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IDT74FCT299SOB

FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER

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®
FAST CMOS
8-INPUT UNIVERSAL
SHIFT REGISTER
DESCRIPTION:
IDT54/74FCT299
IDT54/74FCT299A
IDT54/74FCT299C
Integrated Device Technology, Inc.
FEATURES:
IDT54/74FCT299 equivalent to FAST™ speed
IDT54/74FCT299A 25% faster than FAST
IDT54/74FCT299C 35% faster than FAST
Equivalent to FAST output drive over full temperature
and voltage supply extremes
I
OL
= 48mA (commercial) and 32mA (military)
CMOS power levels (1mW typ. static)
TTL input and output level compatible
CMOS output level compatible
Substantially lower input current levels than FAST
(5µA max.)
8-input universal shift register
JEDEC standard pinout for DIP and LCC
Product available in Radiation Tolerant and Radiation
Enhanced versions
Military product compliant to MIL-STD-883, Class B
Standard Military Drawing# 5962-86862 is listed on this
function. Refer to section 2.
The IDT54/74FCT299 and IDT54/74FCT299A/C are built
using an advanced dual metal CMOS technology. The IDT54/
74FCT299 and IDT54/74FCT299A/C are 8-input universal
shift/storage registers with 3-state outputs. Four modes of
operation are possible: hold (store), shift left, shift right and
load data. The parallel load inputs and flip-flop outputs are
multiplexed to reduce the total number of package pins.
Additional outputs are provided for flip-flops Q
0
and Q
7
to
allow easy serial cascading. A separate active LOW Master
Reset is used to reset the register.
FUNCTIONAL BLOCK DIAGRAM
S
1
S
0
DS
7
DS
0
CP
C
D
Q
0
MR
OE
1
OE
2
I/O
0
I/O
1
I/O
2
I/O
3
I/O
4
I/O
5
I/O
6
I/O
7
2561 drw 01
D C
P
Q
C
D
D C
P
Q
C
D
D C
P
Q
C
D
D C
P
Q
C
D
D C
P
Q
C
D
D C
P
Q
C
D
D C
P
Q
C
D
D C
P
Q
Q
7
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a registered trademark of National Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
©1994
Integrated Device Technology, Inc.
MAY 1992
DSC-4604/3
7.11
1
IDT54/74FCT299/A/C
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
INDEX
S
0
OE
1
OE
2
I/O
6
I/O
4
I/O
2
I/O
0
Q
0
MR
GND
1
2
3
4
5
6
7
8
9
10
20
19
P20-1
D20-1
S020-2
&
E20-1
18
17
16
15
14
13
12
11
Vcc
S
1
DS
7
Q
7
I/O
7
I/O
5
I/O
3
I/O
1
CP
DS
0
I/O
6
I/O
4
I/O
2
I/O
0
Q
0
OE
2
OE
1
S
0
Vcc
S
1
3 2
4
5
6
7
8
20 19
18
1
17
16
15
14
9 10 11 12 13
PIN CONFIGURATIONS
L20-2
DS
7
Q
7
I/O
7
I/O
5
I/O
3
DIP/SOIC/CERPACK
TOP VIEW
MR
GND
DS
0
CP
I/O
1
LCC
TOP VIEW
2561 drw 02
PIN DESCRIPTION
Pin Names
CP
DS
0
DS
7
S
0
, S
1
Description
Clock Pulse Input (Active Edge Rising)
Serial Data Input for Right Shift
Serial Data Input for Left Shift
Mode Select Inputs
Asynchronous Master Reset Input (Active LOW)
3-State Output Enable Inputs (Active LOW)
Parallel Data Inputs or 3-State Parallel Outputs
Serial Outputs
2561 tbl 01
FUNCTION TABLE
(1)
Inputs
MR
S
1
L
H
H
H
H
X
H
L
H
L
S
0
X
H
H
L
L
CP
X
X
Response
Asynchronous Reset Q
0
–Q
7
= LOW
Parallel Load; I/O
n
Q
n
Shift Right; DS
0
Q
0
, Q
0
Q
1
, etc.
Shift Left; DS
7
Q
7
, Q
7
Q
6
, etc.
Hold
2561 tbl 02
MR
OE
1
,
OE
2
I/O
0
–I/O
7
Q
0
, Q
7
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
= LOW-to-HIGH clock transition
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Rating
V
TERM(2)
Terminal Voltage
with Respect
to GND
(3)
V
TERM
Terminal Voltage
with Respect
to GND
T
A
Operating
Temperature
T
BIAS
Temperature
Under Bias
T
STG
Storage
Temperature
P
T
Power Dissipation
DC Output Current
I
OUT
Commercial
Military
Unit
–0.5 to +7.0 –0.5 to +7.0
V
CAPACITANCE
(T
A
= +25°C, f = 1.0MHz)
Symbol
C
IN
C
I/O
Parameter
(1)
Input Capacitance
I/O Capacitance
Conditions
V
IN
= 0V
V
OUT
= 0V
Typ. Max. Unit
6
8
10
12
pF
pF
–0.5 to V
CC
–0.5 to V
CC
V
NOTE:
2561 tbl 04
1. This parameter is guaranteed by characterization data and not tested.
0 to +70
–55 to +125
–55 to +125
0.5
120
–55 to +125
–65 to +135
–65 to +150
0.5
120
°C
°C
°C
W
mA
NOTES:
2561 tbl 03
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed Vcc by +0.5 unless otherwise noted.
2. Inputs and V
CC
terminals only.
3. Outputs and I/O terminals only.
7.11
2
IDT54/74FCT299/A/C
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: V
LC
= 0.2V; V
HC
= V
CC
– 0.2V
Commercial: T
A
= 0°C to +70°C, V
CC
= 5.0V
±
5%; Military: T
A
= –55°C to +125°C, V
CC
= 5.0V
±
10%
Symbol
V
IH
V
IL
I
IH
I
IL
I
IH
I
IL
V
IK
I
OS
V
OH
Parameter
Input HIGH Level
Input LOW Level
Input HIGH Current
(Except I/O Pins)
Input LOW Current
(Except I/O Pins)
Input HIGH Current
(I/O Pins Only)
Input LOW Current
(I/O Pins Only)
Clamp Diode Voltage
Short Circuit Current
Output HIGH Voltage
Vcc = Min., I
N
= –18mA
Vcc = Max.
(3)
, V
O
= GND
Vcc = 3V, V
IN
= V
LC
or V
HC
, I
OH
= –32µA
Vcc = Min.
V
IN
= V
IH
or V
IL
V
OL
Output LOW Voltage
I
OH
= –300µA
I
OH
= –12mA MIL.
I
OH
= –15mA COM’L.
Vcc = 3V, V
IN
= V
LC
or V
HC
, I
OL
= 300µA
Vcc = Min.
V
IN
= V
IH
or V
IL
I
OL
= 300µA
I
OL
= 32mA MIL.
I
OL
= 48mA COM’L.
V
CC
= Max.
Test Conditions
(1)
Guaranteed Logic HIGH Level
Guaranteed Logic LOW Level
V
CC
= Max.
V
I
= V
CC
V
I
= 2.7V
V
I
= 0.5V
V
I
= GND
V
I
= V
CC
V
I
= 2.7V
V
I
= 0.5V
V
I
= GND
Min.
2.0
–60
V
HC
V
HC
2.4
2.4
Typ.
(2)
–0.7
–120
V
CC
V
CC
4.3
4.3
GND
GND
0.3
0.3
Max.
0.8
5
5
(4)
–5
(4)
–5
15
15
(4)
Unit
V
V
µA
µA
–15
(4)
–15
–1.2
V
LC
V
LC(4)
0.5
0.5
2561 tbl 05
V
mA
V
V
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
7.11
3
IDT54/74FCT299/A/C
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
V
LC
= 0.2V; V
HC
= V
CC
– 0.2V
Symbol
I
CC
∆I
CC
I
CCD
Parameter
Quiescent Power Supply
Current
Quiescent Power Supply
Current TTL Inputs HIGH
Dynamic Power Supply
Current
(4)
Test Conditions
(1)
Vcc = Max.
V
IN
V
HC
; V
IN
V
LC
Vcc = Max.
V
IN
= 3.4V
(3)
Vcc = Max.
Outputs Open
OE
1
=
OE
2
= GND
MR
= V
CC
S
0
= S
1
= V
CC
DS
0
= DS
1
= GND
One Input Toggling
50% Duty Cycle
Vcc = Max.
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
OE
1
=
OE
2
= GND
MR
= V
CC
S
0
= S
1
= V
CC
DS
0
= DS
7
= GND
One Bit Toggling
at f
i
= 5MHz
50% Duty Cycle
Vcc = Max.
Outputs Open
f
CP
= 10MHz
50% Duty Cycle
OE
1
=
OE
2
= GND
MR
= V
CC
S
0
= S
1
= V
CC
DS
0
= DS
7
= GND
Eight Bits Toggling
at f
i
= 2.5MHz
50% Duty Cycle
V
IN
V
HC
V
IN
V
LC
Min.
Typ.
(2)
0.2
0.5
0.15
Max.
1.5
2.0
0.25
Unit
mA
mA
mA/MHz
I
C
Total Power Supply
Current
(6)
V
IN
V
HC
V
IN
V
LC
(FCT)
1.7
4.0
mA
V
IN
= 3.4V
V
IN
= GND
2.2
6.0
V
IN
V
HC
V
IN
V
LC
(FCT)
4.0
7.8
(5)
V
IN
= 3.4V
V
IN
= GND
6.2
16.8
(5)
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25°C ambient.
3. Per TTL driven input (V
IN
= 3.4V); all other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
∆I
CC
D
H
N
T
+ I
CCD
(f
CP
/2 + f
i
N
i
)
I
CC
= Quiescent Current
∆I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Output Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
All currents are in milliamps and all frequencies are in megahertz.
2561 tbl 06
7.11
4
IDT54/74FCT299/A/C
FAST CMOS 8-INPUT UNIVERSAL SHIFT REGISTER
MILITARY AND COMMERCIAL TEMPERATURE RANGES
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
IDT54/74FCT299
Com’l.
Symbol
Parameter
Propagation Delay
t
PLH
t
PHL
CP to Q
0
or Q
7
t
PLH
t
PHL
t
PHL
t
PHL
t
PZH
t
PZL
t
PHZ
t
PLZ
t
SU
Propagation Delay
CP to I/O
n
Propagation Delay
MR
to Q
0
or Q
7
Propagation Delay
MR
to I/O
n
Output Enable Time
OE
n
to I/O
n
Output Disable Time
OE
n
to I/O
n
Set-up Time HIGH
or LOW
S
0
or S
1
to CP
Hold Time HIGH
or LOW
S
0
or S
1
to CP
Set-up Time HIGH
or LOW I/O
n
, DS
0
or DS
7
to CP
Hold Time HIGH
or LOW I/O
n
, DS
0
or DS
7
to CP
CP Pulse width
HIGH or LOW
Mil.
IDT54/74FCT299A
Com’l.
Mil.
IDT54/74FCT299C
Com’l.
Mil.
Condition
(1)
Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Unit
C
L
= 50pF 2.0
10.0 2.0 14.0 2.0
7.2
2.0
9.5
2.0
6.5
2.0
7.5
ns
R
L
= 500Ω
2.0
2.0
2.0
1.5
1.5
7.5
12.0
10.0
15.0
11.0
7.0
2.0
2.0
2.0
1.5
1.5
7.5
12.0
10.5
15.0
15.0
9.0
2.0
2.0
2.0
1.5
1.5
3.5
7.2
7.2
8.7
6.5
6.0
2.0
2.0
2.0
1.5
1.5
4.0
9.5
9.5
11.5
7.5
6.5
2.0
2.0
2.0
1.5
1.5
3.5
6.5
6.5
6.5
6.5
6.0
2.0
2.0
2.0
1.5
1.5
4.0
7.5
7.5
7.5
7.5
6.5
ns
ns
ns
ns
ns
ns
t
H
1.0
1.0
1.0
1.0
1.0
1.0
ns
t
SU
5.5
5.5
4.0
4.5
4.0
4.5
ns
t
H
1.5
1.5
1.5
1.5
1.5
1.5
ns
t
W
t
W
t
REM
7.0
7.0
7.0
7.0
7.0
7.0
5.0
5.0
5.0
6.0
6.0
6.0
5.0
5.0
5.0
6.0
6.0
6.0
ns
ns
ns
2561 tbl 07
MR
Pulse Width
LOW
Recovery Time
MR
to CP
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
7.11
5
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