首页 > 器件类别 > 存储 > 存储

K4B2G0846D-HCF80

DDR DRAM, 256MX8, 0.3ns, CMOS, PBGA78

器件类别:存储    存储   

厂商名称:SAMSUNG(三星)

厂商官网:http://www.samsung.com/Products/Semiconductor/

器件标准:

下载文档
器件参数
参数名称
属性值
是否Rohs认证
符合
厂商名称
SAMSUNG(三星)
包装说明
FBGA, BGA78,9X13,32
Reach Compliance Code
compliant
最长访问时间
0.3 ns
最大时钟频率 (fCLK)
533 MHz
I/O 类型
COMMON
交错的突发长度
8
JESD-30 代码
R-PBGA-B78
内存密度
2147483648 bit
内存集成电路类型
DDR DRAM
内存宽度
8
端子数量
78
字数
268435456 words
字数代码
256000000
最高工作温度
85 °C
最低工作温度
组织
256MX8
输出特性
3-STATE
封装主体材料
PLASTIC/EPOXY
封装代码
FBGA
封装等效代码
BGA78,9X13,32
封装形状
RECTANGULAR
封装形式
GRID ARRAY, FINE PITCH
电源
1.5 V
认证状态
Not Qualified
刷新周期
8192
连续突发长度
8
最大待机电流
0.012 A
最大压摆率
0.105 mA
标称供电电压 (Vsup)
1.5 V
表面贴装
YES
技术
CMOS
温度等级
OTHER
端子形式
BALL
端子节距
0.8 mm
端子位置
BOTTOM
Base Number Matches
1
文档预览
Rev. 1.13, May. 2011
K4B2G0446D
K4B2G0846D
2Gb D-die DDR3 SDRAM
78FBGA with Lead-Free & Halogen-Free
(RoHS compliant)
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND
SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed
herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung
Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property
right is granted by one party to the other party under this document, by implication, estoppel or other-
wise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or
similar applications where product failure could result in loss of life or personal or physical harm, or any
military or defense application, or any governmental procurement to which special terms or provisions
may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
2011 Samsung Electronics Co., Ltd. All rights reserved.
-1-
K4B2G0446D
K4B2G0846D
datasheet
History
- First SPEC. Release
- Corrected IDD current spec.(IDD7)
- Corrected typo.
- Corrected typo.
- Corrected typo.
Draft Date
Aug. 2010
Sep. 2010
Nov. 2010
Jan. 2011
May. 2011
Rev. 1.13
DDR3 SDRAM
Revision History
Revision No.
1.0
1.1
1.11
1.12
1.13
Remark
-
-
-
-
-
Editor
S.H.Kim
S.H.Kim
S.H.Kim
J.Y.Lee
J.Y.Lee
-2-
K4B2G0446D
K4B2G0846D
datasheet
Rev. 1.13
DDR3 SDRAM
Table Of Contents
2Gb D-die DDR3 SDRAM
1. Ordering Information ..................................................................................................................................................... 5
2. Key Features................................................................................................................................................................. 5
3. Package pinout/Mechanical Dimension & Addressing.................................................................................................. 6
3.1 x4 Package Pinout (Top view) : 78ball FBGA Package .......................................................................................... 6
3.2 x8 Package Pinout (Top view) : 78ball FBGA Package .......................................................................................... 7
3.3 FBGA Package Dimension (x4/x8) .......................................................................................................................... 8
4. Input/Output Functional Description.............................................................................................................................. 9
5. DDR3 SDRAM Addressing ........................................................................................................................................... 10
6. Absolute Maximum Ratings .......................................................................................................................................... 11
6.1 Absolute Maximum DC Ratings............................................................................................................................... 11
6.2 DRAM Component Operating Temperature Range ................................................................................................ 11
7. AC & DC Operating Conditions..................................................................................................................................... 11
7.1 Recommended DC operating Conditions (SSTL_1.5)............................................................................................. 11
8. AC & DC Input Measurement Levels ............................................................................................................................ 12
8.1 AC & DC Logic input levels for single-ended signals .............................................................................................. 12
8.2 V
REF
Tolerances...................................................................................................................................................... 13
8.3 AC & DC Logic Input Levels for Differential Signals............................................................................................... 14
8.3.1. Differential signals definition ............................................................................................................................ 14
8.3.2. Differential swing requirement for clock (CK - CK) and strobe (DQS - DQS) .................................................. 14
8.3.3. Single-ended requirements for differential signals ........................................................................................... 15
8.4 Differential Input Cross Point Voltage...................................................................................................................... 16
8.5 Slew rate definition for Differential Input Signals ..................................................................................................... 16
8.6 Slew rate definitions for Differential Input Signals ................................................................................................... 16
9. AC & DC Output Measurement Levels ......................................................................................................................... 17
9.1 Single-ended AC & DC Output Levels..................................................................................................................... 17
9.2 Differential AC & DC Output Levels......................................................................................................................... 17
9.3 Single-ended Output Slew Rate .............................................................................................................................. 17
9.4 Differential Output Slew Rate .................................................................................................................................. 18
9.5 Reference Load for AC Timing and Output Slew Rate ............................................................................................ 18
9.6 Overshoot/Undershoot Specification ....................................................................................................................... 19
9.6.1. Address and Control Overshoot and Undershoot specifications...................................................................... 19
9.6.2. Clock, Data, Strobe and Mask Overshoot and Undershoot Specifications ...................................................... 19
9.7 34ohm Output Driver DC Electrical Characteristics................................................................................................. 20
9.7.1. Output Drive Temperature and Voltage Sensitivity .......................................................................................... 21
9.8 On-Die Termination (ODT) Levels and I-V Characteristics ..................................................................................... 21
9.8.1. ODT DC Electrical Characteristics ................................................................................................................... 22
9.8.2. ODT Temperature and Voltage sensitivity ...................................................................................................... 23
9.9 ODT Timing Definitions ........................................................................................................................................... 24
9.9.1. Test Load for ODT Timings .............................................................................................................................. 24
9.9.2. ODT Timing Definitions .................................................................................................................................... 24
10. IDD Current Measure Method ..................................................................................................................................... 27
10.1 IDD Measurement Conditions ............................................................................................................................... 27
11. 2Gb DDR3 SDRAM D-die IDD Specification Table .................................................................................................... 36
12. Input/Output Capacitance ........................................................................................................................................... 37
13. Electrical Characteristics and AC timing for DDR3-800 to DDR3-1866 ...................................................................... 38
13.1 Clock Specification ................................................................................................................................................ 38
13.1.1. Definition for tCK(avg).................................................................................................................................... 38
13.1.2. Definition for tCK(abs).................................................................................................................................... 38
13.1.3. Definition for tCH(avg) and tCL(avg) .............................................................................................................. 38
13.1.4. Definition for note for tJIT(per), tJIT(per, Ick) ................................................................................................. 38
13.1.5. Definition for tJIT(cc), tJIT(cc, Ick) ................................................................................................................. 38
13.1.6. Definition for tERR(nper)................................................................................................................................ 38
13.2 Refresh Parameters by Device Density................................................................................................................. 39
13.3 Speed Bins and CL, tRCD, tRP, tRC and tRAS for corresponding Bin ................................................................. 39
13.3.1. Speed Bin Table Notes .................................................................................................................................. 43
-3-
K4B2G0446D
K4B2G0846D
datasheet
Rev. 1.13
DDR3 SDRAM
14. Timing Parameters by Speed Grade .......................................................................................................................... 44
14.1 Jitter Notes ............................................................................................................................................................ 50
14.2 Timing Parameter Notes........................................................................................................................................ 51
14.3 Address/Command Setup, Hold and Derating : .................................................................................................... 52
14.4 Data Setup, Hold and Slew Rate Derating : .......................................................................................................... 59
-4-
K4B2G0446D
K4B2G0846D
datasheet
DDR3-1066 (7-7-7)
K4B2G0446D-HCF8
K4B2G0846D-HCF8
DDR3-1333 (9-9-9)
4
K4B2G0446D-HCH9
K4B2G0846D-HCH9
DDR3-1600 (11-11-11)
3
K4B2G0446D-HCK0
K4B2G0846D-HCK0
Rev. 1.13
DDR3 SDRAM
1. Ordering Information
[ Table 1 ] Samsung 2Gb DDR3 D-die ordering information table
Organization
512Mx4
256Mx8
DDR3-1866 (13-13-13)
2
K4B2G0446D-HCMA
K4B2G0846D-HCMA
Package
78 FBGA
78 FBGA
NOTE
:
1. Speed bin is in order of CL-tRCD-tRP.
2. Backward compatible to DDR3-1600(11-11-11), DDR3-1333(9-9-9), DDR3-1066(7-7-7)
3. Backward compatible to DDR3-1333(9-9-9), DDR3-1066(7-7-7)
4. Backward compatible to DDR3-1066(7-7-7)
2. Key Features
[ Table 2 ] 2Gb DDR3 D-die Speed bins
Speed
tCK(min)
CAS Latency
tRCD(min)
tRP(min)
tRAS(min)
tRC(min)
DDR3-800
6-6-6
2.5
6
15
15
37.5
52.5
DDR3-1066
7-7-7
1.875
7
13.125
13.125
37.5
50.625
DDR3-1333
9-9-9
1.5
9
13.5
13.5
36
49.5
DDR3-1600
11-11-11
1.25
11
13.75
13.75
35
48.75
DDR3-1866
13-13-13
1.07
13
13.91
13.91
34
47.91
Unit
ns
nCK
ns
ns
ns
ns
• JEDEC standard 1.5V ± 0.075V Power Supply
• V
DDQ
= 1.5V ± 0.075V
• 400 MHz f
CK
for 800Mb/sec/pin, 533MHz f
CK
for 1066Mb/sec/pin,
667MHz f
CK
for 1333Mb/sec/pin, 800MHz f
CK
for 1600Mb/sec/pin,
900MHz f
CK
for 1866Mb/sec/pin,
• 8 Banks
• Programmable CAS Latency(posted CAS): 5,6,7,8,9,10,11,12,13
• Programmable Additive Latency: 0, CL-2 or CL-1 clock
• Programmable CAS Write Latency (CWL) = 5(DDR3-800),
6(DDR3-1066), 7(DDR3-1333), 8(DDR3-1600) and 9(DDR3-1866)
• 8-bit pre-fetch
• Burst Length: 8 (Interleave without any limit, sequential with starting
address “000” only), 4 with tCCD = 4 which does not allow seamless
read or write [either On the fly using A12 or MRS]
• Bi-directional Differential Data-Strobe
• Internal(self) calibration : Internal self calibration through ZQ pin
(RZQ : 240 ohm ± 1%)
• On Die Termination using ODT pin
• Average Refresh Period 7.8us at lower than T
CASE
85°C, 3.9us at
85°C < T
CASE
< 95
°C
• Asynchronous Reset
• Package : 78 balls FBGA - x4/x8
• All of Lead-Free products are compliant for RoHS
• All of products are Halogen-free
The 2Gb DDR3 SDRAM D-die is organized as a 64Mbit x 4 I/Os x 8banks
or 32Mbit x 8 I/Os x 8banks device. This synchronous device achieves high
speed double-data-rate transfer rates of up to 1866Mb/sec/pin (DDR3-
1866) for general applications.
The chip is designed to comply with the following key DDR3 SDRAM fea-
tures such as posted CAS, Programmable CWL, Internal (Self) Calibration,
On Die Termination using ODT pin and Asynchronous Reset .
All of the control and address inputs are synchronized with a pair of exter-
nally supplied differential clocks. Inputs are latched at the crosspoint of dif-
ferential clocks (CK rising and CK falling). All I/Os are synchronized with a
pair of bidirectional strobes (DQS and DQS) in a source synchronous fash-
ion. The address bus is used to convey row, column, and bank address
information in a RAS/CAS multiplexing style. The DDR3 device operates
with a single 1.5V ± 0.075V power supply and 1.5V ± 0.075V V
DDQ
.
The 2Gb DDR3 D-die device is available in 78ball FBGAs(x4/x8).
NOTE
: 1. This data sheet is an abstract of full DDR3 specification and does not cover the common features which are described in “DDR3 SDRAM Device Operation & Timing
Diagram”.
2. The functionality described and the timing specifications included in this data sheet are for the DLL Enabled mode of operation.
-5-
查看更多>
参数对比
与K4B2G0846D-HCF80相近的元器件有:K4B2G0446D-HCF80。描述及对比如下:
型号 K4B2G0846D-HCF80 K4B2G0446D-HCF80
描述 DDR DRAM, 256MX8, 0.3ns, CMOS, PBGA78 DDR DRAM, 512MX4, 0.3ns, CMOS, PBGA78,
是否Rohs认证 符合 符合
厂商名称 SAMSUNG(三星) SAMSUNG(三星)
包装说明 FBGA, BGA78,9X13,32 FBGA, BGA78,9X13,32
Reach Compliance Code compliant compliant
最长访问时间 0.3 ns 0.3 ns
最大时钟频率 (fCLK) 533 MHz 533 MHz
I/O 类型 COMMON COMMON
交错的突发长度 8 8
JESD-30 代码 R-PBGA-B78 R-PBGA-B78
内存密度 2147483648 bit 2147483648 bit
内存集成电路类型 DDR DRAM DDR DRAM
内存宽度 8 4
端子数量 78 78
字数 268435456 words 536870912 words
字数代码 256000000 512000000
最高工作温度 85 °C 85 °C
组织 256MX8 512MX4
输出特性 3-STATE 3-STATE
封装主体材料 PLASTIC/EPOXY PLASTIC/EPOXY
封装代码 FBGA FBGA
封装等效代码 BGA78,9X13,32 BGA78,9X13,32
封装形状 RECTANGULAR RECTANGULAR
封装形式 GRID ARRAY, FINE PITCH GRID ARRAY, FINE PITCH
电源 1.5 V 1.5 V
认证状态 Not Qualified Not Qualified
刷新周期 8192 8192
连续突发长度 8 8
最大待机电流 0.012 A 0.012 A
最大压摆率 0.105 mA 0.105 mA
标称供电电压 (Vsup) 1.5 V 1.5 V
表面贴装 YES YES
技术 CMOS CMOS
温度等级 OTHER OTHER
端子形式 BALL BALL
端子节距 0.8 mm 0.8 mm
端子位置 BOTTOM BOTTOM
Base Number Matches 1 1
热门器件
热门资源推荐
器件捷径:
L0 L1 L2 L3 L4 L5 L6 L7 L8 L9 LA LB LC LD LE LF LG LH LI LJ LK LL LM LN LO LP LQ LR LS LT LU LV LW LX LY LZ M0 M1 M2 M3 M4 M5 M6 M7 M8 M9 MA MB MC MD ME MF MG MH MI MJ MK ML MM MN MO MP MQ MR MS MT MU MV MW MX MY MZ N0 N1 N2 N3 N4 N5 N6 N7 N8 NA NB NC ND NE NF NG NH NI NJ NK NL NM NN NO NP NQ NR NS NT NU NV NX NZ O0 O1 O2 O3 OA OB OC OD OE OF OG OH OI OJ OK OL OM ON OP OQ OR OS OT OV OX OY OZ P0 P1 P2 P3 P4 P5 P6 P7 P8 P9 PA PB PC PD PE PF PG PH PI PJ PK PL PM PN PO PP PQ PR PS PT PU PV PW PX PY PZ Q1 Q2 Q3 Q4 Q5 Q6 Q8 Q9 QA QB QC QE QF QG QH QK QL QM QP QR QS QT QV QW QX QY R0 R1 R2 R3 R4 R5 R6 R7 R8 R9 RA RB RC RD RE RF RG RH RI RJ RK RL RM RN RO RP RQ RR RS RT RU RV RW RX RY RZ
需要登录后才可以下载。
登录取消