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RCR20C823JM

Fixed Resistor, Ceramic Composition, 0.5W, 82000ohm, 350V, 5% +/-Tol,

器件类别：无源元件电阻器

厂商名称：Rockwell Automation

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参数预览

器件参数

参数名称

属性值

Objectid

918409039

Reach Compliance Code

unknown

ECCN代码

EAR99

YTEOL

0

构造

Insulated

引线直径

0.79 mm

引线长度

38.1 mm

最高工作温度

105 °C

最低工作温度

-55 °C

封装直径

3.51 mm

封装长度

9.53 mm

封装形式

Axial

额定功率耗散 (P)

0.5 W

参考标准

MIL-R-39008

电阻

82000 Ω

电阻器类型

FIXED RESISTOR

系列

RCR20C SERIES

技术

CERAMIC COMPOSITION

容差

5%

工作电压

350 V

文档预览

L

!41L-R-39008C

?&&w%nP”

MIL-R-39008B

14 June

1973

MILITARY

RESISTORS,

SPECIFICATION

(IWSULATEO),

FOR

by

all

of

Depitrt-

Oefense.

FIXED,

COMPOSITION

ESTA8LISHE0

RELIABILITY

GENERAL

SPECIFICATION

is

approved

of

the

This

q

ents

speclflcatfon

q

nd

Agencies

for

use

Department

1.

SCOPE

This

specification

comers

the

general

requirements

for

established

reljabfllty,

insulated,

ffxed

resfstors

having

a coapositton

resistance

element

consisting

of a mixture

of carbon,

insulating

material,

and

suitable

binders,

q

ither

molded

together

or applied

as a thin

layer

of conducting

material

on an

insulating

form.

Resistors

covered

by this

specification

have

failure

rates

percent

per

1,000

hours

(see

1.2.1.5)

at

50 percent

ran

ing

from

1.0

to

0.001

qt

..

t.bi.fit

temperature

of 70 C (see

table

1).

These

ful?-load

operatlnm

at

q

60 percent

confidence

level

“on the

bbsis

of

faflure

‘iates

qre

established

Iffe

tests.

The faflure

rate,

identified

by the

appropriate

symbol,

is referred

q

t

q

voltage

q

quivalent

-to-SO

percent

of

to operation

at

rated

temperatareand

A-p4rt

per

15’perCent).

rated

watta

e (with

m permissible

resistance

change

of

q

q

illion

{PP i ) qualfty

system

is

used

for

documenting

q

nd reportfng

the

Bverage

Statfstlcal

outgoing

quallty

of

resistors

supplfed

to thfs

specfffcatlon.

q

anufacturing

process

to

process

control

(SPC)

techniques

are

required

in the

minimize

variation

in production

of resistors

supplied

to this

specification.

1.2

Classlficatfon.

or Identifying

form.

and as

Number

specified

’[PIN).

[see

The

3.1.

Part

6.1.

or

and

Identifying

6.12):

Number

is

fn

1.1

Scope.

the

1.2.1

part

following

i

(see

St

112~1.1)

i

l%aracteristfc

(see

1.2.1.2)

i

resistance

“(see

1.2.1.3)

i

Resistance

tolerance

(see

1.2.1.4)

=

i

7 il

(~ee”1~2~i.~)

t

I

lBeneficial

lpertfnent

Iaddressed

.107703-S000

I(OO

Form

I

comments

(recommendations,

addftfons,

deletions)

and any

data

which

may be of use

in improving

thfs

document

should

be

to:

IJS Army

Laboratory

Command

ATTN:

SLCET-R-S,

Fort

Monmouth,

by using

the

self-addressed

Standardization

Document

Improvement

1426)

appearing

at

the

end

of thfs

document

or by letter.

NJ

r

I

i

I

~

AMSC N/A

DISTRIBUTION

STATEMENT

A.

Approved

for

public

release;

distribution

fs

FSC 5905

unlimited.

MIL-R-39008C

TABLE

I

I.

Characteristic.

I

ambient

I

tempera-

lSymbollture

(100

percent

Irated

wattage

and

1

150 percent

rated

i

Iwattage

for

I

lMaximum

Ioperating

I

I

I

Resistance

temperature

characteristic

In aximum

Ireslstance

Iambfent

I

all

h

owabl

1

from

~e~t~!~;c~natl

temperature

of 25 C

i

I

(+)

At

+105”C

r

I

I

I

[ Nomfnal

I

/

resistance

I

i

I

I

I

I

Ifaflure

Ideternlnatfon.

rate

)

At

-55*C

I

11,000

Ohms

?i7W_under

to

10,000

Incl.1

to

0.1 megohm

I

Percent

“c

/

I Percent

(+)

/

!

/

fG

I

1

/

70

i

;

I1,1OO

111,000

Ilncl

I

I

10:0

I

i

I

I

i

15.0

13.0

1~1

i

I

I

1

7:5

:

I

I

/

I

10.11%%

tncl

11.1

to

10

Incl

111.0

and

over

20.0

25.o

I

!

I

10.0

15.0

15.0

/

I

I

1

I

I

1.2.1.1

Style.

Is Identfffed

The

style

followed

by a two-dlglt

numbar;

the

letters

insulated,

composftlon,

fixed

resfstors,

power

r~tlng

of the

resistors.

In

1.2.1.2

Characterfstfc.

q

ccordance

wfth

tabl

The

q

characteristic

by the

three-letter

Identffy

established

and the

number

ldentfffes

symbol

“RCR”

rellabflfty,

the

q

sfngle,

sfze

lttter

q

nd

fs

identified

by

I.

Reslstenct.

The nominal

resistance

value

expressed

fn ohms fs

1.2.1.3

identified

by

hree-iflgft

number;

the

ffrst

two dlgfts

represent

sfgnfffcant

ffgures

qnd

the

last

Qfgft

specfffes

the

number

of zeros

to follow.

When

resistance

values

less

than

10 ohms are

requfred,

the

letter

“R” fs substituted

for

one of the

sfgnfffcant

dfgfts

to represent

the

decfmal

pofnt.

When the

letter

“R” fs used,

succeeding

digfts

of the

group

represent

figures

as shown

the

following

example:

2R7

Mfnlmum

standerd

‘1O

to

1.2.1.4

sfngle

and maxtmum

values

for

100”

decade

values

q

very decade

shall

ufth

fn

q

ccordance

The

table

11.

resistance

= 2.7

ohms

specfffed

sequence

(see

3.1).

demonstrated

The

fQr

{n

shall

be as

follow

the

MS90178.

resistance

the

Resistance

tolerance.

letter

in accordance

wfth

TABLE

tolerance

Is

Identlfled

by

a

II.

Resistance

tolercnce.

i

Symbol

;

Resistance

Percent

tolerance

(*)

I

I

IJ

]K

i

I

i

I

I

1:

MIL-R-39008C

1.2.1.5

Failure

rate

table

111 is signified

failure

rate

level

for

TABLE

designation.

by a single

which

the

Faflure

rate

The

letter

resfstor

level

(at

failure

rate

P, R, S),

(M,

is qualified

50

percent

designation

as

which

identifies

(see

4.4).

rated

wattage).

shown

in

the

III.

1

1

Failure-rate

I

I

designation

I

level

I

1

Failure

percent/1,000

rate

hours

f-

I

I

. . . . . . . . . . . I

I

i

2.

2.1

APPLICABLE

Government

DOCUMENTS

documents.

! .. ........~

. .........

! . . . . . . . . ...!

q

q

1.0

0.1

0.01

0.001

I

I

I

i

2.1.1

Speciffc&tfons,

standards,

and handbooks.

The followlng

specfffcations,

standards,

qnd

h

db

k

t

of thi

f

document to the extent

specified

herein.

Unless

~~he%l~e

~~sc?f!~~,

the

is~ues

of these

documents

are

those

Index

of Specfficatlons

and

lfsted

In the

fssue

of the

Department

of Defense

Standards

(DODISS)

and supplement

thereto,

cited

fn the

solicitation

(see

6.1).

SPECIFICATION

NILITARY

\

HIL.R.39008/l

UIL-R-39008/2

MIL-R-39008/3

MIL-R-39008/4

M!L-R-39008/5

MIL-R-39032

STANOARDS

MILITARY

MIL-STD-202

MIL-STD-690

MIL-STD-790

MIL-STD-81O

MIL-STD-1276

MIL-STO-1285

MS90178

.

Resfstors.

Established

Resfstors.

Establfsh8d

‘Resistors,

Established

Resistors,

Established

Resistors,

Established

Resistors,

Insulated),

Fixed,

Composition

Reliability,

Style

RCR07 .

Insulated).

Ffxed.

Composition

Rell~bflity,

Style-RCR20.

Ffxed,

Composition

(Insulated),

Relfabflity,

Style

RCR32.

Ffxed

Composition

(Insulated),

Relfabflfty,

Style

RCR05.

Fixed,

Composition

(Insulated),

Reliability.

Style

RCR42.

Packaging

of.

‘-

.

.

.

-

.

.

q

nd Electrical

Test

Methods

for

Electronic

Component

Parts.

and

Procedures.

Faflure

rate

Sampling

Plans

Relfabilfty

Assurance

Program

for

Electronic

Parts

$pecfffcations.

Environmental

Test

Methods

and Engfneerfng

Gufdelfnes.

Leads

for

Electronic

Component

Parts.

Marking

of Electrical

and Electronic

Parts.

Standard

24 Value

Series

Oecade

for

Electronic

and 20-Percent

Tolerances.

Components

of S-,

10-,

copies

avaflable

Avenue,

of

federal

from

the

Philadelphia,

specfffcations,

Standardization

Documents

PA 19111-5094).

(Unless

otherwfse

indfcated,

standards,

and handbooks

are

Desk.

Bufldfng

4D,

700

Robbins

q

nd

q

flftary

Order

3

NIL-R-39008C

2.2

Non.Government

publications.

The followfng

documen%

to ttl

q

extent

speclffed

herein.

Unless

of the

documents

which

are

DOD adopted

are

those

DODISS

cited

In the

solicitation.

Unless

otherwise

documents

not

lfsted

In the

DODISS

are

the

issues

solicitation

(see

6.1).

ELECTRONIC

EIA-554

EIA-557

INDUSTRIES

ASSOCIATION

(EIA]

of

documents

form

a part

of thfs

otherwise

speclflerl,

the

Issues

listed

In the

issue

of the

specffled,

the

Issues

of

of the

documents

cited

in the

Assessment

Per

Mllllon

Statistical

Outgotng

Nonconforming

(PPM)

(DOD Adopted).

Process

Control

Systems

Electronic

Levels

(DOD

Industries

In

Part

Adopted).

(ApplfCatfOn

Association,

fOr COpleS

2001

Eye

Street,

should

be

qddressed

to the

Washington

DC 20006.)

(Non-Government

standards

Organfzatlons

that

prepare

be available

fn or through

and other

publications

are

or d~strfbute

the

documents.

librarfes

or other

informational

q

vaflable

normally

These

documents

services.

from

also

may

2.3

Order

of prece~ence.

In the

qvent

of a conflict

document

and the

references

cited

herein

(except

for

specfficatlons,

specification

sheets,

or MS standards),

takes

precedence.

Nothfng

fn this

document,

however,

and regulations

unless

a specfffc

exemptfon

has been

3.

REQUIREMENTS

between

the

text

of this

related

associated

detafl

the

text

of this

document

supersedes

applicable

laws

obtained.

3.1

Associated

detafl

speclflcatlons.

The Indfvfdual

ftem

requirements

shall

be as specfffed

q

pplicable

qssociated

detafl

wfth

the

herein

and In accordance

speclffcatfon.

In the

event

of

qny

confllct

between

the

requirements

of thfs

specfffcatlon

and the

associated

detafl

specfffcatfon,

the

latter

shall

govern.

3.2

Qualification.

Resfstors

furnfshed

under

thfs

speclffcatfon

shall

be

products

wnlca

q

ctfvity

for

lfstfng

on the

qre quthorized

by the

qualifying

applicable

qualffled

products

list

qt

the

time

of award

of contract

(see

4.4

qnd

6.2).

In additfon,

the manufacturer

shall

obtafn

certification

from

the

qualifying

activ?ty

that

the

reliability

assurance

requirements

of 4.1.2

have

been

met and are

befng

maintained.

Authorized

distributors

that

qre

approved

to

MIL-STO-790

distributor

requirements

by the

qualfffed

products

lfst

(QPL)

sanufacturer

are

listed

in the

QPL.

3.3

Relfabflfty

and

quallty.

The

s~~;;;ca%%+i%e

rkqulrement~

xceptions

and

q

3.3.2

qnd

proc~duras

specfffed

fn

relfabflfty

$pectffed

4.1.2,

of resistors

q

nd

q

afntal.ed

In MIL-$TD.6~

4.4.4,

4.6.2.1.

furnfshed

and

under

with

MIL-STD-790

thfs

the

with

established

fn accordance

details

CJualfty.

3.3.2.1

Statlstlcal

Implement

and use

process

control.

The contractor

I hall

statistical

process

control

ng process

for

parts

q

anufacture<

techniques

fn the

covered

by thfs

specfflcatlon.

and

qaintained

The SPC program

shall

be developed

fn accordance

wfth

all

the

requirements

of EIA-557.

The SPC program

shall

be

documented

and nafntafned

as part

of the

overall

relfabf<

fty

assurance

program

as

speciffed

In HIL-STD-790.

The

implementation

of statfst’

cal

process

control

shall

be 12

qonths

from the date

of thfs

specfffcatfon.

Processes

for

oldlng

lfmfted

to

q

application

of SPC techniques

should

Include

but

are

not

operatfon

and marking.

4

MI L- R-39008C

levels.

3.3.2.2

Quality

The quality

of lots

that

have

been

subjected

to and

passed

the

subgroup

1

UO percent

screening

inspection

of the

group

A inspection

shall

be established

~nd maintained

in accordance

with

4.6.1.2.2

and EIA-554.

Individual

PPN defect

level

(I.e.,

PPM-2

and PPM-3)

and an overall

PPM defect

level

(I.e.,

PPN-5)

shall

be established

based

on the

tects

prescribed

in the

subgroup

2 tests

af the

group

A Inspections.

The defect

level

for

PPM-2

shall

be

less

than

100 PPM.

The implementation

of part

per

qilllon

verification

shall

be

12 months

from

the

date

of this

specification.

The contr~ctor

shall

notify

3.3.2.2.1

Noncompliance.

when the

100

1 evel

is reached

or exceeded

for

PPM-2.

provide

sufficient

information

to the

qualifying

activfty

of the

problea

and what

corrective

action

fs being

taken.

this

problem

shall

be the

basts

for

removal

of

the

affected

the

qualifying

activity

The contractor

shall

documenting

the

causes

Failure

to correct

product

from

the

QPL.

The

qaterial

shall

-be

qs

specffied

herefn.

However,

when a

3.4

Material.

q

ater~el

fs not

specffied,

defintte

shall

be used

which

wi17

enable

a

q

aterfal

the

resistors

to

qeet

the

performance

requirements

of this

speciflcetfon.

q

aterial

shall

not

be construed

as a

Acceptance

or 8pproval

of any constituent

guarantee

of the

acceptance

of the

finfshed

product.

The resistors

shal?

3.5

Design

and construction.

construct

specffied

(see

imensions

on,

and physfcal

consist

of a composition

resistance

element

protected

humidity

and temperature

conditions

by an enclosure

q

oisture-resfstant,

Insulating

qaterial.

3.5.1

soldering.

—

Termfnals.

~~

All

teralnals

shall

be

suitably

be of the

desfgn,

3.1).

Each

resfstor

against

exposure

or a coatfng

of

shall

to

treated

to

facillate

.

authorized

suppllhd

by the

to

3.5.1.1

Solder

dfp

(netlnnlag)

lecds.

category

C

butor)

qy

solder

1P

this

speciflc~t!on

provided

the

solder

q

ctlvfty.

qualifying

3.5.1.2

be based

a.

Qualifying

on one of

activity

the

following

qp

proval

options:

The aanufacturer’(or

(retin)

the

leads

of

dfp

process

has been

hfs

prodmct

approved

.

Approval

of

the

solder

dip

process

will

Uhen

the

origfnal

lead

finish

52 of RIL-STO-1276.

(NOTE:

applicable.

)

The manufacturer

retinnlng

as is used

in the

When the

lead

of NIL-STO-1276

used

for

solder

qualfffed

was hot

solder

dfp

lead

finish

The 200

qfcroinch

saxfmum

thfckness

is not

same

solder

dip

process

for

shall

use the

original

Manufacture

of the

product.

52

be

b.

originally

qualffied

was not

hot

solder

dfp

lead

finish

qs

prescrlbod

In Itea

q

,

q

pproval

for

the

process

to

dip

shall

be based

on the

following

test

procedure:

(1)

Thirty

saaples

of

qny

roslstance

value

for

etch

style

qnd

lead

flnfsh

shall

be subjected

to the

manufacturing’s

solder

dip

process.

Folleufng

the

solder

dip

process,

the

reststors

are

$ubJected

to the

dc ?eslstance

test

qnd

other

group

A

qre

allowed.

No defects

electrfcals).

Ten

test.

The

heat

dip

of

the

30 samples

No defects

are

(2)

q

llowed.

qre

then

subjected

to

the

solderabilfty

(3)

reaIafning

20

test

followed

of gold

plated

samples

are

subjected

to the

by the

moisture

resistance

leads

is not

allowed.)

resistance

to solder

test

(NOTE:

Solder

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器件捷径:

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