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W332M64V-133BC

Synchronous DRAM, 32MX64, 5.5ns, CMOS, PBGA219, 25 X 25 MM, PLASTIC, BGA-219

器件类别:存储    存储   

厂商名称:Microsemi

厂商官网:https://www.microsemi.com

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器件参数
参数名称
属性值
是否无铅
含铅
是否Rohs认证
不符合
厂商名称
Microsemi
零件包装代码
BGA
包装说明
BGA,
针数
219
Reach Compliance Code
unknown
ECCN代码
EAR99
访问模式
FOUR BANK PAGE BURST
最长访问时间
5.5 ns
其他特性
AUTO/SELF REFRESH
JESD-30 代码
S-PBGA-B219
内存密度
2147483648 bit
内存集成电路类型
SYNCHRONOUS DRAM
内存宽度
64
功能数量
1
端口数量
1
端子数量
219
字数
33554432 words
字数代码
32000000
工作模式
SYNCHRONOUS
最高工作温度
70 °C
最低工作温度
组织
32MX64
封装主体材料
PLASTIC/EPOXY
封装代码
BGA
封装形状
SQUARE
封装形式
GRID ARRAY
峰值回流温度(摄氏度)
225
认证状态
Not Qualified
自我刷新
YES
最大供电电压 (Vsup)
3.6 V
最小供电电压 (Vsup)
3 V
标称供电电压 (Vsup)
3.3 V
表面贴装
YES
技术
CMOS
温度等级
COMMERCIAL
端子形式
BALL
端子位置
BOTTOM
处于峰值回流温度下的最长时间
30
文档预览
W332M64V-XBX
32Mx64 Synchronous DRAM
FEATURES

High Frequency = 100, 125, 133MHz

Package:
• 219 Plastic Ball Grid Array (PBGA), 25 x 25mm

3.3V ±0.3V power supply

Fully Synchronous; all signals registered on positive edge
of system clock cycle

Internal pipelined operation; column address can be
changed every clock cycle

Internal banks for hiding row access/precharge

Programmable Burst length 1,2,4,8 or full page

8192 refresh cycles

Commercial, Industrial and Military Temperature Ranges

Organized as 32M x 64

Weight: W332M64V-XBX - 2.5 grams typical
GENERAL DESCRIPTION
The 256MByte (2Gb) SDRAM is a high-speed CMOS, dynamic
random-access, memory using 4 chips containing 536,870,912
bits. Each chip is internally configured as a quad-bank DRAM with
a synchronous interface. Each of the chip’s 134,217,728-bit banks
is organized as 8,192 rows by 1,024 columns by 16 bits.
Read and write accesses to the SDRAM are burst oriented; ac-
cesses start at a selected location and continue for a programmed
number of locations in a programmed sequence. Accesses begin
with the registration of an ACTIVE command, which is then fol-
lowed by a READ or WRITE command. The address bits regis-
tered coincident with the ACTIVE command are used to select the
bank and row to be accessed (BA0, BA1 select the bank; A0-12
select the row). The address bits registered coincident with the
READ or WRITE command are used to select the starting column
location for the burst access.
The SDRAM provides for programmable READ or WRITE burst
lengths of 1, 2, 4 or 8 locations, or the full page, with a burst ter-
minate option. An AUTO PRECHARGE function may be enabled
to provide a self-timed row precharge that is initiated at the end
of the burst sequence.
The 2Gb SDRAM uses an internal pipelined architecture to achieve
high-speed operation. This architecture is compatible with the 2n rule
of prefetch architectures, but it also allows the column address to
be changed on every clock cycle to achieve a high-speed, fully
random access. Precharging one bank while accessing one of
the other three banks will hide the precharge cycles and provide
seamless, high-speed, random-access operation.
The 2Gb SDRAM is designed to operate at 3.3V. An auto refresh
mode is provided, along with a power-saving, power-down mode.
All inputs and outputs are LVTTL compatible. SDRAMs offer
substantial advances in DRAM operating performance, including
the ability to synchronously burst data at a high data rate with
automatic column-address generation, the ability to interleave
between internal banks in order to hide precharge time and the
capability to randomly change column addresses on each clock
cycle during a burst access.
BENEFITS

41% SPACE SAVINGS

Reduced part count

Reduced trace lengths for lower parasitic capacitance

Suitable for hi-reliability applications

Laminate interposer for optimum TCE match

Pinout compatible with lower densities WEDPN4M64V-
XBX, WEDPN8M64V-XBX and WEDPN16M64V-XBX
* This product is subject to change without notice.
DENSITY COMPARISONS
Discrete Approach (mm)
11.9
11.9
11.9
11.9
W332M64V-XBX
22.3
54
TSOP
54
TSOP
54
TSOP
54
TSOP
25
W332M64V-XBX
25
S
A
V
I
N
G
S
41%
Area
4 x 265mm
2
= 1,060mm
2
625mm
2
Microsemi Corporation reserves the right to change products or specifications without notice.
January 2011
Rev. 2
© 2011 Microsemi Corporation. All rights reserved.
1
Microsemi Corporation • (602) 437-1520 • www.whiteedc.com
www.microsemi.com
W332M64V-XBX
FIGURE 1 – PIN CONFIGURATION
Top View
1
A
B
C
D
E
F
G
H
J
K
L
M
N
P
R
T
DQ1
DQ3
DQ6
DQ7
CAS0#
CS0#
V
SS
V
SS
NC
NC
DQ56
DQ57
DQ60
DQ62
V
SS
2
DQ0
DQ2
DQ4
DQ5
DQML0
WE0#
RAS0#
V
SS
V
SS
CKE3
CLK3
DQMH3
DQ58
DQ59
DQ61
DQ63
3
DQ14
DQ12
DQ10
DQ8
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
V
CC
DQ55
DQ53
DQ51
DQ49
4
DQ15
DQ13
DQ11
DQ9
DQMH0
CLK0
CKE0
V
CCQ
V
CCQ
CS3#
CAS3#
WE3#
DQ54
DQ52
DQ50
DQ48
5
V
SS
V
SS
V
CC
V
CCQ
NC
NC
NC
V
SS
V
SS
NC
RAS3#
DQML3
NC
V
SS
V
CC
V
CCQ
6
V
SS
V
SS
V
CC
V
CCQ
NC
7
A9
A0
A2
A12
NC
8
A10
A7
A5
DNU
BA0
9 10
A11
A6
A4
DNU
BA1
A8
A1
A3
DNU
NC
11 12 13 14 15 16
V
CCQ
V
CC
V
SS
V
SS
NC
V
CCQ
V
CC
V
SS
V
SS
NC
RAS1#
CAS1#
V
CC
V
CC
NC
NC
DQ16
DQ18
DQ20
DQ22
DQML1
WE1#
CS1#
V
SS
V
SS
CKE2
CLK2
DQMH2
DQ41
DQ43
DQ45
DQ47
DQ17
DQ19
DQ21
DQ23
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
V
SS
DQ40
DQ42
DQ44
DQ46
DQ31
DQ29
DQ27
DQ26
NC
DQMH1
NC
V
CCQ
V
CCQ
RAS2#
WE2#
DQML2
DQ37
DQ36
DQ34
DQ32
V
SS
DQ30
DQ28
DQ25
DQ24
CLK1
CKE1
V
CC
V
CC
CS2#
CAS2#
DQ39
DQ38
DQ35
DQ33
V
CC
NC
NC
V
SS
V
CC
V
CCQ
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
NC
V
CC
V
SS
V
SS
NC
NC
V
CC
V
SS
V
SS
NOTE: DNU = Do Not Use; to be left unconnected for future upgrades.
NC = Not Connected Internally.
Microsemi Corporation reserves the right to change products or specifications without notice.
January 2011
Rev. 2
© 2011 Microsemi Corporation. All rights reserved.
2
Microsemi Corporation • (602) 437-1520 • www.whiteedc.com
www.microsemi.com
W332M64V-XBX
FIGURE 2 – FUNCTIONAL BLOCK DIAGRAM
WE
0
#
RAS
0
#
CAS
0
#
WE# RAS# CAS#
A
0-12
BA
0-1
CLK
0
CKE
0
CS
0
#
DQML
0
DQMH
0
A
0-12
BA
0-1
CLK
CKE
CS#
DQML
DQMH
DQ
0
DQ
0
U0
DQ
15
DQ
15
WE
1
#
RAS
1
#
CAS
1
#
WE# RAS# CAS#
A
0-12
BA
0-1
CLK
1
CKE
1
CS
1
#
DQML
1
DQMH
1
CLK
CKE
CS#
DQML
DQMH
DQ
0
DQ
16
U1
DQ
15
DQ
31
WE
2
#
RAS
2
#
CAS
2
#
WE# RAS# CAS#
A
0-12
BA
0-1
CLK
2
CKE
2
CS
2
#
DQML
2
DQMH
2
CLK
CKE
CS#
DQML
DQMH
DQ
0
DQ
32
U2
DQ
15
DQ
47
WE
3
#
RAS
3
#
CAS
3
#
WE# RAS# CAS#
A
0-12
BA
0-1
CLK
3
CKE
3
CS
3
#
DQML
3
DQMH
3
CLK
CKE
CS#
DQML
DQMH
DQ
0
DQ
48
U3
DQ
15
DQ
63
Microsemi Corporation reserves the right to change products or specifications without notice.
January 2011
Rev. 2
© 2011 Microsemi Corporation. All rights reserved.
3
Microsemi Corporation • (602) 437-1520 • www.whiteedc.com
www.microsemi.com
W332M64V-XBX
FUNCTIONAL DESCRIPTION
Read and write accesses to the SDRAM are burst oriented;
accesses start at a selected location and continue for a
programmed number of locations in a programmed sequence.
Accesses begin with the registration of an ACTIVE command which
is then followed by a READ or WRITE command. The address
bits registered coincident with the ACTIVE command are used to
select the bank and row to be accessed (BA0 and BA1 select the
bank, A0-12 select the row). The address bits (A0-9) registered
coincident with the READ or WRITE command are used to select
the starting column location for the burst access.
Prior to normal operation, the SDRAM must be initialized. The
following sections provide detailed information covering device
initialization, register definition, command descriptions and device
operation.
FIGURE. 3 – MODE REGISTER DEFINITION
A
12
A
11
A
10
A
9
A
8
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
Address Bus
Mode Register (Mx)
Reserved* Reserved* WB Op Mode
CAS Latency
BT
Burst Length
*Should program
M12, M11, M10 = 0, 0
to ensure compatibility
with future devices.
M2 M1M0
0
0
0
0
1
1
1
1
0 0
0 1
1 0
1 1
0 0
0 1
1 0
1 1
1
2
4
8
Burst Length
M3 = 0
M3 = 1
1
2
4
8
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
Reserved
Full Page
INITIALIZATION
SDRAMs must be powered up and initialized in a predefined
manner. Operational procedures other than those speci
ed may
result in undefined operation. Once power is applied to V
CC
and
V
CCQ
(simultaneously) and the clock is stable (stable clock is
de
ned as a signal cycling within timing constraints specified for the
clock pin), the SDRAM requires a 100μs delay prior to issuing any
command other than a COMMAND INHIBIT or a NOP. Starting at
some point during this 100μs period and continuing at least through
the end of this period, COMMAND INHIBIT or NOP commands
should be applied.
Once the 100μs delay has been satisfied with at least one
COMMAND INHIBIT or NOP command having been applied, a
PRECHARGE command should be applied. All banks must be
precharged, thereby placing the device in the all banks idle state.
Once in the idle state, two AUTO REFRESH cycles must be performed.
After the AUTO REFRESH cycles are complete, the SDRAM is ready
for Mode Register programming. Because the Mode Register will
power up in an unknown state, it should be loaded prior to applying
any operational command.
M8
0
-
M7
0
-
-
M3
0
1
Burst Type
Sequential
Interleaved
M6 M5 M4
0
0
0
0
1
1
1
1
0 0
0 1
1 0
1 1
0 0
0 1
1 0
1 1
CAS Latency
Reserved
Reserved
2
3
Reserved
Reserved
Reserved
Reserved
M6-M0
Defined
Operating Mode
Standard Operation
All other states reserved
M9
0
1
Write Burst Mode
Programmed Burst Length
Single Location Access
REGISTER DEFINITION
MODE REGISTER
The Mode Register is used to define the specific mode of operation
of the SDRAM. This definition includes the selec-tion of a burst
length, a burst type, a CAS latency, an operating mode and a
write burst mode, as shown in Figure 3. The Mode Register is
programmed via the LOAD MODE REGISTER command and will
retain the stored information until it is programmed again or the
device loses power.
Mode register bits M0-M2 specify the burst length, M3 speci
es
the type of burst (sequential or interleaved), M4-M6 specify the
CAS latency, M7 and M8 specify the operating mode, M9 speci
es
the WRITE burst mode, and M10 and M11 are reserved for future
use. Address A12 (M12) is undefined but should be driven LOW
during loading of the mode register.
The Mode Register must be loaded when all banks are idle, and
the controller must wait the specified time before initiating the
Microsemi Corporation reserves the right to change products or specifications without notice.
January 2011
Rev. 2
© 2011 Microsemi Corporation. All rights reserved.
4
subsequent operation. Violating either of these requirements will
result in unspecified operation.
BURST LENGTH
Read and write accesses to the SDRAM are burst oriented, with
the burst length being programmable, as shown in Figure 3. The
burst length determines the maximum number of column locations
that can be accessed for a given READ or WRITE command.
Burst lengths of 1, 2, 4 or 8 locations are available for both the
sequential and the interleaved burst types, and a full-page burst
is available for the sequential type. The full-page burst is used in
conjunction with the BURST TERMINATE command to generate
arbitrary burst lengths.
Reserved states should not be used, as unknown operation or
incompatibility with future versions may result.
Microsemi Corporation • (602) 437-1520 • www.whiteedc.com
www.microsemi.com
W332M64V-XBX
When a READ or WRITE command is issued, a block of columns
equal to the burst length is effectively selected. All accesses for
that burst take place within this block, meaning that the burst will
wrap within the block if a boundary is reached. The block is uniquely
selected by A1-9 when the burst length is set to two; by A2-9 when
the burst length is set to four; and by A3-9 when the burst length
is set to eight. The remaining (least significant) address bit(s) is
(are) used to select the starting location within the block. Full-page
bursts wrap within the page if the boundary is reached.
CAS LATENCY
The CAS latency is the delay, in clock cycles, between the
registration of a READ command and the availability of the
rst
piece of output data. The latency can be set to two or three clocks.
If a READ command is registered at clock edge n, and the latency
is m clocks, the data will be available by clock edge n+m. The I/
Os will start driving as a result of the clock edge one cycle earlier
(n + m - 1), and provided that the relevant access times are met,
the data will be valid by clock edge n + m. For example, assuming
that the clock cycle time is such that all relevant access times are
met, if a READ command is registered at T0 and the latency is
programmed to two clocks, the I/Os will start driving after T1 and
the data will be valid by T2. Table 2 below indicates the operating
frequencies at which each CAS latency setting can be used.
Reserved states should not be used as unknown operation or
incompatibility with future versions may result.
BURST TYPE
Accesses within a given burst may be programmed to be either
sequential or interleaved; this is referred to as the burst type and
is selected via bit M3.
The ordering of accesses within a burst is determined by the burst
length, the burst type and the starting column address, as shown
in Table 1.
TABLE 1 – BURST DEFINITION
Burst
Length
2
A1
0
0
1
1
A1
0
0
1
1
0
0
1
1
n = A
0-9
(location 0-y)
Starting Column
Address
A0
0
1
A0
0
1
0
1
A0
0
1
0
1
0
1
0
1
Order of Accesses Within a Burst
Type = Sequential
Type = Interleaved
0-1
1-0
0-1-2-3
1-2-3-0
2-3-0-1
3-0-1-2
0-1-2-3-4-5-6-7
1-2-3-4-5-6-7-0
2-3-4-5-6-7-0-1
3-4-5-6-7-0-1-2
4-5-6-7-0-1-2-3
5-6-7-0-1-2-3-4
6-7-0-1-2-3-4-5
7-0-1-2-3-4-5-6
Cn, Cn + 1, Cn + 2
Cn + 3, Cn + 4...
…Cn - 1,
Cn…
0-1
1-0
0-1-2-3
1-0-3-2
2-3-0-1
3-2-1-0
0-1-2-3-4-5-6-7
1-0-3-2-5-4-7-6
2-3-0-1-6-7-4-5
3-2-1-0-7-6-5-4
4-5-6-7-0-1-2-3
5-4-7-6-1-0-3-2
6-7-4-5-2-3-0-1
7-6-5-4-3-2-1-0
Not Supported
OPERATING MODE
The normal operating mode is selected by setting M7 and M8 to
zero; the other combinations of values for M7 and M8 are reserved
for future use and/or test modes. The programmed burst length
applies to both READ and WRITE bursts.
Test modes and reserved states should not be used because
unknown operation or incompatibility with future versions may
result.
4
TABLE 2 – CAS LATENCY
ALLOWABLE OPERATING
FREQUENCY (MHz)
SPEED
-100
-125
-133
CAS LATENCY = 2
75
100
100
CAS LATENCY = 3
100
125
133
8
A2
0
0
0
0
1
1
1
1
WRITE BURST MODE
When M9 = 0, the burst length programmed via M0-M2 applies
to both READ and WRITE bursts; when M9 = 1, the programmed
burst length applies to READ bursts, but write accesses are single-
location (nonburst) accesses.
Full
Page
(y)
NOTES:
1. For full-page accesses: y = 1,024.
2. For a burst length of two, A1-9 select the block-of-two burst; A0 selects the starting column
within the block.
3. For a burst length of four, A2-9 select the block-of-four burst; A0-1 select the starting column
within the block.
4. For a burst length of eight, A3-9 select the block-of-eight burst; A0-2 select the starting column
within the block.
5. For a full-page burst, the full row is selected and A0-9 select the starting column.
6. Whenever a boundary of the block is reached within a given sequence above, the following
access wraps within the block.
7. For a burst length of one, A0-9 select the unique column to be accessed, and Mode Register bit
M3 is ignored.
COMMANDS
The Truth Table provides a quick reference of available commands.
This is followed by a written description of each command. Three
additional Truth Tables appear following the Operation section;
these tables provide current state/next state information.
COMMAND INHIBIT
The COMMAND INHIBIT function prevents new commands from
being executed by the SDRAM, regardless of whether the CLK
signal is enabled. The SDRAM is effectively deselected. Operations
already in progress are not affected.
Microsemi Corporation reserves the right to change products or specifications without notice.
January 2011
Rev. 2
© 2011 Microsemi Corporation. All rights reserved.
5
Microsemi Corporation • (602) 437-1520 • www.whiteedc.com
www.microsemi.com
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