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IDT71V2559S80BG

ZBT SRAM, 256KX18, 8ns, CMOS, PBGA119, 14 X 22 MM, PLASTIC, BGA-119

器件类别:存储    存储   

厂商名称:IDT (Integrated Device Technology)

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器件参数
参数名称
属性值
是否Rohs认证
不符合
厂商名称
IDT (Integrated Device Technology)
零件包装代码
BGA
包装说明
14 X 22 MM, PLASTIC, BGA-119
针数
119
Reach Compliance Code
not_compliant
ECCN代码
3A991.B.2.A
最长访问时间
8 ns
其他特性
FLOW-THROUGH ARCHITECTURE
最大时钟频率 (fCLK)
95 MHz
I/O 类型
COMMON
JESD-30 代码
R-PBGA-B119
JESD-609代码
e0
长度
22 mm
内存密度
4718592 bit
内存集成电路类型
ZBT SRAM
内存宽度
18
湿度敏感等级
3
功能数量
1
端子数量
119
字数
262144 words
字数代码
256000
工作模式
SYNCHRONOUS
最高工作温度
70 °C
最低工作温度
组织
256KX18
输出特性
3-STATE
封装主体材料
PLASTIC/EPOXY
封装代码
BGA
封装等效代码
BGA119,7X17,50
封装形状
RECTANGULAR
封装形式
GRID ARRAY
并行/串行
PARALLEL
峰值回流温度(摄氏度)
NOT SPECIFIED
电源
2.5/3.3 V
认证状态
Not Qualified
座面最大高度
2.36 mm
最大待机电流
0.04 A
最小待机电流
3.14 V
最大压摆率
0.25 mA
最大供电电压 (Vsup)
3.465 V
最小供电电压 (Vsup)
3.135 V
标称供电电压 (Vsup)
3.3 V
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子面层
Tin/Lead (Sn63Pb37)
端子形式
BALL
端子节距
1.27 mm
端子位置
BOTTOM
处于峰值回流温度下的最长时间
NOT SPECIFIED
宽度
14 mm
文档预览
128K x 36, 256K x 18,
3.3V Synchronous ZBT™ SRAMs
2.5V I/O, Burst Counter,
Flow-Through Outputs
x
x
IDT71V2557
IDT71V2559
Features
128K x 36, 256K x 18 memory configurations
Supports high performance system speed - 100 MHz
(7.5 ns Clock-to-Data Access)
ZBT
TM
Feature - No dead cycles between write and read
cycles
Internally synchronized output buffer enable eliminates the
need to control
OE
Single R/W (READ/WRITE) control pin
4-word burst capability (Interleaved or linear)
Individual byte write (BW
1
-
BW
4
) control (May tie active)
Three chip enables for simple depth expansion
3.3V power supply (±5%)
2.5V (±5%)I/O Supply (V
DDQ
)
Packaged in a JEDEC Standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch
ball grid array (fBGA)
The IDT71V2557/59 contain address, data-in and control signal
registers. The outputs are flow-through (no output data register). Output
enable is the only asynchronous signal and can be used to disable the
outputs at any given time.
A Clock Enable (CEN) pin allows operation of the IDT71V2557/59
to be suspended as long as necessary. All synchronous inputs are
ignored when (CEN) is high and the internal device registers will hold
their previous values.
There are three chip enable pins (CE
1
, CE
2
,
CE
2
) that allow the
user to deselect the device when desired. If any one of these three is not
asserted when ADV/LD is low, no new memory operation can be initiated.
However, any pending data transfers (reads or writes) will be completed.
The data bus will tri-state one cycle after the chip is deselected or a write
is initiated.
The IDT71V2557/59 have an on-chip burst counter. In the burst
mode, the IDT71V2557/59 can provide four cycles of data for a single
address presented to the SRAM. The order of the burst sequence is
defined by the
LBO
input pin. The
LBO
pin selects between linear and
interleaved burst sequence. The ADV/LD signal is used to load a new
external address (ADV/LD = LOW) or increment the internal burst
counter (ADV/LD = HIGH).
The IDT71V2557/59 SRAMs utilize IDT's latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball
grid array (BGA) and a 165 fine pitch ball grid array (fBGA).
x
x
x
x
x
x
x
x
x
Description
The IDT71V2557/59 are 3.3V high-speed 4,718,592-bit (4.5 Mega-
bit) synchronous SRAMs organized as 128K x 36 / 256K x 18. They are
designed to eliminate dead bus cycles when turning the bus around
between reads and writes, or writes and reads. Thus they have been
given the name ZBT
TM
, or Zero Bus Turnaround.
Address and control signals are applied to the SRAM during one clock
cycle, and on the next clock cycle the associated data cycle occurs, be
it read or write.
Pin Description Summary
A
0
-A
17
CE
1
, CE
2
,
CE
2
OE
R/W
CEN
BW
1
,
BW
2
,
BW
3
,
BW
4
CLK
ADV/LD
LBO
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
V
DD
, V
DDQ
V
SS
Address Inputs
Chip Enables
Output Enable
Read/Write Signal
Clock Enable
Individual Byte Write Selects
Clock
Advance burst address / Load new address
Linear / Interleaved Burst Order
Data Input / Output
Core Power, I/O Power
Ground
Input
Input
Input
Input
Input
Input
Input
Input
Input
I/O
Supply
Supply
Synchronous
Synchronous
Asynchronous
Synchronous
Synchronous
Synchronous
N/A
Synchronous
Static
Synchronous
Static
Static
4878 tbl 01
ZBT and ZeroBus Turnaround are trademarks of Integrated Device Technology, Inc. and the architecture is supported by Micron Technology and Motorola Inc.
OCTOBER 2000
DSC-4878/05
1
©2000 Integrated Device Technology, Inc.
IDT71V2557, IDT71V2559, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
ZBT™ Feature, 2.5V I/O, Burst Counter, and Flow-Through Outputs
Commercial and Industrial Temperature Ranges
Pin Definitions
(1)
Symbol
A
0
-A
17
ADV/LD
Pin Function
Address Inputs
Advance / Load
I/O
I
I
Active
N/A
N/A
Description
Synchronous Address inputs. The address register is triggered by a combination of the
rising edge of CLK, ADV/LD low,
CEN
low, and true chip enables.
ADV/LD is a synchronous input that is used to load the internal registers with new address
and control when it is sampled low at the rising edge of clock with the chip selected. When
ADV/LD is low with the chip deselected, any burst in progress is terminated. When ADV/
LD
is sampled high then the internal burst counter is advanced for any burst that was in
progress. The external addresses are ignored when ADV/LD is sampled high.
R/W signal is a synchronous input that identifies whether the current load cycle initiated is a
Read or Write access to the memory array. The data bus activity for the current cycle takes
place one clock cycle later.
Synchronous Clock Enable Input. When
CEN
is sampled high, all other synchronous
inputs, including clock are ignored and outputs re main unchanged. The effect of
CEN
sampled high on the device outputs is as if the low to hig h clock transition did not occur.
For normal operation,
CEN
must be sampled low at rising edge of clock.
Synchronous byte write enables. Each 9-bit byte has its own active low byte write enable.
On load write cycles (When R/W and ADV/LD are sampled low) the appropriate byte write
signal (BW
1
-BW
4
) must be valid. The byte write signal must also be valid on each cycle of
a burst write. Byte Write signals are ignored when R/W is sampled high. The appropriate
byte(s) of data are written into the device one cycle later.
BW
1
-BW
4
can all be tied low if
always doing write to the entire 36-bit word.
Synchronous active low chip enable.
CE
1
and
CE
2
are used with CE
2
to enable the
IDT71V2557/59. (CE
1
or
CE
2
sampled high or CE
2
sampled low) and ADV/LD low at the
rising edge of clock, initiates a deselect cycle. The ZBT
TM
has a one cycle deselect, i.e.,
the data bus will tri-state one clock cycle after deselect is initiated.
Synchronous active high chip enable. CE
2
is used with
CE
1
and
CE
2
to enable the chip.
CE
2
has inverted polarity but otherwise identical to
CE
1
and
CE
2
.
This is the clock input to the IDT71V2557/59. Except for
OE,
all timing references for the
device are made with respect to the rising edge of CLK.
Data input/output (I/O) pins. The data input path is registere d, triggered by the rising edge
of CLK. The data output path is flow-through (no output register).
Burst order selection input. When
LBO
is high the Interleaved burst sequence is selected.
When
LBO
is low the Linear burst sequence is selected.
LBO
is a static input, and it must
not change during device operation..
Asynchronous output enable.
OE
must be low to read data from the 71V2557/59. When
OE
is HIGH the I/O pins are in a high-impedance state.
OE
does not need to be actively
controlled for read and write cycles. In normal operation,
OE
can be tied low.
3.3V core power supply.
2.5V I/O Supply.
Ground.
4878 tbl 02
R/W
Read / Write
I
N/A
CEN
Clock Enable
I
LOW
BW
1
-BW
4
Individual Byte
Write Enables
I
LOW
CE
1
,
CE
2
Chip Enables
I
LOW
CE
2
CLK
I/O
0
-I/O
31
I/O
P1
-I/O
P4
LBO
Chip Enable
Clock
Data Input/Output
Linear Burst Order
I
I
I/O
I
HIGH
N/A
N/A
LOW
OE
Output Enable
I
LOW
V
DD
V
DDQ
V
SS
NOTE:
Power Supply
Power Supply
Ground
N/A
N/A
N/A
N/A
N/A
N/A
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
6.42
2
IDT71V2557, IDT71V2559, 128K x 36, 256K x 18, 3.3V SynchronousSRAMs with
ZBT™ Feature, 2.5V I/O, Burst Counter, and Flow-Through Outputs
Commercial and Industrial Temperature Ranges
Functional Block Diagram — 128K x 36
LBO
Address A [0:16]
CE
1
, CE
2
CE
2
R/W
CEN
ADV/LD
BWx
Input Register
DI
DO
D
Q
Control
D
Q
128K x 36 BIT
MEMORY ARRAY
Address
D
Clk
Q
Control Logic
Mux
Clock
Sel
OE
Gate
Data I/O [0:31], I/O P[1:4]
4878 drw 01
,
6.42
3
IDT71V2557, IDT71V2559, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
ZBT™ Feature, 2.5V I/O, Burst Counter, and Flow-Through Outputs
Commercial and Industrial Temperature Ranges
Functional Block Diagram — 256K x 18
LBO
Address A [0:17]
CE
1
, CE
2
CE
2
R/W
CEN
ADV/LD
BWx
D
Clk
D
Q
Control
D
Q
256K x 18 BIT
MEMORY ARRAY
Address
Input Register
DI
DO
Q
Control Logic
Mux
Clock
Sel
OE
Gate
Data I/O [0:15], I/O P[1:2]
4878 drw 01a
,
Recommended DC Operating
Conditions
Symbol
V
DD
V
DDQ
V
SS
V
IH
V
IH
V
IL
Parameter
Core Supply Voltage
I/O Supply Voltage
Ground
Input High Voltage - Inputs
Input High Voltage - I/O
Input Low Voltage
Min.
3.135
2.375
0
1.7
1.7
-0.3
(1)
Typ.
3.3
2.5
0
____
____
____
Max.
3.465
2.625
0
V
DD
+0.3
V
DDQ
+0.3
(2)
0.7
Unit
V
V
V
V
V
V
4878 tbl 03
NOTES:
1. V
IL
(min.) = –1.0V for pulse width less than t
CYC
/2, once per cycle.
2. V
IH
(max.) = +6.0V for pulse width less than t
CYC
/2, once per cycle.
6.42
4
IDT71V2557, IDT71V2559, 128K x 36, 256K x 18, 3.3V SynchronousSRAMs with
ZBT™ Feature, 2.5V I/O, Burst Counter, and Flow-Through Outputs
Commercial and Industrial Temperature Ranges
Recommended Operating
Temperature and Supply Voltage
Grade
Commercial
Industrial
Temperature
(1)
0°C to +70°C
-40°C to +85°C
V
SS
0V
0V
V
DD
3.3V±5%
3.3V±5%
V
DDQ
2.5V±5%
2.5V±5%
4878 tbl 05
NOTE:
1. T
A
is the "instant on" case temperature.
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
I/O
P3
I/O
16
I/O
17
V
DDQ
V
SS
I/O
18
I/O
19
I/O
20
I/O
21
V
SS
V
DDQ
I/O
22
I/O
23
V
SS
(1)
V
DD
V
DD
(2)
V
SS
I/O
24
I/O
25
V
DDQ
V
SS
I/O
26
I/O
27
I/O
28
I/O
29
V
SS
V
DDQ
I/O
30
I/O
31
I/O
P4
CE
2
BW
4
BW
3
BW
2
BW
1
CE
2
V
DD
V
SS
CLK
R/W
CEN
OE
ADV/LD
NC
(3)
NC
(3)
A
8
A
9
Pin Configuration — 128K x 36
A
6
A
7
CE
1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O
P2
I/O
15
I/O
14
V
DDQ
V
SS
I/O
13
I/O
12
I/O
11
I/O
10
V
SS
V
DDQ
I/O
9
I/O
8
V
SS
V
SS
(1)
V
DD
V
SS
(1,5)
I/O
7
I/O
6
V
DDQ
V
SS
I/O
5
I/O
4
I/O
3
I/O
2
V
SS
V
DDQ
I/O
1
I/O
0
I/O
P1
4878 drw 02
,
NOTES:
1. Pins 14, 64, and 66 do not have to be connected directly to V
SS
as long as the input voltage is < V
IL
.
2. Pin 16 does not have to be connected directly to V
DD
as long as the input voltage is > V
IH
.
3. Pins 83 and 84 are reserved for future 8M and 16M respectively.
4. DNU = Do not use; Pins 38, 39, 42 and 43 are reserved for respective JTAG pins: TMS, TDI, TDO and TCK on future
revisions. Within this current version, these pins are not connected.
5. On future revisions, Pin 64 will be used for ZZ (sleep mode).
LBO
A
5
A
4
A
3
A
2
A
1
A
0
DNU
(4)
DNU
(4)
V
SS
V
DD
DNU
(4)
DNU
(4)
A
10
A
11
A
12
A
13
A
14
A
15
A
16
Top View
100 TQFP
6.42
5
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