T493X107K016AH6320,T493X107K016AH6320 pdf中文资料,T493X107K016AH6320引脚图,T493X107K016AH6320电路-Datasheet-电子工程世界

文档预览

Tantalum Surface Mount Capacitors – High Reliability

T493 High Reliability Alternative MnO

(CWR11 Style)

Overview

The KEMET T493 Series is designed for the Commercial

Off-The-Shelf (COTS) requirements of military and

aerospace applications. This series is a surface mount

product offering various lead-frame plating options,

Weibull grading options, surge current testing, F-Tech (an

improved anode manufacturing process) and Simulated

Breakdown Voltage (SBDV) screening options to improve

long term reliability. Standard, low, and ultra-low ESR

options are available. All lots of this series are conditioned

with MIL–PRF–55365 Group A testing. This series is also

approved for DLA Drawing 07016 (please see part number

list specific to this drawing).

KEMET’s F-Tech eliminates hidden defects in the dielectric

which continue to grow in the field, causing capacitor

failures. Based on the fundamental understanding of

degradation mechanisms in tantalum and niobium

capacitors, F-Tech incorporates multiple process

methodologies. Some minimize the oxygen and carbon

content in the anodes which become contaminants

and can lead to the crystallization of the anodic oxide

dielectric. This process methodology reduces the

contaminants, improving quality of the dielectric. An

additional technology provides a stronger mechanical

connection point between the tantalum lead wire and

tantalum anode, enhancing robustness and product

reliability. The benefit of F-Tech is illustrated by a 2,000

hour, 85°C, 1.32 X rated voltage accelerated life test.

F-Tech parts see no degradation while standard tantalum's

have 1.5 orders of magnitude degradation in leakage

current. F-Tech is currently available for the T493 Series

(select D and X case capacitance values in 25 V and

higher rated voltage). Please contact KEMET for details on

ordering other part types with these capabilities.

KEMET’s patented Simulated Breakdown Screening (SBDS)

is a nondestructive testing technique that simulates the

breakdown voltage (BDV) of a capacitor without damage to

its dielectric or to the general population of capacitors. This

screening identifies hidden defects in the dielectric, providing

the highest level of dielectric testing. SBDS is based on the

simulation of breakdown voltage (BDV), the ultimate test of

the dielectric in a capacitor.

Low BDV indicates defects in the dielectric, and therefore, a

higher probability of failure in the field. High BDV indicates

a stronger dielectric and high-reliability performance in the

field. This new screening method allows KEMET to identify

the breakdown voltage of each individual capacitor and

provide only the strongest capacitors from each lot.

SBDS is currently available on select part types in the T493

and T497 Series. Please contact KEMET for details on

ordering other part types with these capabilities.

KEMET offers these technologies per the following options:

• F-Tech only

• SBDS only

• Combination of both F-Tech and SBDS for the ultimate

protection

Built Into Tomorrow

T2007_T493 • 10/14/2021

Tantalum Surface Mount Capacitors – High Reliability

T493 High Reliability Alternative MnO

(CWR11 Style)

Benefits

• F-Tech and Simulated Breakdown Voltage (SBDS)

screening options available

• Tape & Reel standard packaging per EIA 481

• Symmetrical, compliant terminations

• Laser-marked case

• 100% surge current test available on all case sizes

•

Termination options B, C, H, K, T, N, and M

Weibull failure options B and C

All parts tested per Group A of MIL–PRF–55365

Approved for DLA Drawing 07016 applications*

* Defense Logistics Agency (DLA), previously identified as DSCC

Applications

Typical applications include decoupling and filtering in military and aerospace applications.

Environmental Compliance

RoHS compliant when ordered with 100% Sn solder.

• Halogen-free

• Epoxy compliant with UL94 V-0

• Molded Epoxy complies for outgassing testing under ASTM E 595.

K-SIM

For a detailed analysis of specific part numbers, please visit ksim.kemet.com to access KEMET’s K-SIM software. KEMET

K-SIM is designed to simulate behavior of components with respect to frequency, ambient temperature, and DC bias levels.

Ordering Information

Capacitor

Class

Tantalum

493

227

006

Surge

61 = None

62 = 10 Cycles after

Weibull, 25°C

63 = 10 cycles after

Weibull, −55°C and

85°C after Weibull

64 = 10 cycles

before Weibull,−55°

and +85°C

ESR

10 = ESR

– Standard

20 = ESR

– Low

30 = ESR

– Ultra low

Rated

Case Capacitance Capacitance Voltage Failure Rate/ Termination Finish

Series Size Code (pF)

Tolerance

Design

(VDC)

Military

COTS

First two

digits

represent

significant

figures.

Third digit

specifies

number of

zeros.

J = ±5%

K = ±10%

M = ±20%

004 = 4

006 = 6.3

010 = 10

016 = 16

020 = 20

025 = 25

035 = 35

050 = 50

063 = 63

A = N/A

B = 0.1%

/1,000 hours

C = 0.01%

/1,000 hours

C = Hot solder dipped

H = Standard solder

coated (SnPb 5% Pb

minimum)

B = Gold plated

K = Solder fused

T = 100% Tin

N = Non-magnetic

100% Tin (Sn)

M = Non-magnetic

(SnPb)

Packaging

(C-Spec)

Blank = 7"

Reel

7280 = 13"

Reel

7610 = Bulk

Bag

7640 = Bluk

plastic box

WAFL =

Waffle Pack

For detailed part number offerings, please refer to: Table 1A – COTS, Table 1B – DLA Drawing 07016

T2007_T493 • 10/14/2021

Tantalum Surface Mount Capacitors – High Reliability

T493 High Reliability Alternative MnO

(CWR11 Style)

Ordering Information – DLA Drawing 07016

07016-

Drawing Number

001

Dash Number

See Part Number

Table

Capacitance

Tolerance

J = ±5%

K = ±10%

M = ±20%

Reliability Grade

B = 0.1%/1,000 hours

C = 0.01%/1,000 hours

Termination Finish

C = Hot solder dipped

H = Standard solder coated

(SnPb 5% Pb minimum)

B = Gold plated

Surge

A = + 25ºC after Weibull

B = −55ºC and +85ºC after

Weibull

C = −55ºC and + 85ºC

before Weibull

Z or no option= No test

required

For detailed part number offerings, please refer to: Table 1A – COTS, Table 1B – DLA Drawing 07016

Ordering Information – F-Tech & Simulated Breakdown Screening (SBDS)

Capacitor

Class

Tantalum

493

Series

Military

COTS

226

020

Failure Rate/

Design

A = N/A

B = 0.1%

/1,000 hours

C = 0.01%

/1,000 hours

Termination Finish

C = Hot solder dipped

H = Standard solder

coated (SnPb 5% Pb

minimum)

B = Gold plated K =

Solder fused

K = Solder fused

T = 100% Tin

N = Non-magnetic

100% Tin (Sn)

M = Non-magnetic

(SnPb)

Surge

61 = None

62 = 10 Cycles

after Weibull,

25ºC

63 = 10 cycles

after Weibull,

−55ºC and 85ºC

after Weibull

64 = 10 cycles

before Weibull,

−55° and +85°C

Screening/ESR

11 = F-Tech + SBDS *

12 = SBDS

13 = F-Tech *

21 = Low ESR + 11

22= Low ESR + 12

23 = Low ESR + 13

31= Ultra Low ESR + 11

32 = Ultra Low ESR + 12

33 = Ultra Low ESR + 13

Packaging

(C-Spec)

Blank = 7" Reel

7280 = 13" Reel

7610 = Bulk Bag

7640 = Bluk

plastic box

WAFL = Waffle

Pack

Rated

Case Capacitance Capacitance

Voltage

Tolerance

Size Code (pF)

(VDC)

First two

digits

represent

significant

figures.

Third digit

specifies

number of

zeros.

J = ±5%

K = ±10%

M = ±20%

025 = 25

035 = 35

050 = 50

063 = 63

* Select "C", "D" and "X" case sizes in 20 V and higher rated voltage

For detailed part number offerings, please refer to: Table 1A – COTS, Table 1B – DLA Drawing 07016

Performance Characteristics

Item

Operating Temperature

Rated Capacitance Range

Capacitance Tolerance

Rated Voltage Range

DF (120 Hz)

ESR (100 kHz)

Leakage Current

−55° C to 125° C

0.1 – 470 μF at 120 Hz/25°C

J Tolerance (5%), K Tolerance (10%), M Tolerance (20%)

4 – 63 V

Refer to Part Number Electrical Specification Table

≤ 0.01 CV (µA) at rated voltage after 5 minutes

Performance Characteristics

T2007_T493 • 10/14/2021

Tantalum Surface Mount Capacitors – High Reliability

T493 High Reliability Alternative MnO

(CWR11 Style)

Qualification

Test

Endurance

Condition

Δ C/C

85°C at rated voltage, 2,000 hours

125°C at 2/3 rated voltage, 2,000 hours

DCL

ESR

Δ C/C

DCL

ESR

Δ C/C

MIL–STD–202, Method 107, Condition B, mounted,

−55°C to 125°C, 1,000 cycles

DCL

ESR

+25°C

Extreme temperature exposure at a

succession of continuous steps at +25°C,

−55°C, +25°C, +85°C, +125°C, +25°C

Δ C/C

DCL

25°C and 85°C, 1.32 x rated voltage 1,000 cycles

(125°C, 1.2 x rated voltage)

IL*

Δ C/C

DCL

ESR

Δ C/C

DCL

Characteristics

Within ±10% of initial value

Within initial limits

Within 1.25 x initial limit

Within initial limits

Within ±10% of initial value

Within initial limits

Within 1.25 x initial limit

Within initial limits

Within ±5% of initial value

Within initial limits

Within 1.25 x initial limit

Within initial limits

−55°C

±10%

N/A

+85°C

±10%

1.5 x IL

10 x IL

+125°C

±15%

1.5 x IL

12 x IL

Storage Life

125°C at 0 volts, 2,000 hours

Thermal Shock

Temperature Stability

Within ±5% of initial value

Within initial limits

Within ±10% of initial value

Within initial limits

Surge Voltage

Mechanical Shock/

Vibration

*IL = Initial limit

MIL–STD–202, Method 213, Condition I, 100 G peak

MIL–STD–202, Method 204, Condition D, 10 Hz to

2,000 Hz, 20 G peak

Certification

MIL–PRF–55365/8

DLA Drawing 07016

T2007_T493 • 10/14/2021

Tantalum Surface Mount Capacitors – High Reliability

T493 High Reliability Alternative MnO

(CWR11 Style)

Electrical Characteristics

ESR vs. Frequency

1,000

100

Impedance, ESR (Ohms)

T493B106/020_IMP

T493E476/035_IMP

T493X226/035_IMP

T493B106/020_ESR

T493E476/035_ESR

T493X226/035_ESR

0.1

0.01

100

1,000

10,000

Frequency (Hz)

100,000

1,000,000

10,000,000

Capacitance vs. Frequency

100

Capacitance (µF)

T493B106/020

T493E476/035

T493X226/035

0.1

100

1,000

10,000

Frequency (Hz)

100,000

1,000,000

10,000,000

T2007_T493 • 10/14/2021