SWCX1 SWEPT QUARTZ CRYSTALS
6 MHz to 250 MHz
Radiation Resistant,
Miniature Surface Mount
and Leaded Quartz Crystals
DESCRIPTION
For applications that require resistance to radiation, Statek
offers our swept quartz AT-cut resonators. Made with cultured
quartz that is electrically "swept" at high temperature to
remove interstitial impurities within the crystalline structure,
these resonators are superior to those utilizing non-swept
quartz in maintaining their frequency and other electrical
characteristics under exposure to radiation levels of 100 krad
(1 kGy) and greater. As Rad-Hard applications typically
require various degrees of high-reliability components,
Statek offers these resonators in three distinct screening
options to meet mission critical program requirements from
Engineering to Flight.
FEATURES
unt
Mo
ce
urfa
S
ed
ead
L
DIMENSIONS
1
Surface Mount
Leaded
Radiation tolerance up to 100 kRad total dose
High shock and vibration resistance
Ultra high reliability
Custom designs available
Military and space screening available
Low aging
Designed, manufactured and tested in the USA
Critical processes performed in class 10 cleanroom
APPLICATIONS
TYPICAL
DIM
A
B
C (max)
D
E
F
inches
0.315
0.140
0.070
0.045
0.060
-
mm
8.00
3.56
1.78
1.14
1.52
-
TYPICAL
inches
0.315
0.140
0.070
0.310
0.020
0.150
mm
8.00
3.56
1.78
7.87
1.02
3.81
Military & Aerospace
Satellite
Space exploration systems
Deep space probes
Telemetry
PACKAGING OPTIONS
03 Lead dimension
Width = .018” (.46 mm) typical
Thickness = .012” (.30 mm) typical
1. Other package options are available; contact factory
TERMINATIONS AVAILABLE
SM / LEADED
• Tray Pack (standard for Leaded, option for SM)
• 16mm tape, 7” or 13” reels (only for SM)
Per EIA 481 (see Tape and Reel data sheet 10109)
PACKAGE DIMENSIONS
Designation
SM1
SM2 / 03
SM3 / 03
Termination
Gold Plated
Solder Plated
Solder Dipped
SWCX1 SM
SWCX1 Leaded
SWCX1 10199 - Rev C
S
YS
TEM
C
ERT
I
F
I
C
AT
N
IO
STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256
www.statek.com
IS
O
01
90
ELECTRICAL SPECIFICATIONS TABLE
1
(Specifications shown are typical unless otherwise noted.)
SM or Leaded
SWCX1 (SM)
SWCX1 (03)
Frequency
Range
6.0 MHz to
250 MHz
Motional Resistance
R1 @ 25°C
25
15
@ 32 MHz
@ 155.2 MHz
Motional Capacitance
C1 @ 25°C
6.2 fF @ 32 MHz
4.0 fF @ 155.2 MHz
Shunt Capacitance
C0 @ 25°C
Quality Factor
Q @ 25°C
Load Capacitance
CL
20 pF, f
≤
50 MHz
10 pF, f > 50 MHz
Drive Level
500 µW Max f
≤
50 MHz
200 µW Max f > 50 MHz
2.3 pF @ 32 MHz
30 k @ 32 MHz
2.3 pF @ 155.2 MHz 30 k @ 155.2 MHz
GENERAL SPECIFICATIONS TABLE
1
(Specifications shown are typical unless otherwise noted.)
SM or Leaded
SWCX1 (SM)
SWCX1 (03)
Frequency
Range
6.0 MHz to
250 MHz
Calibration Tolerance
@ 25°C
± 100 ppm, or tighter
as required
Frequency
Temperature Stability
Please refer to CX1 AT
data sheet
Aging, first year
2 ppm Max
Shock, survival
2
3,000 g peak 0.3 ms,
½
sine
Vibration, survival
20 g, 10-2,000 Hz
swept sine
Standard CX
data sheet
10127 CX1 AT/
10107 CX1 SM AT
1. For more detailed specifications on crystals, refer to standard crystal datasheets.
2. Higher shock available.
STANDARD TESTS & SCREENING OPTIONS
Code
S
x
x
x
x
x
x
x
x
x
x
M
x
x
E
x
Item
Made with swept quartz
Internal visual (pre-seal)
PIND testing
Radiographic inspection
Unwanted modes
Low temperature storage
Frequency and resistance over operating
temperature range
Method
Comments
Statek internal standard
MIL-STD-883 Method 2020 Condition A
MIL-STD-202 Method 209
MIL-PRF-3098
MIL-PRF-3098
MIL-PRF-3098
Spurious-mode ratio 2:1 or greater
Resistance must meet specification at this low
temperature.
Measure every 2.5 degree C or tighter over
operating temperature range; frequency and
resistance must meet specification.
Frequency and resistance must meet
specification after aging; maximum allowed
change in series frequency 5 ppm.
Performed in both the width and thickness
directions.
x
x
Accelerated aging
105 degree C for a minimum of 160 hours
x
x
x
x
x
x
x
x
x
x
x
x
Seal test (fine leak)
Seal test (gross leak)
Final electrical test
External visual (post-seal)
MIL-STD-883 Method 1014 Condition A1
MIL-STD-883 Method 1014 Condition C
π-network
measurement per IEC 60444
Statek internal standard
Measure F
s
, R
1
, C
1
, C
0
, Q, and F
L
S: For space-based applications.
M: For military applications.
E: For engineering prototypes and applications not requiring the additional screening.
HOW TO ORDER SWCX1 SWEPT CRYSTALS
SWCX1
Swept
Quartz
Crystal
S
Screening per
option code
S = Space
M = Military
E = Engineering
S
S = special or
custom design.
Blank = standard
C
C = Ceramic
Lid
SM1
–
NOTE : Example only. For Specific ordering requirements, call us at ++1 714-639-7810
20.0M
Frequency
M = MHz
,
100
/
100
/
–
/
I
Leaded
03
Surface Mount
SM1
SM2
SM3
Calibration Frequency
Tolerance Stability over
@ 25
0
C
Temp.Range
(in ppm)
(in ppm)
Temp. Range:
C = -10
O
C to +70
O
C
I
= -40
O
C to +85
O
C
M = -55
O
C to +125
O
C
S = Customer Specified
I
Operating Temp. Range:
C = -10
O
C to +70
O
C
I
= -40
O
C to +85
O
C
M = -55
O
C to +125
O
C
S = Customer Specified
SWCX1 10199 - Rev C
S
OR
—
/
—
/
200
Total
Frequency
Tolerance
(in ppm)
/
YS
TEM
C
ERT
I
F
I
C
AT
N
IO
STATEK CORPORATION 512 N. MAIN ST., ORANGE, CA 92868 714-639-7810 FAX: 714-997-1256
www.statek.com
IS
O
01
90
