DETAIL PRODUCT
SPECIFICATION CONTROL DRAWING
Revision Record
Revision
–
A
B
C
D
DCO
Description
Initial release
Updated part numbers
Edited part numbers
Edited Environmental Conditions, added temperature range options.
Changed par. 3.1.1 split supply and load variation from frequency
stability vs. temperature characteristics; changed phase noise note;
split current for lower supply voltage. (ECO 10552)
Section 3.1.1 Electrical Characteristics:
Parameter: Freq. stability vs. ±5 % Input Voltage Variation, Max;
Value: WAS: ±1.2 for Vss= 5 and 3.3V ±0.3 for Vss= 5 and 3.3V
IS:
±1.2 for Vss= 5 and 3.3V ±0.3 for Vss= 12
Eng. Approval QA Approval
Initials and Date
Initials and Date
LV RS
LV RS
LV RS
LV BR
CA
CA
CA
CA
Release
Date
5/28/08
1/9/09
6/21/09
12/2/10
7/24/12
E
2224
LV JL 10/2/13
CP 10/2/13
10/2/13
UNLESS OTHERWISE SPECIFIED
Dimensions are in Inches
Tolerances
Decimal
Fraction
Angular
.xxx ± .005
.xx ± .02
.x ± .1
x° ± 2°
THE INFORMATION CONTAINED IN THIS SPECIFICATION CONTROL DRAWING IS THE SOLE PROPERTY OF Q
TECH CORPORATION. ANY REPRODUCTION OR DISTRIBUTION OF THIS PROPRIETARY DOCUMENT IN PART OR
AS A WHOLE WITHOUT THE WRITTEN PERMISSION OF QTECH CORPORATION IS PROHIBITED.
INFORMATION INCLUDED HEREIN IS CONTROLLED UNDER THE INTERNATIONAL TRAFFIC IN ARMS
REGULATIONS (ITAR) BY THE U.S. DEPARTMENT OF STATE. TRANSFER OF THIS INFORMATION TO A FOREIGN
PERSON OR FOREIGN ENTITY REQUIRES AN EXPORT LICENSE ISSUED BY THE U.S. STATE DEPARTMENT OR AN
ITAR EXEMPTION TO THE LICENSE REQUIREMENT PRIOR TO THE EXPORT OR TRANSFER.
Initial Release
Prepared
Luis Vargas
Checked
Craig Albright
Engineering Approval
Ron Stephens
Quality Assurance Approval
Craig Albright
Released
Alfred Min
F1195-2RA
Date
5/28/08
Date
2/10/09
Date
2/10/09
Date
2/10/09
Date
2/10/09
SCALE
10150 West Jefferson Blvd.
Culver City, CA 90232-3510 USA
LOW PROFILE 24 PIN FLAT PACK HYBRID
CRYSTAL OSCILLATOR, TCXO, CLASS S,
STANDARD DESIGN FOR SINE WAVE
UP TO 350MHz
DRAWING NO.
REVISION
QT814, QT815 and QT816
Sine-Wave 24 Flat Pack
SIZE
CAGE CODE
E
PAGE
NONE
A
51774
1 of 10
1.0
SCOPE
This specification establishes the detail requirements for low profile hybrid, hermetically sealed,
HCMOS output temperature compensated crystal oscillators (TCXO)
Type 3, Class 2 (Reference
MIL-PRF-55310).
2.0
APPLICABLE DOCUMENTS
The following documents of the latest issue form a part of this drawing to the extent specified herein.
2.1
Specifications and Standards
SPECIFICATIONS
MILITARY
MIL-S-19500
Semiconductor Devices, General Specification For
MIL-PRF-55310 Crystal Oscillators, General Specification For
MIL-PRF-38535 Integrated Circuits, (Microcircuits) Manufacturing, General Specification For
MIL-PRF-38534 Hybrid Microcircuits, General Specification For
STANDARDS
MILITARY
MIL-STD-202
MIL-STD-883
MIL-STD-1686
Test Methods for Electronic and Electrical Component Parts
Test Methods and Procedures for Microelectronics
Electrostatic Discharge Control Program for Protection of Electrical and
Electronics Parts, Assemblies and Equipment.
2.2
Conflicting Requirements
In the event of conflict between requirements of this specification and other requirements of the
applicable detail drawing, the precedence in which requirements shall govern, in descending order, is
as follows:
a) Applicable Customer purchase order.
b) Applicable detail drawing.
c) This specification.
d) Other specifications or standards referenced in 2.1 herein.
2.3
Customer Purchase Order Special Requirements
Additional special requirements shall be specified in the applicable Customer purchase order when
additional requirements or modifications specified herein are needed for compliance to special program
or product line requirements.
3.0
3.1
PERFORMANCE REQUIREMENTS
General Definition
The TCXO is a high reliability signal generator that provides a sine-wave output. The TCXO has been
designed to operate in a spaceflight environment with an expected lifetime in excess of 15 years.
Lifetime is defined as the sum of operational and storage environments.
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
CAGE NO.
A
51774
QT814, QT815 and QT816
Sine-Wave 24 Flat Pack
Page 2 of 10
REV.
E
3.1.1
Electrical Characteristics
SYMBOL
fo
Vs
Is
f/fc
(Ta)
-
Vs±5%
Vs, nom. / Ta=+25C
Contact factory for other
options available
PARAMETER
Frequency Nom.
Supply voltage, Nom.
Input Current, max.
Freq. stability vs.
Operating Temperature
Electrical Frequency
Adjustment Min.
(when specified)
CONDITIONS
VALUE
See part number
generation table
See part number
generation table
30 for Vs= 55 for Vs= 5
12 and 15V
and 3.3V
See part number
generation table
UNIT
MHz
V
mA
ppm
ppm
f/fo
(Vcc)
±5 PPM Two options:
1) via an external select-at-
test resistor connected
from Pin 1 to Ground
2) Via External tuning voltage
±5.0
See part number
generation table
±1.2 for
Vss= 5 and
3.3V
±0.3
±5.0
0.2
0.001
30 to 75
75.1 to 350
3rd
3
rd
X
See part number
generation table
-20
-20
N/A
-20
-80
-110
-135
-155
-155
ppm
ppm
ppm
MHz
dBm
dBc
dBc
dBc/H
z
dBc/H
z
dBc/H
z
dBc/H
z
dBc/H
z
dBc
±0.3 for
Vss= 12
ppm
Freq. stability vs. ±5 %
Input Voltage Variation,
Max
Freq. stability vs. ±5 %
Load Variation, Max
Aging Max
Freq. stability vs. Vacuum
Short term stability
RF Output
Output level Min.
Harmonics Max.
Sub-harmonics Max.
Phase noise @ freq. offset
(Output Frequency up
to 75 MHz)
f/fc
(Vs) ±5 % Vs,, Ta=+25C
f/fc
(Load)
f/fo
f/fo
f/fc(t)
Vs, nom. / Ta=+25C
over 10 year (first year
≤
1
ppm)
Met by design, not tested
t=1sec.
(Allan Deviation)
Contact factory for other
options available
Sine Class S, 100 krads (Si)
total dose Min
See notes: A,B,C and D
below
£
£
£
£
£
(f)
(f)
(f)
(f)
(f)
f=10Hz
f=100Hz
f=1kHz
f=10kHz
f=100kHz
Spurious
Under static conditions. Met by
design, not tested.
-70
-70
A:
For Frequencies between 75.1 MHz and 150 MHz phase noise degrades between 6 dbc/Hz to 10 dbc/Hz
B:
For Frequencies between 150.1 MHz and 210 MHz phase noise degrades between 10 dbc/Hz to 12
dbc/Hz
C:
For Frequencies between 210.5 MHz and 225 MHz phase noise degrades 13 dbc/Hz
D:
For Frequencies between 225.5 MHz and 300 MHz phase noise degrades 15 dbc/Hz
3.2
Absolute Maximum Rating
Supply Voltage
DC Input Current
0 to +16.5 VDC
55 mA maximum
SIZE
CAGE NO.
Note 1
Note 1
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
A
51774
QT814, QT815 and QT816
Sine-Wave 24 Flat Pack
Page 3 of 10
REV.
E
Storage Temperature range
Lead Temperature (Soldering, 10 seconds)
-62°C to +125°C
300°C
Note 1
Note 1
Notes: 1 – without irreversible damages
3.2.1
Physical Characteristics
3.2.1.1 Dimensions - The TCXO outline dimensions and terminal connections shall be as shown in Figure 1
herein.
3.2.1.2 Weight - The TCXO shall weigh less than or equal to 25 grams.
3.2.1.3 Materials - The TCXO package body and lead finish shall be gold in accordance with MIL-PRF-38534.
3.3
Design and Construction
The design and construction of the crystal oscillator shall be as specified herein. As a minimum, the
oscillators shall meet the design and construction requirements of MIL-PRF-55310, except element
evaluation shall be as specified in 3.3.1.
SCREENING FLOW CHART
(Screening is performed on a 100% basis)
Operation
Non-Destruct Wire Bond Pull
Internal Visual
100%, MIL-STD-883, Method 2023 (2.4 grams)
MIL-STD-883, methods 2017 & 2032 condition K (class S). During the time
interval between final internal visual inspection and preparation for sealing,
hybrid crystal oscillators shall be stored in a dry, controlled environment as
defined in MIL-STD-883, method 2017 or in a vacuum bake oven.
48 hrs minimum @ +150°C MIL-STD-883, Method 1008 TC B
MI-STD 883, Method 1011, TC A
MI-STD 883, Method 1010, TC B
MIL-STD-883, Method 2001, TC A (5000 gs, Y1 Axis only)
MIL-STD-883, Method 2020, TC B
Frequency, Output levels, Input Current@ +25°C
+125°C for 240 hours
100% Method 1014, (TC A1 for fine leak and TC C for gross leak)
Frequency, Output levels, Input Current
@ +25°C & Temp Extremes listed on the Electrical Specification
MIL-STD-883, Method 2012 class S
MIL-STD-883 Method 2009
Stabilization Bake
Thermal Shock
Temperature Cycling
Constant Acceleration
PIND
Electrical Test
Burn-In (Powered with load)
Seal Test (fine & gross)
Electrical Test
Radiographic
External visual
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
CAGE NO.
A
51774
QT814, QT815 and QT816
Sine-Wave 24 Flat Pack
Page 4 of 10
REV.
E
PARAMETER
Group A Inspection
(Testing is performed on a 100% basis)
SYMB
CONDITIONS
OL
Is
f/fc
(Ta)
f/fo
(Vcc)
Vs, nom. / Ta=+25C
Vs, nominal and over the operating
temperature range indicated under part
number definition
± Vs, nom. / Ta=+25C as indicated
under part number definition
Sine Class S, 100 krads (Si) total dose
Min
± Vs, nom. / Ta=+25C
£
£
£
£
£
(f)
(f)
(f)
(f)
(f)
± Vs, nom. / Ta=+25C
f=10Hz
f=100Hz
f=1kHz
f=10kHz
f=100kHz
MIL-STD-883, Method 2009
VALUE
30 for
55 for
Vss= 12 Vss= 5
and 15V and 3.3V
indicated under
part number
definition
indicated under
part number
definition
indicated under
part number
definition
-30
-80
-110
-135
-155
-155
UNIT
Input Current, max.
Freq. stability vs. Operating
Temperature
Electrical Frequency
Adjustment Min.
(when specified)
Output level Min.
Harmonics/Harmonicas, Max.
Phase noise @ freq. offset
(Output Frequency up to
75 MHz)
mA
ppm
ppm
dBm
dBc
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
dBc/Hz
See note A below
External Visual
A:
For Frequencies between 75.1 MHz and 150 MHz phase noise degrades between 6 dbc/Hz to 10 dbc/Hz
B:
For Frequencies between 150.1 MHz and 210 MHz phase noise degrades between 10 dbc/Hz to 12
dbc/Hz
C:
For Frequencies between 210.5 MHz and 225 MHz phase noise degrades 13 dbc/Hz
D:
For Frequencies between 225.5 MHz and 300 MHz phase noise degrades 15 dbc/Hz
Group B Inspection
Testing shall be performed after completion of Frequency Aging and before parts are
shipped
SUB-
TEST DESCRIPTION
CONDITION
QTY
GROUP
MIL-PRF-55310
1
Frequency Aging
100%
Para 3.6.34.2
2
Hermetic Seal 1/
Electrical 1/ (Go/NoGo)
Fine Leak – MIL-STD-883 Method 1014 Condition A1
Gross Leak – MIL-STD-883, Method 1014 Condition C
100%
100%
3
Q-TECH Corporation
10150 W. Jefferson Blvd.
Culver City, CA 90232
SIZE
CAGE NO.
A
51774
QT814, QT815 and QT816
Sine-Wave 24 Flat Pack
Page 5 of 10
REV.
E
