PA09M/883
Table 4 Group A Inspection
SG Parameter
1
1
1
1
1
1
1
3
3
3
3
3
3
3
2
2
2
2
2
2
2
4
4
4
4
4
4
4
4
Quiescent Current
Input Offset Voltage
Input Offset Voltage
Input Offset Voltage
Input Bias Current, +IN
Input Bias Current, –IN
Input Offset Current
Quiescent Current
Input Offset Voltage
Input Offset Voltage
Input Offset Voltage
Input Bias Current, +IN
Input Bias Current, –IN
Input Offset Current
Quiescent Current
Input Offset Voltage
Input Offset Voltage
Input Offset Voltage
Input Bias Current, +IN
Input Bias Current, –IN
Input Offset Current
Output Voltage, I
O
= 3A
Output Voltage, I
O
= 66mA
Output Voltage, I
O
= 2A
Current Limits
Stability/Noise
Slew Rate
Open Loop Gain
Common Mode Rejection
Symbol
I
Q
V
OS
V
OS
V
OS
+I
B
–I
B
I
OS
I
Q
V
OS
V
OS
V
OS
+I
B
–I
B
I
OS
I
Q
V
OS
V
OS
V
OS
+I
B
–I
B
I
OS
V
O
V
O
V
O
I
CL
E
N
SR
A
OL
CMR
Temp. Power Test Conditions
25°C
25°C
25°C
25°C
25°C
25°C
25°C
–55°C
–55°C
–55°C
–55°C
–55°C
–55°C
–55°C
125°C
125°C
125°C
125°C
125°C
125°C
125°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
25°C
±35V V
IN
= 0, A
V
= 100
±35V V
IN
= 0, A
V
= 100
±12V V
IN
= 0, A
V
= 100
±40V V
IN
= 0, A
V
= 100
±35V V
IN
= 0
±35V V
IN
= 0
±35V V
IN
= 0
±35V V
IN
= 0, A
V
= 100
±35V V
IN
= 0, A
V
= 100
±12V V
IN
= 0, A
V
= 100
±40V V
IN
= 0, A
V
= 100
±35V V
IN
= 0
±35V V
IN
= 0
±35V V
IN
= 0
±35V V
IN
= 0, A
V
= 100
±35V V
IN
= 0, A
V
= 100
±12V V
IN
= 0, A
V
= 100
±40V V
IN
= 0, A
V
= 100
±35V V
IN
= 0
±35V V
IN
= 0
±35V V
IN
= 0
±21.3V R
L
= 3.75
Ω
±40V R
L
= 500
Ω
±38V R
L
= 15
Ω
±32.2V R
L
= 3.75
Ω
±35V R
L
=500Ω, A
V
=1, C
L
=1.5nF
±35V R
L
= 500
Ω
±35V R
L
= 500
Ω,
F = 10Hz
±34.5V
R
L
= 500
Ω,
F = DC, V
CM
=
±22.5V
Min
Max
85
3
5.3
3.5
100
100
50
165
5.4
7.7
5.9
100
100
50
140
6
8.3
6.5
10
10
10
Units
mA
mV
mV
mV
pA
pA
pA
mA
mV
mV
mV
pA
pA
pA
mA
mV
mV
mV
nA
nA
nA
V
V
V
11.3
33
30
3.4
25
80
64
6
1
500
A
mV
V/µs
dB
dB
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Aug 2015
PA09MU Rev M
PA09M/883
SG Parameter
6
6
6
6
6
6
6
Output Voltage, I
O
= 3A
Output Voltage, I
O
= 66mA
Output Voltage, I
O
= 2A
Stability/Noise
Slew Rate
Open Loop Gain
Common Mode Rejection
Symbol
V
O
V
O
V
O
E
N
SR
A
OL
CMR
Temp. Power Test Conditions
–55°C ±21.3V R
L
= 3.75
Ω
–55°C ±40V R
L
= 500
Ω
–55°C
–55°C
–55°C
–55°C
±38V R
L
= 15
Ω
R
L
= 500Ω, A
V
= 1, C
L
=
±35V
1.5nF
±35V R
L
= 500
Ω
Min
11.3
33
30
Max
Units
V
V
V
1
25
80
64
500
mV
V/µs
dB
dB
±35V R
L
= 500
Ω,
F = 10Hz
R = 500
Ω,
F = DC, V
CM
=
–55°C ±34.5V
L
±22.5V
5
5
5
5
5
5
Output Voltage, I
O
= 66mA
Output Voltage, I
O
= 1A
Stability/Noise
Slew Rate
Open Loop Gain
Common Mode Rejection
V
O
V
O
E
N
SR
A
OL
CMR
±40V R
L
= 500
Ω
125°C ±23.5V R
L
= 15
Ω
125°C
125°C
125°C
125°C
±35V
R
L
= 500Ω, A
V
= 1, C
L
=
1.5nF
33
15
1
20
80
64
500
V
V
mV
V/µs
dB
dB
±35V R
L
= 500
Ω
±35V R
L
= 500
Ω,
F = 10Hz
R
L
= 500
Ω,
F = DC, V
CM
=
±22.5V
125°C ±34.5V
2
PA09MU Rev M
PA09M/883
BURN IN CIRCUIT
Figure 1: Burn In Circuit
*These components are used to stabilize device due to poor high frequency characteristics of burn in board.
**Input signals are calculated to result in internal power dissipation of approximately 2.1W at case tempera‐
ture = 125°C.
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PA09MU Rev M
3
