V
Note 2
1
2, 3
1
2, 3
Gain (V
OUT
= 2V
P-P
)
A
VP1
V
IN
= -1V to +1V
1
2, 3
Output Voltage Swing
V
OP100
R
L
= 100Ω, V
IN
= +3.3V
1
2, 3
V
ON100
R
L
= 100Ω, V
IN
= -3.3V
1
2, 3
Output Voltage Swing
V
OP50
R
L
= 50Ω, V
IN
= +2.7V
R
L
= 50Ω, V
IN
= +3.3V
1
2
3
V
ON50
R
L
= 50Ω, V
IN
= -2.7V
R
L
= 50Ω, V
IN
= -3.3V
1
2
3
TEMPERATURE
(
o
C)
25
125, -55
25
125, -55
25
125, -55
25
125, -55
25
125, -55
25
125, -55
25
125, -55
25
125, -55
25
125, -55
25
125
-55
25
125
-55
MIN
-25
-40
39
35
39
35
-40
-65
-
-
25
20
0.980
0.975
3
2.5
-
-
2.5
2.5
1.5
-
-
-
MAX
25
40
-
-
-
-
40
65
40
50
-
-
1.020
1.025
-
-
-3
-2.5
-
-
-
-2.5
-2.5
-1.5
UNITS
mV
mV
dB
dB
dB
dB
µA
µA
µA/V
µA/V
kΩ
kΩ
V/V
V/V
V
V
V
V
V
V
V
V
V
V
PSRRN
Input Current
I
BSP
R
IN
Spec Number
2
511083-883
HFA1110/883
TABLE 1. DC ELECTRICAL PERFORMANCE SPECIFICATIONS (Continued)
Device Tested at: V
SUPPLY
=
±5V,
R
SOURCE
= 0Ω, R
L
= 100Ω, V
OUT
= 0V, Unless Otherwise Specified.
PARAMETER
Output Current
SYMBOL
+I
OUT
CONDITIONS
Note 3
GROUP A
SUBGROUPS
1, 2
3
-I
OUT
Note 3
1, 2
3
Quiescent Power
Supply Current
I
CC
R
L
= 100Ω
1
2, 3
I
EE
R
L
= 100Ω
1
2, 3
NOTES:
2. Guaranteed from Input Common Mode Rejection Test, by: R
IN
= 1/CMS
IBP
.
3. Guaranteed from V
OUT
Test with R
L
= 50Ω, by: I
OUT
= V
OUT
/50Ω.
TABLE 2. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
Interim Electrical Parameters (Pre Burn-In)
Final Electrical Test Parameters
Group A Test Requirements
Groups C and D Endpoints
NOTE:
4. PDA applies to Subgroup 1 only.
SUBGROUPS (SEE TABLE 1)
1
1 (Note 7), 2, 3
1, 2, 3
1
TEMPERATURE
(
o
C)
25, 125
-55
25, 125
-55
25
125, -55
25
125, -55
MIN
50
30
-
-
14
-
-26
-33
MAX
-
-
-50
-30
26
33
-14
-
UNITS
mA
mA
mA
mA
mA
mA
mA
mA
Spec Number
3
511083-883
HFA1110/883
Test Circuit
(Applies to Table 1)
V+
I
CC
+
10
0.1
V
OS
=
0.1
510
1
V
IN
0.1
100K (0.01%)
1
K1
2
5
100
100
4
8
DUT
470pF
+
-
x100
510
1K
V
OUT
V
Y
V
Y
100
I
BIAS
=
V
Z
100K
V
Z
K3
-
+
HA-5177
0.1
+
10
0.1
I
EE
V-
NOTE:
All Resistors =
±1%
(Ω)
All Capacitors =
±10%
(µF)
Unless Otherwise Noted
Chip Components Recommended
Spec Number
4
511083-883
HFA1110/883
Test Waveforms
SIMPLIFIED TEST CIRCUIT FOR LARGE AND SMALL SIGNAL PULSE RESPONSE
