OP470
Very low noise, quad, operational amplifier
3.0
Absolute Maximum Ratings
1/
Supply Voltage (V
CC
) .........................................................
Differential Input Voltage 2/...............................................
Differential Input Current 2/ ...............................................
Input Voltage ......................................................................
Output Short Circuit Duration ............................................
Storage Temperature Range................................................
Lead Temperature (soldering, 60 seconds).........................
Power Dissipation (P
D
) .......................................................
Maximum Junction Temperature (T
J
).................................
Ambient Operating Temperature Range.............................
Absolute Maximum Ratings Notes:
1/
Stresses above the absolute maximum rating may cause permanent damage to
the device. Extended operation at the maximum levels may degrade
performance and affect reliability.
The inputs are protected by back-to-back diodes. Current limiting resistors are
not used in order to achieve low noise performance. If the differential input
voltage exceeds ±1V, the input current should be limited to ±25mA.
±18V dc
±1V dc
±25mA
Supply voltage
Continuous
-65°C to +150°C
+300°C
500mW
+150°C
-55°C to +125°C
2/
3.1
Thermal Characteristics:
Thermal Resistance, Lead Leadless Chip Carrier (TC) Package
Junction-to-Case (Θ
JC
) = See MIL-STD-1835
Junction-to-Ambient (Θ
JA
) = 110 °C/W Max
4.0
Electrical Table:
Table I - Electrical Characteristics
Parameter
Input Offset Voltage
Symbol
V
IO
M, D, L, R
Input Offset Current
I
IO
V
CM
= 0V
M, D, L, R
Input Bias Current
Input Noise Voltage 4/
I
IB
E
n
V
CM
= 0V
M, D, L, R
fo = 1Hz to 100Hz
V
O
= ±10V, R
L
= 10kΩ
Large Signal Voltage Gain
A
VS
M, D, L, R
V
O
= ±10V, R
L
= 2kΩ 4/
Conditions
1/
Sub-
groups
1
2, 3
1
1
2, 3
1
1
2, 3
1
7
4
5, 6
4
4
5, 6
Limit
Min
Limit
Max
±0.4
±0.6
±0.6
±10
±20
±50
±25
±50
±500
110
Units
mV
nA
nV
RMS
1000
750
100
500
400
V/mV
ASD0013059 Rev. B
25-Sep-07
Page 2 of 5
OP470
Very low noise, quad, operational amplifier
Table I - Electrical Characteristics (continued)
Conditions
Sub-
1/
groups
Output Voltage Swing 4/
V
OP
R
L
= 2Kohm
4, 5, 6,
No Load
1, 2, 3
Supply Current 2/
I
SY
M, D, L, R
1
Input Voltage Range 4/
IVR
1, 2, 3
Slew Rate 4/
SR
7
A
VLC
= +21, R
L
= 10kΩ
1
Common Mode Rejection 4/ CMR
V
CM
= IVR 3/
2, 3
1
Power Supply Rejection
PSRR
V
S
= ±4.5V to ±18V
Ratio 4/
2, 3
Parameter
Symbol
Table I Notes:
1/ V
S
= ±15V, R
S
= 50Ω, unless otherwise specified.
2/ I
SY
limit equals the total of all four amplifiers.
3/ IVR is defined as the V
CM
range used for the CMR test.
4/ Not tested Post Irradiation.
4.1
Electrical Test Requirements:
Limit
Min
±12
Limit
Max
11
11
±11
1.4
110
100
1.8
5.6
Units
V
mA
V
V/μV
dB
μV/V
Table II
Test Requirements
Interim Electrical Parameters
Final Electrical Parameters
Group A Test Requirements
Group C end-point electrical parameters
Group D end-point electrical parameters
Group E end-point electrical parameters
Subgroups (in accordance with
MIL-PRF-38535, Table III)
1
1, 2, 3, 4, 5, 6 1/ 2/
1, 2, 3, 4, 5, 6, 7
1, 2, 3 2/
1
1
1/ PDA applies to Subgroup 1 only. Delta's excluded from PDA.
2/ See Table III for delta parameters. See table I for conditions.
4.2
Life Test and Burn-In Delta Limits:
Table III
TEST
TITLE
V
IO
I
IB
I
IO
ASD0013059 Rev. B
BURN-IN
ENDPOINT
±0.4
±25
±10
LIFETEST
ENDPOINT
±0.5
±30
±15
25-Sep-07
DELTA
LIMIT
±0.1
±5
±5
UNITS
mV
nA
nA
Page 3 of 5
OP470
Very low noise, quad, operational amplifier
5.0
Life Test/Burn-In Information
5.1
5.2
5.3
HTRB is not applicable for this drawing.
Burn-in is per MIL-STD-883 Method 1015 test condition B.
Steady state life test is per MIL-STD-883 Method 1005.
ASD0013059 Rev. B
25-Sep-07
Page 4 of 5
OP470
Very low noise, quad, operational amplifier
Rev
A
B
Description of Change
Initiate
Update web address. Remove BI circuit.
Date
Dec. 10, 2002
May 29, 2003
ASD0013059 Rev. B
25-Sep-07
Page 5 of 5
嵌入式系统
