INTEGRATED CIRCUITS
NE56632-XX
Active-LOW system reset
with adjustable delay time
Product data
2002 Mar 25
Philips
Semiconductors
Philips Semiconductors
Product data
Active-LOW system reset with adjustable delay time
NE56632-XX
DESCRIPTION
The NE56632-XX is a family of Active-LOW, power-on reset that
offers precision threshold voltage detection within
±1.5%
and super
low operating supply current of typically 3.0
µA.
It includes a reset
delay that is user adjustable with an external capacitor.
Several detection threshold voltages are available at 1.9V , 2.0 V,
2.7 V, 2.8 V, 2.9 V, 3.0 V, 3.1 V, 4.2 V, 4.3 V, 4.4 V, 4.5 V, and 4.6 V.
Other thresholds are offered upon request at 100 mV steps from
1.9 V to 4.6 V.
With its ultra low supply current and high precision voltage threshold
detection capability, the NE56632-XX is well suited for various
battery powered applications such as reset circuits for logic and
microprocessors, voltage check, and level detecting. It is available in
the SOT23-5 package.
FEATURES
•
High precision threshold detection voltage: V
S
±1.5%
•
Super low operating supply current: 3
µA
typ.
•
Built-in hysteresis voltage: 50 mV typ.
•
Detection threshold voltage: 1.9 V, 2.0 V, 2.7 V, 2.8 V, 2.9 V,
3.0 V, 3.1 V, 4.2 V, 4.3 V, 4.4 V, 4.5 V, and 4.6 V.
APPLICATIONS
•
Reset for microprocessor and logic circuits
•
Voltage level detection circuit
•
Battery voltage check circuit
•
Detection circuit for battery back-up
•
Reset Output: Active-LOW, open collector
•
Other detection threshold voltages available upon request at
100 mV steps from 1.9 V to 4.6 V.
•
Large low reset output current: 30 mA typ.
•
Power-on reset delay time adjustable with external capacitor:
200
µs
to 200 ms
•
Reset assertion with V
CC
down to 0.65 V
SIMPLIFIED SYSTEM DIAGRAM
TO V
CC
R
PU
TO RESET
TERMINAL
OF CPU
4
5
NE56632-XX
1
2
3
C
D
SL01605
Figure 1. Simplified system diagram.
2002 Mar 25
2
853–2329 27919
Philips Semiconductors
Product data
Active-LOW system reset with adjustable delay time
NE56632-XX
ORDERING INFORMATION
TYPE NUMBER
NE56632-XXD
PACKAGE
NAME
SOT23-5 / SOT25 (SO5)
DESCRIPTION
plastic small outline package; 5 leads (see dimensional drawing)
TEMPERATURE
RANGE
–20 to +75
°C
NOTE:
The device has 12 voltage output options, indicated by the XX on
the ‘Type number’.
XX
19
20
27
28
29
30
31
42
43
44
45
46
VOLTAGE (Typical)
1.9 V
2.0 V
2.7 V
2.8 V
2.9 V
3.0 V
3.1 V
4.2 V
4.3 V
4.4 V
4.5 V
4.6 V
Part number marking
The package is marked with a four letter code. The first three letters
designate the product. The fourth letter, represented by ‘x’, is a date
tracking code.
Part Number
NE56632-19D
NE56632-20D
NE56632-27D
NE56632-28D
NE56632-29D
NE56632-30D
NE56632-31D
NE56632-42D
NE56632-43D
NE56632-44D
NE56632-45D
NE56632-46D
Marking
AKZx
ALAx
ALBx
ALCx
ALDx
ALEx
ALFx
ALGx
ALHx
ALJx
ALKx
ALLx
PIN CONFIGURATION
PIN DESCRIPTION
PIN
SYMBOL
TC
SUB
GND
V
OUT
V
CC
DESCRIPTION
Delay time control; set with external
capacitor.
Substrate. Connect to ground (GND).
Ground. Negative supply.
Reset output voltage. Active-LOW.
Positive supply voltage; detection threshold
voltage input.
1
2
3
TC
1
5
V
CC
SUB
2
NE56632-XX
GND
3
4
V
OUT
4
5
SL01604
Figure 2. Pin configuration.
MAXIMUM RATINGS
SYMBOL
V
CC
T
amb
T
stg
P
Supply voltage
Ambient operating temperature
Storage temperature
Power dissipation
PARAMETER
MIN.
–0.3
–20
–40
–
MAX.
+10
+75
+125
150
UNIT
V
°C
°C
mW
2002 Mar 25
3
Philips Semiconductors
Product data
Active-LOW system reset with adjustable delay time
NE56632-XX
ELECTRICAL CHARACTERISTICS
T
amb
= 25
°C,
unless otherwise specified.
SYMBOL
V
S
PARAMETER
Detection threshold
CONDITIONS
V
CC
= HIGH-to-LOW; R
L
= 4.7 kΩ; S1=ON;
V
OL
≤
0.4 V;
04V
Test Circuit 1 (Figure 27)
-XX
46
45
44
43
42
31
30
29
28
27
20
19
V
hys
V
S
/∆T
V
OL
I
LO
I
CCL
I
CCH
t
PLH
t
PHL
V
OPL
I
OL1
I
OL2
Hysteresis voltage
Detection threshold voltage
temperature coefficient
LOW-level output voltage
Output leakage current
Supply current (ON time)
Supply current (OFF time)
LOW-to-HIGH delay time
HIGH-to-LOW delay time
Minimum operating
threshold voltage
Output current (ON Time 1)
Output current (ON Time 2)
R
L
= 4.7 kΩ; V
CC
= LOW-to-HIGH-to-LOW; S1 = ON; Test
Circuit 1 (Figure 27)
R
L
= 4.7 kΩ; T
amb
= –20
°C
to +75
°C;
S1 = ON;
Test Circuit 1 (Figure 27)
V
CC1
= V
S(min)
– 0.05 V; R
L
= 4.7 kΩ; S1 = ON;
Test Circuit 1 (Figure 27)
V
CC1
= V
CC2
= 10 V; S2 = ON; Test Circuit 1 (Figure 27)
V
CC1
= V
S(min)
– 0.05 V; R
L
=
∞;
Test Circuit 1 (Figure 27)
V
CC1
= V
S(typ)
/0.85; R
L
=
∞;
Test Circuit 1 (Figure 27)
C
L
= 100 pF; R
L
= 4.7 kΩ; C
D
= 10 nF (Note 1)
C
L
= 100 pF; R
L
= 4.7 kΩ; C
D
= 10 nF (Note 2)
R
L
= 4.7 kΩ; V
OL
≤
0.4 V; S1 = ON;
Test Circuit 1 (Figure 27)
V
O
= 0.4 V; R
L
= 0; V
CC1
= V
S(min)
– 0.05 V;
V
CC2
= 0.4 V; S2 = ON; Test Circuit 1 (Figure 27)
V
O
= 0.4 V; R
L
= 0; V
CC1
= V
S(min)
– 0.05 V;
T
amb
= –20
°C
to +75
°C;
S2 = ON;
Test Circuit 1 (Figure 27)
MIN.
4.531
4.432
4.334
4.235
4.137
3.053
2.955
2.856
2.758
2.659
1.970
1.871
25
–
–
–
–
–
–
–
–
5
3
TYP.
4.600
4.500
4.400
4.300
4.200
3.100
3.000
2.900
2.800
2.700
2.000
1.900
50
±0.01
0.2
–
5.0
3.0
(Note 3)
(Note 3)
0.65
–
–
MAX.
4.669
4.568
4.466
4.365
4.263
3.147
3.045
2.944
2.842
2.741
2.030
1.929
100
–
0.4
±0.1
9.0
5.0
–
–
0.80
–
–
UNIT
V
V
V
V
V
V
V
V
V
V
V
V
mV
%/°C
V
µA
µA
µA
ms
µs
V
mA
mA
NOTES:
1. t
PLH
: V
CC
= (V
S(typ)
– 0.4 V) to (V
S(typ)
+ 0.4 V); t
PLH
is release delay time (Test Circuit 2, Figure 28).
2. t
PHL
: V
CC
= (V
S(typ)
+ 0.4 V) to (V
S(typ)
– 0.4 V); t
PHL
is assertion delay time (Test Circuit 2, Figure 28).
3. See Table 1.
Table 1. NE56632-XX series typical delay time
–XX
46
45
44
43
42
31
30
29
28
27
20
19
t
PLH
195 ms
190 ms
185 ms
180 ms
175 ms
120 ms
115 ms
110 ms
105 ms
100 ms
65 ms
60 ms
t
PHL
140
µs
140
µs
140
µs
140
µs
140
µs
120
µs
120
µs
120
µs
100
µs
100
µs
100
µs
100
µs
2002 Mar 25
4
Philips Semiconductors
Product data
Active-LOW system reset with adjustable delay time
NE56632-XX
TYPICAL PERFORMANCE CURVES, NE56632-20
2.0050
V
hys
, HYSTERESIS VOLTAGE (mV)
V
S
, DETECTION THRESHOLD (V)
2.0025
2.0000
1.9975
1.9950
1.9925
1.9900
1.9875
1.9850
–40
Test Circuit 1
V
CC
= HIGH-to-LOW
R
L
= 4.7 kΩ
V
OL
≤
0.4 V
S1 = ON
–20
0
20
40
60
80
100
100
90
80
70
60
50
40
Test Circuit 1
V
CC
= LOW-to-HIGH-to-LOW
R
L
= 4.7 kΩ
S1 = ON
–20
0
20
40
60
80
100
30
–40
AMBIENT TEMPERATURE, T
amb
(°C)
AMBIENT TEMPERATURE, T
amb
(°C)
SL01620
SL01621
Figure 3. Detection threshold versus temperature.
Figure 4. Hysteresis voltage versus temperature.
0.225
V
OL
, LOW-LEVEL OUTPUT VOLTAGE (V)
0.220
0.215
0.210
0.205
0.200
0.195
0.190
0.185
–40
I
CCL
, SUPPLY CURRENT (ON time), (
µ
A)
9
8
7
6
5
Test Circuit 1
V
CC1
= V
S(min)
– 0.05 V
R
L
= 4.7 kΩ
S1 = ON
–20
0
20
40
60
80
100
4
3
–40
Test Circuit 1
V
CC1
= V
S(min)
– 0.05 V
R
L
=
∞
–20
0
20
40
60
80
100
AMBIENT TEMPERATURE, T
amb
(°C)
AMBIENT TEMPERATURE, T
amb
(°C)
SL01622
SL01623
Figure 5. LOW-level output voltage versus temperature.
Figure 6. Supply current (ON time) versus temperature.
V
OPL
, MIN. OPERATING THRESHOLD VOLTAGE (V)
4.5
I
CCH
, SUPPLY CURRENT (OFF time), (
µ
A)
0.9
4.0
0.8
0.7
3.5
0.6
3.0
0.5
Test Circuit 1
R
L
= 4.7 kΩ
V
OL
≤
0.4 V
S1 = ON
–20
0
20
40
60
80
100
2.5
Test Circuit 1
R
L
=
∞
V
CC1
= V
S(typ)
/0.85
–20
0
20
40
60
80
100
0.4
2.0
–40
0.3
–40
AMBIENT TEMPERATURE, T
amb
(°C)
AMBIENT TEMPERATURE, T
amb
(°C)
SL01624
SL01625
Figure 7. Supply current (OFF time) versus temperature.
Figure 8. Min. operating threshold voltage versus temperature.
2002 Mar 25
5
