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RCR20G104JP

Fixed Resistor, Ceramic Composition, 0.5W, 100000ohm, 350V, 5% +/-Tol,

器件类别:无源元件    电阻器   

厂商名称:Rockwell Automation

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器件参数
参数名称
属性值
厂商名称
Rockwell Automation
Reach Compliance Code
unknow
ECCN代码
EAR99
构造
Insulated
引线直径
0.79 mm
引线长度
38.1 mm
最高工作温度
105 °C
最低工作温度
-55 °C
封装直径
3.51 mm
封装长度
9.53 mm
封装形式
Axial
额定功率耗散 (P)
0.5 W
参考标准
MIL-R-39008
电阻
100000 Ω
电阻器类型
FIXED RESISTOR
系列
RCR20G SERIES
技术
CERAMIC COMPOSITION
容差
5%
工作电压
350 V
文档预览
L
!41L-R-39008C
?&&w%nP”
MIL-R-39008B
14 June
1973
MILITARY
RESISTORS,
SPECIFICATION
(IWSULATEO),
FOR
by
all
of
Depitrt-
Oefense.
FIXED,
COMPOSITION
ESTA8LISHE0
RELIABILITY
GENERAL
SPECIFICATION
is
approved
of
the
This
q
ents
speclflcatfon
q
nd
Agencies
for
use
Department
1.
SCOPE
This
specification
comers
the
general
requirements
for
established
reljabfllty,
insulated,
ffxed
resfstors
having
a coapositton
resistance
element
consisting
of a mixture
of carbon,
insulating
material,
and
suitable
binders,
q
ither
molded
together
or applied
as a thin
layer
of conducting
material
on an
insulating
form.
Resistors
covered
by this
specification
have
failure
rates
percent
per
1,000
hours
(see
1.2.1.5)
at
50 percent
ran
ing
from
1.0
to
0.001
qt
..
t.bi.fit
temperature
of 70 C (see
table
1).
These
ful?-load
operatlnm
at
q
60 percent
confidence
level
“on the
bbsis
of
faflure
‘iates
qre
established
Iffe
tests.
The faflure
rate,
identified
by the
appropriate
symbol,
is referred
q
t
q
voltage
q
quivalent
-to-SO
percent
of
to operation
at
rated
temperatareand
A-p4rt
per
15’perCent).
rated
watta
e (with
m permissible
resistance
change
of
q
q
illion
{PP i ) qualfty
system
is
used
for
documenting
q
nd reportfng
the
Bverage
Statfstlcal
outgoing
quallty
of
resistors
supplfed
to thfs
specfffcatlon.
q
anufacturing
process
to
process
control
(SPC)
techniques
are
required
in the
minimize
variation
in production
of resistors
supplied
to this
specification.
1.2
Classlficatfon.
or Identifying
form.
and as
Number
specified
’[PIN).
[see
The
3.1.
Part
6.1.
or
and
Identifying
6.12):
Number
is
fn
1.1
Scope.
the
1.2.1
part
following
i
(see
St
112~1.1)
i
l%aracteristfc
(see
1.2.1.2)
i
resistance
“(see
1.2.1.3)
i
Resistance
tolerance
(see
1.2.1.4)
=
i
7 il
(~ee”1~2~i.~)
t
I
lBeneficial
lpertfnent
Iaddressed
.107703-S000
I(OO
Form
I
comments
(recommendations,
addftfons,
deletions)
and any
data
which
may be of use
in improving
thfs
document
should
be
to:
IJS Army
Laboratory
Command
ATTN:
SLCET-R-S,
Fort
Monmouth,
by using
the
self-addressed
Standardization
Document
Improvement
1426)
appearing
at
the
end
of thfs
document
or by letter.
NJ
r
I
i
I
~
AMSC N/A
DISTRIBUTION
STATEMENT
A.
Approved
for
public
release;
distribution
fs
FSC 5905
unlimited.
MIL-R-39008C
TABLE
I
I.
Characteristic.
I
ambient
I
tempera-
lSymbollture
(100
percent
Irated
wattage
and
1
150 percent
rated
i
Iwattage
for
I
lMaximum
Ioperating
I
I
I
Resistance
temperature
characteristic
In aximum
Ireslstance
Iambfent
I
all
h
owabl
1
from
~e~t~!~;c~natl
temperature
of 25 C
i
I
(+)
At
+105”C
r
I
I
I
[ Nomfnal
I
/
resistance
I
i
I
I
I
I
Ifaflure
Ideternlnatfon.
rate
)
At
-55*C
I
11,000
Ohms
?i7W_under
to
10,000
Incl.1
to
0.1 megohm
I
Percent
“c
/
I Percent
(+)
/
!
/
fG
I
1
/
70
i
;
I1,1OO
111,000
Ilncl
I
I
10:0
I
i
I
I
i
15.0
13.0
1~1
i
I
I
1
7:5
:
I
I
/
I
10.11%%
tncl
11.1
to
10
Incl
111.0
and
over
20.0
25.o
I
!
I
10.0
15.0
15.0
/
I
I
1
I
I
1.2.1.1
Style.
Is Identfffed
The
style
followed
by a two-dlglt
numbar;
the
letters
insulated,
composftlon,
fixed
resfstors,
power
r~tlng
of the
resistors.
In
1.2.1.2
Characterfstfc.
q
ccordance
wfth
tabl
The
q
characteristic
by the
three-letter
Identffy
established
and the
number
ldentfffes
symbol
“RCR”
rellabflfty,
the
q
sfngle,
sfze
lttter
q
nd
fs
identified
by
I.
Reslstenct.
The nominal
resistance
value
expressed
fn ohms fs
1.2.1.3
identified
by
hree-iflgft
number;
the
ffrst
two dlgfts
represent
sfgnfffcant
ffgures
qnd
the
last
Qfgft
specfffes
the
number
of zeros
to follow.
When
resistance
values
less
than
10 ohms are
requfred,
the
letter
“R” fs substituted
for
one of the
sfgnfffcant
dfgfts
to represent
the
decfmal
pofnt.
When the
letter
“R” fs used,
succeeding
digfts
of the
group
represent
figures
as shown
the
following
example:
2R7
Mfnlmum
standerd
‘1O
to
1.2.1.4
sfngle
and maxtmum
values
for
100”
decade
values
q
very decade
shall
ufth
fn
q
ccordance
The
table
11.
resistance
= 2.7
ohms
specfffed
sequence
(see
3.1).
demonstrated
The
fQr
{n
shall
be as
follow
the
MS90178.
resistance
the
Resistance
tolerance.
letter
in accordance
wfth
TABLE
tolerance
Is
Identlfled
by
a
II.
Resistance
tolercnce.
i
Symbol
;
Resistance
Percent
tolerance
(*)
I
I
IJ
]K
i
I
i
I
I
1:
MIL-R-39008C
1.2.1.5
Failure
rate
table
111 is signified
failure
rate
level
for
TABLE
designation.
by a single
which
the
Faflure
rate
The
letter
resfstor
level
(at
failure
rate
P, R, S),
(M,
is qualified
50
percent
designation
as
which
identifies
(see
4.4).
rated
wattage).
shown
in
the
III.
1
1
Failure-rate
I
I
designation
I
level
I
1
Failure
percent/1,000
rate
hours
f-
I
I
. . . . . . . . . . . I
I
i
2.
2.1
APPLICABLE
Government
DOCUMENTS
documents.
! .. ........~
. .........
! . . . . . . . . ...!
q
q
1.0
0.1
0.01
0.001
I
I
I
i
2.1.1
Speciffc&tfons,
standards,
and handbooks.
The followlng
specfffcations,
standards,
qnd
h
db
k
t
of thi
f
document to the extent
specified
herein.
Unless
~~he%l~e
~~sc?f!~~,
the
is~ues
of these
documents
are
those
Index
of Specfficatlons
and
lfsted
In the
fssue
of the
Department
of Defense
Standards
(DODISS)
and supplement
thereto,
cited
fn the
solicitation
(see
6.1).
SPECIFICATION
NILITARY
\
HIL.R.39008/l
UIL-R-39008/2
MIL-R-39008/3
MIL-R-39008/4
M!L-R-39008/5
MIL-R-39032
STANOARDS
MILITARY
MIL-STD-202
MIL-STD-690
MIL-STD-790
MIL-STD-81O
MIL-STD-1276
MIL-STO-1285
MS90178
.
Resfstors.
Established
Resfstors.
Establfsh8d
‘Resistors,
Established
Resistors,
Established
Resistors,
Established
Resistors,
Insulated),
Fixed,
Composition
Reliability,
Style
RCR07 .
Insulated).
Ffxed.
Composition
Rell~bflity,
Style-RCR20.
Ffxed,
Composition
(Insulated),
Relfabflity,
Style
RCR32.
Ffxed
Composition
(Insulated),
Relfabflfty,
Style
RCR05.
Fixed,
Composition
(Insulated),
Reliability.
Style
RCR42.
Packaging
of.
‘-
.
.
.
-
.
.
q
nd Electrical
Test
Methods
for
Electronic
Component
Parts.
and
Procedures.
Faflure
rate
Sampling
Plans
Relfabilfty
Assurance
Program
for
Electronic
Parts
$pecfffcations.
Environmental
Test
Methods
and Engfneerfng
Gufdelfnes.
Leads
for
Electronic
Component
Parts.
Marking
of Electrical
and Electronic
Parts.
Standard
24 Value
Series
Oecade
for
Electronic
and 20-Percent
Tolerances.
Components
of S-,
10-,
copies
avaflable
Avenue,
of
federal
from
the
Philadelphia,
specfffcations,
Standardization
Documents
PA 19111-5094).
(Unless
otherwfse
indfcated,
standards,
and handbooks
are
Desk.
Bufldfng
4D,
700
Robbins
q
nd
q
flftary
Order
3
NIL-R-39008C
2.2
Non.Government
publications.
The followfng
documen%
to ttl
q
extent
speclffed
herein.
Unless
of the
documents
which
are
DOD adopted
are
those
DODISS
cited
In the
solicitation.
Unless
otherwise
documents
not
lfsted
In the
DODISS
are
the
issues
solicitation
(see
6.1).
ELECTRONIC
EIA-554
EIA-557
INDUSTRIES
ASSOCIATION
(EIA]
of
documents
form
a part
of thfs
otherwise
speclflerl,
the
Issues
listed
In the
issue
of the
specffled,
the
Issues
of
of the
documents
cited
in the
Assessment
Per
Mllllon
Statistical
Outgotng
Nonconforming
(PPM)
(DOD Adopted).
Process
Control
Systems
Electronic
Levels
(DOD
Industries
In
Part
Adopted).
(ApplfCatfOn
Association,
fOr COpleS
2001
Eye
Street,
should
be
qddressed
to the
Washington
DC 20006.)
(Non-Government
standards
Organfzatlons
that
prepare
be available
fn or through
and other
publications
are
or d~strfbute
the
documents.
librarfes
or other
informational
q
vaflable
normally
These
documents
services.
from
also
may
2.3
Order
of prece~ence.
In the
qvent
of a conflict
document
and the
references
cited
herein
(except
for
specfficatlons,
specification
sheets,
or MS standards),
takes
precedence.
Nothfng
fn this
document,
however,
and regulations
unless
a specfffc
exemptfon
has been
3.
REQUIREMENTS
between
the
text
of this
related
associated
detafl
the
text
of this
document
supersedes
applicable
laws
obtained.
3.1
Associated
detafl
speclflcatlons.
The Indfvfdual
ftem
requirements
shall
be as specfffed
q
pplicable
qssociated
detafl
wfth
the
herein
and In accordance
speclffcatfon.
In the
event
of
qny
confllct
between
the
requirements
of thfs
specfffcatlon
and the
associated
detafl
specfffcatfon,
the
latter
shall
govern.
3.2
Qualification.
Resfstors
furnfshed
under
thfs
speclffcatfon
shall
be
products
wnlca
q
ctfvity
for
lfstfng
on the
qre quthorized
by the
qualifying
applicable
qualffled
products
list
qt
the
time
of award
of contract
(see
4.4
qnd
6.2).
In additfon,
the manufacturer
shall
obtafn
certification
from
the
qualifying
activ?ty
that
the
reliability
assurance
requirements
of 4.1.2
have
been
met and are
befng
maintained.
Authorized
distributors
that
qre
approved
to
MIL-STO-790
distributor
requirements
by the
qualfffed
products
lfst
(QPL)
sanufacturer
are
listed
in the
QPL.
3.3
Relfabflfty
and
quallty.
The
s~~;;;ca%%+i%e
rkqulrement~
xceptions
and
q
3.3.2
qnd
proc~duras
specfffed
fn
relfabflfty
$pectffed
4.1.2,
of resistors
q
nd
q
afntal.ed
In MIL-$TD.6~
4.4.4,
4.6.2.1.
furnfshed
and
under
with
MIL-STD-790
thfs
the
with
established
fn accordance
details
CJualfty.
3.3.2.1
Statlstlcal
Implement
and use
process
control.
The contractor
I hall
statistical
process
control
ng process
for
parts
q
anufacture<
techniques
fn the
covered
by thfs
specfflcatlon.
and
qaintained
The SPC program
shall
be developed
fn accordance
wfth
all
the
requirements
of EIA-557.
The SPC program
shall
be
documented
and nafntafned
as part
of the
overall
relfabf<
fty
assurance
program
as
speciffed
In HIL-STD-790.
The
implementation
of statfst’
cal
process
control
shall
be 12
qonths
from the date
of thfs
specfffcatfon.
Processes
for
oldlng
lfmfted
to
q
application
of SPC techniques
should
Include
but
are
not
operatfon
and marking.
4
MI L- R-39008C
levels.
3.3.2.2
Quality
The quality
of lots
that
have
been
subjected
to and
passed
the
subgroup
1
UO percent
screening
inspection
of the
group
A inspection
shall
be established
~nd maintained
in accordance
with
4.6.1.2.2
and EIA-554.
Individual
PPN defect
level
(I.e.,
PPM-2
and PPM-3)
and an overall
PPM defect
level
(I.e.,
PPN-5)
shall
be established
based
on the
tects
prescribed
in the
subgroup
2 tests
af the
group
A Inspections.
The defect
level
for
PPM-2
shall
be
less
than
100 PPM.
The implementation
of part
per
qilllon
verification
shall
be
12 months
from
the
date
of this
specification.
The contr~ctor
shall
notify
3.3.2.2.1
Noncompliance.
when the
100
1 evel
is reached
or exceeded
for
PPM-2.
provide
sufficient
information
to the
qualifying
activfty
of the
problea
and what
corrective
action
fs being
taken.
this
problem
shall
be the
basts
for
removal
of
the
affected
the
qualifying
activity
The contractor
shall
documenting
the
causes
Failure
to correct
product
from
the
QPL.
The
qaterial
shall
-be
qs
specffied
herefn.
However,
when a
3.4
Material.
q
ater~el
fs not
specffied,
defintte
shall
be used
which
wi17
enable
a
q
aterfal
the
resistors
to
qeet
the
performance
requirements
of this
speciflcetfon.
q
aterial
shall
not
be construed
as a
Acceptance
or 8pproval
of any constituent
guarantee
of the
acceptance
of the
finfshed
product.
The resistors
shal?
3.5
Design
and construction.
construct
specffied
(see
imensions
on,
and physfcal
consist
of a composition
resistance
element
protected
humidity
and temperature
conditions
by an enclosure
q
oisture-resfstant,
Insulating
qaterial.
3.5.1
soldering.
Termfnals.
~~
All
teralnals
shall
be
suitably
be of the
desfgn,
3.1).
Each
resfstor
against
exposure
or a coatfng
of
shall
to
treated
to
facillate
.
authorized
suppllhd
by the
to
3.5.1.1
Solder
dfp
(netlnnlag)
lecds.
category
C
butor)
qy
solder
1P
this
speciflc~t!on
provided
the
solder
q
ctlvfty.
qualifying
3.5.1.2
be based
a.
Qualifying
on one of
activity
the
following
qp
proval
options:
The aanufacturer’(or
(retin)
the
leads
of
dfp
process
has been
hfs
prodmct
approved
.
Approval
of
the
solder
dip
process
will
Uhen
the
origfnal
lead
finish
52 of RIL-STO-1276.
(NOTE:
applicable.
)
The manufacturer
retinnlng
as is used
in the
When the
lead
of NIL-STO-1276
used
for
solder
qualfffed
was hot
solder
dfp
lead
finish
The 200
qfcroinch
saxfmum
thfckness
is not
same
solder
dip
process
for
shall
use the
original
Manufacture
of the
product.
52
be
b.
originally
qualffied
was not
hot
solder
dfp
lead
finish
qs
prescrlbod
In Itea
q
,
q
pproval
for
the
process
to
dip
shall
be based
on the
following
test
procedure:
(1)
Thirty
saaples
of
qny
roslstance
value
for
etch
style
qnd
lead
flnfsh
shall
be subjected
to the
manufacturing’s
solder
dip
process.
Folleufng
the
solder
dip
process,
the
reststors
are
$ubJected
to the
dc ?eslstance
test
qnd
other
group
A
qre
allowed.
No defects
electrfcals).
Ten
test.
The
heat
dip
of
the
30 samples
No defects
are
(2)
q
llowed.
qre
then
subjected
to
the
solderabilfty
(3)
reaIafning
20
test
followed
of gold
plated
samples
are
subjected
to the
by the
moisture
resistance
leads
is not
allowed.)
resistance
to solder
test
(NOTE:
Solder
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