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HY57V56820HT-K

Synchronous DRAM, 32MX8, 5.4ns, CMOS, PDSO54, 0.400 INCH, TSOP2-54

器件类别:存储    存储   

厂商名称:SK Hynix(海力士)

厂商官网:http://www.hynix.com/eng/

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器件参数
参数名称
属性值
是否无铅
含铅
是否Rohs认证
不符合
厂商名称
SK Hynix(海力士)
零件包装代码
TSOP2
包装说明
TSOP2, TSOP54,.46,32
针数
54
Reach Compliance Code
compliant
ECCN代码
EAR99
访问模式
FOUR BANK PAGE BURST
最长访问时间
5.4 ns
其他特性
AUTO/SELF REFRESH
最大时钟频率 (fCLK)
133 MHz
I/O 类型
COMMON
交错的突发长度
1,2,4,8
JESD-30 代码
R-PDSO-G54
长度
22.22 mm
内存密度
268435456 bit
内存集成电路类型
SYNCHRONOUS DRAM
内存宽度
8
功能数量
1
端口数量
1
端子数量
54
字数
33554432 words
字数代码
32000000
工作模式
SYNCHRONOUS
最高工作温度
70 °C
最低工作温度
组织
32MX8
输出特性
3-STATE
封装主体材料
PLASTIC/EPOXY
封装代码
TSOP2
封装等效代码
TSOP54,.46,32
封装形状
RECTANGULAR
封装形式
SMALL OUTLINE, THIN PROFILE
峰值回流温度(摄氏度)
NOT SPECIFIED
电源
3.3 V
认证状态
Not Qualified
刷新周期
8192
座面最大高度
1.2 mm
自我刷新
YES
连续突发长度
1,2,4,8,FP
最大待机电流
0.002 A
最大压摆率
0.22 mA
最大供电电压 (Vsup)
3.6 V
最小供电电压 (Vsup)
3 V
标称供电电压 (Vsup)
3.3 V
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子形式
GULL WING
端子节距
0.8 mm
端子位置
DUAL
处于峰值回流温度下的最长时间
NOT SPECIFIED
宽度
10.16 mm
文档预览
HY57V56820H(L)T
4 Banks x 8M x 8Bit Synchronous DRAM
DESCRIPTION
The HY57V56820HT is a 268,435,456bit CMOS Synchronous DRAM, ideally suited for the main memory applications which require
large memory density and high bandwidth. HY57V56820HT is organized as 4banks of 8,388,608x8.
HY57V56820HT is offering fully synchronous operation referenced to a positive edge of the clock. All inputs and outputs are synchro-
nized with the rising edge of the clock input. The data paths are internally pipelined to achieve very high bandwidth. All input and output
voltage levels are compatible with LVTTL.
Programmable options include the length of pipeline (Read latency of 2 or 3), the number of consecutive read or write cycles initiated by
a single control command (Burst length of 1,2,4,8 or full page), and the burst count sequence(sequential or interleave). A burst of read or
write cycles in progress can be terminated by a burst terminate command or can be interrupted and replaced by a new burst read or
write command on any cycle. (This pipelined design is not restricted by a `2N` rule.)
FEATURES
Single 3.3±0.3V power supply
All device pins are compatible with LVTTL interface
JEDEC standard 400mil 54pin TSOP-II with 0.8mm of pin
pitch
All inputs and outputs referenced to positive edge of system
clock
Data mask function by DQM
Internal four banks operation
Auto refresh and self refresh
8192 refresh cycles / 64ms
Programmable Burst Length and Burst Type
- 1, 2, 4, 8 or Full page for Sequential Burst
- 1, 2, 4 or 8 for Interleave Burst
Programmable CAS Latency ; 2, 3 Clocks
ORDERING INFORMATION
Part No.
HY57V56820HT-6
HY57V56820HT-K
HY57V56820HT-H
HY57V56820HT-8
HY57V56820HT-P
HY57V56820HT-S
HY57V56820HLT-6
HY57V56820HLT-K
HY57V56820HLT-H
HY57V56820HLT-8
HY57V56820HLT-P
HY57V56820HLT-S
Clock Frequency
166MHz
133MHz
133MHz
125MHz
100MHz
100MHz
166MHz
133MHz
133MHz
125MHz
100MHz
100MHz
Power
Organization
Interface
Package
Normal
4Banks x 8Mbits x8
LVTTL
400mil 54pin TSOP II
Low power
This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsibility for use of
circuits described. No patent licenses are implied.
Rev. 1.4/Sep. 02
1
HY57V56820H(L)T
PIN CONFIGURATION
V
DD
DQ0
V
DDQ
NC
DQ1
V
SSQ
NC
DQ2
V
DDQ
NC
DQ3
V
SSQ
NC
V
DD
NC
/WE
/CAS
/RAS
/CS
BA0
BA1
A10/AP
A0
A1
A2
A3
V
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
54
53
52
51
50
49
48
47
46
45
44
43
54pin TSOP II 42
400mil x 875mil 41
0.8mm pin pitch 40
39
38
37
36
35
34
33
32
31
30
29
28
V
SS
DQ7
V
SSQ
NC
DQ6
V
DDQ
NC
DQ5
V
SSQ
NC
DQ4
V
DDQ
NC
V
SS
NC
DQM
CLK
CKE
A12
A11
A9
A8
A7
A6
A5
A4
V
SS
PIN DESCRIPTION
PIN
CLK
CKE
CS
BA0, BA1
A0 ~ A12
Clock
Clock Enable
Chip Select
Bank Address
Address
Row Address Strobe,
Column Address Strobe,
Write Enable
Data Input/Output Mask
Data Input/Output
Power Supply/Ground
Data Output Power/Ground
No Connection
PIN NAME
DESCRIPTION
The system clock input. All other inputs are registered to the SDRAM on the
rising edge of CLK
Controls internal clock signal and when deactivated, the SDRAM will be one
of the states among power down, suspend or self refresh
Enables or disables all inputs except CLK, CKE and DQM
Selects bank to be activated during RAS activity
Selects bank to be read/written during CAS activity
Row Address : RA0 ~ RA12, Column Address : CA0 ~ CA9
Auto-precharge flag : A10
RAS, CAS and WE define the operation
Refer function truth table for details
Controls output buffers in read mode and masks input data in write mode
Multiplexed data input / output pin
Power supply for internal circuits and input buffers
Power supply for output buffers
No connection
RAS, CAS, WE
DQM
DQ0 ~ DQ7
V
DD
/V
SS
V
DDQ
/V
SSQ
NC
Rev. 1.4/Sep. 02
2
HY57V56820H(L)T
FUNCTIONAL BLOCK DIAGRAM
8Mbit x 4banks x 8 I/O Synchronous DRAM
Self refresh logic
& timer
Internal Row
counter
CLK
Row active
8Mx8 Bank3
Row
Pre
Decoders
8Mx8 Bank2
X decoders
8Mx8 Bank1
X decoders
8Mx8 Bank0
X decoders
DQ0
DQ1
I/O Buffer & Logic
Sense AMP & I/O Gate
CKE
CS
State Machine
RAS
CAS
WE
DQM
X decoders
refresh
Column
Active
Memory
Cell
Array
Column
Pre
Decoders
DQ6
DQ7
Y decoders
Bank Select
Column Add
Counter
A0
A1
Address buffers
A12
BA0
BA1
Address
Registers
Burst
Counter
Mode Registers
CAS Latency
Data Out Control
Pipe Line Control
Rev. 1.4/Sep. 02
3
HY57V56820H(L)T
ABSOLUTE MAXIMUM RATINGS
Parameter
Ambient Temperature
Storage Temperature
Voltage on Any Pin relative to V
SS
Voltage on V
DD
relative to V
SS
Short Circuit Output Current
Power Dissipation
Soldering Temperature
Time
T
A
T
STG
V
IN
, V
OUT
V
DD,
V
DDQ
I
OS
P
D
T
SOLDER
Symbol
0 ~ 70
-55 ~ 125
-1.0 ~ 4.6
-1.0 ~ 4.6
50
1
260
10
Rating
°C
°C
V
V
mA
W
°C ⋅
Sec
Unit
Note :
Operation at above absolute maximum rating can adversely affect device reliability
DC OPERATING CONDITION
(TA=0 to 70°C)
Parameter
Power Supply Voltage
Input High Voltage
Input Low Voltage
Symbol
V
DD
, V
DDQ
V
IH
V
IL
Min
3.0
2.0
V
SSQ
- 2.0
Typ.
3.3
3.0
0
Max
3.6
V
DDQ
+ 0.3
0.8
Unit
V
V
V
Note
1
1,2
1,3
Note :
1.All voltages are referenced to V
SS
= 0V
2.V
IH
(max) is acceptable 5.6V AC pulse width with
≤3ns
of duration
3.V
IL
(min) is acceptable -2.0V AC pulse width with
≤3ns
of duration
AC OPERATING CONDITION
(TA=0 to 70°C, V
DD
=3.3
±
0.3V, V
SS
=0V)
Parameter
AC Input High / Low Level Voltage
Input Timing Measurement Reference Level Voltage
Input Rise / Fall Time
Output Timing Measurement Reference Level
Output Load Capacitance for Access Time Measurement
Symbol
V
IH
/ V
IL
Vtrip
tR / tF
Voutref
CL
Value
2.4/0.4
1.4
1
1.4
50
Unit
V
V
ns
V
pF
1
Note
Note :
1. Output load to measure access time is equivalent to two TTL gates and one capacitor (50pF)
For details, refer to AC/DC output circuit
Rev. 1.4/Sep. 02
4
HY57V56820H(L)T
CAPACITANCE
(TA=25°C, f=1MHz)
-6/K/H
Parameter
Input capacitance
CLK
A0 ~ A12, BA0, BA1, CKE, CS, RAS, CAS,
WE, DQM
Data input / output capacitance
DQ0 ~ DQ7
Pin
Symbol
Min
C
I1
CI
2
C
I/O
2.5
2.5
4.0
Max
3.5
3.8
6.5
Min
2.5
2.5
4.0
Max
4.0
5.0
6.5
pF
pF
pF
-8/P/S
Unit
OUTPUT LOAD CIRCUIT
Vtt=1.4V
RT=250
Output
Output
50pF
50pF
DC Output Load Circuit
AC Output Load Circuit
DC CHARACTERISTICS I
(TA=0 to 70°C, V
DD
=3.3
±
0.3V)
Parameter
Input Leakage Current
Output Leakage Current
Output High Voltage
Output Low Voltage
I
LI
I
LO
V
OH
V
OL
Symbol
Min.
-1
-1
2.4
-
Max
1
1
-
0.4
Unit
uA
uA
V
V
Note
1
2
I
OH
= -4mA
I
OL
= +4mA
Note :
1.V
IN
= 0 to 3.6V, All other pins are not tested under V
IN
=0V
2.D
OUT
is disabled, V
OUT
=0 to 3.6V
Rev. 1.4/Sep. 02
5
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