MCP3301
13-Bit Differential Input, Low Power A/D Converter
with SPI Serial Interface
Features
•
•
•
•
•
•
•
•
•
•
•
Full Differential Inputs
±1 LSB max DNL
±1 LSB max INL (MCP3301-B)
±2 LSB max INL (MCP3301-C)
Single supply operation: 4.5V to 5.5V
100 ksps sampling rate with 5V supply voltage
50 nA typical standby current, 1 µA max
450 µA max active current at 5V
Industrial temp range: -40°C to +85°C
8-pin MSOP, PDIP, and SOIC packages
Mixed Signal PICtail™ Demo Board (P/N:
MXSIGDM) compatible
General Description
The MCP3301 13-bit analog-to-digital (A/D) converter
features full differential inputs and low power consump-
tion in a small package that is ideal for battery-powered
systems and remote data acquisition applications.
Incorporating a successive approximation architecture
with on-board sample and hold circuitry, the 13-bit A/D
converter is specified to have ±1 LSB Differential Non-
linearity (DNL) and ±1 LSB Integral Nonlinearity (INL)
for B-grade devices and ±2 LSB for C-grade devices.
The industry-standard SPI serial interface enables 13-
bit A/D converter capability to be added to any PIC
®
microcontroller.
The MCP3301 features a low current design that per-
mits operation with typical standby and active currents
of only 50 nA and 300 µA, respectively. The device is
capable of conversion rates of up to 100 ksps with
tested specifications over a 4.5V to 5.5V supply range.
The reference voltage can be varied from 400 mV to
5V, yielding input-referred resolution between 98 µV
and 1.22 mV.
The MCP3301 is available in 8-pin PDIP, 150 mil SOIC,
and MSOP packages. The full differential inputs of this
device enable a wide variety of signals to be used in
applications such as remote data acquisition, portable
instrumentation, and battery-operated applications.
Applications
• Remote Sensors
• Battery-operated Systems
• Transducer Interface
Functional Block Diagram
V
REF
V
DD
V
SS
Package Types
CDAC
IN+
IN-
Sample
& Hold
Circuits
MSOP, PDIP, SOIC
V
REF
IN(+)
IN(-)
V
SS
1
2
3
4
8
7
6
5
V
DD
CLK
D
OUT
CS/SHDN
MCP3301
-
+
Comparator
13-Bit SAR
Control Logic
Shift
Register
CS/SHDN
CLK
D
OUT
2001-2011 Microchip Technology Inc.
DS21700E-page 1
MCP3301
1.0
ELECTRICAL
CHARACTERISTICS
*Notice:
Stresses above those listed under “Maximum
ratings” may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at
those or any other conditions above those indicated in the
operational listings of this specification is not implied.
Exposure to maximum rating conditions for extended periods
may affect device reliability.
Maximum Ratings*
V
DD
...................................................................................7.0V
All inputs and outputs w.r.t. V
SS
............... -0.3V to V
DD
+0.3V
Storage temperature .....................................-65°C to +150°C
Ambient temperature with power applied......-65°C to +125°C
Maximum Junction Temperature .................................. 150°C
ESD protection on all pins (HBM) .................................> 4 kV
ELECTRICAL CHARACTERISTICS
Electrical Characteristics:
Unless otherwise noted, all parameters apply at V
DD
= 5V, V
SS
= 0V, and V
REF
= 5V. Full differential
input configuration (Figure
1-5)
with fixed common mode voltage of 2.5V. All parameters apply over temperature with
T
AMB
= -40°C to +85°C
(Note
7).
Conversion speed (
F
SAMPLE)
is 100 ksps with
F
CLK
= 17*
F
SAMPLE
Parameter
Conversion Rate
Maximum Sampling Frequency
Conversion Time
Acquisition Time
DC Accuracy
Resolution
Integral Nonlinearity
Differential Nonlinearity
Positive Gain Error
Negative Gain Error
Offset Error
Dynamic Performance
Total Harmonic Distortion
Signal to Noise and Distortion
Spurious Free Dynamic Range
Common-Mode Rejection
Power Supply Rejection
Note 1:
2:
3:
4:
5:
6:
7:
8:
9:
THD
SINAD
SFDR
CMRR
PSR
—
—
—
—
—
-91
78
92
79
74
—
—
—
—
—
dB
dB
dB
dB
dB
Note 3
Note 3
Note 3
Note 6
Note 4
INL
DNL
—
—
—
-3
-3
-3
12 data bits + sign
±0.5
±1
±0.5
-0.75
-0.5
+3
±1
±2
±1
+2
+2
+6
bits
LSB
LSB
LSB
LSB
LSB
MCP3301-B
MCP3301-C
Monotonic with no missing codes over
temperature
Symbol
Min
—
Typ
—
13
1.5
Max
100
Units
ksps
CLK
periods
CLK
periods
Conditions
See
F
CLK
specifications
(Note
8)
F
SAMPLE
t
CONV
t
ACQ
This specification is established by characterization and not 100% tested.
See characterization graphs that relate converter performance to V
REF
level.
V
IN
= 0.1V to 4.9V @ 1 kHz.
V
DD
= 5V DC ±500 mV
P-P
@ 1 kHz, see test circuit
Figure 1-4.
Maximum clock frequency specification must be met.
V
REF
= 400 mV, V
IN
= 0.1V to 4.9V @ 1 kHz
MSOP devices are only specified at 25°C and +85°C.
For slow sample rates, see
Section 5.2.1 “Maintaining Minimum Clock Speed”
for limitations on clock frequency.
4.5V - 5.5V is the supply voltage range for specified performance
DS21700E-page 2
2001-2011 Microchip Technology Inc.
MCP3301
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Characteristics:
Unless otherwise noted, all parameters apply at V
DD
= 5V, V
SS
= 0V, and V
REF
= 5V. Full differential
input configuration (Figure
1-5)
with fixed common mode voltage of 2.5V. All parameters apply over temperature with
T
AMB
= -40°C to +85°C
(Note
7).
Conversion speed (
F
SAMPLE)
is 100 ksps with
F
CLK
= 17*
F
SAMPLE
Parameter
Reference Input
Voltage Range
Current Drain
Analog Inputs
Full-Scale Input Span
Absolute Input Voltage
IN(+)-IN(-)
IN(+)
IN(-)
Leakage Current
Switch Resistance
Sample Capacitor
Digital Input/Output
Data Coding Format
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
Input Leakage Current
Output Leakage Current
Pin Capacitance
Timing Specifications
Clock Frequency
(Note 8)
Clock High Time
Clock Low Time
CS Fall To First Rising CLK Edge
CLK Fall To Output Data Valid
CLK Fall To Output Enable
CS Rise To Output Disable
CS Disable Time
D
OUT
Rise Time
D
OUT
Fall Time
Note 1:
2:
3:
4:
5:
6:
7:
8:
9:
V
IH
V
IL
V
OH
V
OL
I
LI
I
LO
C
IN
, C
OUT
Binary Two’s Complement
0.7 V
DD
—
4.1
—
-10
-10
—
—
—
—
—
—
—
—
—
0.3 V
DD
—
0.4
10
10
10
V
V
V
V
µA
µA
pF
I
OH
= -1 mA, V
DD
= 4.5V
I
OL
= 1 mA, V
DD
= 4.5V
V
IN
= V
SS
or V
DD
V
OUT
= V
SS
or V
DD
T
AMB
= 25°C, f = 1 MHz,
Note 1
V
DD
= 5V,
F
SAMPLE
= 100 ksps
Note 5
Note 5
R
S
C
SAMPLE
-V
REF
-0.3
-0.3
—
—
—
—
—
—
0.001
1
25
V
REF
V
DD
+ 0.3
V
DD
+ 0.3
±1
—
—
V
V
V
µA
k
pF
See
Figure 5-3
See
Figure 5-3
0.4
—
—
—
100
0.001
V
DD
150
3
V
µA
µA
Note 2
CS = V
DD
= 5V
Symbol
Min
Typ
Max
Units
Conditions
F
CLK
t
HI
t
LO
t
SUCS
t
DO
t
EN
t
DIS
t
CSH
t
R
t
F
0.085
275
275
100
—
—
—
580
—
—
—
—
—
—
—
—
—
—
—
—
1.7
—
—
—
125
200
125
200
100
—
100
100
MHz
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
V
DD
= 5V, see
Figure 1-2
V
DD
= 2.7V, see
Figure 1-2
V
DD
= 5V, see
Figure 1-2
V
DD
= 2.7V, see
Figure 1-2
See test circuits,
Figure 1-2;
Note 1
See test circuits,
Figure 1-2;
Note 1
See test circuits,
Figure 1-2;
Note 1
This specification is established by characterization and not 100% tested.
See characterization graphs that relate converter performance to V
REF
level.
V
IN
= 0.1V to 4.9V @ 1 kHz.
V
DD
= 5V DC ±500 mV
P-P
@ 1 kHz, see test circuit
Figure 1-4.
Maximum clock frequency specification must be met.
V
REF
= 400 mV, V
IN
= 0.1V to 4.9V @ 1 kHz
MSOP devices are only specified at 25°C and +85°C.
For slow sample rates, see
Section 5.2.1 “Maintaining Minimum Clock Speed”
for limitations on clock frequency.
4.5V - 5.5V is the supply voltage range for specified performance
2001-2011 Microchip Technology Inc.
DS21700E-page 3
MCP3301
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Characteristics:
Unless otherwise noted, all parameters apply at V
DD
= 5V, V
SS
= 0V, and V
REF
= 5V. Full differential
input configuration (Figure
1-5)
with fixed common mode voltage of 2.5V. All parameters apply over temperature with
T
AMB
= -40°C to +85°C
(Note
7).
Conversion speed (
F
SAMPLE)
is 100 ksps with
F
CLK
= 17*
F
SAMPLE
Parameter
Power Requirements
Operating Voltage
Operating Current
Standby Current
Temperature Ranges
Specified Temperature Range
Operating Temperature Range
Storage Temperature Range
Thermal Package Resistance
Thermal Resistance, 8L-MSOP
Thermal Resistance, 8L-PDIP
Thermal Resistance, 8L-SOIC
Note 1:
2:
3:
4:
5:
6:
7:
8:
9:
JA
JA
JA
—
—
—
206
85
163
—
—
—
°C/W
°C/W
°C/W
T
A
T
A
T
A
-40
-40
-65
—
—
—
+85
+85
+150
°C
°C
°C
V
DD
I
DD
I
DDS
4.5
—
—
—
—
300
200
0.05
5.5
450
—
1
V
µA
µA
Note 9
V
DD ,
V
REF
= 5V, D
OUT
unloaded
V
DD
, V
REF
= 2.7V, D
OUT
unloaded
CS = V
DD
= 5.0V
Symbol
Min
Typ
Max
Units
Conditions
This specification is established by characterization and not 100% tested.
See characterization graphs that relate converter performance to V
REF
level.
V
IN
= 0.1V to 4.9V @ 1 kHz.
V
DD
= 5V DC ±500 mV
P-P
@ 1 kHz, see test circuit
Figure 1-4.
Maximum clock frequency specification must be met.
V
REF
= 400 mV, V
IN
= 0.1V to 4.9V @ 1 kHz
MSOP devices are only specified at 25°C and +85°C.
For slow sample rates, see
Section 5.2.1 “Maintaining Minimum Clock Speed”
for limitations on clock frequency.
4.5V - 5.5V is the supply voltage range for specified performance
.
t
CSH
CS
t
SUCS
t
HI
t
LO
CLK
t
EN
HI-Z
t
DO
t
R
Sign Bit
t
F
t
DIS
HI-Z
D
OUT
Null Bit
LSB
FIGURE 1-1:
Timing Parameters.
DS21700E-page 4
2001-2011 Microchip Technology Inc.
MCP3301
1.1
Test Circuits
1 k
1/2
MCP602
+
-
5V ±500 mVp-p
To VDD on DUT
1.4V
MCP3301
D
OUT
3 k
Test Point
2.63V
20 k
5VP-P
1 k
1 k
C
L
= 100 pF
FIGURE 1-2:
Test Point
Load Circuit for t
R
, t
F
,
t
DO.
FIGURE 1-4:
Power Supply Sensitivity
Test Circuit (PSRR).
V
DD
MCP3301
D
OUT
3 k
100 pF
V
DD
/2
t
DIS
Waveform 2
t
EN
Waveform
t
DIS
Waveform 1
5V
P-P
V
REF
= 5V
1 µF
0.1 µF
IN(+)
IN(-)
V
DD
= 5V
0.1 µF
V
SS
Voltage Waveforms for t
DIS
CS
5V
P-P
V
REF
V
DD
MCP3301
V
SS
V
IH
90%
T
DIS
V
CM
= 2.5V
D
OUT
Waveform 1*
FIGURE 1-5:
Full Differential Test
Configuration Example.
D
OUT
Waveform 2†
10%
V
REF
=2.5V
1 µF
0.1 µF
5V
P-P
V
REF DD
V
MCP3301
IN(-)
V
SS
IN(+)
V
DD
=5V
0.1 µF
*Waveform
1 is for an output with internal
conditions such that the output is high, unless
disabled by the output control.
†Waveform
2 is for an output with internal
conditions such that the output is low, unless
disabled by the output control.
FIGURE 1-3:
T
EN
.
Load Circuit for T
DIS
and
V
CM
=2.5V
FIGURE 1-6:
Pseudo Differential Test
Configuration Example.
2001-2011 Microchip Technology Inc.
DS21700E-page 5
