MM Series – MLCC for Medical Applications
General Specifications
The AVX MM series is a multi-layer ceramic capacitor designed for
use in medical applications other than implantable/life support.
These components have the design & change control expected for
medical devices and also offer enhanced LAT including reliability
testing and 100% inspection.
APPLICATIONS
Implantable, Non-Life Supporting Medical Devices
• e.g. implanted temporary cardiac monitor, insulin pumps
External, Life Supporting Medical Devices
• e.g. heart pump external controller
External Devices
• e.g. patient monitoring, diagnostic equipment
HOW TO ORDER
MM02
Size
MM02 = 0402
MM03 = 0603
MM05 = 0805
MM06 = 1206
MM10 = 1210
MM08 = 1808
MM12 = 1812
MM20 = 2220
Z
Rated
Voltage
Z = 10V
Y = 16V
3 = 25V
5 = 50V
1 = 100V
2 = 200V
V = 250V
7 = 500V
A
Dielectric
Code
A = NP0 (C0G)
C = X7R
100
Capacitance
Code (In pF)
(2 significant
digits + number
of zeros)
for values <10pF:
letter R denotes
decimal point.
Example:
68pF = 680
8.2pF = 8R2
J
C
T
Termination
Finish
T = Plated Ni & Sn
(NP0 only)
Z = Flexiterm
(X7R only)
2
Packaging
2 = 7" Reel
4 = 13" Reel
A
Special
Code
A = Standard
*Contact AVX
for others
Capacitance
Failure Rate
Tolerance
C = Standard
B = ±0.1pF
Range
C = ±0.25pF
D = ±0.5pF
*
Contact AVX
for others
F = ±1% (≥10pF)
G = ±2% (≥10pF)
J = ±5%
K = ±10%
M = ±20%
L
W
T
t
COMMERCIAL VS MM SERIES PROCESS COMPARISON
Administrative
Design
Dicing
Lot Qualification
Destructive Physical
Analysis (DPA)
Visual/Cosmetic Quality
Application Robustness
Commercial
Standard part numbers; no restriction on
who purchases these parts
Minimum ceramic thickness of 0.020"
on all X7R product
Side & end margins = 0.003" min
As per EIA RS469
Standard process and inspection
Standard sampling for accelerated wave
solder on X7R dielectrics
MM Series
Specific series part number, used to control
supply of product
Minimum ceramic thickness of 0.029" (0.74mm)
Side & end margins = 0.004" min
Cover layers = 0.003" min
Increased sample plan – stricter criteria
100% inspection
Increased sampling for accelerated
wave solder on X7R and NP0 followed
by lot by lot reliability testing
AVX will qualify and notify customers before
making any change to the following materials
or processes:
• Dielectric formulation, type, or supplier
• Metal formulation, type, or supplier
• Termination material formulation, type, or supplier
• Manufacturing equipment type
• Quality testing regime including sample size and
accept/ reject criteria
Design/Change Control
Required to inform customer of changes in:
• form
• fit
• function
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MM Series – MLCC for Medical Applications
NP0 (C0G) – Specifications & Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Q
Insulation Resistance
Dielectric Strength
NP0 Specification Limits
-55ºC to +125ºC
Within specified tolerance
<30 pF: Q≥ 400+20 x Cap Value
≥30 pF: Q≥ 1000
100,000MΩ or 1000MΩ - μF,
whichever is less
No breakdown or visual defects
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 MHz ± 10% for cap ≤ 1000 pF
1.0 kHz ± 10% for cap > 1000 pF
Voltage: 1.0Vrms ± .2V
Charge device with rated voltage for
60 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Deflection: 2mm
Test Time: 30 seconds
1mm/sec
Resistance to
Flexure
Stresses
Appearance
Capacitance
Variation
Q
Insulation
Resistance
No defects
±5% or ±.5 pF, whichever is greater
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±2.5% or ±.25 pF, whichever is greater
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±2.5% or ±.25 pF, whichever is greater
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±3.0% or ± .3 pF, whichever is greater
≥ 30 pF:
≥10 pF, <30 pF:
<10 pF:
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
90 mm
Solderability
Appearance
Capacitance
Variation
Resistance to
Solder Heat
Q
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Q
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Q
(C=Nominal Cap)
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Load
Humidity
Q
Insulation
Resistance
Dielectric
Strength
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
Thermal
Shock
Repeat for 5 cycles and measure after
24 hours at room temperature
Load Life
Charge device with twice rated voltage in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0).
Remove from test chamber and stabilize at
room temperature for 24 hours
before measuring.
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±5.0% or ± .5 pF, whichever is greater
≥ 30 pF:
≥10 pF, <30 pF:
<10 pF:
Q≥ 350
Q≥ 275 +5C/2
Q≥ 200 +10C
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature for 24 ± 2 hours
before measuring.
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
126
113016
MM Series – MLCC for Medical Applications
NP0/C0G Capacitance Range
PREFERRED SIZES ARE SHADED
SIZE
Cap
(pF)
0.5
1.0
1.2
1.5
1.8
2.2
2.7
3.3
3.9
4.7
5.6
6.8
8.2
10
12
15
18
22
27
33
39
47
56
68
82
100
120
150
180
220
270
330
390
470
560
680
820
1000
1200
1500
WVDC
0R5
1R0
1R2
1R5
1R8
2R2
2R7
3R3
3R9
4R7
5R6
6R8
8R2
100
120
150
180
220
270
330
390
470
560
680
820
101
121
151
181
221
271
331
391
471
561
681
821
102
122
152
WVDC
16
0603
25
50
100
16
0805
25
50
100
16
25
1206
50
100
16
25
50
100
16
25
50
100
16
25
50
100
SIZE
0603
0805
1206
113016
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MM Series – MLCC for Medical Applications
X7R Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
X7R Specification Limits
-55ºC to +125ºC
Within specified tolerance
≤ 10% for ≥ 50V DC rating
≤ 12.5% for 25V DC rating
≤ 12.5% for 25V and 16V DC rating
≤ 12.5% for ≤ 10V DC rating
100,000MΩ or 1000MΩ - μF,
whichever is less
No breakdown or visual defects
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
Insulation Resistance
Dielectric Strength
Resistance to
Flexure
Stresses
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
No defects
≤ ±12%
Meets Initial Values (As Above)
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
1-5 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Deflection: 2mm
Test Time: 30 seconds
1mm/sec
90 mm
Solderability
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
Resistance to
Solder Heat
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Step 1: -55ºC ± 2º
Step 2: Room Temp
Step 3: +125ºC ± 2º
Step 4: Room Temp
30 ± 3 minutes
≤ 3 minutes
30 ± 3 minutes
≤ 3 minutes
Thermal
Shock
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, -0)
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, -0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
Load Life
Load
Humidity
128
113016
MM Series – MLCC for Medical Applications
X7R Capacitance Range
PREFERRED SIZES ARE SHADED
SIZE
Cap
pf
220
270
330
390
470
560
680
820
1000
1200
1500
1800
2200
2700
3300
3900
4700
5600
6800
8200
cap 0.010
uf 0.012
0.015
0.018
0.022
0.027
0.033
0.039
0.047
0.056
0.068
0.082
0.10
0.12
0.15
0.22
0.33
0.47
0.56
0.68
0.82
1.0
1.2
1.5
WVDC
221
271
331
391
471
561
681
821
102
122
152
182
222
272
332
392
472
562
682
822
103
123
153
183
223
273
333
393
473
563
683
823
104
124
154
224
334
474
564
684
824
105
125
155
WVDC
0402
0603
0805
1206
1210
1808
1812
2220
16 25 50 10 16 25 50 100 200 10 16
25 50 100 200 250 10 16 25 50 100 200 250 500 10 16 25 50 100 200 250 500 50 100 200 50 100 200 250 25 50 100
16 25 50 10 16 25 50 100 200 10 16
25 50 100 200 250 10 16 25 50 100 200 250 500 10 16 25 50 100 200 250 500 50 100 200 50 100 200 250 25 50 100
SIZE
0402
0603
0805
1206
1210
1808
1812
2220
110116
129
嵌入式系统
