M28C64
64 Kbit (8K x 8) Parallel EEPROM
With Software Data Protection
s
Fast Access Time:
– 90 ns at V
CC
=5 V for M28C64 and M28C64-A
– 120 ns at V
CC
=3 V for M28C64-xxW
s
Single Supply Voltage:
– 4.5 V to 5.5 V for M28C64 and M28C64-A
– 2.7 V to 3.6 V for M28C64-xxW
28
s
s
Low Power Consumption
Fast BYTE and PAGE WRITE (up to 64 Bytes)
– 1 ms at V
CC
=4.5 V for M28C64-A
– 3 ms at V
CC
=4.5 V for M28C64
– 5 ms at V
CC
=2.7 V for M28C64-xxW
1
PDIP28 (BS)
PLCC32 (KA)
s
Enhanced Write Detection and Monitoring:
– Ready/Busy Open Drain Output
– Data Polling
– Toggle Bit
– Page Load Timer Status
1
28
s
s
s
s
JEDEC Approved Bytewide Pin-Out
Software Data Protection
100000 Erase/Write Cycles (minimum)
Data Retention (minimum):
– 40 Years for M28C64 and M28C64-xxW
– 10 Years for M28C64-A
SO28 (MS)
300 mil width
TSOP28 (NS)
8 x 13.4 mm
Figure 1. Logic Diagram
VCC
Table 1. Signal Names
13
A0-A12
DQ0-DQ7
W
E
G
RB
V
CC
V
SS
Address Input
Data Input / Output
Write Enable
Chip Enable
Output Enable
Ready / Busy
Supply Voltage
8
DQ0-DQ7
A0-A12
W
E
M28C64
RB
G
VSS
Ground
AI01350C
June 2000
1/24
M28C64
Figure 2A. DIP Connections
RB
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
1
28
2
27
3
26
4
25
5
24
6
23
7
22
M28C64
8
21
9
20
10
19
11
18
12
17
13
16
14
15
AI01351C
Figure 2C. SO Connections
VCC
W
NC
A8
A9
A11
G
A10
E
DQ7
DQ6
DQ5
DQ4
DQ3
RB
A12
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
DQ1
DQ2
VSS
1
2
3
4
5
6
7
M28C64
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
VCC
W
NC
A8
A9
A11
G
A10
E
DQ7
DQ6
DQ5
DQ4
DQ3
AI01353C
Note: 1. NC = Not Connected
Note: 1. NC = Not Connected
Figure 2B. PLLC Connections
RB
DU
VCC
W
NC
A7
A12
Figure 2D. TSOP Connections
G
A11
A9
A8
NC
W
VCC
RB
A12
A7
A6
A5
A4
A3
22
21
A10
E
DQ7
DQ6
DQ5
DQ4
DQ3
VSS
DQ2
DQ1
DQ0
A0
A1
A2
1 32
A6
A5
A4
A3
A2
A1
A0
NC
DQ0
A8
A9
A11
NC
G
A10
E
DQ7
DQ6
9
M28C64
25
28
1
M28C64
15
14
17
DQ1
DQ2
VSS
DU
DQ3
DQ4
DQ5
7
8
AI01354C
AI01352D
Note: 1. NC = Not Connected
2. DU = Do Not Use
Note: 1. NC = Not Connected
DESCRIPTION
The M28C64 devices consist of 8192x8 bits of low
power, parallel EEPROM, fabricated with
STMicroelectronics’ proprietary single polysilicon
CMOS technology. The devices offer fast access
time, with low power dissipation, and require a
single voltage supply (5V or 3V, depending on the
option chosen).
The device has been designed to offer a flexible
microcontroller interface, featuring both hardware
and software handshaking, with Ready/Busy,
Data Polling and Toggle Bit. The device supports
a 64 byte Page Write operation. Software Data
Protection (SDP) is also supported, using the
standard JEDEC algorithm.
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M28C64
Table 2. Absolute Maximum Ratings
1
Symbol
T
A
T
STG
V
CC
V
IO
V
I
V
ESD
Parameter
Ambient Operating Temperature
Storage Temperature
Supply Voltage
Input or Output Voltage
Input Voltage
Electrostatic Discharge Voltage (Human Body model)
2
Value
-40 to 125
-65 to 150
-0.3 to V
CC
+1
-0.6 to V
CC
+0.6
-0.3 to 6.5
4000
Unit
°C
°C
V
V
V
V
Note: 1. Except for the rating “Operating Temperature Range”, stresses above those listed in the Table “Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only, and operation of the device at these or any other conditions
above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi-
tions for extended periods may affect device reliability. Refer also to the ST SURE Program and other relevant quality documents.
2. MIL-STD-883C, 3015.7 (100 pF, 1500
Ω)
Figure 3. Block Diagram
RB
E
G
W
VPP GEN
RESET
CONTROL LOGIC
X DECODE
A6-A12
(Page Address)
ADDRESS
LATCH
64K ARRAY
A0-A5
ADDRESS
LATCH
Y DECODE
SENSE AND DATA LATCH
I/O BUFFERS
PAGE LOAD
TIMER STATUS
TOGGLE BIT
DATA POLLING
AI01355
DQ0-DQ7
3/24
M28C64
Table 3. Operating Modes
1
Mode
Stand-by
Output Disable
Write Disable
Read
Write
Chip Erase
E
1
X
X
0
0
0
G
X
1
X
0
1
V
W
X
X
1
1
0
0
DQ0-DQ7
Hi-Z
Hi-Z
Hi-Z
Data Out
Data In
Hi-Z
Note: 1. 0=
V
IL
; 1=
V
IH
; X =
V
IH
or V
IL
; V=12V
±
5%.
SIGNAL DESCRIPTION
The external connections to the device are
summarized in Table 1, and their use in Table 3.
Addresses (A0-A12).
The address inputs are
used to select one byte from the memory array
during a read or write operation.
Data In/Out (DQ0-DQ7).
The contents of the data
byte are written to, or read from, the memory array
through the Data I/O pins.
Chip Enable (E).
The chip enable input must be
held low to enable read and write operations.
When Chip Enable is high, power consumption is
reduced.
Output Enable (G).
The Output Enable input
controls the data output buffers, and is used to
initiate read operations.
Write Enable (W).
The Write Enable input controls
whether the addressed location is to be read, from
or written to.
Ready/Busy (RB).
Ready/Busy is an open drain
output that can be used to detect the end of the
internal write cycle.
DEVICE OPERATION
In order to prevent data corruption and inadvertent
write operations, an internal V
CC
comparator
inhibits the Write operations if the V
CC
voltage is
lower than V
WI
(see Table 4A and Table 4B). Once
the voltage applied on the V
CC
pin goes over the
V
WI
threshold (V
CC
>V
WI
), write access to the
memory is allowed after a time-out t
PUW
, as
specified in Table 4A and Table 4B.
Further protection against data corruption is
offered by the E and W low pass filters: any glitch,
on the E and W inputs, with a pulse width less than
10 ns (typical) is internally filtered out to prevent
inadvertent write operations to the memory.
Table 4A. Power-Up Timing
1
for M28C64 (5V range)
(T
A
= 0 to 70
°C
or –40 to 85
°C
or –40 to 125
°C;
V
CC
= 4.5 to 5.5 V)
Symbol
t
PUR
t
PUW
V
WI
Parameter
Time Delay to Read Operation
Time Delay to Write Operation (once V
CC
≥
V
WI
)
Write Inhibit Threshold
3.0
Min.
Max.
1
10
4.2
Unit
µs
ms
V
Note: 1. Sampled only, not 100% tested.
Table 4B. Power-Up Timing
1
for M28C64-xxW (3V range)
(T
A
= 0 to 70
°C
or –40 to 85
°C;
V
CC
= 2.7 to 3.6 V)
Symbol
t
PUR
t
PUW
V
WI
Parameter
Time Delay to Read Operation
Time Delay to Write Operation (once V
CC
≥
V
WI
)
Write Inhibit Threshold
1.5
Min.
Max.
1
15
2.5
Unit
µs
ms
V
Note: 1. Sampled only, not 100% tested.
4/24
M28C64
Read
The device is accessed like a static RAM. When E
and G are low, and W is high, the contents of the
addressed location are presented on the I/O pins.
Otherwise, when either G or E is high, the I/O pins
revert to their high impedance state.
Write
Write operations are initiated when both W and E
are low and G is high. The device supports both
W-controlled and E-controlled write cycles (as
shown in Figure 11 and Figure 12). The address is
latched during the falling edge of W or E (which
ever occurs later) and the data is latched on the
rising edge of W or E (which ever occurs first).
After a delay, t
WLQ5H
, that cannot be shorter than
the value specified in Table 10A to Table 10C, the
internal write cycle starts. It continues, under
internal timing control, until the write operation is
complete. The commencement of this period can
be detected by reading the Page Load Timer
Status on DQ5. The end of the cycle can be
detected by reading the status of the Data Polling
and the Toggle Bit functions on DQ7 and DQ6.
Page Write
The Page Write mode allows up to 64 bytes to be
written on a single page in a single go. This is
achieved through a series of successive Write
operations, no two of which are separated by more
than the t
WLQ5H
value (as specified in Table 10A
to Table 10C).
All bytes must be located on the same page
address (A12-A6 must be the same for all bytes).
The internal write cycle can start at any instant
after t
WLQ5H
. Once initiated, the write operation is
internally timed, and continues, uninterrupted,
until completion.
As with the single byte Write operation, described
above, the DQ5, DQ6 and DQ7 lines can be used
to detect the beginning and end of the internally
controlled phase of the Page Write cycle.
Software Data Protection (SDP)
The device offers a software-controlled write-
protection mechanism that allows the user to
inhibit all write operations to the device. This can
be useful for protecting the memory from
inadvertent write cycles that may occur during
periods of instability (uncontrolled bus conditions
when excessive noise is detected, or when power
supply levels are outside their specified values).
By default, the device is shipped in the
“unprotected” state: the memory contents can be
freely changed by the user. Once the Software
Data Protection Mode is enabled, all write
commands are ignored, and have no effect on the
memory contents.
The device remains in this mode until a valid
Software Data Protection disable sequence is
received. The device reverts to its “unprotected”
state.
The status of the Software Data Protection
(enabled or disabled) is represented by a non-
Figure 4. Software Data Protection Enable Algorithm and Memory Write
Write AAh in
Address 1555h
Page Write
Timing
(see note 1)
Page Write
Timing
(see note 1)
Write AAh in
Address 1555h
Write 55h in
Address 0AAAh
Write 55h in
Address 0AAAh
Write A0h in
Address 1555h
Write A0h in
Address 1555h
Write
is enabled
Physical
Page Write
Instruction
Page Write
(1 up to 64 bytes)
SDP is set
SDP Enable Algorithm
Write to Memory
When SDP is SET
AI01356C
Note: 1. The most significant address bits (A12 to A6) differ during these specific Page Write operations.
5/24