L7C164/166
DEVICES INCORPORATED
16K x 4 Static RAM
L7C164/166
DEVICES INCORPORATED
16K x 4 Static RAM
DESCRIPTION
The
L7C164
and
L7C166
are high-
performance, low-power CMOS static
RAMs. The storage cells are organ-
ized as 16,384 words by 4 bits per
word. Data In and Data Out signals
share I/O pins. The L7C164 has a
single active-low Chip Enable. The
L7C166 has a single Chip Enable and
an Output Enable. These devices are
available in four speeds with max-
imum access times from 12 ns to 25 ns.
Inputs and outputs are TTL compat-
ible. Operation is from a single +5 V
power supply. Power consumption is
325 mW (typical) at 25 ns. Dissipation
drops to 60 mW (typical) when the
memory is deselected.
Two standby modes are available.
Proprietary Auto-Powerdown™
circuitry reduces power consumption
automatically during read or write
accesses which are longer than the
minimum access time, or when the
memory is deselected. In addition,
data may be retained in inactive
storage with a supply voltage as low
as 2 V. The L7C164 and L7C166
consume only 30 µW (typical) at 3 V,
allowing effective battery backup
operation.
The L7C164 and L7C166 provide
asynchronous (unclocked) operation
with matching access and cycle times.
An active-low Chip Enable and a
three-state I/O bus simplify the
connection of several chips for
increased capacity.
Memory locations are specified on
address pins A
0
through A
13
. For the
L7C164, reading from a designated
location is accomplished by pre-
senting an address and driving CE
LOW while WE remains HIGH. For
the L7C166, CE and OE must be LOW
while WE remains HIGH. The data in
the addressed memory location will
then appear on the Data Out pins
within one access time. The output
pins stay in a high-impedance state
when CE or OE is HIGH, or WE is
LOW.
Writing to an addressed location is
accomplished when the active-low CE
and WE inputs are LOW. Either
signal may be used to terminate the
write operation. Data In and Data Out
signals have the same polarity.
Latchup and static discharge pro-
tection are provided on-chip. The
L7C164 and L7C166 can withstand an
injection current of up to 200 mA on
any pin without damage.
FEATURES
q
16K x 4 Static RAM with Common
I/O
q
Auto-Powerdown™ Design
q
Advanced CMOS Technology
q
High Speed — to 12 ns maximum
q
Low Power Operation
Active: 325 mW typical at 25 ns
Standby: 400 µW typical
q
Data Retention at 2 V for Battery
Backup Operation
q
Available 100% Screened to
MIL-STD-883, Class B
q
Plug Compatible with IDT 6198/
7188 and Cypress CY7C164/166
q
Package Styles Available:
• 24-pin Plastic DIP
• 22/24-pin Ceramic DIP
• 24-pin Plastic SOJ
• 22/28-pin Ceramic LCC
L7C164/166 B
LOCK
D
IAGRAM
ROW
ADDRESS
O
CE
WE
OE
(L7C166 only)
BS
O
ROW SELECT
8
256 x 64 x 4
MEMORY
ARRAY
CONTROL
COLUMN SELECT
& COLUMN SENSE
6
COLUMN ADDRESS
LE
4
I/O
3-0
1
TE
64K Static RAMs
03/04/99–LDS.164/6-D
L7C164/166
DEVICES INCORPORATED
16K x 4 Static RAM
M
AXIMUM
R
ATINGS
Above which useful life may be impaired (Notes 1, 2)
Storage temperature ........................................................................................................... –65°C to +150°C
Operating ambient temperature ........................................................................................... –55°C to +125°C
V
CC
supply voltage with respect to ground ............................................................................ –0.5 V to +7.0 V
Input signal with respect to ground ........................................................................................ –3.0 V to +7.0 V
Signal applied to high impedance output ............................................................................... –3.0 V to +7.0 V
Output current into low outputs ............................................................................................................. 25 mA
Latchup current ............................................................................................................................... > 200 mA
O
PERATING
C
ONDITIONS
To meet specified electrical and switching characteristics
Mode
Active Operation, Commercial
Active Operation, Industrial
Active Operation, Military
Data Retention, Commercial
Data Retention, Industrial
Data Retention, Military
Temperature Range
(Ambient)
0°C to +70°C
–40°C to +85°C
–55°C to +125°C
0°C to +70°C
–40°C to +85°C
–55°C to +125°C
E
LECTRICAL
C
HARACTERISTICS
Over Operating Conditions (Note 5)
LE
25
100
2
Symbol
V
OH
V
OL
V
IH
Parameter
Output High Voltage
Output Low Voltage
Input High Voltage
Test Condition
TE
Supply Voltage
4.5 V £
V
CC
£ 5.5 V
4.5 V £
V
CC
£ 5.5 V
4.5 V £
V
CC
£ 5.5 V
2.0 V £
V
CC
£ 5.5 V
2.0 V £
V
CC
£ 5.5 V
2.0 V £
V
CC
£ 5.5 V
L7C164/166
Min
2.4
0.4
2.2
V
CC
+0.3
0.8
+10
+10
12
80
10
25
300
150
5
7
L7C164/166-
Typ
Max Unit
V
V
V
–3.0
–10
–10
V
µA
µA
mA
µA
µA
pF
pF
20
120
15
140
12
165
Unit
mA
V
CC
= 4.5 V,
I
OH
= –4.0 mA
I
OL
= 8.0 mA
V
IL
I
IX
I
OZ
I
CC2
I
CC3
I
CC4
C
IN
Input Low Voltage
Input Leakage Current
Output Leakage Current
V
CC
Current, TTL Inactive
V
CC
Current, CMOS Standby
V
CC
Current, Data Retention
Input Capacitance
Output Capacitance
O
C
OUT
Symbol
I
CC1
Parameter
V
CC
Current, Active
BS
O
(Note 3)
Ground
≤
V
IN
≤
V
CC
(Note 4)
(Note 7)
(Note 8)
V
CC
= 3.0 V
(Notes 9, 10)
Ambient Temp = 25°C,
V
CC
= 5.0 V
Test Frequency = 1 MHz
(Note 10)
Test Condition
(Note 6)
64K Static RAMs
03/04/99–LDS.164/6-D
L7C164/166
DEVICES INCORPORATED
16K x 4 Static RAM
SWITCHING CHARACTERISTICS
Over Operating Range
R
EAD
C
YCLE
Notes 5, 11, 12, 22, 23, 24 (ns)
L7C164/166–
25
Symbol
t
AVAV
t
AVQV
t
AXQX
t
CLQV
t
CLQZ
t
CHQZ
t
OLQV
t
OLQZ
t
OHQZ
t
PU
t
PD
t
CHVL
Parameter
Read Cycle Time
Address Valid to Output Valid
(Notes 13, 14)
Address Change to Output Change
Chip Enable Low to Output Valid
(Notes 13, 15)
Chip Enable Low to Output Low Z
(Notes 20, 21)
Chip Enable High to Output High Z
(Notes 20, 21)
Output Enable Low to Output Valid
Output Enable Low to Output Low Z
(Notes 20, 21)
Output Enable High to Output High Z
(Notes 20, 21)
Input Transition to Power Up
(Notes 10, 19)
Power Up to Power Down
(Notes 10, 19)
Chip Enable High to Data Retention
(Note 10)
3
10
3
25
3
8
Min
25
25
3
20
3
8
Max
20
Min
20
20
3
15
3
5
6
0
5
0
20
0
Max
Min
15
15
3
12
15
Max
12
Min
12
12
Max
R
EAD
C
YCLE
— A
DDRESS
C
ONTROLLED
Notes 13, 14
ADDRESS
t
AVQV
DATA OUT
PREVIOUS DATA VALID
LE
t
AVAV
t
PD
t
AVAV
DATA VALID
t
AXQX
t
PU
I
CC
R
EAD
C
YCLE
— CE/OE C
ONTROLLED
Notes 13, 15
CE
BS
O
t
CLQV
t
CLQZ
t
OLQZ
t
OLQV
HIGH IMPEDANCE
OE
DATA OUT
t
PU
t
PD
I
CC
O
50%
50%
D
ATA
R
ETENTION
Notes 9, 10
DATA RETENTION MODE
V
CC
4.5 V
4.5 V
t
CHVL
CE
V
IH
3
TE
12
10
8
0
0
0
10
8
5
0
0
0
25
20
20
0
0
0
DATA VALID
t
CHQZ
t
OHQZ
HIGH
IMPEDANCE
≥
2V
t
AVAV
V
IH
64K Static RAMs
03/04/99–LDS.164/6-D
L7C164/166
DEVICES INCORPORATED
16K x 4 Static RAM
SWITCHING CHARACTERISTICS
Over Operating Range
W
RITE
C
YCLE
Notes 5, 11, 12, 22, 23, 24 (ns)
L7C164/166–
25
Symbol
t
AVAV
t
CLEW
t
AVBW
t
AVEW
t
EWAX
t
WLEW
t
DVEW
t
EWDX
t
WHQZ
t
WLQZ
Parameter
Write Cycle Time
Chip Enable Low to End of Write Cycle
Address Valid to Beginning of Write Cycle
Address Valid to End of Write Cycle
End of Write Cycle to Address Change
Write Enable Low to End of Write Cycle
Data Valid to End of Write Cycle
End of Write Cycle to Data Change
Write Enable High to Output Low Z
(Notes 20, 21)
Write Enable Low to Output High Z
(Notes 20, 21)
Min
20
15
0
15
0
15
Max
20
Min
20
15
0
15
0
15
Max
Min
15
12
0
12
0
12
7
15
Max
12
Min
12
10
0
10
0
10
6
0
0
4
Max
W
RITE
C
YCLE
— WE C
ONTROLLED
Notes 16, 17, 18, 19
t
AVAV
ADDRESS
t
CLEW
CE
t
AVEW
WE
LE
t
WLEW
t
DVEW
DATA-IN VALID
t
AVBW
DATA IN
BS
O
t
WLQZ
t
PU
t
PU
DATA OUT
HIGH IMPEDANCE
I
CC
W
RITE
C
YCLE
— CE C
ONTROLLED
Notes 16, 17, 18, 19
t
AVAV
ADDRESS
t
AVBW
t
CLEW
t
EWAX
t
WLEW
t
DVEW
DATA-IN VALID
CE
t
AVEW
O
WE
DATA IN
DATA OUT
I
CC
HIGH IMPEDANCE
t
PU
t
PD
4
TE
10
0
10
0
0
0
0
0
7
7
5
t
EWAX
t
EWDX
t
WHQZ
t
PD
t
EWDX
64K Static RAMs
03/04/99–LDS.164/6-D
L7C164/166
DEVICES INCORPORATED
16K x 4 Static RAM
NOTES
1. Maximum Ratings indicate stress specifi-
cations only. Functional operation of these
products at values beyond those indicated
in the Operating Conditions table is not
implied. Exposure to maximum rating con-
ditions for extended periods may affect re-
liability of the tested device.
2. The products described by this specifica-
tion include internal circuitry designed to
protect the chip from damaging substrate
injection currents and accumulations of
static charge. Nevertheless, conventional
precautions should be observed during
storage, handling, and use of these circuits
in order to avoid exposure to excessive elec-
trical stress values.
3. This product provides hard clamping of
transient undershoot. Input levels below
ground will be clamped beginning at –0.6 V.
A current in excess of 100 mA is required to
reach –2.0 V. The device can withstand in-
definite operation with inputs as low as –3 V
subject only to power dissipation and bond
wire fusing constraints.
4. Tested with GND
≤
V
OUT
≤
V
CC
. The
device is disabled, i.e., CE =
V
CC
.
5. A series of normalized curves is available
to supply the designer with typical DC and
AC parametric information for Logic Devices
Static RAMs. These curves may be used to
determine device characteristics at various
temperatures and voltage levels.
6. Tested with all address and data inputs
changing at the maximum cycle rate. The
device is continuously enabled for writing,
i.e., CE
≤
V
IL
, WE
≤
V
IL
. Input pulse levels
are 0 to 3.0 V.
7. Tested with outputs open and all address
and data inputs changing at the maximum
read cycle rate. The device is continuously
disabled, i.e., CE
≥
V
IH
.
11. Test conditions assume input transition
times of less than 3 ns, reference levels of
1.5 V, output loading for specified
I
OL
and
I
OH
plus 30 pF (Fig. 1a), and input pulse
levels of 0 to 3.0 V (Fig. 2).
12. Each parameter is shown as a minimum
or maximum value. Input requirements are
specified from the point of view of the exter-
nal system driving the chip. For example,
t
AVEW
is specified as a minimum since the
external system must supply at least that
much time to meet the worst-case require-
ments of all parts. Responses from the inter-
nal circuitry are specified from the point of
view of the device. Access time, for ex-
ample, is specified as a maximum since
worst-case operation of any device always
provides data within that time.
13. WE is high for the read cycle.
14. The chip is continuously selected (CE
low).
15. All address lines are valid prior-to or
coincident-with the CE transition to active.
20. At any given temperature and voltage
condition, output disable time is less than
output enable time for any given device.
21. Transition is measured ±200 mV from
steady state voltage with specified loading
in Fig. 1b. This parameter is sampled and
not 100% tested.
22. All address timings are referenced from
the last valid address line to the first transi-
tioning address line.
23. CE or WE must be inactive during ad-
dress transitions.
24. This product is a very high speed device
and care must be taken during testing in
order to realize valid test information. In-
adequate attention to setups and proce-
dures can cause a good part to be rejected as
faulty. Long high inductance leads that
cause supply bounce must be avoided by
bringing the
V
CC
and ground planes di-
rectly up to the contactor fingers. A 0.01 µF
high frequency capacitor is also required
between
V
CC
and ground. To avoid signal
reflections, proper terminations must be
used.
16. The internal write cycle of the memory
is defined by the overlap of CE active and
WE low. All three signals must be active to
initiate a write. Any signal can terminate a
write by going inactive. The address, data,
and control input setup and hold times
should be referenced to the signal that be-
comes active last or becomes inactive first.
17. If WE goes low before or concurrent
with the latter of CE going active, the output
remains in a high impedance state.
18. If CE goes inactive before or concurrent
with WE going high, the output remains in
a high impedance state.
19. Powerup from
I
CC2
to
I
CC1
occurs as a
result of any of the following conditions:
a. Falling edge of CE.
b. Falling edge of WE (CE active).
c. Transition on any address line (CE
active).
d. Transition on any data line (CE, and WE
active).
The device automatically powers down
from
I
CC1
to
I
CC2
after
t
PD
has elapsed from
any of the prior conditions. This means that
power dissipation is dependent on only
cycle rate, and is not on Chip Select pulse
width.
LE
5
BS
O
TE
F
IGURE
1a.
+5 V
OUTPUT
R
1
480
Ω
INCLUDING
JIG AND
SCOPE
30 pF
R
2
255
Ω
F
IGURE
1b.
+5 V
OUTPUT
R
2
255
Ω
R
1
480
Ω
8. Tested with outputs open and all address
and data inputs stable. The device is con-
tinuously disabled, i.e., CE =
V
CC
. Input
levels are within 0.2 V of
V
CC
or GND.
O
9. Data retention operation requires that
V
CC
never drop below 2.0 V. CE must be
≥
V
CC
– 0.2 V. All other inputs must meet
V
IN
≥
V
CC
– 0.2 V or
V
IN
≤
0.2 V to ensure
full powerdown. For low power version (if
applicable), this requirement applies only to
CE and WE; there are no restrictions on data
and address.
10. These parameters are guaranteed but
not 100% tested.
INCLUDING
JIG AND
SCOPE
5 pF
F
IGURE
2.
+3.0 V
10%
90%
90%
10%
<3 ns
GND
<3 ns
64K Static RAMs
03/04/99–LDS.164/6-D
