Thick Film Chip Resistors (RC General)
Thick Film General Chip Resistors
- 0402(01005), 0603(0201), 1005(0402), 1608(0603), 2012(0805), 3216(1206),
3225(1210), 5025(2010), 6432(2512)
■
Features
●
●
●
●
●
Small, thin and lightweight
High reliability
Applicable Both flow and reflow soldering.
Suitable size and package for surface mount assembly
RoHS Compliant.
■ Part Number System
RC
Type (Series)
RC
General purpose
chip resistor
0603
Size : mm (inch)
0402 0.4×0.2mm (01005)
0603
1005
1608
2012
3216
3225
5025
6432
0.6×0.3mm (0201)
1.0×0.5mm (0402)
1.6×0.8mm (0603)
2.0×1.2mm (0805)
3.2×1.6mm (1206)
3.2×2.5mm (1210)
5.0×2.5mm (2010)
6.4×3.2mm (2512)
D
F
G
J
F
Tolerance
±0.5%
±1.0%
±2.0%
±5.0%
2552
Resistance Value
- 3-digit code System
(E-24 series)
- 4-digit code System
(E-96 series)
- Jumper : ‘000’
- 2552 : 25.5KΩ
CS
Packing Type
CS
ES
AS
7” reel
10” reel
13” reel
* Jumper :
‘J’
Thick Film Chip Resistors (RC General)
■
Structure and Dimensions
[ Top View ]
[ Side View ]
A
T
B
[ Bottom View ]
102
A
L
W
[ Unit : mm ]
Size(mil)
RC0402(01005)
RC0603(0201)
RC1005(0402)
RC1608(0603)
RC2012(0805)
RC3216(1206)
RC3225(1210)
RC5025(2010)
RC6432(2512)
L
0.40±0.02
0.60±0.03
1.00±0.05
1.60±0.10
2.00±0.20
3.20±0.20
3.20±0.20
5.00±0.20
6.30±0.20
W
0.20±0.02
0.30±0.03
0.50±0.05
0.80±0.10
1.25±0.15
1.60±0.15
2.55±0.20
2.50±0.20
3.20±0.20
T
0.13±0.02
0.23±0.03
0.35±0.05
0.45±0.10
0.55±0.10
0.55±0.10
0.55±0.10
0.55±0.10
0.55±0.10
A
0.10±0.03
0.10±0.05
0.20±0.10
0.30±0.20
0.40±0.20
0.45±0.20
0.45±0.20
0.60±0.20
0.60±0.20
B
0.10±0.03
0.15±0.05
0.25±0.10
0.35±0.10
0.35±0.20
0.40±0.20
0.40±0.20
0.60±0.20
0.60±0.20
Unit Weight
0.04mg
0.15mg
0.6mg
2.1mg
4.9mg
9.5mg
16mg
26mg
41mg
Thick Film Chip Resistors (RC General)
■
Applications and Ratings
Type
RC0402
RC0603
RC1005
RC1608
RC2012
RC3216
RC3225
RC5025
RC6432
Size
(mil)
01005
0201
0402
0603
0805
1206
1210
2010
2512
Rated
Power
[W]
1/32
1/20
1/16
1/10
1/8
1/4
1/3
2/3
1
Rated Voltage
[V]
Max Working
Tolerance
Voltage
[%]
[V]
15
25
±1(F)
±5(J)
Resistance
Range
[Ω]
1 ~ 1M
1 ~ 10M
T.C.R
[ppm/℃]
1~9.9Ω : ± 300
10~1MΩ ± 250
1~9.9Ω : ±300
10~10MΩ : ±250
-55~125
Working
Temp.
[℃]
Moisture
Level
P
R
P : Rated Power(W)
R : Resistance(Ω)
50
50
150
200
200
200
200
±0.5(D)
±1(F)
±5(J)
1 ~ 10M
1~9.9Ω : ±300
10~10MΩ : ±100
-55 ~ 155
Level 1
•
Please contact our sales representatives or engineers for other specifications
■
Power Derating Curve
■
Jumper Ratings
Type
0402, 0603
1005 and
bigger sizes
0402,
0603 size
Rated
Current [A]
0.5
1
2
Max Overload
Current [A]
1
2
4
Resistance
[Ω]
Working
Temp.[℃]
-55 ~ 125
1005, 1608
2012 and
bigger sizes
0.05max
-55 ~ 155
■
Rated Voltage
V=
E : Rated Voltage (V)
P : Rated Power (W)
R : Resistance Value (Ω)
Thick Film Chip Resistors (RC General)
■ Standard Soldering Pad Dimensions
: Land Pattern
C
: Chip Resistor
A
B
A
[ Unit : mm ]
Size(mil)
RC0402(01005)
RC0603(0201)
RC1005(0402)
RC1608(0603)
RC2012(0805)
RC3216(1206)
RC3225(1210)
RC5025(2010)
RC6432(2512)
Reflow Soldering
A
017
0.37
0.60
0.80
0.90
1.30
1.30
1.40
1.40
B
0.20
0.28
0.50
0.80
1.40
1.80
1.80
3.30
4.60
2A + B
0.54
1.02
1.70
2.40
3.20
4.40
4.40
6.10
7.40
C
0.18
0.29
0.50
0.80
1.20
1.50
2.40
2.40
3.00
Thick Film Chip Resistors (RC General)
■
Performance Characteristics
ITEM
Requirements
Specification
Within the specified
tolerance
Within the specified
T.C.R
ΔR
<
±1%+0.1Ω
JIS C 5201-1 4.5
JIS C 5201-1 4.8
+20℃
→
-55℃ / +20℃
→
+125℃
JIS C 5201-1 4.13
Rated Voltage×2.5, 5sec
JIS C 5201-1 4.17
Rosin Ethanol (25%WT)
245+5/-0℃, 2±0.5 sec
JIS C 5201-1 4.18
260±5℃, 10±1 sec
JIS C 5201-1 4.19
-55℃
↔
+125℃, 100 cycle
JIS C 5201-1 4.24
40±2℃, 90~95%RH, 1,000
+48
hours
90mins ON, 30mins OFF
JIS C 5201-1 4.25
Rated Voltage, 70±2℃, 1,000
+48
hours
90mins ON, 30mins OFF
JIS C 5201-1 4.25.3
155±2℃, 1,000
+48
hours
Test Conditions
(JIS C 5201-1)
Resistance
Temperature
Characteristic
Short time
Overload
Solderability
Immersed over 95%
Resistance to
Solder Heat
Temperature
Cycle
Moisture
Resistance
ΔR
<
±1%+0.1Ω
ΔR
<
±1%+0.1Ω
ΔR
<
±3%+0.1Ω
Load Life
ΔR
<
±3%+0.1Ω
High Temp.
Exposure
ΔR
<
±3%+0.1Ω
※ The reliability test condition can be replaced by the corresponding accelerated test condition.
