NASA SPACE LEVEL BME X7R MLCC
S311-P838 Approved
AVX is the first company to be awarded the NASA S311-P838 specification for
its Space BME 7XR MLCC technology.
This technology delivers an advanced capacitance voltage capability compared
to conventional PME (Precious Metal Electrode) technologies while meeting the
reliability levels demanded by NASA’s space industry. The technology has
several key benefits, downsizing case sizes, reducing weight and allowing more
efficient use of the PCB area available. The range is tested using Mil spec
standards and methods including 100% ultrasonic examination in compliance
with the NASA space specification. These surface mount components also
incorporate Flexiterm
®
, which greatly enhances resistance to any of the
mechanical stress experienced by MLCCs during PCB assembly and in
operation.
FEATURES
• Higher CV capability than standard capacitors resulting in reduced size / weight of components and saving in PCB space
required.
• Every production lot will have a C of C, DPA and a summary data package.
• Use of Flexiterm
®
technology for enhanced mechanical stress resistance.
• Case sizes: 0603 - 1812, cap values 2.2nF - 8.2uF available.
• Voltages:16 - 100 Volts
HOW TO ORDER
S311P838
GSFC
Identifier
A
F
X
Dielectric
Type
X = X7R
825
Capacitance
in pF
2 significant
digits +
number of
zeros
e.g.
103 = 10nF
225 = 2.2μF
J
Tolerance
J = ±5%
K = ±10%
M = ±20%
1
R
3
Packaging/
Marking
1 = T/R unmarked capacitors
2 = T/R marked capacitors
3 = Waffle Pack,
unmarked capacitors
4 = Waffle Pack,
marked capacitors
Ultrasonic Size Code
Examination
A = 0402
A = 100%
B = 0603
C = 0805
D = 1206
E = 1210
F = 1812
Voltage
Termination
1 = 25Vdc
R = Sn/Pb
2 = 50Vdc
plated
3 = 100Vdc
6 = 16Vdc
Please note all parts are terminated with a minimum 10% Pb plating.
DIMENSIONS
W
L
T
t
mm (inches)
Min.
Max.
(L) Length
1.48 (0.058) 1.75 (0.069)
(W) Width
0.66 0.026) 0.97 (0.038)
(T) Thickness
1.02 (0.040) Max.
(t) terminal 0.20 (0.008) 0.50 (0.020)
Size
0603
0805
1206
1210
1812
Min.
Max.
4.19 (0.165) 4.95 (0.195)
2.79 (0.115) 3.56 (0.140)
2.80 (0.110) Max.
0.25 (0.010) 0.95 (0.037)
Min.
Max.
Min.
Max.
Min.
Max.
1.79 (0.070) 2.29 (0.090) 3.00 (0.118) 3.40 (0.134) 3.00 (0.118) 3.40 (0.124)
1.01 (0.040) 1.45 (0.057) 1.40 (0.055) 1.80 (0.071) 2.25 (0.088) 2.70 (0.108)
1.52 (0.060) Max.
1.80 (0.071) Max.
2.80 (0.110) Max.
0.25 (0.010) 0.75 (0.030) 0.25 (0.010) 0.75 (0.030) 0.25 (0.010) 0.75 (0.030)
2
040416
NASA SPACE LEVEL BME X7R MLCC
S311-P838 Approved
PREFERRED SIZES ARE SHADED
Case Size
B (0603)
Code
Value 16V 25V 50V 100V 16V
222 2.2 (nF)
272
2.7
332
3.3
392
3.9
472
4.7
562
5.6
682
6.8
822
8.2
103
10
123
12
153
15
183
18
223
22
273
27
333
33
393
39
473
47
563
56
683
68
823
82
104
100
124
120
154
150
184
180
224
220
274
270
334
330
394
390
474
470
564
560
684
680
824
820
105
1 (μF)
125
1.2
155
1.5
185
1.8
225
2.2
275
2.7
335
3.3
395
3.9
475
4.7
565
5.6
685
6.8
825
8.2
106
10
C (0805)
25V 50V 100V 16V
D (1206)
25V 50V 100V
16V
E (1210)
25V 50V 100V 16V
F (1812)
25V 50V 100V
040416
3
NASA SPACE LEVEL BME X7R MLCC
S311-P838 Approved
ELECTRICAL MEASUREMENTS AT ROOM TEMPERATURE
Charateristics
Capacitance
Symbol
C
A
Test Method
and Conditions
MIL-STD-202 Method 305
25ºC, 1KHz, 1V
rms
MIL-STD-202 Method 302
120 sec, 25ºC
For C
n
≤ 10000pF:
For C
n
> 10000pF:
Measured 25ºC,
1KHz, 1V
rms,
16-25 Volts
> 25 Volts
MIL-STD-202 Method 301
60 sec
Tolerance
(± %)
5
10
20
All
Limits
Min.
0.95C
n
0.9C
n
0.8C
n
Max.
1.05C
n
1.1C
n
1.2C
n
Unit
pF
Insulation Resistance
R
I
100
1000
–
–
GΩ
GΩ nF
Dissipation Factor
Df
All
3.5
3.5
2.5U
R
–
%
%
V
Voltage Proof
VP
All
ELECTRICAL MEASUREMENTS AT HIGH AND LOW TEMPERATURE
Charateristics
Insulation Resistance
Symbol
R
I
Test Method and Conditions
(Note 1)
MIL-STD-202 Method 302
For C
n
≤ 10000pF:
For C
n
> 10000pF:
Limits
Min.
10
100
Max.
–
Unit
GΩ
GΩ nF
4
040416
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