ESMT
Revision History
Revision 1.0 (May. 29, 2007)
-Original
Preliminary
M52D128168A
Elite Semiconductor Memory Technology Inc.
Publication Date: May. 2007
Revision: 1.0
1/47
ESMT
SDRAM
FEATURES
Preliminary
M52D128168A
2M x 16 Bit x 4 Banks
Synchronous DRAM
MAX
FREQ.
1.8V power supply
LVTTL compatible with multiplexed address
Four banks operation
MRS cycle with address key programs
- CAS Latency (2 & 3)
- Burst Length (1, 2, 4, 8 & full page)
- Burst Type (Sequential & Interleave)
EMRS cycle with address
All inputs are sampled at the positive going edge of the
system clock
Special function support
-
PASR (Partial Array Self Refresh)
-
TCSR (Temperature Compensated Self Refresh)
-
DS (Driver Strength)
DQM for masking
Auto & self refresh
64ms refresh period (4K cycle)
PRODUCT NO.
PACKAGE
54 TSOP II
54 Ball FBGA
54 TSOP II
54 Ball FBGA
Comments
Pb-free
Pb-free
Pb-free
Pb-free
M52D128168A-7.5TG 133MHz
M52D128168A-7.5BG 133MHz
M52D128168A-10TG
M52D128168A-10BG
100MHz
100MHz
ORDERING INFORMATION
GENERAL DESCRIPTION
The M52D128168A is 134,217,728 bits synchronous high data rate Dynamic RAM organized as 4 x 2,097,152 words
by 16 bits. Synchronous design allows precise cycle controls with the use of system clock I/O transactions are possible on
every clock cycle. Range of operating frequencies, programmable burst length and programmable latencies allow the same
device to be useful for a variety of high bandwidth, high performance memory system applications.
PIN ASSIGNMENT (Top View)
1
2
DQ15
3
VSSQ
4
5
6
7
VDDQ
8
DQ0
9
VDD
V
DD
DQ0
V
DDQ
DQ1
DQ2
V
SSQ
DQ3
DQ4
V
DDQ
DQ5
DQ6
V
SSQ
DQ7
V
DD
LDQM
WE
CAS
RAS
CS
BA0
BA1
A
10
/AP
A
0
A
1
A
2
A
3
V
DD
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
V
SS
DQ15
V
SSQ
DQ14
DQ13
V
DDQ
DQ12
DQ11
V
SSQ
DQ10
DQ9
V
DDQ
DQ8
V
SS
NC
UDQM
CLK
CKE
NC
A
11
A
9
A
8
A
7
A
6
A
5
A
4
V
SS
A
VSS
B
DQ14
DQ13
VDDQ
VSSQ
DQ2
DQ1
C
DQ12
DQ11
VSSQ
VDDQ
DQ4
DQ3
D
DQ10
DQ9
VDDQ
VSSQ
DQ6
DQ5
E
DQ8
NC
VSS
VDD
LDQM
DQ7
F
UDQM
CLK
CKE
CAS
RAS
WE
G
NC
A11
A9
BA0
BA1
CS
H
A8
A7
A6
A0
A1
A10
J
VSS
A5
A4
A3
A2
VDD
54 Ball FBGA
(8x8mm)
(mm ball pitch)
Elite Semiconductor Memory Technology Inc.
Publication Date: May. 2007
Revision: 1.0
2/47
ESMT
M52D128168A
FUNCTIONAL BLOCK DIAGRAM
CLK
CKE
Clock
Generator
Preliminary
Bank D
Bank C
Bank B
Row Decoder
Row
Address
Buffer
&
Refresh
Counter
Address
Mode
Register
Bank A
Sense Amplifier
Command Decoder
Control Logic
CS
RAS
CAS
WE
Data Control Circuit
Input & Output
Buffer
Latch Circuit
Column
Address
Buffer
&
Refresh
Counter
L(U)DQM
Column Decoder
DQ
PIN FUNCTION DESCRIPTION
PIN
CLK
CS
CKE
A0 ~ A11
BA0 , BA1
NAME
System Clock
Chip Select
Clock Enable
Address
Bank Select Address
INPUT FUNCTION
Active on the positive going edge to sample all inputs
Disables or enables device operation by masking or enabling all
inputs except CLK , CKE and L(U)DQM
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one cycle prior new command.
Disable input buffers for power down in standby.
Row / column address are multiplexed on the same pins.
Row address : RA0~RA11, column address : CA0~CA7
Selects bank to be activated during row address latch time.
Selects bank for read / write during column address latch time.
Latches row addresses on the positive going edge of the CLK with
RAS
Row Address Strobe
RAS low.
Enables row access & precharge.
Latches column address on the positive going edge of the CLK with
CAS
Column Address Strobe
CAS low.
Enables column access.
Enables write operation and row precharge.
WE
Write Enable
Data Input / Output Mask
Data Input / Output
Power Supply / Ground
Data Output Power / Ground
No Connection
Latches data in starting from CAS ,
WE
active.
Makes data output Hi-Z, t
SHZ
after the clock and masks the output.
Blocks data input when L(U)DQM active.
Data inputs / outputs are multiplexed on the same pins.
Power and ground for the input buffers and the core logic.
Isolated power supply and ground for the output buffers to provide
improved noise immunity.
This pin is recommended to be left No Connection on the device.
L(U)DQM
DQ0 ~ DQ15
VDD / VSS
VDDQ / VSSQ
NC
Elite Semiconductor Memory Technology Inc.
Publication Date: May. 2007
Revision: 1.0
3/47
ESMT
M52D128168A
ABSOLUTE MAXIMUM RATINGS
PARAMETER
Voltage on any pin relative to V
SS
Voltage on V
DD
supply relative to V
SS
Storage temperature
Power dissipation
Short circuit current
Note:
Preliminary
SYMBOL
V
IN
, V
OUT
V
DD
, V
DDQ
T
STG
P
D
I
OS
VALUE
-1.0 ~ 2.6
-1.0 ~ 2.6
-55 ~ +150
1
50
UNIT
V
V
°
C
W
mA
Permanent device damage may occur if ABSOLUTE MAXIMUM RATING are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITION
Recommended operating conditions (Voltage referenced to V
SS
= 0V, T
A
= 0 to 70
°
C )
PARAMETER
Supply voltage
Input logic high voltage
Input logic low voltage
Output logic high voltage
Output logic low voltage
Input leakage current
Output leakage current
Note:
SYMBOL
V
DD
, V
DDQ
V
IH
V
IL
V
OH
V
OL
I
IL
I
OL
MIN
1.7
0.8xV
DDQ
-0.3
V
DDQ
-0.2
-
-2
-2
TYP
1.8
1.8
0
-
-
-
-
MAX
1.9
V
DDQ
+0.3
0.3
-
0.2
2
2
UNIT
V
V
V
V
V
1
2
I
OH
= -0.1mA
I
OL
= 0.1mA
3
4
NOTE
μ
A
μ
A
1. V
IH(max)
= 2.2V AC for pulse width
≤
3ns acceptable.
2. V
IL(min)
= -1.0V AC for pulse width
≤
3ns acceptable.
3. Any input 0V
≤
V
IN
≤
V
DDQ
, all other pins are not under test = 0V.
4. D
out
is disabled , 0V
≤
V
OUT
≤
V
DDQ
.
CAPACITANCE
(V
DD
= 1.8V, T
A
= 25
°
C , f = 1MHZ)
PARAMETER
Input capacitance (A0 ~ A11, BA0 ~ BA1)
Input capacitance
(CLK, CKE, CS , RAS , CAS ,
WE
&
L(U)DQM)
Data input/output capacitance (DQ0 ~ DQ15)
C
IN2
1.5
3.5
pF
SYMBOL
C
IN1
MIN
1.5
MAX
3.0
UNIT
pF
C
OUT
2.0
4.5
pF
Elite Semiconductor Memory Technology Inc.
Publication Date: May. 2007
Revision: 1.0
4/47
ESMT
M52D128168A
DC CHARACTERISTICS
Preliminary
Recommended operating condition unless otherwise noted，TA = 0 to 70
°
C
Parameter
Operating Current
(One Bank Active)
Precharge Standby
Current in power-down
mode
Precharge Standby
Current in non
power-down mode
Symbol
I
CC1
I
CC2P
I
CC2PS
I
CC2N
Test Condition
CAS
Latency
Version
-7.5
40
0.3
0.3
10
-10
30
Unit Note
mA
mA
mA
mA
1
Burst Length = 1
t
RC
≥
t
RC
(min), t
CC
≥
t
CC
(min), I
OL
= 0mA
CKE
≤
V
IL
(max), t
CC
=15ns
CKE
≤
V
IL
(max), CLK
≤
V
IL
(max), t
CC
=
∞
CKE
≥
V
IH
(min), CS
≥
V
IH
(min), t
CC
=10ns
Input signals are changed one time during 20ns
CKE
≥
V
IH
(min), CLK
≤
V
IL
(max), t
CC
=
∞
Input signals are stable
CKE
≤
V
IL
(max), t
CC
=15ns
CKE
≤
V
IL
(max), CLK
≤
V
IL
(max), t
CC
=
∞
CKE
≥
V
IH
(min), CS
≥
V
IH
(min), t
CC
=10ns
Input signals are changed one time during 20ns
CKE
≥
V
IH
(min), CLK
≤
V
IL
(max), t
CC
=
∞
Input signals are stable
I
OL
= 0mA, Page Burst
All Band Activated, tCCD = tCCD (min)
t
RC
≥
t
RC
(min)
TCSR range
4 Banks
I
CC2NS
Active Standby Current
in power-down mode
Active Standby Current
in non power-down
mode
(One Bank Active)
Operating Current
(Burst Mode)
Refresh Current
I
CC3P
I
CC3PS
I
CC3N
I
CC3NS
1
5
1
20
10
50
90
45
150
140
135
10
45
85
70
250
210
190
mA
mA
mA
mA
mA
1
I
CC4
I
CC5
mA
2
°C
Self Refresh Current
I
CC6
CKE
≤
0.2V
2 Bank
1 Bank
uA
Deep Power Down
Current
I
CC7
CKE
≤
0.2V
uA
Note:
1.Measured with outputs open. Addresses are changed only one time during t
CC
(min).
2.Refresh period is 64ms. Addresses are changed only one time during t
CC
(min).
Elite Semiconductor Memory Technology Inc.
Publication Date: May. 2007
Revision: 1.0
5/47
