◆Reliability
specification
Test items
Life (biased)
High temperature high humidity
Temperature shock
High temperature exposure
Resistance to soldering heat
*1
Standard
≦47Ω
≧47Ω
Condition (test methods (JIS C5201-1)
*
70℃, rated voltage,
1
90min on 30min off, 1000hours
±
（0.5％+0.05Ω） ±
（0.25％+0.01Ω）
±
（0.25％+0.05Ω） ±
（0.1％+0.01Ω）
±
（0.25％+0.05Ω） ±
（0.1％+0.01Ω）
±
（0.25％+0.05Ω） ±
（0.1％+0.01Ω）
Thin film surface mount resistors
±
（0.25％+0.05Ω） ±
（0.1％+0.01Ω）
85℃, 85%RH, 1/10 of rated power, 90min on 30min off, 1000hours
-55℃ (30min) ~ 125℃ (30min) 1000cycles
155℃, no bias, 1000hours
260±5℃, 10 seconds (reflow)
Rated voltage is given by E=
R x P
E= rated voltage (V), R=nominal resistance value(Ω), P=rated power(W)
If rated voltage exceeds maximum voltage /element, maximum voltage/element is the rated voltage.
◆Reliability
test data
○Biased
life test
0.12
0.10
○High
temperature high humidity (biased)
0.12
0.10
HRG series
Resistance drift
（%）
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
Rated Power 1.0W n = 4
Resistance drift
（%）
0.08
Load Life @ 70℃ at
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
Temperature Humidity Bias
0.1W n = 25
HRG3216：10kΩ
HRG3216：10kΩ
10 100 1000 10000
Test duration(h)
10 100 1000 10000
Test duration(h)
○Temperature
shock
0.12
0.10
○High
temperature exposure
0.12
0.10
Resistance drift
（%）
Resistance drift
（%）
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
Thermal Shock
-55℃ - +125℃ n = 25
0.08
0.06
0.04
0.02
0.00
-0.02
-0.04
-0.06
-0.08
-0.10
-0.12
High Temperature Exposure
at 155℃ with no power n = 25
HRG3216：10kΩ
HRG3216：10kΩ
10 100 1000 10000
Test duration(h)
10 100 1000 10000
Test duration(h)
◆Derating
Curve
Ratio to rated power (％)
100
50
0
-55 0 50 70 100 155
Ambient temperature (℃)
26
