CHIP INDUCTOR
SPEER ELECTRONICS, INC.
KQ0805
THIN FILM CHIP INDUCTOR
CHIP INDUCTOR
- Surface Mount 0805 Style
- Flat top suitable for High Speed Pick and
Place Components
- Excellent High Frequency Applications
- High Q Factors and Self-Resonant
Frequency Values
- Inductance Value Marked on Part
- SMT Lab Kit Available
Flat top film
DIMENSIONS
W
Inner coat
Ceramic core
H
Ag/Pd electrode (80/20, 20
µ
m)
Sn/Pb Soldering Plating (90/10, 3
µ
m)
Wt.
L
a
b
Magnet wire
MARKING ON CHIP INDUCTOR
The marking of nominal inductance consists of only one-figure number
as detailed below.
DIMENSIONS
MM
INCH
L
2.0
±0.2
W
1.5
±0.2
Wt
1.4
±0.1
H
1.3
±0.2
a
0.45
±0.1
b
0.4
±0.15
.079
.059
.056
.056
.018
.016
±0.008 ±0.008 ±0.004 ±0.008 ±0.004 ±0.006
VALUE
3.3 nH
6.8 nH
8.2 nH
12 nH
15 nH
18 nH
22 nH
27 nH
33 nH
39 nH
47 nH
NUMBER
0
1
2
3
4
5
6
7
8
9
0
VALUE
56 nH
68 nH
82 nH
100 nH
120 nH
150 nH
180 nH
220 nH
270nH
330nH
390nH
NUMBER
1
2
3
4
5
6
7
8
9
0
1
ORDERING & SPECIFYING INFORMATION*
KQ
Type
Air Core
Winding Form
0805
Size Code
2.0 x 1.5 x 1.3 mm
TE
No tolerance of inductance shall be indicated.
R10
Nominal Inductance
3N3 : 3.3 nH
82N : 82 nH
R22 : 220 nH
J
Tolerance
G:
±2%
J:
±5%
K:
±10%
M:
±20%
Packaging
TE: Embossed Taping
No Designation: Bulk
*Please Note: KSE’s Part Numbers Do Not Contain any Spaces or Hyphens.
TELEPHONE:
814-362-5536
57
FAX:
814-362-8883
CHIP
INDUCTORS
CHIP INDUCTOR
SPEER ELECTRONICS, INC.
KQ0805
THIN FILM CHIP INDUCTOR
STANDARD APPLICATIONS
TYPE
KQ0805TE3N3
KQ0805TE6N8
KQ0805TE8N2
KQ0805TE12N
Inductance
Tolerance (%)
G
J
K M
Quality
Factor
Q. Freq.
min. (MHz)
1500
1000
50
SRF
MHz
(min)
6000
5500
4700
4000
3400
3300
55
500
60
2600
2500
2050
2000
1650
1550
1450
65
1300
1200
1100
920
870
850
650
48
600
560
DC.
Res
Ω
max
0.08
0.11
0.12
0.15
0.17
0.20
0.22
0.25
0.27
0.29
0.31
0.34
0.38
0.42
0.46
0.51
0.56
0.64
0.70
1.0
1.4
1.5
Allowable
Current
mA max.
600
600
600
600
600
600
500
500
500
500
500
500
500
400
400
400
400
400
400
350
310
290
Meas.
Freq.
Mhz
250
250
250
250
250
250
250
250
250
250
200
200
200
150
150
150
100
100
100
250
250
250
Ind.
3.3nH
6.8nH
8.2nH
12nH
15nH
18nH
22nH
27nH
33nH
39nH
47nH
56nH
68nH
82nH
0.10µH
0.12µH
0.15µH
0.18µH
0.22µH
0.27µH
0.33µH
0.39µH
KQ0805TER15
KQ0805TER18
KQ0805TER22
KQ0805TER27
KQ0805TER33
KQ0805TER39
NA
CHIP
INDUCTORS
KQ0805TE15N
KQ0805TE18N
KQ0805TE22N
KQ0805TE27N
KQ0805TE33N
KQ0805TE39N
KQ0805TE47N
KQ0805TE56N
KQ0805TE68N
KQ0805TE82N
KQ0805TER10
KQ0805TER12
NA
50
250
TELEPHONE:
814-362-5536
58
FAX:
814-362-8883
CHIP INDUCTOR
SPEER ELECTRONICS, INC.
KQ0402/KQ0603/KQ0805/KQ1008
MAXIMUM
v
L
No evidence of flaming,
fuming, or breakdown
1000MΩ and over
IEC 695-2-2
No evidence of
damage
No evidence of
breakdown
ENVIRONMENTAL & MECHANICAL CHARACTERISTICS
PARAMETER
Dielectric
Withstanding Voltage
Insulation Resistance
Flammability
Terminal
Pull Strength
Terminal
Bending Strength
TEST METHODS
5 seconds at DC 500V applied
between both terminals and film.
1 minute at DC 100V measured
between both terminals and film.
Withstands needle-flame test.
Terminals shall withstand a pull of
10 N in a horizontal direction
Specimen shall be soldered
on bend test board and force applied to the
opposite side to cause a 10mm deflection
(KQ0603 - 3mm deflection)
2 hours in each direction of
X, Y, Z, on PCB at a frequency
range of 10 - 55 - 10Hz with
1.5mm amplitude
Dropping 1m on the ground of
concrete 1 time.
Immerse in solder at 260
±
5°C
for 10
±
1 seconds
Immerse in the solder at 230
±
5°C
for 3
±
0.5 seconds
Accordance with MIL -STD - 202
Method 215
Store at -40
±
2°C, for 1000 hours
Store at +125
±
2°C, for 1000 hours
Temperature 40
±
2°C, 90-95%RH
for 1000 hours
Biased to full rated current at
+125°C for 1000 hours
Biased to 10% rated current at
+85°C, 85% RH for 1000 hours
100 cycles between
-40°C/hour and + 125°C/hour
v
L/L to be measured at the
temperatures between -40°C and
+125°C as based on the inductance
at 20°C
Vibration
v
L/L within
±5%
v
Q/Q within
±10%
Dropping
Resistance to
Soldering Heat
Solderability
Resistance to
Solvents
Low Temperature
Storage
High Temperature
Storage
Moisture Endurance
Load Life
High Temperature
High Humidity
Thermal Shock
Temperature
Characteristics
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
No evidence of outer damage
v
L/L within
±5%
v
Q/Q within
±10%
95% of the terminal should be
covered with new solder
No damage and marking
must remain legible
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
No evidence of damage
v
L/L within
±5%
v
Q/Q within
±10%
v
L/L within
±5%
Unless otherwise specified, measurements shall be performed within 2 hours after leaving test samples for more than one hour at the
normal temperature and at the normal humidity.
TELEPHONE:
814-362-5536
61
FAX:
814-362-8883
CHIP
INDUCTORS
