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K8S5615EZC-SE1E0

Flash, 16MX16, 100ns, PBGA44, 7.70 X 6.20 MM, 1 MM HEIGHT, 0.50 MM PITCH, LEAD FREE, FBGA-44

器件类别:存储    存储   

厂商名称:SAMSUNG(三星)

厂商官网:http://www.samsung.com/Products/Semiconductor/

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器件参数
参数名称
属性值
厂商名称
SAMSUNG(三星)
零件包装代码
BGA
包装说明
VFBGA,
针数
44
Reach Compliance Code
compli
ECCN代码
EAR99
最长访问时间
100 ns
其他特性
SYNCHRONOUS BURST MODE OPERATION ALSO POSSIBLE
JESD-30 代码
R-PBGA-B44
内存密度
268435456 bi
内存集成电路类型
FLASH
内存宽度
16
功能数量
1
端子数量
44
字数
16777216 words
字数代码
16000000
工作模式
ASYNCHRONOUS
最高工作温度
85 °C
最低工作温度
-25 °C
组织
16MX16
封装主体材料
PLASTIC/EPOXY
封装代码
VFBGA
封装形状
RECTANGULAR
封装形式
GRID ARRAY, VERY THIN PROFILE, FINE PITCH
并行/串行
PARALLEL
编程电压
1.8 V
认证状态
Not Qualified
座面最大高度
1 mm
最大供电电压 (Vsup)
1.95 V
最小供电电压 (Vsup)
1.7 V
标称供电电压 (Vsup)
1.8 V
表面贴装
YES
技术
CMOS
温度等级
OTHER
端子形式
BALL
端子节距
0.5 mm
端子位置
BOTTOM
类型
NOR TYPE
文档预览
Rev. 1.0, Nov. 2010
K8S5615ETC
256Mb C-die NOR Flash
44FBGA, Muxed Burst, Multi Bank SLC
16M x16, 1.7V ~ 1.95V
datasheet
SAMSUNG ELECTRONICS RESERVES THE RIGHT TO CHANGE PRODUCTS, INFORMATION AND
SPECIFICATIONS WITHOUT NOTICE.
Products and specifications discussed herein are for reference purposes only. All information discussed
herein is provided on an "AS IS" basis, without warranties of any kind.
This document and all information discussed herein remain the sole and exclusive property of Samsung
Electronics. No license of any patent, copyright, mask work, trademark or any other intellectual property
right is granted by one party to the other party under this document, by implication, estoppel or other-
wise.
Samsung products are not intended for use in life support, critical care, medical, safety equipment, or
similar applications where product failure could result in loss of life or personal or physical harm, or any
military or defense application, or any governmental procurement to which special terms or provisions
may apply.
For updates or additional information about Samsung products, contact your nearest Samsung office.
All brand names, trademarks and registered trademarks belong to their respective owners.
2009 Samsung Electronics Co., Ltd. All rights reserved.
-1-
K8S5615ETC
datasheet
NOR FLASH MEMORY
History
- First version for target specification.
- Preliminary datasheet.
- Added NOTE "Not 100% tested." for parameter "32-word Buffer Programming
Time" in 18.5 Erase/Program Performance table.
- Specification is finalized.
Draft Date
7, May, 2010
14, Oct. 2010
2, Nov. 2010
18, Nov. 2010
Remark
Target
Preliminary
Preliminary
Final
-
-
-
-
Rev. 1.0
Revision History
Revision No.
0.0
0.5
0.6
1.0
Editor
-2-
K8S5615ETC
256Mb C-die NOR Flash 1
datasheet
NOR FLASH MEMORY
Rev. 1.0
1.0 FEATURES................................................................................................................................................................. 5
2.0 GENERAL DESCRIPTION ......................................................................................................................................... 5
3.0 PIN DESCRIPTION .................................................................................................................................................... 5
4.0 44Ball FBGA TOP VIEW (BALL DOWN) .................................................................................................................... 6
5.0 FUNCTIONAL BLOCK DIAGRAM .............................................................................................................................. 7
6.0 ORDERING INFORMATION ...................................................................................................................................... 8
7.0 PRODUCT INTRODUCTION...................................................................................................................................... 11
8.0 COMMAND DEFINITIONS ......................................................................................................................................... 12
9.0 DEVICE OPERATION ................................................................................................................................................ 14
9.1 Read Mode .............................................................................................................................................................. 14
9.1.1 Asynchronous Read Mode................................................................................................................................ 14
9.1.2 Synchronous (Burst) Read Mode...................................................................................................................... 14
9.1.3 Continuous Linear Burst Read .......................................................................................................................... 14
9.2 Programmable Wait State ....................................................................................................................................... 15
9.3 Handshaking............................................................................................................................................................ 15
9.4 Set Burst Mode Configuration Register ................................................................................................................... 15
9.4.1 Programmable Wait State Configuration........................................................................................................... 15
9.4.2 Burst Read Mode Setting .................................................................................................................................. 15
9.4.3 RDY Configuration ............................................................................................................................................ 15
9.5 Autoselect Mode...................................................................................................................................................... 17
9.6 Standby Mode ......................................................................................................................................................... 17
9.7 Automatic Sleep Mode ............................................................................................................................................ 17
9.8 Output Disable Mode ............................................................................................................................................... 17
9.9 Block Protection & Unprotection.............................................................................................................................. 17
9.10 Hardware Reset..................................................................................................................................................... 17
9.11 Software Reset ...................................................................................................................................................... 18
9.12 Program ................................................................................................................................................................. 18
9.13 Accelerated Program ............................................................................................................................................. 18
9.14 Write Buffer Programming ..................................................................................................................................... 18
9.15 Accelerated Write Buffer Programming ................................................................................................................. 19
9.16 Chip Erase ............................................................................................................................................................. 19
9.17 Block Erase ........................................................................................................................................................... 19
9.18 Unlock Bypass....................................................................................................................................................... 19
9.19 Erase Suspend / Resume...................................................................................................................................... 20
9.20 Program Suspend / Resume ................................................................................................................................. 20
9.21 Read While Write Operation .................................................................................................................................. 20
9.22 OTP Block Region ................................................................................................................................................. 20
9.23 Low VCC Write Inhibit ........................................................................................................................................... 20
9.24 Write Pulse “Glitch” Protection .............................................................................................................................. 21
9.25 Logical Inhibit......................................................................................................................................................... 21
10.0 FLASH MEMORY STATUS FLAGS ......................................................................................................................... 22
11.0 Deep Power Down .................................................................................................................................................... 24
12.0 Common Flash Memory Interface............................................................................................................................. 25
13.0 ABSOLUTE MAXIMUM RATINGS
..................................................................................................................... 27
14.0 RECOMMENDED OPERATING CONDITIONS ( Voltage reference to GND )......................................................... 27
15.0 DC CHARACTERISTICS...................................................................................................................................
28
16.0 CAPACITANCE (TA = 25 °C, VCC = 1.8V, f = 1.0MHz)........................................................................................... 30
17.0 AC TEST CONDITION
...................................................................................................................................... 30
18.0 AC CHARACTERISTICS .......................................................................................................................................... 30
18.1 Synchronous/Burst Read.................................................................................................................................30
18.2 Asynchronous Read
........................................................................................................................................34
18.3 Hardware Reset(RESET) ...................................................................................................................................... 36
18.4 Erase/Program Operation...................................................................................................................................... 37
18.5 Erase/Program Performance
...........................................................................................................................38
-3-
K8S5615ETC
datasheet
NOR FLASH MEMORY
Rev. 1.0
19.0 CROSSING OF FIRST WORD BOUNDARY IN BURST READ MODE ................................................................... 45
-4-
K8S5615ETC
datasheet
NOR FLASH MEMORY
2.0 GENERAL DESCRIPTION
Rev. 1.0
256M Bit (16M x16) Muxed Burst / Multi Bank SLC NOR Flash Memory
1.0 FEATURES
Single Voltage, 1.7V to 1.95V for Read and Write operations
Organization
- 16,777,216 x 16 bit ( Word Mode Only)
Multiplexed Data and Address for reduction of interconnections
- A/DQ0 ~ A/DQ15
Read While Program/Erase Operation
Multiple Bank Architecture
- 16 Banks (16Mb Partition)
OTP Block : Extra 512-Word block
Read Access Time (@ C
L
=30pF)
- Asynchronous Random Access Time : 100ns
- Synchronous Random Access Time :95ns
- Burst Access Time :
11ns (66MHz) / 9ns (83MHz) / 7ns (108MHz) /6ns (133MHz)
Burst Length :
- Continuous Linear Burst
- Linear Burst : 8-word & 16-word with Wrap
Block Architecture
- Uniform block part (K8S(54/55/56/57)15EZC) : Two hundred fifty six
64Kword blocks
- Boot block part (K8S(54/55/56/57)15ET(B)C) : Four 16Kword blocks
and two hundred fifty five 64Kword blocks (Bank 0 contains four 16 Kword
blocks and fifteen 64Kword blocks, Bank 1 ~ Bank 15 contain two hundred
forty 64Kword blocks)
Reduce program time using the V
PP
Support 32-word Buffer Program
Power Consumption (Typical value, C
L
=30pF)
- Synchronous Read Current : 35mA at 133MHz
- Program/Erase Current : 25mA
- Read While Program/Erase Current : 45mA
- Standby Mode/Auto Sleep Mode : 30uA
Block Protection/Unprotection
- Using the software command sequence
- Last two boot blocks are protected by WP=V
IL
(Boot block part : K8S(54/55/56/57)15ET(B)C)
- Last one block (BA255) is protected by WP=V
IL
(Uniform block part : K8S(54/55/56/57)15EZC)
- All blocks are protected by V
PP
=V
IL
Handshaking Feature
- Provides host system with minimum latency by monitoring RDY
Erase Suspend/Resume
Program Suspend/Resume
Unlock Bypass Program/Erase
Hardware Reset (RESET)
Deep Power Down Mode
Data Polling and Toggle Bits
- Provides a software method of detecting the status of program
or erase completion
Endurance
- 100K Program/Erase cycles
Extended Temperature : -25°C ~ 85°C
Support Common Flash Memory Interface
Low Vcc Write Inhibit
Output Driver Control by Configuration Register
Package : 44-Ball FBGA type (7.7mm x 6.2mm), 0.5mm ball pitch
1.0mm(Max.)Thickness
The K8S(54/55/56/57)15E featuring single 1.8V power supply is a 256Mbit
Muxed Burst Multi Bank Flash Memory organized as 16Mx16. The memory
architecture of the device is designed to divide its memory arrays into
256blocks(Uniform block part)/259 blocks(Boot block part) with indepen-
dent hardware protection. This block architecture provides highly flexible
erase and program capability. The K8S(54/55/56/57)15E NOR Flash con-
sists of sixteen banks. This device is capable of reading data from one bank
while programming or erasing in the other bank. Regarding read access
time, the K8S54/5615E provides an 11ns burst access time and an 95ns
initial access time at 66MHz. At 83MHz, the K8S54/5615E provides an 9ns
burst access time and an 95ns initial access time. At 108MHz, the K8S55/
5715E provides an 7ns burst access time and an 95ns initial access time.
At 133MHz, the K8S55/5715E provides an 6ns burst access time and an
95ns initial access time. The device performs a program operation in units
of 16 bits (Word) and erases in units of a block. Single or multiple blocks
can be erased. The block erase operation is completed within typically
0.6sec. The device requires 25mA as program/erase current in the
extended temperature ranges.
The K8S(54/55/56/57)15E NOR Flash Memory is created by using Sam-
sung's advanced CMOS process technology.
3.0 PIN DESCRIPTION
Pin Name
A16 - A23
A/DQ0 - A/DQ15
CE
OE
RESET
V
PP
WE
WP
CLK
RDY
AVD
DPD
Vcc
V
SS
Pin Function
Address Inputs
Multiplexed Address/Data input/output
Chip Enable
Output Enable
Hardware Reset
Accelerates Programming
Write Enable
Hardware Write Protection Input
Clock
Ready Output
Address Valid Input
Deep Power Down
Power Supply
Ground
-5-
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