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MDO4000CT5

Benchtop Oscilloscopes Five-Year Total Protection Plan

器件类别:热门应用    测试测量   

厂商名称:Tektronix

厂商官网:https://www.tek.com/

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器件参数
参数名称
属性值
产品种类
Product Category
Benchtop Oscilloscopes
制造商
Manufacturer
Tektronix
RoHS
Details
工厂包装数量
Factory Pack Quantity
1
单位重量
Unit Weight
3.711985 oz
文档预览
Mixed Domain Oscilloscopes
MDO4000C Series Datasheet
WINNER OF 13 INDUSTRY AWARDS
Key Performance Specifications
1. Oscilloscope
„„
4
„„
1
analog channels
GHz, 500 MHz, 350 MHz, and 200 MHz bandwidth
models Bandwidth is upgradable (up to 1 GHz)
to 5 GS/s sample rate
M record length on all channels
„„
Up
„„
20
„„
>
340, 000 wfm/s maximum waveform capture rate
„„
Standard
passive voltage probes with 3.9 pF capacitive
loading and 1 GHz or 500 MHz analog bandwidth
range of 9 kHz–3 GHz or 9 kHz–6 GHz
Ultra-wide capture bandwidth
≥1
GHz
capture of spectrum analyzer with
analog and digital acquisitions
vs. time, amplitude vs. time, and
phase vs. time waveforms
predefined waveform types
MHz waveform generation
Customizable and fully upgradable 6-in-1
integrated oscilloscope with synchronized
insights into analog, digital, and RF signals
Introducing the world’s highest performance 6-in-1 integrated
oscilloscope that includes a spectrum analyzer, arbitrary/
function generator, logic analyzer, protocol analyzer and
DVM/frequency counter. The MDO4000C Series has the
performance you need to solve the toughest embedded
design challenges quickly and efficiently. When configured
with an integrated spectrum analyzer, it is the only instrument
that provides simultaneous and synchronized acquisition of
analog, digital and spectrum, ideal for incorporating wire-
less communications (IoT) and EMI troubleshooting. The
MDO4000C is completely customizable and fully upgradable
so you can add the instruments you need now – or later.
2. Spectrum Analyzer (Optional)
„„
Frequency
„„
Time-synchronized
„„
Frequency
3. Arbitrary/Function Generator (Optional)
„„
13
„„
50
„„
128
k arbitrary generator record length 250 MS/s
arbitrary generator sample rate
M record length on all channels
ps timing resolution
4. Logic Analyzer (Optional) 16 digital channels
„„
20
„„
60.6
5. Protocol Analyzer (Optional)
„„
Serial
bus support for I2C, SPI, RS-232/422/485/
UART, USB 2.0, Ethernet, CAN, LIN, FlexRay,
MIL-STD-1553, and Audio standards
6. Digital Voltmeter/Frequency Counter
(Free with product registration)
„„
4-digit
„„
5-digit
AC RMS, DC, and AC+DC RMS voltage
measurements
frequency measurements
Datasheet
MSO/DPO2000B
High-Level
Description
Advanced debug features at
an affordable price
MDO3000
MDO4000C
MSO/DPO5000B
Exceptional signal fidelity with
advanced analysis and math
6-in-1 integrated oscilloscope Performance 6-in-1
integrated oscilloscope
with synchronized insights
into analog, digital and
spectral signals
Design and Debug
EMI Troubleshooting
Education
100 MHz, 200 MHz,
350 MHz, 500 MHz, 1 GHz
5 GS/s
2, 4
10 M
(Optional) 16
(Standard) 9 kHz -Analog BW
(Optional) 9 kHz -3 GHz
(Optional) Up to 50 MHz with
13 functions and arbitrary
waveform generation
Trigger & Decode:
I
2
C, SPI,
RS-232/422/485/UART,
CAN, LIN, FlexRay, USB2.0,
MIL-STD-1553, Audio
Design and Debug
EMI Troubleshooting
General Purpose RF Design
and Integration
200 MHz, 350 MHz,
500 MHz, 1 GHz
5 GS/s
4
20 M
(Optional) 16
(Optional) 9 kHz -3 GHz
(Optional) 9 kHz -6 GHz
(Optional) Up to 50 MHz with
13 functions and arbitrary
waveform generation
Trigger & Decode:
I
2
C,
SPI, RS-232/422/485/
UART, CAN, LIN, FlexRay,
USB2.0, Ethernet, MIL-STD-
1553, Audio
Commonly Used For
Design and Debug
Education
Advanced Design and Debug
USB Ethernet Compliance
Research
350 MHz, 500 MHz,
1 GHz, 2 GHz
10 GS/s
4
25 M
(Optional) Up to 125 M
(Optional) 16
N/A
N/A
Analog Bandwidth
Maximum Analog
Sample Rate
Analog Channels
Record Length
Digital Channels
Spectrum
Analyzer Channel
AFG
70 MHz, 100 MHz, 200 MHz
1 GS/s
2, 4
1M
(Optional) 16
N/A
N/A
Serial Bus Analysis
Trigger & Decode:
I
2
C,
SPI, RS-232/422/485/
UART, CAN, LIN
Trigger & Decode:
I
2
C, SPI,
RS-232/422/485/UART,
CAN, LIN, FlexRay, USB2.0,
Ethernet, MIL-STD-1553
Decode Only:
USB-HSIC,
MIPI D-PHY
Compliance:
BroadR-
Reach, USB2.0, USB-PWR,
Ethernet, MOST
Power, Limit/Mask, Video,
Vector Signal Analysis, Jitter
500 MHz, 3.9 pF or
1 GHz, 3.9 pF
Advanced Analysis
Power, Limit/Mask, Video
Power, Limit/Mask, Video,
Spectrogram, Vector
Signal Analysis
500 MHz, 3.9 pF or
1 GHz, 3.9 pF
Standard Probing
100 MHz, 12 pF or
200 MHz, 12 pF
250 MHz, 3.9 pF
500 MHz, 3.9 pF or
1 GHz, 3.9 pF
2
www.tektronix.com
Mixed Domain Oscilloscopes
Typical Applications
Embedded Design
Discover and solve issues quickly by performing system
level debug on mixed signal embedded systems
including today’s most common serial bus and wireless
technologies.
1. Oscilloscope
At the core of the MDO4000C Series is a world-class oscil-
loscope, offering comprehensive tools that speed each stage
of debug – from quickly discovering anomalies and capturing
them, to searching your waveform record for events of interest
and analyzing their characteristics and your device’s behavior.
Power Design
Make reliable and repeatable voltage, current, and
power measurements using automated power quality,
switching loss, harmonics, ripple, modulation, and safe
operating area measurements with the widest selection
of power probes in an affordable solution.
Digital Phosphor Technology with Fastacq
High-Speed Waveform Capture
To debug a design problem, first you must know it exists.
Every design engineer spends time looking for problems in
their design, a time-consuming and frustrating task without the
right debug tools.
Digital phosphor technology with FastAcq provides you with
fast insight into the real operation of your device. Its fast
waveform capture rate – greater than 340, 000 wfms/s – gives
you a high probability of quickly seeing the infrequent prob-
lems common in digital systems: runt pulses, glitches, timing
issues, and more.
EMI Troubleshooting
Quickly track down the source of EMI in an embedded
system by determining which time domain signals may
be causing unwanted EMI. See in real-time the effects
time domain signals have on system EMI emissions.
Wireless Troubleshooting
Whether using Bluetooth, 802.11 Wi-Fi, ZigBee, or
some other wireless technology, the MDO4000C
enables viewing an entire system – analog, digital, and
RF, time-synchronized to understand its true behavior.
Capture an ultra-wide band in a single capture to view
interactions among multiple wireless technologies, or
to view an entire broadband frequency range from a
modern standard like 802.11/ad.
Education
Managing multiple instruments on a bench can be
troublesome. The MDO4000C eliminates the need to
manage multiple instruments by integrating six instru-
ment types into a single instrument. The integration
of a spectrum analyzer enables teaching of advanced
wireless technology course work while minimizing
the investment required. Full upgradability enables
adding functionality over time as needs change or
budgets allow.
Digital phosphor technology enables a greater than 340, 000 wfm/s waveform
capture rate and real-time intensity grading.
Manufacturing Test and Troubleshooting
Size and space constraints can play havoc on a manu-
facturing floor. The unique 6-in-1 MDO4000C minimizes
rack or bench space by integrating multiple instruments
into one small package. Integration reduces cost asso-
ciated with utilizing multiple different instrument types in
manufacturing test or troubleshooting stations.
To further enhance the visibility of rarely occurring events,
intensity grading is used to indicate how often rare tran-
sients are occurring relative to normal signal characteristics.
There are four waveform palettes available in FastAcq acqui-
sition mode.
„„
The
Temperature
palette uses color-grading to indicate
frequency of occurrence with hot colors like red/yellow
indicating frequently occurring events and colder colors like
blue/green indicating rarely occurring events.
www.tektronix.com
3
Datasheet
„„
The
Spectral
palette uses color-grading to indicate
frequency of occurrence with colder colors like blue indi-
cating frequently occurring events and hot colors like red
indicating rarely occurring events.
Normal
palette uses the default channel color (like
yellow for channel one) along with gray-scale to indicate
frequency of occurrence where frequently occurring events
are bright.
Inverted
palette uses the default channel color along
with grayscale to indicate frequency of occurrence where
rarely occurring events are bright.
„„
The
„„
The
These color palettes quickly highlight the events that over
time occur more often or, in the case of infrequent anomalies,
occur less often.
Infinite or variable persistence choices determine how long
waveforms stay on the display, helping you to determine how
often an anomaly is occurring.
Over 125 trigger combinations make capturing your event of interest easy.
Triggering
Discovering a device fault is only the first step. Next, you must
capture the event of interest to identify root cause. To enable
this, the MDO4000C contains over 125 trigger combinations
providing a complete set of triggers – including runt, logic,
pulse width/glitch, setup and hold violation, serial packet, and
parallel data – to help quickly locate your event of interest.
And with up to a 20 M record length, you can capture many
events of interest, even thousands of serial packets, in a
single acquisition for further analysis while maintaining high
resolution to zoom in on fine signal details and record reliable
measurements.
Wave Inspector
®
Waveform Navigation and
Automated Search
With long record lengths, a single acquisition can include thou-
sands of screens of waveform data. Wave Inspector
®
, the
industry’s best tool for waveform navigation and automated
search, enables you to find events of interest in seconds.
Wave Inspector controls provide unprecedented efficiency in viewing, navigating,
and analyzing waveform data. Zip through your long record by turning the outer
pan control (1). Get details from the beginning to end in seconds. See something
of interest and want to see more details? Just turn the inner zoom control (2).
4
www.tektronix.com
Mixed Domain Oscilloscopes
Zoom and Pan
A dedicated, two-tier front-panel control provides intui-
tive control of both zooming and panning. The inner control
adjusts the zoom factor (or zoom scale); turning it clockwise
activates zoom and goes to progressively higher zoom factors,
while turning it counterclockwise results in lower zoom factors
and eventually turning zoom off. No longer do you need to
navigate through multiple menus to adjust your zoom view.
The outer control pans the zoom box across the waveform
to quickly get to the portion of waveform you are interested
in. The outer control also utilizes force-feedback to determine
how fast to pan on the waveform. The farther you turn the
outer control, the faster the zoom box moves. Pan direction is
changed by simply turning the control the other way.
User Marks
Press the
Set Mark
front-panel button to place one or more
marks on the waveform. Navigating between marks is as
simple as pressing the
Previous
(←) and
Next
(→) buttons on
the front panel.
Search step 1: You define what you would like to find.
Search Marks
The Search button allows you to automatically search through
your long acquisition looking for user-defined events. All
occurrences of the event are highlighted with search marks
and are easily navigated to, using the front panel Previous
(←) and Next(→) buttons. Search types include edge, pulse
width/glitch, timeout, runt, logic, setup and hold, rise/fall time,
parallel bus, and I
2
C, SPI, RS-232/422/485/UART, USB 2.0,
Ethernet, CAN, LIN, FlexRay, MIL-STD-1553, and I
2
S/LJ/RJ/
TDM packet content. A search mark table provides a tabular
view of the events found during the automated search. Each
event is shown with a time stamp, making timing measure-
ments between events easy.
Search step 2: Wave Inspector automatically searches through the record and
marks each event with a hollow white triangle. You can then use the Previous and
Next buttons to jump from one event to the next.
Search step 3: The Search Mark table provides a tabular view of each of the
events found by the automated search. Each event is shown with a time stamp
making timing measurements between events easy.
www.tektronix.com
5
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