FAST CMOS
16-BIT LATCHED
TRANSCEIVER
Integrated Device Technology, Inc.
IDT54/74FCT16543T/AT/CT/ET
IDT54/74FCT162543T/AT/CT/ET
FEATURES:
• Common features:
– 0.5 MICRON CMOS Technology
– High-speed, low-power CMOS replacement for
ABT functions
–
Typical t
SK
(o) (Output Skew) < 250ps
– Low input and output leakage
≤1µA
(max.)
– ESD > 2000V per MIL-STD-883, Method 3015;
> 200V using machine model (C = 200pF, R = 0)
– Packages include 25 mil pitch SSOP, 19.6 mil pitch
TSSOP, 15.7 mil pitch TVSOP and 25 mil pitch Cerpack
– Extended commercial range of -40°C to +85°C
– V
CC
= 5V
±10%
• Features for FCT16543T/AT/CT/ET:
– High drive outputs (-32mA I
OH
, 64mA I
OL
)
– Power off disable outputs permit “live insertion”
– Typical V
OLP
(Output Ground Bounce) < 1.0V at
V
CC
= 5V, T
A
= 25°C
• Features for FCT162543T/AT/CT/ET:
– Balanced Output Drivers:
±24mA
(commercial),
±16mA
(military)
– Reduced system switching noise
– Typical V
OLP
(Output Ground Bounce) < 0.6V at
V
CC
= 5V,T
A
= 25°C
DESCRIPTION:
The FCT16543T/AT/CT/ET and FCT162543T/AT/CT/ET
16-bit latched transceivers are built using advanced dual metal
CMOS technology. These high-speed, low-power devices are
organized as two independent 8-bit D-type latched transceiv-
ers with separate input and output control to permit indepen-
dent control of data flow in either direction. For example, the A-
to-B Enable (x
CEAB
) must be LOW in order to enter data from
the A port or to output data from the B port. x
LEAB
controls the
latch function. When x
LEAB
is LOW, the latches are transpar-
ent. A subsequent LOW-to-HIGH transition of x
LEAB
signal
puts the A latches in the storage mode. x
OEAB
performs output
enable function on the B port. Data flow from the B port to the
A port is similar but requires using x
CEBA
, x
LEBA
, and x
OEBA
inputs. Flow-through organization of signal pins simplifies
layout. All inputs are designed with hysteresis for improved
noise margin.
The FCT16543T/AT/CT/ET are ideally suited for driving
high-capacitance loads and low-impedance backplanes. The
output buffers are designed with power off disable capability to
allow "live insertion" of boards when used as backplane drivers.
The FCT162543T/AT/CT/ET have balanced output drive
with current limiting resistors. This offers low ground bounce,
minimal undershoot, and controlled output fall times–reducing
the need for external series terminating resistors. The
FCT162543T/AT/CT/ET are plug-in replacements for the
FCT16543T/AT/CT/ET and 54/74ABT16543 for on-board bus
interface applications.
FUNCTIONAL BLOCK DIAGRAM
1
OEBA
1
CEBA
1
LEBA
1
OEAB
1
CEAB
1
LEAB
2
OEBA
2
CEBA
2
LEBA
2
OEAB
2
CEAB
2
LEAB
C
1
A
1
2
A
1
C
1
B
1
D
C
D
D
C
D
2
B
1
TO 7 OTHER CHANNELS
2618 drw 01
TO 7 OTHER CHANNELS
2618 drw 02
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
©1996
Integrated Device Technology, Inc.
SEPTEMBER 1996
DSC-2618/7
5.12
1
IDT54/74FCT16543T/AT/CT/ET, 162543T/AT/CT/ET
FAST CMOS 16-BIT LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN CONFIGURATIONS
1
OEAB
1
LEAB
1
CEAB
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
56
55
54
53
52
51
50
49
48
47
46
45
44
SO56-1 43
SO56-2
SO56-3 42
41
40
39
38
37
36
35
34
33
32
31
30
29
1
OEBA
1
LEBA
1
CEBA
1
OEAB
1
LEAB
1
CEAB
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
E56-1
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
2618 drw 04
1
OEBA
1
LEBA
1
CEBA
GND
1
A
1
1
A
2
GND
1
B
1
1
B
2
GND
1
A
1
1
A
2
GND
1
B
1
1
B
2
V
CC
1
A
3
1
A
4
1
A
5
V
CC
1
B
3
1
B
4
1
B
5
V
CC
1
A
3
1
A
4
1
A
5
V
CC
1
B
3
1
B
4
1
B
5
GND
1
A
6
1
A
7
1
A
8
2
A
1
2
A
2
2
A
3
GND
1
B
6
1
B
7
1
B
8
2
B
1
2
B
2
2
B
3
GND
1
A
6
1
A
7
1
A
8
2
A
1
2
A
2
2
A
3
GND
1
B
6
1
B
7
1
B
8
2
B
1
2
B
2
2
B
3
GND
2
A
4
2
A
5
2
A
6
GND
2
B
4
2
B
5
2
B
6
GND
2
A
4
2
A
5
2
A
6
GND
2
B
4
2
B
5
2
B
6
V
CC
2
A
7
2
A
8
V
CC
2
B
7
2
B
8
V
CC
2
A
7
2
A
8
V
CC
2
B
7
2
B
8
GND
2
CEAB
2
LEAB
2
OEAB
GND
2
CEBA
2
LEBA
2
OEBA
GND
2
CEAB
2
LEAB
2
OEAB
GND
2
CEBA
2
LEBA
2
OEBA
SSOP/
TSSOP/TVSOP
TOP VIEW
2618 drw 03
CERPACK
TOP VIEW
5.12
2
IDT54/74FCT16543T/AT/CT/ET, 162543T/AT/CT/ET
FAST CMOS 16-BIT LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
PIN DESCRIPTION
Pin Names
x
OEAB
x
OEBA
x
CEAB
x
CEBA
x
LEAB
x
LEBA
xAx
xBx
Description
A-to-B Output Enable Input (Active LOW)
B-to-A Output Enable Input (Active LOW)
A-to-B Enable Input (Active LOW)
B-to-A Enable Input (Active LOW)
A-to-B Latch Enable Input (Active LOW)
B-to-A Latch Enable Input (Active LOW)
A-to-B Data Inputs or B-to-A 3-State Outputs
B-to-A Data Inputs or A-to-B 3-State Outputs
2618 tbl 01
FUNCTION TABLE
(1, 2)
For A-to-B (Symmetric with B-to-A)
Inputs
x
CEAB
x
LEAB
H
X
L
L
L
L
X
H
L
H
L
H
x
OEAB
X
X
L
L
H
H
Latch
Status
xAx to xBx
Storing
Storing
Transparent
Storing
Transparent
Storing
Output
Buffers
xBx
High Z
X
Current A Inputs
Previous* A Inputs
High Z
High Z
NOTES:
2618 tbl 02
1. * Before x
LEAB
LOW-to-HIGH Transition
H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
2. A-to-B data flow shown; B-to-A flow control is the same, except using
x
CEBA
, x
LEBA
and x
OEBA
.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Description
Max.
V
TERM(2)
Terminal Voltage with Respect to –0.5 to +7.0
GND
V
TERM(3)
Terminal Voltage with Respect to
–0.5 to
GND
V
CC
+0.5
T
STG
Storage Temperature
–65 to +150
I
OUT
DC Output Current
–60 to +120
Unit
V
V
°C
mA
CAPACITANCE
(T
A
= +25°C, f = 1.0MHz)
Symbol
Parameter
(1)
C
IN
Input
Capacitance
C
I/O
I/O
Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ.
3.5
3.5
Max. Unit
6.0
pF
8.0
pF
2618 lnk 04
NOTE:
1. This parameter is measured at characterization but not tested.
NOTES:
2618 lnk 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other condi-
tions above those indicated in the operational sections of this specifica-
tion is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
2. All device terminals except FCT162XXXT Output and I/O terminals.
3. Output and I/O terminals for FCT162XXXT.
5.12
3
IDT54/74FCT16543T/AT/CT/ET, 162543T/AT/CT/ET
FAST CMOS 16-BIT LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= –40°C to +85°C, V
CC
= 5.0V
±
10%; Military: T
A
= –55°C to +125°C, V
CC
= 5.0V
±
10%
Symbol
V
IH
V
IL
I
I H
I
I L
I
OZH
I
OZL
V
IK
I
OS
V
H
I
CCL
I
CCH
I
CCZ
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current (Input pins)
(5)
Input HIGH Current (I/O pins)
(5)
Input LOW Current (Input pins)
(5)
Input LOW Current (I/O pins)
(5)
High Impedance Output Current
(3-State Output pins)
(5)
Clamp Diode Voltage
Short Circuit Current
Input Hysteresis
Quiescent Power Supply Current
V
CC
= Min., I
IN
= –18mA
V
CC
= Max., V
O
= GND
(3)
—
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
V
I
= GND
V
CC
= Max.
V
O
= 2.7V
V
O
= 0.5V
Min.
2.0
—
—
—
—
—
—
—
—
–80
—
—
Typ.
(2)
—
—
—
—
—
—
—
—
–
0.7
–
140
Max.
—
Unit
V
V
µA
0.8
±1
±1
±1
±1
±1
±1
–
1.2
–
225
—
µA
V
mA
mV
µA
100
5
V
CC
= Max., V
IN
= GND or V
CC
500
2618 lnk 05
OUTPUT DRIVE CHARACTERISTICS FOR FCT16543T
Symbol
I
O
V
OH
Parameter
Output Drive Current
Output HIGH Voltage
Test Conditions
(1)
V
CC
= Max., V
O
= 2.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –3mA
I
OH
= –12mA MIL.
I
OH
= –15mA COM'L.
I
OH
= –24mA MIL.
I
OH
= –32mA COM'L.
(4)
I
OL
= 48mA MIL.
I
OL
= 64mA COM'L.
≤
4.5V
Min.
–50
2.5
2.4
2.0
—
—
Typ.
(2)
—
Max.
–
180
—
—
—
0.55
±1
Unit
mA
V
V
V
V
µA
2618 lnk 06
3.5
3.5
3.0
0.2
—
V
OL
I
OFF
Output LOW Voltage
Input/Output Power Off Leakage
(5)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= 0V, V
IN
or V
O
OUTPUT DRIVE CHARACTERISTICS FOR FCT162543T
Symbol
I
ODL
I
ODH
V
OH
V
OL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions
(1)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
V
CC
= 5V, V
IN
= V
IH
or V
IL,
V
OUT
= 1.5V
(3)
V
CC
= Min.
V
IN
= V
IH
or V
IL
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= –16mA MIL.
I
OH
= –24mA COM'L.
I
OL
= 16mA MIL.
I
OL
= 24mA COM'L.
Min.
60
–60
2.4
—
Typ.
(2)
115
–115
3.3
0.3
Max.
200
–200
—
0.55
Unit
mA
mA
V
V
2618 lnk 07
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
4. Duration of the condition can not exceed one second.
5. The test limit for this parameter is
±
5µA at T
A
= –55°C.
5.12
4
IDT54/74FCT16543T/AT/CT/ET, 162543T/AT/CT/ET
FAST CMOS 16-BIT LATCHED TRANSCEIVER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol
∆I
CC
I
CCD
Parameter
Quiescent Power Supply
Current TTL Inputs HIGH
Dynamic Power Supply Current
(4)
Test Conditions
(1)
V
CC
= Max.
V
IN
= 3.4V
(3)
V
CC
= Max., Outputs Open
x
CEAB
and x
OEAB
= GND
x
CEBA
= V
CC
One Input Toggling
50% Duty Cycle
V
CC
= Max., Outputs Open
f
i
= 10MHz
50% Duty Cycle
x
LEAB
, x
CEAB
and
x
OEAB
= GND
x
CEBA
= V
CC
One Bit Toggling
V
CC
= Max., Outputs Open
f
i
= 2.5MHz
50% Duty Cycle
x
LEAB
, x
CEAB
and
x
OEAB
= GND
x
CEBA
= V
CC
Sixteen Bits Toggling
V
IN
= V
CC
V
IN
= GND
Min.
—
—
Typ.
(2)
0.5
60
Max.
1.5
100
Unit
mA
µA/
MHz
I
C
Total Power Supply Current
(6)
V
IN
= V
CC
V
IN
= GND
—
0.6
1.5
mA
V
IN
= 3.4V
V
IN
= GND
—
0.9
2.3
V
IN
= V
CC
V
IN
= GND
—
2.4
4.5
(5)
V
IN
= 3.4V
V
IN
= GND
—
6.4
16.5
(5)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
N
CP
/2 + f
i
N
i
)
I
CC
= Quiescent Current (I
CCL
,
I
CCH
and I
CCZ
)
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
N
CP
= Number of Clock Inputs at f
CP
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
2618 tbl 08
5.12
5
